Journal Pre-proof On the impedance response of interdigitated electrodes Arthur R. Dizon, Mark E. Orazem PII:
S0013-4686(19)31871-7
DOI:
https://doi.org/10.1016/j.electacta.2019.135000
Reference:
EA 135000
To appear in:
Electrochimica Acta
Received Date: 23 July 2019 Revised Date:
18 September 2019
Accepted Date: 2 October 2019
Please cite this article as: A.R. Dizon, M.E. Orazem, On the impedance response of interdigitated electrodes, Electrochimica Acta (2019), doi: https://doi.org/10.1016/j.electacta.2019.135000. This is a PDF file of an article that has undergone enhancements after acceptance, such as the addition of a cover page and metadata, and formatting for readability, but it is not yet the definitive version of record. This version will undergo additional copyediting, typesetting and review before it is published in its final form, but we are providing this version to give early visibility of the article. Please note that, during the production process, errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain. © 2019 Published by Elsevier Ltd.
On the Impedance Response of Interdigitated Electrodes Arthur R. Dizona , Mark E. Orazema,∗ a Department
of Chemical Engineering, University of Florida, Gainesville, FL, 32611, USA
Abstract Finite-element impedance simulations were used to provide a relationship between the characteristic dimension and the physical dimensions of the interdigitated electrodes. Inclusion of electric and displacement currents allowed simulation of the capacitive loop associated with the geometric capacitance. An error analysis was used to quantify the influence of mesh and domain sizes on the numerical accuracy of the simulations. The interdigitated electrode geometry is shown to induce a frequency dispersion, dependent on electrode digit width, height, and separation, that can be characterized in terms of a complex ohmic impedance with real asymptotic limits for ohmic resistance at high and low frequencies. Characteristic dimensions, calculated from the primary ohmic resistance, the geometric capacitance, and the high-frequency ohmic resistance were in agreement for all geometries considered. The characteristic dimension calculated from the low-frequency ohmic resistance deviated under conditions that led to frequency dispersion. The Havriliak-Negami equation is shown to provide a good representation of the complex ohmic impedance. The present work is applicable to the analysis and interpretation of experimental data obtained using interdigitated electrodes. Keywords: interdigitated electrodes; impedance spectroscopy; frequency dispersion
1
1. Introduction
2
Interdigitated electrodes are microelectrodes deposited onto a substrate such that the working and counter
3
electrodes have the appearance of interlaced fingers separated by a small distance. The micron-scale sep-
4
aration between the working and counter electrodes serves to increase the sensitivity for electrochemical
5
impedance spectroscopy measurements and to facilitate electrochemical analyses with small sample sizes.
6
The primary use of interdigitated electrodes is as electrochemical sensors. Bueno and Paix˜ao1 studied the
7
use of copper interdigitated electrodes to detect adulteration of ethanol with water by dielectrometry, which is
8
the measurement of the relative permittivity using alternating current. The method was found to be accurate
9
for detecting adulteration in mixtures of 10 to 25 vol.% of water in ethanol. Staginus2 studied the application
10
of interdigitated electrodes for the detection of organic pollutants. Mohamad et al.3 studied the detection
11
of triglycerides in hexane. Matylitskaya et al.4 studied the kinetics on nano-scale interdigitated electrodes ∗ Corresponding
author Email address:
[email protected] (Mark E. Orazem)
Preprint submitted to Electrochimica Acta
October 3, 2019
12
for lab-on-a-chip applications and observed reduced sensitivity resulting from surface films. Interdigitated
13
electrodes are commonly employed for label-less detection of cancer cells and viruses, in which the electrode
14
surfaces are functionalized to detect specific cell types.5, 6, 7, 8, 9, 10
15
Zaretsky et al.11 developed a mathematical framework for the relationship between surface capaci-
16
tance and the periodic interdigitated electrode microstructure for dielectrometry. An early example of
17
interdigitated-electrode fabrication was demonstrated by Chidsat et al.,12 where platinum interdigitated
18
electrodes were made with a digit width of 3.5 µm and a digit spacing of 2.5 µm. Zou et al.13 demonstrated
19
the fabrication of nanometer-scale electrodes designed for bioimpedance measurements. Skjolding et al.14
20
concluded that optimal signal sensitivity occurred with electrode widths less than 1 µm through kinetic
21
studies using nano-interdigitated electrodes. Pliquett et al.15 demonstrated an increase in the noise of impe-
22
dance measurements with reduced digit width. Ibrahim et al.16 optimized interdigitated electrode sensitivity
23
through finite-element simulations and concluded that the optimal ratio of digit spacing and width was 0.66.
24
Jeon et al.17 fabricated nano-gap interdigitated aluminum electrodes and proposed that fabrication defects
25
at electrode edges contributed to deviations from predicted results.
26
Hong et al.18 attributed experimental departures from theoretically predicted impedance to fringing,
27
or edge effects. Chen et al.19 developed a dual-channel interdigitated electrode to mitigate the effect
28
of the substrate on capacitive measurements. Tomˇc´ık20 accounted for overlapping diffusion layers of the
29
interdigitated electrodes and the effect on impedance. Blume et al.21 provided a mathematical framework for
30
the effect of multiple layers deposited on the surface of an interdigitated electrode using conformal mapping.
31
MacKay et al.22 studied increasing the sensitivity of interdigitated electrodes by performing simulations of
32
gold nano-particles adhered to the surface of gold interdigitated electrodes. The simulations predicted that
33
the nano-particles adhered to the electrode surface disrupted the screening effect of the ions in solutions. De
34
La Rica et al.23 studied the viability of polysilicon interdigitated electrodes for electrochemical impedance
35
spectroscopy measurements and demonstrated the detection of urea with polysilicon interdigitated electrodes.
36
Olthuis et al.24 studied interdigitated electrodes coated with a resistive Ta2 O5 film in the determination
37
of the interdigitated electrode cell constant. Using a frequency range of 20 Hz to 500 kHz, experimental
38
cell constants were found to be approximately 10-20% smaller than cell constants calculated from conformal
39
mapping. The disparity between the experimental and calculated cell constants was attributed to edge
40
effects, i.e., geometry-induced nonuniform current and potential distributions.
