- Email: [email protected]
Characterization made easy
TOOLS & TECHNIQUES UPDATE
Spectroscopy solution The pre-aligned Shamrock 163 imaging spectrograph from Andor Technology has a fully adjustable slit and choice of single grating, as well as the Andor iDus detector and Andor’s propriety SOLIS (S) software. It comes with an image-corrected optical design providing better resolution with higher throughput. When combined with the iDus family of high-end spectroscopy detectors, the Shamrock 163 can be used for applications including absorption/transmission, fluorescence, reflection, and source characterization. Contact: www.andor.com
Isolating the vibration The new Vario Basic series from Halcyonics has been designed as a cost-effective isolation system for applications with high static load and small load changes during operation. Compared with passive systems, Halcyonics’ active systems deliver excellent vibration isolation characteristics at exceptionally low frequencies of 2-3 Hz. They actively isolate vibration for all six degrees of freedom. Vario Basic systems are available with isolation elements in three different lengths and two different load ranges. Contact: www.halcyonics.co.uk
Keeping image processing in the family Olympus has launched a new analySIS family of specialized image processing solutions for materials inspection applications within a wide range of industries. The analySIS family ranges from basic image acquisition and documentation software through to complete automatic inspection systems. The analySIS family also includes application-specific packages, the Inspector series, and specially designed digital cameras. The digital approach of the analySIS family provides significantly higher objectivity and reproducibility compared with conventional inspection methods. The results are more precise, more reliable, and can be obtained faster. All software packages are easy to use for image analysis applications including layer thickness and roughness measurements, microhardness testing, chart navigation, and grain size analysis. Contact: www.olympus-europa.com
memory to expand this memory capability. A large, full-color, thin-film transistor liquid-crystal display makes all instrument settings and measurement data clear. The colors can be easily changed for different laser safety goggles. Contact: www.newport.com
Characterization made easy Pacific Nanotechnology has released a dedicated scanning probe microscope (SPM) for the characterization of nanoparticles. The Nano-RPTM is a complete particle characterization system that uses an atomic force microscope (AFM) designed for capturing three-dimensional images of nanoparticles. The Nano-RPTM is based on the company’s Nano-R2TM platform with enhanced hardware and software, allowing the user to visualize two- and threedimensional topography and measure the average size, size distribution, and two-dimensional concentration of nanoparticles. Preparation of nanoparticles for study is simplified through the provision of extremely flat activated substrates. The samples are first anchored and then placed on the microscope stage for scanning. Analysis is performed using the NanoRule+TM particle characterization software package, which enables data to be presented in a wide variety of formats including exportable tables and graphs. Contact: www.pacificnanotech.com
Wide-ranging spectrometers The VS140 family of microspectrophotometers from HORIBA Jobin Yvon feature integrated high-sensitivity linear charge-coupled device (CCD) or photodiode array (PDA) detectors. The compact design, large aperture f/2.4 optics, and simple fiber-based C-mount microscope adapter make the VS140 ideal for a wide range of biomedical, physical, and forensic applications. The instrument comes with powerful spectroscopic software and the universal USB 2.0 interface, industry -standard microscope adapter. Its small footprint make it easy to transfer the VS140 between multiple work stations. The wavelength ranges available are 190-800 nm, 380-780 nm, and 400-1100 nm Contact: www.jobinyvon.co.uk
Materials data empowers product design
Power meters with memory Newport’s new 1931-C power and optical meter provides power measurements from 10 pW to 40 W using photodiode detectors. The meters are capable of pulsed measurements up to 20 kHz, which is an order of magnitude higher than other commercially available products. The 1931-C power meter family is an ideal solution for the measurement the optical power of any type of laser, laser diode, or broadband light source. The meters are able to store up to 250 000 data points internally, with a USB-based external flash
Users of ANSYS® WorkbenchTM for engineering design can now easily import and apply materials data from GRANTA MITM, Granta’s powerful ‘material intelligence’ system. This allows engineers to use the best available information in product analysis and design. The technology enabling this integration is bundled with all GRANTA MITM installations. The system will enable companies seeking to improve design, safety, and reliability to manage and use their material property data more effectively. Contact: www.grantadesign.com
