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Electronic component reliability fundamentals, modelling, evaluation, and assurance
Book reviews
975
ELECTRONIC COMPONENT RELIABILITY FUNDAMENTALS, MODELLING, EVALUATION, AND ASSURANCE FINN JENSEN JOHN WILEY AND SONS LIMITED, Baffins Lane, Chichester, West Sussex PO19 IUD, England £40.00 ($65.00) (ISBN: 0-471-95296-6) Published 1995 The reliability of electronic components was the subject of intensive research over the past decades and further intensive research will certainly be continued in the future; i.e. the component manufacturers are pressed by new and stringent reliability demands from the component users. On the other hand, the component and technology complexities are continuously growing and setting new problems in analysis and design of component reliability. The component reliability level is increased by improving the design and component technology, and there are real problems to verify the component reliability in a traditional way and to convince the component buyers that a particular product indeed is as reliable as the manufacturer might claim. All these problems require new approaches to component, as well as to system reliability which, as the author emphasizes in the preface of the book, will involve a breakdown of traditional barriers, between reliability physicists, component designers and production engineers. The book is written just to be useful to all of them in searching for new approaches to component reliability. In our opinion, that is one of the main contributions to the book and will help the better understanding and development of electronic component reliability. The subtitle of the book suggests that it deals with the fundamentals, modelling, evaluation and assurance of electronic component reliability. It is a successful attempt to present the existing, traditional approaches in component reliability and new ideas, as the topics of reliability modelling, reliability indicators, and proactive process control of built-in reliability. Some of the new approaches given in the book are still being developed, but they can stimulate reader's imagination as to how to apply them in practice. The content of the book is divided into four parts: fundamentals, modelling, evaluation and assurance. The first part includes four chapters in which reliability terminology and parameters (Chapter 1), reliability physics and failure mechanisms (Chapter 2), statistical distributions (Chapter 3), and mixed distribution and multiple failure mechanisms (Chapter 4) are discussed. The second part of the book also includes four chapters which deal with the load-strength concept (Chapter 5), intrinsic (Chapters 6 and 7), and extrinsic reliability (Chapter 8). The third part of the book, made up of three chapters, discusses life testing (Chapter 9), field failure data analysis (Chapter 10) and reliability prediction of electronic equipment (Chapter 11). The fourth part of the book addresses the burn-in approach in reliability screening (Chapter 12), reliability indicator screening (Chapter 13), and the new ideas on component reliability assurance (Chapter 14), like proactive process control, component qualification and robustness, and yield versus reliability. The appendices include the tables of the distribution which are frequently used in modelling and evaluation of the component reliability. Amonst the problems discussed in the book, some of them can be emphasized as follows. The problem of the correct choice of acceleration factor into accelerated lifetests, the way in which to extract component reliability data from field failures, the new reliability prediction philosophy based on modelling of wearout mechanisms and on the concept of robustness, a new scheme for sample burn-in and the concept of the reliability indicators. It should be emphasized that this book represents an interesting, and good combination of the reliability theory and practice. In this way, the book will be of interest for specialists from both industrial and academic environments, and, specially, for the engineers who will be applying reliability principles in component design, manufacture, testing and field service. It is hoped that this book will be of help to all of them in solving the component reliability problems created by the ever more increasing component complexity, and of new approaches in the component reliability modelling, evaluation and assurance. M. M. JEVTIC
MICROELECTRONICS STRUCTURE AND OPERATION OF MICROPROCESSOR-BASED SYSTEMS DOUGLAS M. BONIFACE ALBION PUBLISHING LIMITED, Coil House, Westergate, Chichester, West Sussex, PO20 6QL, U.K. £12.95 (Paperback) (ISBN: 1-898563-32-2) Published July 1996
There have been many hundreds of books dealing with "Microelectronics", the majority being specialized books dealing with specific aspects of microelectronics. This book, however, is designed specifically for teaching to the new GNVQ syllabuses, dealing principally with the structure and operation of microprocessor-based systems. The author makes the point that the fundamental design of microcomputers was developed nearly 30 years ago, and what has changed is the range and complexity of the tasks now being undertaken.