41
The influence of edge effects on impedance response has been studied extensively for disk electrodes,
42
starting with Newman25 in 1970. Brichzin et al.26 performed oxygen-reduction kinetic studies using Sr-
43
doped LaMnO3 disk microelectrodes and demonstrated the relationship between the disk-electrode geometry
44
and subsequent nonuniform current distribution on polarization resistance. Huang et al.27, 28, 29 showed that
45
the frequency dispersion associated with relaxation of nonuniform current and potential distributions can be
46
expressed in terms of a complex ohmic impedance. Their approach was extended to rectangular electrodes
2
47
by Davis et al.30 More recently, Gharbi et al.31 showed that the Havriliak–Negami model32 provided a good
48
fit to the complex ohmic impedance for a disk electrode and identified the high- and low-frequency limits of
49
the complex ohmic impedance as Re,HF and Re,LF , respectively.
50
Patterned electrodes, used in the development of solid-oxide fuel cells (SOFC) with a geometry simi-
51
lar to interdigitated electrodes, have nonuniform current distributions and are subject to geometry-induced
52
frequency dispersion. Mizusaki et al.33 performed kinetic studies of hydrogen oxidation using patterned
53
electrodes, an early example of the use of the patterned-electrode geometry in the development of SOFC.
54
Goodwin et al.34 developed a computational kinetic model informed by the work of Mizusaki et al.33 for
55
hydrogen oxidation on Ni–yttria-stabilized zirconia patterned anodes. Chen at al.35 studied the influence
56
of interfacial capacitances and cell geometry on the impedance response of a SOFC and concluded that the
57
pattern spacing strongly influenced the impedance response. Ciucci et al.36 performed hydrogen-oxidation
58
kinetic studies that accounted for the influence of electrode geometry and ionic transport through a mixed-
59
ionic electron conductor (MIEC) and identified two reaction mechanisms associated with multiple current
60
pathways. Chueh at al.37 demonstrated increased electrochemical activity using patterned CeO2 –metal
61
anodes that showed good agreement between the simulated and experimental impedance responses of hy-
62
drogen oxidation. Nenning et al.38 developed an SOFC that utilized an interdigitated-electrode geometry
63
that was operated both as a patterned anode and as an interdigitated-electrode cell. Comparison of exper-
64
imental measurements in the two operational modes yielded kinetic parameters and electrical properties of
65
the MIEC.
66
Liu at al.39 performed finite-element simulations and demonstrated good agreement with previous re-
67
ported experimental data of SOFC. They concluded that the patterned electrode geometry has a strong
68
influence on the impedance response. A geometry-dependent high-frequency feature was observed in the
69
simulated impedance responses, but a physical interpretation was not provided.39 Such a high-frequency
70
feature could be consistent with the frequency dispersion reported, for example, by Davis et al.30 and Gharbi
71
et al.31
72
The objective of the present work is to explore the extent to which the discrepancy reported in the
73
literature between cell constants extracted from simulations and those extracted from experiments can be
74
attributed to the influence of geometry-induced frequency dispersion. Previous work on the influence of
75
electrode geometry on impedance response has emphasized isolated disk and rectangular electrodes. The
76
close proximity of interdigitated working and counter electrodes may be expected to distort the current and
77
potential distributions. The objective of the present work was, therefore, to investigate the influence of
78
geometry on the impedance response of interdigitated electrodes. Emphasis is placed on the relationship
79
between the high- and low-frequency limits of the complex ohmic impedance and the high-frequency loop
80
associated with the geometric capacitance.
3
Counter
L
S
Working
W
Working
W
H
Counter
S
(a)
W
(b)
Figure 1: Schematic representation of an interdigitated electrode from a (a) top-down view and (b) a cross-section side view. The working electrode is in gray and the counterelectrode is in black. The electrode digit dimensions are length L, width W , spacing S, and height H. In (a), the gray dashed box contains the repeating unit cell of the electrode. In (b), the dotted line contains the simulation domain and the dashed line is the plane of symmetry between the working and counterelectrode.
81
2. Methods
82
An interdigitated microelectrode comprises interlaced fingers, as shown in Figure 1(a). The electrode
83
dimensions are the height H, width W , length L, and spacing between digits S. The number of fingers or
84
digits can vary depending on design. The total area of the electrode is given by A = nd L (W + 2H)
(1)
85
where nd is the number of digit electrode pairs. The area of the collector wires was not included. A side-view
86
cross section of an interdigitated electrode is shown in Figure 1(b). Shibata40 presented a scanning trans-
87
mission electron microscope image of a commercially available interdigitated electrode (Metrohm DropSens
88
G-IDEAU5), yielding an estimate of 120 nm for the height of an electrode.
89
The impedance of interdigitated electrodes in media was obtained by a numerical solution using COMSOL TM
90
R Multiphysics version 5.0. The computer used to perform the calculations was a Dell R
91
workstation with two E5620 2.4 GHz Intel
92
2.1. Mathematical Model Development
93
Xeon
R
processors and 96 GB of RAM.
The governing equation was conservation of current density ∇·i=0
94
Precision T7500
(2)
The current density vector i comprised both electrical and displacement currents, i.e., i = κE +
4
dD dt
(3)
95
where κ is the electrical conductivity, E is the electric field vector, and D is the electrical displacement
96
vector. The electrical displacement vector was obtained from the constitutive relationship D = r 0 E
97
and the electric-field vector was related to the electrical potential Φ by E = −∇Φ
98
(5)
Equations (2)–(5) are straightforward applications of Maxwell’s equations.41 The electric potential and current were represented in phasor notation as
99
100
(4)
e jωt } Φ = Φ + Re{Φe
(6)
i = i + Re{eiejωt }
(7)
and
101
where ω is the angular frequency, Φ and i are the steady-state electrical potential and current density,
102
e and ei are complex potential and current density phasors, respectively. The phasors Φ e respectively, and Φ
103
and ei are functions of frequency and position, but are independent of time. Under assumptions of a steady state and uniform properties, substitution of equations (3) to (7) into
104
105
equation (2) yields ∇ · i = −κ∇2 Φ = 0
106
107
(8)
The conservation of current under a sinusoidal steady-state may be expressed as e=0 ∇ · ei = − (κ + jωr 0 ) ∇2 Φ
(9)
e=0 (1 + jωr 0 ρ) ∇2 Φ
(10)
or
108
which are equivalent forms. As the permittivity of vacuum 0 = 8.8542 × 10−14 C/V cm is a very small
109
number, equation (10) shows that, for electrolytes of modest resistivity, the contribution of the displacement
110
current can be neglected for impedance measurements in the usual 10 mHz–100 kHz range. The displacement
111
current plays an important role for measurements performed in high-resistivity electrolytes such as organic
112
liquids.42, 43
113
2.1.1. Primary Ohmic Resistance
114
The boundary condition at the electrode surface for calculation of the primary resistance was that the
115
electrolyte potential just outside the diffuse part of the double layer was uniform, i.e., Φ0 = Φm . The
116
boundary condition for the insulating surfaces and the plane of symmetry of the working electrode was
117
n · ∇Φ = 0, where n is the outwardly directed unit normal vector. The boundary condition far from the 5
118
electrode and for the plane of symmetry between the working and counterelectrode shown in Figure 1(b)
119
was Φ = 0. The solution to the steady-state equation (8) yielded a value for the primary ohmic resistance
120
Re,p = Φm /I, where I was obtained by integration of the steady-state current density over the surface of
121
the electrode.
