On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy

On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy

Accepted Manuscript On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy K. Heinze, O. Arnoul...

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Accepted Manuscript

On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy K. Heinze, O. Arnould, J.-Y. Delenne, V. Lullien-Pellerin, M. Ramonda, M. George PII: DOI: Reference:

S0304-3991(17)30308-X 10.1016/j.ultramic.2018.07.009 ULTRAM 12615

To appear in:

Ultramicroscopy

Received date: Revised date: Accepted date:

13 June 2017 3 July 2018 22 July 2018

Please cite this article as: K. Heinze, O. Arnould, J.-Y. Delenne, V. Lullien-Pellerin, M. Ramonda, M. George, On the effect of local sample slope during modulus measurements by contact-resonance atomic force microscopy, Ultramicroscopy (2018), doi: 10.1016/j.ultramic.2018.07.009

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