975
ELECTRONIC COMPONENT RELIABILITY FUNDAMENTALS, MODELLING, EVALUATION, AND ASSURANCE FINN JENSEN JOHN WILEY AND SONS LIMITED, Baffins Lane, Chichester, West Sussex PO19 IUD, England £40.00 ($65.00) (ISBN: 0-471-95296-6) Published 1995 The reliability of electronic components was the subject of intensive research over the past decades and further intensive research will certainly be continued in the future; i.e. the component manufacturers are pressed by new and stringent reliability demands from the component users. On the other hand, the component and technology complexities are continuously growing and setting new problems in analysis and design of component reliability. The component reliability level is increased by improving the design and component technology, and there are real problems to verify the component reliability in a traditional way and to convince the component buyers that a particular product indeed is as reliable as the manufacturer might claim. All these problems require new approaches to component, as well as to system reliability which, as the author emphasizes in the preface of the book, will involve a breakdown of traditional barriers, between reliability physicists, component designers and production engineers. The book is written just to be useful to all of them in searching for new approaches to component reliability. In our opinion, that is one of the main contributions to the book and will help the better understanding and development of electronic component reliability. The subtitle of the book suggests that it deals with the fundamentals, modelling, evaluation and assurance of electronic component reliability. It is a successful attempt to present the existing, traditional approaches in component reliability and new ideas, as the topics of reliability modelling, reliability indicators, and proactive process control of built-in reliability. Some of the new approaches given in the book are still being developed, but they can stimulate reader's imagination as to how to apply them in practice. The content of the book is divided into four parts: fundamentals, modelling, evaluation and assurance. The first part includes four chapters in which reliability terminology and parameters (Chapter 1), reliability physics and failure mechanisms (Chapter 2), statistical distributions (Chapter 3), and mixed distribution and multiple failure mechanisms (Chapter 4) are discussed. The second part of the book also includes four chapters which deal with the load-strength concept (Chapter 5), intrinsic (Chapters 6 and 7), and extrinsic reliability (Chapter 8). The third part of the book, made up of three chapters, discusses life testing (Chapter 9), field failure data analysis (Chapter 10) and reliability prediction of electronic equipment (Chapter 11). The fourth part of the book addresses the burn-in approach in reliability screening (Chapter 12), reliability indicator screening (Chapter 13), and the new ideas on component reliability assurance (Chapter 14), like proactive process control, component qualification and robustness, and yield versus reliability. The appendices include the tables of the distribution which are frequently used in modelling and evaluation of the component reliability. Amonst the problems discussed in the book, some of them can be emphasized as follows. The problem of the correct choice of acceleration factor into accelerated lifetests, the way in which to extract component reliability data from field failures, the new reliability prediction philosophy based on modelling of wearout mechanisms and on the concept of robustness, a new scheme for sample burn-in and the concept of the reliability indicators. It should be emphasized that this book represents an interesting, and good combination of the reliability theory and practice. In this way, the book will be of interest for specialists from both industrial and academic environments, and, specially, for the engineers who will be applying reliability principles in component design, manufacture, testing and field service. It is hoped that this book will be of help to all of them in solving the component reliability problems created by the ever more increasing component complexity, and of new approaches in the component reliability modelling, evaluation and assurance. M. M. JEVTIC
MICROELECTRONICS STRUCTURE AND OPERATION OF MICROPROCESSOR-BASED SYSTEMS DOUGLAS M. BONIFACE ALBION PUBLISHING LIMITED, Coil House, Westergate, Chichester, West Sussex, PO20 6QL, U.K. £12.95 (Paperback) (ISBN: 1-898563-32-2) Published July 1996
There have been many hundreds of books dealing with "Microelectronics", the majority being specialized books dealing with specific aspects of microelectronics. This book, however, is designed specifically for teaching to the new GNVQ syllabuses, dealing principally with the structure and operation of microprocessor-based systems. The author makes the point that the fundamental design of microcomputers was developed nearly 30 years ago, and what has changed is the range and complexity of the tasks now being undertaken.