122
2.1.2. Impedance Spectroscopy
123
124
The boundary condition for normal current density at the electrode surface may be expressed for a pure capacitance in the time domain as ∂ (Φm − Φ0 ) ∂t
(11)
em − Φ e0 = jωCdl Φ
(12)
n · κ∇Φ|electrode = Cdl 125
and in the frequency domain, using phasor notation, as e n · κ∇Φ
electrode
126
e m is the potential difference of the metal and a reference, and Cdl is where n is the unit normal vector, Φ
127
the double-layer capacitance. The approach used in the present work follows that of Huang et al.27 and
128
e m due to symmetry. The boundary condition for Gharbi et al.31 The amplitude of the perturbation was 2Φ
129
e = 0. The boundary the insulating surfaces and the plane of symmetry of the working electrode was n · ∇Φ
130
condition far from the electrode and for the plane of symmetry between the working and counterelectrode
131
e = 0. The impedance is a frequency-dependent transfer function given by shown in Figure 1(b) was Φ Z (ω) =
em Φ eI
(13)
132
e m is a complex phasor representing the potential difference between the electrode and a reference where Φ
133
located far from the electrode surface, and eI is a complex phasor representing the integral of ei over the
134
electrode surface.
135
2.2. Simulation Parameters, Domain, and Meshing
136
R Simulations were performed using the COMSOL Multiphysics finite-element software with triangular-
137
element discretization and a Lagrange quadratic shape function. A multi-frontal massively parallel sparse
138
direct solver (MUMPS) was used with a relative tolerance set at 10−4 . To achieve the refined mesh size
139
required at the electrode surface, two semi-circular sub-domains were defined that contained the electrode
140
corners. The sub-domains were contained within a quarter circle domain of radius Hdom .
141
The simulation domain and meshing parameters used for the simulation of an isolated rectangular elec-
142
trode are shown in Table 1. The meshed domain of an isolated rectangular electrode is shown in Figure 2.
143
For an interdigitated electrode, the mirror-image counterelectrode was simulated by the addition of a vertical
144
plane of symmetry located between the working and counterelectrode. The interdigitated electrode digits of
145
width W were separated by a distance S. Therefore, a vertical plane of symmetry was added at the position 6
Table 1: The meshing parameters used for the simulation of an isolated rectangular electrode.
Simulation Parameter
value
Hdom
1500W
sdom
250W
se
2.25×10−6 W
ss
750se
(b)
(a)
(c)
Figure 2: Image of the 2-D simulation domain and meshing of an isolated interdigitated-electrode digit with a width of 10 nm using the simulation domain and meshing parameters prescribed in Table 1. The simulation domain and meshing was identical to one used for a 2-D axisymmetric disk electrode with a radius of 5 nm embedded in an insulated plane. (a) Full simulation domain. (b) Enlarged image of the electrode surface. (c) Enlarged image of the edge of the embedded electrode.
7
(b) (a) (c)
Figure 3: Image of the 2-D simulation domain and meshing of an interdigitated-electrode digit pair with an electrode width of 10 nm and an electrode spacing of 9.9 µm. The truncation of the hemispherical domain represented a plane of symmetry between the working and counterelectrode. (a) Full simulation domain. (b) Enlarged image of the electrode surface. (c) Enlarged image of the edge of the embedded electrode.
146
of (W + S) /2. The simulation domain and meshing for a working electrode in the presence of a mirror-image
147
counterelectrode is shown in Figure 3. Simulations with a finite-height used the same simulation domain
148
and meshing parameters used for a flat electrode. The boundary conditions for the electrode were assigned
149
to the vertical electrode surface.
150
The accuracy of the IDE simulations was assessed by evaluating the primary and low-frequency ohmic
151
resistances as functions of the domain size and maximum element size at the electrode corners and edges.
152
The primary and low-frequency ohmic resistances approached an asymptotic values, Re,p,0 and Re,LF,0 ,
153
respectively, as the domain size was increased for a maximum element size at the electrode periphery given
154
by Table 1. The results are presented in Figure 4(a) for four electrode configurations. The values of W , S,
155
and H for the electrode configurations, presented in Table 2, represent extremes for the calculations reported
156
in the present work. The values of ohmic resistance followed −n Re,k = Re,k,0 + aHdom
(14)
157
The resulting values for Re,p,0 and Re,LF,0 , obtained by nonlinear Levenberg–Marquardt algorithm44 imple-
158
mented in Origin 2019br , are presented in Table 2. The relative percent error, calculated as ε = 100
|Re,k − Re,k,0 | Re,k,0
(15)
159
is presented in Figure 4(b). The simulations reported in the present work, shown as filled symbols in
160
Figure 4(b), had errors that ranged from 2 × 10−4 % to 0.04%. 8
101 100
1.000
10-1 0.995
10-2 10-3
0.990 0.05
0.10
0.15
10-4
0.20
10-4
(a)
10-3
10-2
10-1
(b)
Figure 4: Results of a parametric study showing the influence of domain size on the calculated primary (black) and low-frequency (grey) ohmic resistance: a) ohmic resistance scaled by the asymptotic ohmic resistance (see Table 2) as a function of inverse domain size. The line represents the fit of equation (14). (b) The absolute percent error as a function of inverse domain size. The closed symbols represented the dimensions used for the simulations reported in the present work.