SEPTEMBER 2006 | VOLUME 9 | NUMBER 9
53
Spectroscopy solution The pre-aligned Shamrock 163 imaging spectrograph from Andor Technology has a fully adjustable slit and choice of single grating, as well as the Andor iDus detector and Andor’s propriety SOLIS (S) software. It comes with an image-corrected optical design providing better resolution with higher throughput. When combined with the iDus family of high-end spectroscopy detectors, the Shamrock 163 can be used for applications including absorption/transmission, fluorescence, reflection, and source characterization. Contact: www.andor.com
Isolating the vibration The new Vario Basic series from Halcyonics has been designed as a cost-effective isolation system for applications with high static load and small load changes during operation. Compared with passive systems, Halcyonics’ active systems deliver excellent vibration isolation characteristics at exceptionally low frequencies of 2-3 Hz. They actively isolate vibration for all six degrees of freedom. Vario Basic systems are available with isolation elements in three different lengths and two different load ranges. Contact: www.halcyonics.co.uk
Keeping image processing in the family Olympus has launched a new analySIS family of specialized image processing solutions for materials inspection applications within a wide range of industries. The analySIS family ranges from basic image acquisition and documentation software through to complete automatic inspection systems. The analySIS family also includes application-specific packages, the Inspector series, and specially designed digital cameras. The digital approach of the analySIS family provides significantly higher objectivity and reproducibility compared with conventional inspection methods. The results are more precise, more reliable, and can be obtained faster. All software packages are easy to use for image analysis applications including layer thickness and roughness measurements, microhardness testing, chart navigation, and grain size analysis. Contact: www.olympus-europa.com
memory to expand this memory capability. A large, full-color, thin-film transistor liquid-crystal display makes all instrument settings and measurement data clear. The colors can be easily changed for different laser safety goggles. Contact: www.newport.com
Characterization made easy Pacific Nanotechnology has released a dedicated scanning probe microscope (SPM) for the characterization of nanoparticles. The Nano-RPTM is a complete particle characterization system that uses an atomic force microscope (AFM) designed for capturing three-dimensional images of nanoparticles. The Nano-RPTM is based on the company’s Nano-R2TM platform with enhanced hardware and software, allowing the user to visualize two- and threedimensional topography and measure the average size, size distribution, and two-dimensional concentration of nanoparticles. Preparation of nanoparticles for study is simplified through the provision of extremely flat activated substrates. The samples are first anchored and then placed on the microscope stage for scanning. Analysis is performed using the NanoRule+TM particle characterization software package, which enables data to be presented in a wide variety of formats including exportable tables and graphs. Contact: www.pacificnanotech.com
Wide-ranging spectrometers The VS140 family of microspectrophotometers from HORIBA Jobin Yvon feature integrated high-sensitivity linear charge-coupled device (CCD) or photodiode array (PDA) detectors. The compact design, large aperture f/2.4 optics, and simple fiber-based C-mount microscope adapter make the VS140 ideal for a wide range of biomedical, physical, and forensic applications. The instrument comes with powerful spectroscopic software and the universal USB 2.0 interface, industry -standard microscope adapter. Its small footprint make it easy to transfer the VS140 between multiple work stations. The wavelength ranges available are 190-800 nm, 380-780 nm, and 400-1100 nm Contact: www.jobinyvon.co.uk
Materials data empowers product design
Power meters with memory Newport’s new 1931-C power and optical meter provides power measurements from 10 pW to 40 W using photodiode detectors. The meters are capable of pulsed measurements up to 20 kHz, which is an order of magnitude higher than other commercially available products. The 1931-C power meter family is an ideal solution for the measurement the optical power of any type of laser, laser diode, or broadband light source. The meters are able to store up to 250 000 data points internally, with a USB-based external flash
Users of ANSYS® WorkbenchTM for engineering design can now easily import and apply materials data from GRANTA MITM, Granta’s powerful ‘material intelligence’ system. This allows engineers to use the best available information in product analysis and design. The technology enabling this integration is bundled with all GRANTA MITM installations. The system will enable companies seeking to improve design, safety, and reliability to manage and use their material property data more effectively. Contact: www.grantadesign.com
SEPTEMBER 2006 | VOLUME 9 | NUMBER 9
53