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Photodetectors for laser research
TOOLS & TECHNIQUES UPDATE
Multimode STEM imaging A new scanning transmission electron microscope detector from LEO Electron Microscopy can be used in a scanning electron microscope to acquire information at the subnanometer level. The multimode detector allows simultaneous bright field and dark field imaging at any sample position. Additionally, an orientated dark field imaging mode is achieved with a unique, segmented detector plane. A variable camera length optimizes signal strength, compensating for scattering angles depending on the atomic number. Contact: www.leo-em.com
Atom source for thin film growth The MATS-Series of RF atom sources from MANTIS Deposition Ltd. produce neutral, highly reactive atomic species for the growth of high quality compound materials, such as GaN, GaInNAs, Al2O3, and high dielectric constant materials. Other applications include data storage, catalytic films, and cleaning substrate surfaces with atomic hydrogen. The source sizes in the MATS-Series range from 20 mm in diameter for research purposes to 175 mm for production uses. Incorporating a zero-ion current configuration as standard, a beam-thermalizer can be fitted to reduce the small fraction of energetic atoms produced.
Large samples find new stage PicoMAPS™ from Molecular Imaging Corp. is a new atomic force microscope (AFM) stage designed for the surface characterization of large samples. It offers fast and accurate positioning of specimens for imaging at the atomic scale. The motorized AFM stage can be used with the company’s PicoSPM II™ or PicoLE™ microscopes. The PicoMAPS stage enables accurate AFM imaging and high-speed displacements over the entire sample. It allows investigators to locate and identify an event precisely and automatically reposition the sample to the area of interest. Samples up to 200 mm in size can be imaged in air, fluids, and under controlled temperature conditions. An automated tip approach feature also prevents damage to delicate sample structures. A top-down design makes studying samples with varying heights easy.
Contact: www.e-thermal.com
Contact: www.zeiss.com
Contact: www.molec.com
Photodetectors for laser research
Contact: www.mantisdeposition.com
Transition in thermal analysis Netzch Instruments, Inc. is releasing a number of systems for thermal analysis and measurement of thermophysical properties. The DTA 404 PC Eos® can carry out differential thermal analysis (DTA) or differential scanning calorimetry (DSC) measurements between room temperature and 1550°C. The DSC 204 F1 Phoenix® allows DSC measurements from -90°C to 600°C. A liquid nitrogen cooling system can further extend this temperature range. The TG 209 F1 Iris® is a thermogravimetry instrument.
A three-position reflector slider uses ‘push-and-click’ modules to simplify the process of converting between contrast techniques. The 35 W halogen lamp has a higher intensity and improved homogeneity of illumination than previous instruments. The Axiovert 40 Mat can be equipped with a rotary analyzer for reflected light polarization contrast and a lambda slider for colored polarization contrast. A 90° rotary mechanical stage can also be added. A selection of high-performance condensers is available and improved transmitted light equipment is offered as an option. Carl Zeiss is also introducing its AxioVision Release 4.1 software for all light microscope users. It enables analysis and archiving of individual and series images along with automatic operation of the camera and microscope.
Microscope basks in reflected light Carl Zeiss is launching the Axiovert 40 Mat, a reflected light microscope with high optical performance for routine applications in materials science. A new five-position nosepiece provides a range of standard magnifications: 5 x, 10 x, 20 x, 50 x, and 100 x. Alternatively, it is possible to choose a standard four-position nosepiece, which allows dark field and differential interference contrast, as well as bright field and polarization contrast observations.