Table 2: Asymptotic values of ohmic resistance obtained changing the domain radius for a fixed value of maximum element size at the electrode periphery.
Case
W /µm
S/µm
H/µm
Re,p,0 /Ωcm2
Re,LF,0 /Ωcm2
a
1
9
0
12.6256±0.00065
13.5077±0.00034
b
5
5
0
50.0070±0.00033
54.2745±0.00028
c
9.9
0.1
0
28.0794±0.00030
54.7878±0.00021
d
5
5
0.16
48.83633±0.0011
53.714±0.0019
9
101 1.06
100
1.04
10-1
1.02
10-2
1.00 0
2
4
0
6
(a)
1
2
3
4
5
(b)
Figure 5: Results of a parametric study showing the influence of maximum element size at the electrode periphery on the calculated primary (black) ohmic resistance: a) ohmic resistance scaled by the asymptotic ohmic resistance (see Table 3) as a function of the logarithm of maximum element size. The line represents the fit of equation (16). (b) The absolute percent error as a function of logarithm of maximum element size. The closed symbols represented the dimensions used for the simulations reported in the present work.
Table 3: Asymptotic values of ohmic resistance obtained changing the maximum element size at the electrode surface for a fixed value of domain size.
Case
W /µm
S/µm
H/µm
Re,p,0 /Ωcm2
Re,LF,0 /Ωcm2
a
1
9
0
12.619±0.010
13.502
b
5
5
0
49.988±0.041
54.27404
c
9.9
0.1
0
28.087±0.010
54.78589
d
5
5
0.16
48.7840±0.0033
53.70734
161
A similar study was performed to explore the influence on maximum element size at the electrode edge
162
for the fixed domain size given in Table 1. For the range of maximum element sizes considered, the low-
163
frequency ohmic resistance was found to be independent of maximum element size. The primary ohmic
164
resistance, however, was sensitive to the mesh size used and followed n
Re,p = Re,p,0 + a [log (se )]
(16)
165
The results are presented in Figure 5(a) The resulting values for Re,p,0 , obtained by nonlinear Levenberg–
166
Marquardt algorithm44 implemented in Origin 2019br , and and Re,LF,0 taken from the simulations with the
167
smallest maximum element size, are presented in Table 3. The relative percent error, calculated as equation
168
(15), is presented in Figure 5(b). The simulations reported in the present work, shown as filled symbols in
169
Figure 5(b), had errors on that ranged from 0.0075% to 0.091%.
170
The asymptotic values of ohmic resistance reported in Table 2 for a fixed maximum element size and 10
171
Table 3 for a fixed domain size were in agreement within 0.055%. Thus, the parametric studies reported in
172
Figures 4 and 5 suggest a maximum calculation uncertainty of 0.09%.
173
2.3. Process Model
174
Nonlinear regression using the Levenberg–Marquardt algorithm44 was performed on the synthetic impe-
175
dance data generated by the finite-element simulations. The process model comprised three contributions,
176
i.e., Z = Zg + Ze + Z0
(17)
177
The impedance associated with the geometric capacitance Zg was modeled as a resistor and constant-phase
178
element connected in parallel given by Zg =
Re,HF 1 + (jω)αg Qg Re,HF
(18)
179
where Re,HF was the high-frequency ohmic resistance, and αg and Qg were parameters associated with the
180
geometric capacitance.
181
While a CPE was used to provide a general fitting to the simulation results, the mesh refinement described
182
in Section 2.2 yielded almost ideal capacitive loops with αg ≈ 0.999. The constant-phase-element parameters
183
Qg and αg were used to calculate the effective capacitance according to the equation developed by Brug et
184
al.45 given as (1−α )/αg
g Re,HF g Cg = Q1/α g
185
(19)
The ohmic resistance can be used to extract the resistivity of the sample media following Re,HF = ρδHF
(20)
186
where ρ is resistivity of the medium and δHF is the characteristic electrode dimension associated with the high-
187
frequency ohmic resistance. The dielectric constant r of the medium may be obtained from the geometric
188
capacitance, i.e., Cg =
r 0 δHF
(21)
189
where 0 is the permittivity of vacuum. Use of equations (20) and (21) requires knowledge of the interdigitated
190
electrode characteristic dimension δHF .
191
The ohmic impedance Ze was represented by the use of up to four Voigt elements46 as Ze =
n RC X k=1
Rk 1 + jωRk Ck
(22)
192
A series of Voigt elements yielded the lowest standard error in the regressed parameters of the geomet-
193
ric capacitance in comparison to other equivalent circuits such as an RCPE. Following equation (12), the
194
interfacial impedance Z0 was that of a capacitor, i.e., Z0 =
1 jωCdl
11
(23)
195
The regression of equation (17) to the synthetic data under statistical weighting yielded parameters with
196
95.4% confidence intervals that did not include zero.
197
3. Results
198
Simulations of interdigitated electrodes were performed to determine the influence of the electrode digit
199
width, spacing, and height on the on the impedance response. Parameters were extracted from the simulated
200
data by nonlinear regression of an impedance process model given by equation (17).
201
The simulation frequency range of 1 mHz to 1 GHz was sufficient to display the high-frequency loop
202
associated with geometric capacitance. The simulations were performed using an assumed solution resistivity
203
of ρ = 105 Ωcm and a dielectric constant of 11.294, representative of an organic non-polar liquid. The results
204
of the simulations, presented in dimensionless format, are independent of the electrolyte properties.
205
The width of an interdigitated-electrode digit W was varied from 1 to 9.9 µm. The sum of the electrode
206
width W and gap S was held constant at 10 µm. As a result, the electrode spacing was given by S =
207
10 µm − W . Simulations were also performed to account for the influence of the finite height of the electrode
208
digits. The height of the electrode was varied from 0 to 0.160 µm; whereas, for these simulations, the width
209
and spacing were held constant at 5 µm. The effective ohmic resistance and geometric capacitance were
210
extracted by nonlinear regression of the process model given in equation (17).
211
A typical calculated impedance response for the Metrohm DropSens G-IDEAU5 interdigitated electrode is
212
presented in Figure 6, in which the contributions of the geometric and interfacial impedances are delineated.
