JOURNAL
OF NUCLEAR
24 (1967) 232-233. @
MATERIALS
OPTICAL
CONSTANTS
OF PLUTONIUM
D. T. LARSON
The Dow Chemical Company,
is fast becoming
18 July
an important
contractor
for the U.S.
Atomic
Energy 232
80402,
USA
1967
components
extinction settings of the ellipsometer were found using the method described by Archer 4). Readings were taken in the four zones, given by McCrackin et al. 2), and the averages were used to calculate the ellipsometer parameters, A and Y. A is defined as the phase change of the parallel and normal components to the plane of incidence and Y is the arctangent of the amplitude ratio of the parallel and normal A prime
CO., AMSTERDAM
AT 5461 B
Rocky Plats Divition *, Golden, Colorado
tool to study corrosion and passivity of metals. In order to pursue such studies, it is necessary to know the optical constants of the substrate. The optical constants for delta-plutonium at 5461 a were determined using an ellipsometer l-3). Delta-plutonium (98.90 wt “,& Pu, 1.01 wt o/o Ga, and 0.09 wt o/o impurities) was used in these studies. The surface finish was prepared with successive grinding stages and a final polishing stage using 1 ,um diamond grit. After polishing, the plutonium coupon was placed in a vacuum system, and the system was evacuated to 5 x 1O-g Torr. Argon ion bombardment at 1500 V, 0.6 mA/cm2, and 30 to 40 micron argon was used to prepare the “clean” surface and was continued until there was no further change in ellipsometer readings. A Rudolph 43303-200 E, photoelectric ellipsometer was used, and the order of the optical components in relationship to the sample was polarizer, sample, compensator, and analyzer. Ellipsometer measurements were made with the plutonium sample in the vacuum chamber The equipped with 7056 Pyrex windows.
*
PUBLISHING
end D. L. CASH
Received
Ellipsometry
NORTH-HOLLAND
4). These parameters
measured for
the “clean” surface were used to calculate 5) the refractive index, n, and the absorption coefficient, 12. The complex index of refraction is related to the optical constants by the relationship fi = n - ki. Table 1 shows the optical TABLE Optical
constants
1
of delta-plutonium
5461 A and an angle
determined
of incidence
at
of 70”.
a=n-ki Sample
I
n
I
k
1
/
2.08
3.64
2 3
;
2.00
3.69
2.14
3.63
4
2.04
3.52
5
2.10
3.57
--i-ln=2.07
& 0.03
k=3.61
f
0.04
?i=2.07-3.61i
constants calculated for five different deltaThe probable errors 6) plutonium samples. calculated from these data are 0.03 and 0.04 for n and k, respectively. The average value for the complex index of refraction at 5461 A constants were is fi=2.07-3.6li. These measured using an angle of incidence of 70”. The accuracy of the optical constants is dependent. on inherent errors in the ellipsometer and the experimental problem of producing a “clean”, smooth surface. Averages of readings in four zones are reported to eliminate systematic errors resulting from polarizer, Commission
Contract
AT(29-l)-1106.
OPTICAL
compensator, Also,
this
CONSTANTS
and analyzer zero misalignment technique
eliminates
errors
7).
from
interference in the compensator 8). The accuracy for the average readings in four zones is d = f 0.04" and !P= f 0.02" while the scales analyzer, and of the polarizer, compensator, are measured in 0.01” angle of incidence increments.
One difficulty in sample preparation
is that argon bombardment tends to etch the plutonium surface 9). The etching of the surface
OB
233
PLUTONIUM
sufficient
to use with ellipsometry
when studying
plutonium
techniques
oxidation.
References 1) J. Kruger, Corrosion 22 (1966) 88 2) F. L. McCrackin,
E. Passaglia,
R. R.
Stromberg
and H. L. Steinberg, J. Res. Natl. Bur. Std. (U.S.) 678
(1963)
363
3)
A. C. Hall,
4)
R. J. Archer,
J. Opt.
5)
A. Vasicek
Sot.
J. Opt.
Am.
in Ellipsometry
will have some bearing on the optical constants
of
obtained. To determine the thickness and index of refraction of a thin film with an ellipsometer, it is necessary to know the optical constants of a “clean” metal surface; however, Winterbottom states 7) that errors in the optical constants of the substrate have only a second order effect on the calculated thickness or index of refraction of a thin film. The accuracy of the optical constants at 5461 d for deltaplutonium reported in this note should be
R. R. Stromberg
surfaces
and
55 (1965)
Sot. Am.
thin
A.
G.
films
(ed.
and J. Kruger;
Worthing
experimental 7) A.
B.
and
J.
Winterbottom, no.
1,
F.
Passaglia, Bur. Std.
Treatment
New York,
Optical
surfaces (The Royal Norwegian Report
E. Natl.
D. C., 1964) p. 25
Geffner,
data (Wiley,
970
in the measurement
Miscl. Publ., no. 256, Washington, 6)
911
52 (1962)
Bruns,
of
1959) p. 158
studies
of
metal
Scientific Society,
Trondheim,
Norway,
1955) p. 67 8)
II.
T.
J. Opt. 9)
K.
Yolken, Sot.
Imlah
R.
Am.
M.
Waxler
57 (1967)
in Extractive
and
J.
Kruger,
283
and physical
metallurgy
of plutonium
and its alloys (ed. W. D. Wilkinson;
Interscience,
New York,
1960) p. 189