Nanoscale electrical characterization

Nanoscale electrical characterization

TOOLS & TECHNIQUES UPDATE Positioner scales height Mad City Labs’ Nano-Z500 piezodriven nanopositioner allows highthroughput single-cell fluorescence...

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Positioner scales height Mad City Labs’ Nano-Z500 piezodriven nanopositioner allows highthroughput single-cell fluorescence microscopy and fast, highresolution confocal imaging while adjusting z-axis height to remove the effects of multiwell plate irregularities. Flexure-guided motion and internal sensors provide closed-loop positioning resolution of <3 nm over the 500 µm travel range. A 15 ms step response allows the z-section to be acquired quickly with minimal photobleaching. Multiframe images of kinetic events can be recorded in fractions of a second. Using the Nano-Drive™ controller, commands may be analog or digital. Contact:

Nanopositioner family Newport’s new NanoPZ™ family of nanopositioners includes the PZA12 compact linear actuator, PZC200 controller, and PZC-SB switchbox. The PZA12’s piezo stepping motor provides 12 mm travel with 30 nm motion sensitivity at up to 0.2 mm/s for loads of up to 50 N with no loss of position when power is removed. Also, the NanoPZ design does not rely on varying static and dynamic friction forces, which can provide inconsistent performance and limited lifetime. The PZC-SB provides control of up to eight PZA12 actuators with a single controller via either an ergonomic handheld interface or RS232 port. Contact:

Long-travel nanopositioner DTI-NanoTech’s NTS100 linear positioning stage has a piezoelectric rotary motor and precision optical encoder, and provides 100 mm travel, 0.4 nm resolution, and longterm stability (<2 nm drift/hr). Features include a multichannel controller, open/closed-loop mode, speed range (stepped to continuous, 0.5 nm/s to 2000 mm/s), rapid response (10 ms), and high load capacity (3 kg). Adapters and universal mounting plates allow various multichannel configurations (e.g. xy, xyz). An optional joystick enables precise simultaneous control of up to three stages. Contact:

plane magnetic field exceeding +2000 Oe with <1 Oe resolution. Adjustable pole tips allow the maximum field to be varied. Rare-earth magnets eliminate fieldinduced heating and drift. The new Digital Access Module optional hardware accessory, which plugs into the front of the MFP-3D controller, allows applications such as photon counting, synchronization of experiments to the AFM scan, and general-purpose digital input/output control. The MFP-3D Extended Head allows a 28 µm scan range in the z-axis for samples with taller features and applications such as pulling on long-chain molecules. Z-sensor noise is <0.3 nm, sensor nonlinearity is <0.2% at full scan, and Z-height noise is <0.06 nm.

Environmental cell for AFM The Environmental Cell is a new option for Pacific Nanotechnology’s Nano-R™ Light Lever atomic force microscope (AFM) for in situ surface characterization. The chamber is formed by a flexible latex seal between the scanner and the top of the sample holder, or puck, which allows lateral translation by up to several millimeters for finding the optimum imaging region. This enables easy, simple changing of both the sample and environment without dismantling the cell. Accessories allow scanning in either gases or liquids. Contact:

Nanoscale electrical characterization Veeco Instruments has two new high-performance, low-noise application modules for nanoscale electrical characterization on its Digital Instruments CP-II scanning probe microscope. Conductive atomic force microscopy measures local current-voltage or current-force spectra and generates two-dimensional (2D) maps of conductivity and sample quality/integrity. This allows direct correlation of structural features with electrical characteristics for analyzing film thickness variations and locating defects. Scanning capacitance microscopy measures variations in carrier concentration on semiconductor structures. Applications include 2D dopant profiling and polarization measurements of small ferroelectric capacitors and single grains. It also enables electrostatic force microscopy and surface potential imaging. Contact:

Modules for 3D AFM Asylum Research is offering a Variable Field Module™ (VFM) for its MFP-3D™ atomic force microscope (AFM). For magnetic force microscopy, conductance, and other applications where a sample exhibits a dependence on magnetic field, the VFM applies an in-


Customizable, portable SPMs The new Nanosurf easyScan2® series of portable scanning probe microscopes (SPM) comprise modular inserts in a single electronic box and various scan heads and software modules that are customizable. The scanning tunneling microscope (STM) module allows quick atomic-resolution imaging on a normal table without vibration isolation. The atomic force microscope (AFM) module has cantilever-alignment chip technology, enabling adjustment-free tip changes. Intelligent electromagnetic scan-head technology has low noise and power consumption. The head’s duallens system allows top and side video views for easy sample positioning. Dynamic AFM and multimode packages enable imaging of soft or sensitive samples. Contact:

Mini 3D piezoactuator With dimensions of 15 mm x 15 mm x 15 mm, piezosystem jena’s microTRITOR three-dimensional piezoactuator allows precise positioning in a limited space. It allows motion of up to 9 µm in the x-, y-, and z-axes and has a maximum load of 15 N. Step resolution is <0.1 nm. A resonant frequency of 2.3 kHz makes it suitable for atomic force microscopy, scanning near-field optical microscopy, Raman microscopy, and other scanning applications. Contact:

December 2005