213
The high-frequency ohmic resistance Re,HF obtained from the impedance response is shown to be equal
214
to the primary ohmic resistance Re,p obtained from steady-state calculations and the ohmic resistance Re
215
obtained from the analytic solution to Laplace’s equation, which does not account for the displacement
216
current. The low-frequency ohmic impedance Re,LF can be seen as the extrapolation of the low-frequency
217
impedance response to the real axis. The value of Re,HF was obtained from nonlinear regression of equation
218
(17), and the value of Re,LF was obtained from the real part of the impedance at a frequency of 1 mHz,
219
which was sufficiently small to yield the asymptotic value of the real part of the impedance.
220
221
Two characteristic frequencies can be identified. The characteristic frequency corresponding to the maximum of the geometric-capacitance loop is given by fc,g =
222
1 2πρr 0
Thus, the dimensionless frequency associated with the geometric capacitance is Kg = ωρr 0
223
(24)
(25)
The frequency associated with geometry-induced frequency dispersion can be expressed as fc,LF =
1 2πRe,LF Cdl 12
(26)
-1.5
-1.0
-0.5
0.0 0.0
0.5
1.0
Figure 6: Calculated impedance response for the Metrohm DropSens G-IDEAU5 electrode scaled by the calculated primary ohmic resistance. The digit width and separation was 5 µm and the electrode height was 120 nm. The calculated impedance is shown by the dashed line. The impedance associated with the geometric capacitance is given as a solid line, and the interfacial impedance is given as a vertical dotted line.
224
Thus, the dimensionless frequency associated with geometry-induced frequency dispersion was given by KLF = ωRe,LF Cdl
(27)
225
The onset of geometry-induced frequency dispersion may be expected to be visible for frequencies larger
226
than KLF = 0.1.
227
The results are presented in the subsequent sections for isolated flat rectangular electrodes embedded in
228
an insulating plane, for flat rectangular electrodes embedded in an insulating plane and in close proximity,
229
and for the raised rectangular electrodes in close proximity. The case involving raised rectangular electrodes
230
in close proximity represents the typical interdigitated electrode; whereas, the case for flat rectangular
231
electrodes embedded in an insulating plane and in close proximity represents an idealized interdigitated
232
electrode.
233
3.1. Impedance of an Isolated Flat Electrode
234
The impedance response of isolated rectangular electrodes, scaled by the low-frequency ohmic resistance,
235
is shown in Figure 7 in Nyquist format. Results were superposed for electrode widths from 1 to 9.9 µm. The
236
ohmic resistances obtained from the primary current distribution, high-frequency ohmic resistance, and the
237
low-frequency ohmic resistance were found to be linearly dependent on the electrode width, i.e., Re = ηρW
13
(28)
1.5
1.0
0.5
0.0 0.0
0.5
1.0
Figure 7: The impedance response in Nyquist format for an isolated flat rectangular electrode scaled by the low-frequency ohmic resistance. The dimensionless characteristic frequencies Kg and KLF are labeled with circles and squares, respectively. Results are superposed for electrode widths from 1 to 9.9 µm.
238
where the average geometric factors η for the seven simulations (for W values of 1, 2.5, 5, 7.5, 9, 9.5, and
239
9.9 µm) were 5.53912±0.00029 for Re,p , 5.538260±0.000052 for Re,HF , and 5.61037000±0.00000025 for Re,LF .
240
The primary and high-frequency ohmic resistances were equal to within 0.016%. As Re,LF /Re,HF = 1.013,
241
i.e., a difference of 1.3%, the contribution of frequency dispersion for the isolated electrode is much less than
242
is shown in Figure 6 for an interdigitated electrode, for which Re,LF /Re,HF = 1.096 (a difference of 9.6%).
243
The scaled modulus and phase angle are shown in Figures 8(a) and 8(b). The curves for scaled modulus
244
|Z|/Re,HF plotted as a function of Kg superposed at high frequencies. The impedance response for Kg > 0.01
245
corresponded to the capacitive loop associated with the geometric capacitance, and the phase at Kg = 1 has
246
a value of −45◦ . This point is shown as a circle in Figure 7. The curves for scaled modulus |Z|/Re,LF plotted
247
as a function of KLF superposed at low frequencies. The impedance response for KLF < 100 corresponded
248
to the capacitive behavior associated with the interfacial impedance. The phase at KLF = 1 has a value of
249
−45◦ , and this point is represented as a square in Figure 7 where −Zj /Re,LF = Zr /Re,LF = 1.
250
3.2. Influence of Counterelectrode Proximity
251
The influence of counterelectrode proximity on impedance response is shown in Nyquist format in Figure 9.
252
The sum of the electrode width and spacing was fixed at 10 µm, thus, the electrode spacing decreased as the
253
electrode width increased. As the spacing decreased, the ratio between the low-frequency ohmic resistance
254
and high-frequency ohmic increased from 1.012 for W = 0.1 µm and S = 9.9 µm to 1.92 for W = 9.9 µm
255
and S = 0.1 µm. Thus, for a gap to electrode with ratio of S/W = 99, the electrode behaved as an 14
10-8 102
10-4
100
104
108 102
101
101
100
100
10-1
10-1
10-2 -8 10
10-4
100
10-8 -90 -75 -60 -45 -30 -15 0 10-8
10-2 108
104
(a)
10-4
100
104
108
10-4
100
104
108
(b)
Figure 8: The impedance response in Bode format for an isolated flat interdigitated-electrode digit with the electrode width as a parameter: a) Modulus scaled by either the high-frequency ohmic resistance or the low-frequency ohmic resistance as a function of dimensionless frequencies, Kg and KLF , respectively and b) phase angle as a function of dimensionless frequencies, Kg and KLF .
1.5
1.0
0.5
a b c d
0.0 0.0
e
0.5
1.0
Figure 9: The impedance of an interdigitated electrode scaled by the low-frequency ohmic resistance in Nyquist format with the electrode width as a parameter. These results show the influence of working and counter electrode proximity. The labels for individual spectra are: a) W = 0.1 µm and S = 9.9 µm; b) W = 1.0 µm and S = 9.0 µm; c) W = 5.0 µm and S = 5.0 µm; d) W = 9.01 µm and S = 1.0 µm; and e) W = 9.9 µm and S = 0.1 µm. The dimensionless characteristic frequencies of Kg = 1 and KLF = 1 are indicated by circles and squares, respectively.
15
10-6 102
10-3
100
103
101
101
100
100
-1
10
d c
10-2 -6 10
b
a
103
100
104
108
10-4
100
104
108
-60 -45 -30 -15
10 100
10-4
-75
-1
e
10-3
10-8 -90
106 102
0 10-8
10-2 106
(a)
(b)
Figure 10: The impedance response in Bode format for a flat interdigitated-electrode digit with the electrode width as a parameter: a) Modulus scaled by either the high-frequency ohmic resistance or the low-frequency ohmic resistance as a function of dimensionless frequencies, Kg and KLF , respectively and b) phase angle as a function of dimensionless frequencies, Kg and KLF . The labels for individual spectra are those shown in Figure 9.
256
isolated electrode; whereas, for smaller values of S/W , the influence of the adjacent electrode increased the
257
contribution of the ohmic impedance.
258
The scaled modulus and phase are shown in Figures 10(a) and 10(b) as a function of dimensionless
259
frequencies Kg and KLF . The extent of frequency dispersion in Figure 3.2 can be compared to that shown
260
in Figure 8 for isolated electrodes. The curves for scaled modulus |Z|/Re,HF plotted as a function of Kg
261
superposed at high frequencies, and the curves for scaled modulus |Z|/Re,LF plotted as a function of KLF
262
superposed at low frequencies. The phase at Kg = 1 and KLF = 1 has values of −45◦ , which correspond to
263
symbols shown in Figure 9.
264
3.3. Impedance Response of a Finite-Height Electrode
265
The influence of electrode height is shown in the impedance responses in Figure 11, in which the electrode
266
height varied from 0 to 160 nm for W = S = 5 µm. The impedance response was not very sensitive
267
to electrode height in the range of simulated electrode heights. The impedance response for an electrode
268
height of 120 nm, corresponding to the Metrohm DropSens G-IDEAU5 electrode, was almost identical to
269
the response shown in Figure 11 for an electrode height of 160 nm.
270
4. Discussion
271
A cell constant is required to employ measurements on interdigitated electrodes to extract electrical
272
properties of adjacent media. The discrepancy reported in the literature between cell constants extracted 16
1.5 1.0 0.5 0.0 0.0
0.5
1.0
Figure 11: The impedance of an interdigitated electrode scaled by the low-frequency ohmic resistance in Nyquist format with the electrode height as a parameter. The electrode width and spacing was fixed at W = S = 5 µm. Results for electrode heights of 0 and 160 nm are displayed. The dimensionless characteristic frequencies of Kg = 1 and KLF = 1 are indicated by circles and squares, respectively.
273
from simulations and those extracted from experiments can be attributed to the influence of frequency
274
dispersion on ohmic impedance described in the present work. The cell constant is given by Kcell =
Re ρA
(29)
275
where A is the electrode area. The cell constant shown in equation (29) has units of cm−1 and can be related
276
to the characteristic dimension of the cell δ following δ = Kcell A
(30)
277
The value of the cell constant depends on whether the ohmic resistance used is that corresponding to high
278
or low frequency. The assessment of characteristic dimension and the characterization of ohmic impedance
279
are presented in the following section.
280
4.1. Characteristic Dimension of an Interdigitated Electrode
281
The characteristic dimension of interdigitated electrodes may be obtained from values for ohmic resistance
282
and geometric capacitance. The characteristic dimension based on the steady-state primary ohmic resistance
283
is given by δp =
Re,p ρ
(31)
284
where Re,p was the ohmic resistance obtained from the steady-state calculation of the primary current
285
distribution. The characteristic dimension based on the high-frequency ohmic resistance is given by δHF =
Re,HF ρ
17
(32)
100 100
10-1 10-1
10-2 10-2
10-3 10-2 10-1 100 101 102
10-3 10-2 10-1 100 101 102
(a)
(b)
Figure 12: The scaled characteristic dimension of an interdigitated electrode as a function of the ratio between the electrode width and spacing with method of calculation as a parameter: a) The ratio of the characteristic dimensions for flat interdigitated electrodes δ0,k to that of isolated rectangular electrodes δ0,k,iso and b) the characteristic dimension of flat interdigitated electrode scaled by the sum of the electrode width and spacing.
286
where Re,HF was the high-frequency ohmic resistance obtained by nonlinear regression of the process model
287
shown in equation (17) to the simulated impedance response. The characteristic dimension based on the
288
low-frequency ohmic resistance is given by δLF =
Re,LF ρ
(33)
289
where the value of Re,LF was obtained from the limiting value of the real part of the impedance at frequencies
290
sufficiently small that the influence of ohmic impedance was negligible. The value was extracted from a
291
frequency of f = 1 mHz, for which KLF < 10−5 . The characteristic dimension based on the geometric
292
capacitance is given by δCg =
r 0 Cg
(34)
293
where Cg was the capacitance associated with the high-frequency loop. The value of Cg was obtained by
294
nonlinear regression of the process model shown in equation (17) to the simulated impedance response. The
295
effective capacitance Cq was obtained from the regressed values of Re,HF , Qg , and αg by use of the Brug
296
formula given as equation (19).
297
The ratio of the characteristic dimensions for flat interdigitated electrodes δ0,k to that of isolated rectan-
298
gular electrodes δ0,k,iso is presented in Figure 12(a) as functions of the width to spacing ratio. The subscript
299
k is used as an identifier of the method of calculation, i.e., equation (31), (32), (33), or (34). The ratio of
300
characteristic dimensions approached a value of unity as W/S decreased, which suggests that as the spacing
301
was increased, the electrode behaved like an isolated electrode. As W/S increased, the ratio of character-
302
istic dimensions appeared to approach a constant value. Excellent agreement was observed between the
18
1.00 0.99 0.98 0.97
10-3
10-2
10-1
Figure 13: The low and high frequency characteristic dimensions as a function of interdigitated electrode height with method as a parameter. The dimensions were extracted from an interdigitated electrode where the electrode width was equal to the electrode spacing. The characteristic dimensions were scaled by the characteristic dimension of a flat interdigitated electrode.
303
characteristic dimensions obtained from the primary ohmic resistance (equation (31)) high-frequency ohmic
304
resistance (equation (32)), and geometric capacitance (equation (34)). For small values of W/S, the charac-
305
teristic dimension obtained from the low-frequency ohmic resistance (equation (33)) was in agreement with
306
those obtained by equations (31), (32), and (34). This result is consistent with the observation that fre-
307
quency dispersion was less evident for isolated rectangular electrodes. For larger values of W/S, a substantial
308
deviation was observed.
309
The scaled characteristic dimensions of flat interdigitated electrodes are presented in Figure 12(b) as
310
functions of the ratio of electrode width and spacing. The maximum in the high-frequency characteristic
311
dimension was observed when the electrode width and spacing were approximately equal, in agreement
312
with the observations of Ibrahim et al.16 As the W/S increased, the difference between the low-frequency
313
(equation (33)) and high-frequency (equations (31), (32), and (34)) characteristic dimensions increased,
314
which suggested that a wider electrode and small electrode spacing yielded greater frequency dispersion.
315
For small W/S, the scaled characteristic dimensions showed a power-law dependence on W/S, which was a
316
result of the scaling of the ohmic resistance with the width of the electrode. This observation is in agreement
317
with the conclusions of Skjolding et al.,14 where optimal sensitivity was observed with thinner interdigitated
318
electrode digits.
319
The ratio of the characteristic dimension of an interdigitated electrode with a finite height to that of a flat
320
electrode is presented in Figure 13 as a function of dimensionless height. The electrode width and spacing
321
were equal, i.e., W/S = 1 for the results presented in Figure 13. The ratio of characteristic dimensions
322
approached a value of unity as the height of the electrode was decreased. As the height of the electrode was
323
increased, the characteristic dimension of an electrode with a finite height decreased, which was attributed
19
-0.04
-0.04
-0.02
-0.02
0.00 1.00
1.02
1.04
1.06
1.08
1.10
0.00 1.00
1.02
(a)
1.04
1.06
1.08
1.10
(b)
Figure 14: Calculated complex ohmic impedance, scaled by the primary ohmic resistance, in Nyquist format with the electrode height-to-width ratio as a parameter: (a) results for H/W values ranging from 0 to 0.04 and (b) results for H/W = 0 and H/W = 0.024. Synthetic data are represented by circles, and the dotted line was obtained by regression of equation (35).
324
to the additional surface area of the vertical sides. In the range of electrode heights simulated, the high-
325
frequency characteristic dimension was reduced by 2.4%; whereas, the low-frequency characteristic dimension
326
was reduced by 1%.
327
4.2. Ohmic Impedance of an Interdigitated Electrode
328
The equivalent-circuit process model utilized Voigt elements in the nonlinear regression. The use of Voigt
329
elements yielded an excellent representation of the ohmic impedance, but required up to eight regression
330
parameters. Gharbi et al.31 showed that a model proposed by Havriliak and Negami32 provided an excellent
331
representation of the complex ohmic impedance for a disk electrode, i.e., Ze = Re,p +
Re,LF − Re,HF 1−β 1−ν 1 + (jωτ )
(35)
332
where τ was the characteristic time constant of the ohmic impedance. The exponents ν and β dictate the
333
limiting phase angles of the ohmic impedance at high and low frequency.
334
The ohmic impedance was obtained by regression of equation (17) to synthetic data. The ohmic impe-
335
dance of an interdigitated electrode with equal width and spacing is shown in Figure 14(a) with the ratio
336
between the electrode height and width as a parameter.
337
The results for nonlinear regression of equation (35) to synthetic ohmic impedance data are shown in
338
Figure 14(b) for interdigitated electrodes with H/W = 0 and H/W = 0.024. The height to width ratio of
339
0.024 corresponds to a height of 120 nm for an interdigitated electrode with a width and spacing of 5 µm,
340
consistent with the Metrohm DropSens G-IDEAU5. The resulting parameters are shown in Table 4. The
341
regressed parameters were statistically significant and suggest that the Havriliak–Negamii equation, shown
342
by Gharbi et al.31 to provide an acceptable fit to the ohmic impedance of a disk electrode, provides an
343
acceptable fit for the ohmic impedance of interdigitated electrodes.
20
Table 4: Regressed parameters of the ohmic impedances shown in Figure 14(b) using the Havriliak-Negami equation shown in equation (35)
Parameter
H/W = 0
H/W = 0.024
Re,HF /Re,p
1.00008±0.00024
0.998220±0.000092
Re,LF /Re,p
1.09918±0.00019
1.085370±0.000022
τ [ms]
0.1195±0.0012
0.1423±0.0010
ν
0.0280±0.0023
0.0190±0.0020
β
0.01277±0.0059
0.3326±0.0043
344
The ohmic impedance in the present work was developed for an ideally polarizable interdigitated electrode.
345
Further work is suggested for interdigitated electrodes under the influence of films and faradaic reactions.
346
Gharbi et al.31 demonstrated that interfacial CPE behavior on a disk electrode yielded a depressed ohmic
347
impedance but did not influence the values of the low- and high-frequency ohmic resistance. Orazem and
348
Tribollet showed in Figure 13.13 of their book,47 for example, that the value of Re,LF /Re,HF is reduced under
349
the influence of faradaic reactions for a disk electrode geometry.
350
4.3. Interdigitated Electrode Cell Constant
351
Simulations were performed that replicated commercially available interdigitated electrodes with a width
352
and spacing of 5 µm. The characteristic dimension obtained from calculation of the primary ohmic resis-
353
tance had a value of 5.001 µm. The low-frequency characteristic dimension was found to be 5.4274 µm.
354
When an electrode height of 120 nm was included in the simulations, the low and high frequency charac-
355
teristic dimensions were reduced to the values of 5.3835 µm and 4.900 µm, respectively. The reduction was
356
attributed to the additional electrode surface area and accompanying frequency dispersion on the vertical
357
faces of the electrode. The inclusion of a finite height was shown to reduce the characteristic dimension
358
and, subsequently, the cell constant Kcell . For conductive media, where the measured frequencies are below
359
KLF = 1, measurement of an ohmic resistance yields the low-frequency ohmic resistance. The cell constant
360
Kcell calculated using the low-frequency ohmic resistance will be larger than the cell constant obtained from
361
numerical simulations of the primary resistance. The characteristic dimension based on the low-frequency
362
ohmic resistance was shown to be roughly 10% larger than the characteristic dimension based on the high-
363
frequency ohmic resistance. The present work demonstrated that for accurate extraction of a electrical
364
properties of a medium using interdigitated electrodes requires use of the applicable characteristic dimension
365
in the appropriate measured frequency range.
366
5. Conclusions
367
The nonuniform current and potential distribution associated with the interdigitated electrode yields a
368
frequency dispersion similar to that reported for a disk electrode. This contribution can be expressed as an 21
369
ohmic impedance with asymptotic values for ohmic impedance at high and low frequencies. The contribution
370
of the ohmic impedance was found to be strongly dependent on the electrode width and, to a lesser extent,
371
on the electrode height. For a large value of electrode width with a narrow gap between electrodes, the low-
372
frequency ohmic resistance had a value that was roughly twice that of the primary or high-frequency ohmic
373
resistance. For the configuration of a Metrohm DropSens G-IDEAU5 electrode with equal 5 µm electrode
374
width and gap and a 120 nm electrode height, the low-frequency ohmic resistance had a value that was 10
375
percent of the primary or high-frequency ohmic resistance.
376
The finite-element simulations reported in the present work for a capacitive electrode surface provide an
377
upper bound for the contribution of the ohmic impedance. As discussed by Orazem and Tribollet47 for a
378
disk electrode, the value of Re,LF /Re,HF can be reduced under the influence of faradaic reactions for a disk
379
electrode geometry. As reported by Gharbi et al.31 for a disk electrode, the presence of constant-phase-
380
element behavior on the disk electrode does not affect the value of Re,LF /Re,HF , though the corresponding
381
Nyquist plots show depressed loops. These observations were confirmed for the interdigitated electrode in
382
work not reported here. As reported by Gharbi et al.31 for a disk electrode, the Havriliak-Negami equation
383
provided a good representation for the ohmic impedance for interdigitated electrodes.
384
Two characteristic frequencies were identified in the present work: one associated with the geometric
385
capacitance (equation (24)) and one associated with the onset of geometry-induced frequency dispersion
386
(equation (26)). The characteristic frequency of the geometric capacitance was independent of the charac-
387
teristic dimension of the interdigitated electrode. The characteristic frequency associated with frequency
388
dispersion was dependent on the cell geometry. The ohmic impedance described in the present work will not
389
be evident for measurements performed for frequencies smaller than the characteristic frequency reported as
390
equation (26).
391
The characteristic dimensions obtained from the geometric capacitance, the primary ohmic resistance,
392
and the high-frequency ohmic resistance were equal for all electrode geometries studied. The characteristic
393
dimensions obtained from the low-frequency ohmic resistance deviated from the values obtained from the
394
geometric capacitance, the primary ohmic resistance, and the high-frequency ohmic resistance for geometric
395
configurations under which the ratio Re,LF /Re,HF deviated from unity.
396
6. Acknowledgments
397
The authors express appreciation for the support of Mr. Michael J. Kubicsko, Metrohm USA, Inc. Mark
398
Orazem acknowledges financial support from the University of Florida Foundation Preeminence and the Dr.
399
and Mrs. Frederick C. Edie term professorships.
22
400
7. List of Symbols
Symbol
Description
A
electrode area, cm2
a
coefficient for extrapolation of the ohmic resistance
Cdl
double-layer capacitance, F/cm2
Ck
capacitance for Voigt-element used to model ohmic impedance, F/cm2
Cg
geometric capacitance, F/cm2
D
electrical displacement vector, C/cm2
E
electric field vector, V/cm
fc,g
characteristic frequency for the geometric capacitance loop, Hz
fc,LF
characteristic frequency based on low-frequency ohmic resistance, Hz
H
electrode digit height, cm
Hdom
domain radius, cm
I
total steady-state current, A
i
current density vector, A/cm2
Kcell
cell constant, cm−1
Kg
dimensionless frequency based on geometric-capacitance
KLF
dimensionless frequency based on low-frequency ohmic resistance
L
electrode digit length, cm
n
exponent for extrapolation of the ohmic resistance
nd
number of electrode digit pairs
n
normal unit vector
Qg
high-frequency CPE parameter, Fsα /cm
r0
radius of disk electrode, cm
Re
ohmic resistance, Ωcm2
Re,HF
high-frequency ohmic resistance, Ωcm2
Re,LF
low-frequency ohmic resistance, Ωcm2
Re,p
primary ohmic resistance obtained from steady-state primary current distribution, Ωcm2
Rk
resistance for Voigt-element used to model ohmic impedance, Ωcm2
sdom
maximum element size in the simulation domain, cm
se
maximum element size at electrode corners, cm
ss
maximum element size on the electrode surface, cm
W
electrode digit width, cm
X
steady-state variable X
e X
complex phasor variable X
23
X0
interfacial variable X
Xm
variable X at the electrode surface
Z
total impedance, Ωcm2
Ze
ohmic impedance, Ωcm2
Zg
impedance associated with geometric capacitance, Ωcm2
Z0
interfacial impedance, Ωcm2
Greek Symbol
Description
αg
regressed high-frequency CPE parameter
β
exponent used in the Havriliak–Negami equation
δ
characteristic dimension, cm
δCg
characteristic dimension obtained from geometric capacitance, cm
δHF
characteristic dimension obtained from high-frequency ohmic resistance, cm
δLF
characteristic dimension obtained from low-frequency ohmic resistance, cm
δp
characteristic dimension obtained from the primary ohmic resistance, cm
0
permittivity of vacuum, 8.8542×10−14 C/Vcm
r
relative dielectric constant
ε
absolute percent error
κ
electrical conductivity, S/cm
ν
exponent used in the Havriliak–Negami equation
Φ
electrical potential, V
ρ
electrolyte resistivity, Ωcm
τ
time constant used in the Havriliak–Negami equation, s
ω
angular frequency, rad/s
24
401
402
403
404
405
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Highlights:
Finite-element impedance simulations provide relationship between characteristic dimension and dimensions of interdigitated electrodes. Model accounted for the loop associated with geometric capacitance. Frequency dispersion characterized in terms of a complex ohmic impedance with real asymptotic limits for ohmic resistance at high and low frequencies.