Newport Corp. is expanding its range of high-speed photodetectors for use in laser-based research. Specific applications include temporal profiling of nanosecond lasers and monitoring chirped amplification of ultrafast laser pulses. Based on InGaAs, GaAs, and Si, the detectors provide a spectral response from the visible to the near infrared (400-1700 nm). Among the new products are additions to the 818-BB series of low-cost photodetectors with a 10 GHz bandwidth, a wider selection of picosecond photodetectors including the fastest commercially available visible detector with a response time of 7 picoseconds, and a novel detector package available with a 1 MHz response that incorporates both tunable gain and filters. The integrated packaging of the photodetectors provides simple, turnkey operation. This ease of use is enhanced by the option of using free space or fibercoupled inputs, as well as the choice of high or low impedance termination. Contact: www.newport.com
February 2004
59
Multimode STEM imaging A new scanning transmission electron microscope detector from LEO Electron Microscopy can be used in a scanning electron microscope to acquire information at the subnanometer level. The multimode detector allows simultaneous bright field and dark field imaging at any sample position. Additionally, an orientated dark field imaging mode is achieved with a unique, segmented detector plane. A variable camera length optimizes signal strength, compensating for scattering angles depending on the atomic number. Contact: www.leo-em.com
Atom source for thin film growth The MATS-Series of RF atom sources from MANTIS Deposition Ltd. produce neutral, highly reactive atomic species for the growth of high quality compound materials, such as GaN, GaInNAs, Al2O3, and high dielectric constant materials. Other applications include data storage, catalytic films, and cleaning substrate surfaces with atomic hydrogen. The source sizes in the MATS-Series range from 20 mm in diameter for research purposes to 175 mm for production uses. Incorporating a zero-ion current configuration as standard, a beam-thermalizer can be fitted to reduce the small fraction of energetic atoms produced.
Large samples find new stage PicoMAPS™ from Molecular Imaging Corp. is a new atomic force microscope (AFM) stage designed for the surface characterization of large samples. It offers fast and accurate positioning of specimens for imaging at the atomic scale. The motorized AFM stage can be used with the company’s PicoSPM II™ or PicoLE™ microscopes. The PicoMAPS stage enables accurate AFM imaging and high-speed displacements over the entire sample. It allows investigators to locate and identify an event precisely and automatically reposition the sample to the area of interest. Samples up to 200 mm in size can be imaged in air, fluids, and under controlled temperature conditions. An automated tip approach feature also prevents damage to delicate sample structures. A top-down design makes studying samples with varying heights easy.
Contact: www.e-thermal.com
Contact: www.zeiss.com
Contact: www.molec.com
Photodetectors for laser research
Contact: www.mantisdeposition.com
Transition in thermal analysis Netzch Instruments, Inc. is releasing a number of systems for thermal analysis and measurement of thermophysical properties. The DTA 404 PC Eos® can carry out differential thermal analysis (DTA) or differential scanning calorimetry (DSC) measurements between room temperature and 1550°C. The DSC 204 F1 Phoenix® allows DSC measurements from -90°C to 600°C. A liquid nitrogen cooling system can further extend this temperature range. The TG 209 F1 Iris® is a thermogravimetry instrument.
A three-position reflector slider uses ‘push-and-click’ modules to simplify the process of converting between contrast techniques. The 35 W halogen lamp has a higher intensity and improved homogeneity of illumination than previous instruments. The Axiovert 40 Mat can be equipped with a rotary analyzer for reflected light polarization contrast and a lambda slider for colored polarization contrast. A 90° rotary mechanical stage can also be added. A selection of high-performance condensers is available and improved transmitted light equipment is offered as an option. Carl Zeiss is also introducing its AxioVision Release 4.1 software for all light microscope users. It enables analysis and archiving of individual and series images along with automatic operation of the camera and microscope.
Microscope basks in reflected light Carl Zeiss is launching the Axiovert 40 Mat, a reflected light microscope with high optical performance for routine applications in materials science. A new five-position nosepiece provides a range of standard magnifications: 5 x, 10 x, 20 x, 50 x, and 100 x. Alternatively, it is possible to choose a standard four-position nosepiece, which allows dark field and differential interference contrast, as well as bright field and polarization contrast observations.
Newport Corp. is expanding its range of high-speed photodetectors for use in laser-based research. Specific applications include temporal profiling of nanosecond lasers and monitoring chirped amplification of ultrafast laser pulses. Based on InGaAs, GaAs, and Si, the detectors provide a spectral response from the visible to the near infrared (400-1700 nm). Among the new products are additions to the 818-BB series of low-cost photodetectors with a 10 GHz bandwidth, a wider selection of picosecond photodetectors including the fastest commercially available visible detector with a response time of 7 picoseconds, and a novel detector package available with a 1 MHz response that incorporates both tunable gain and filters. The integrated packaging of the photodetectors provides simple, turnkey operation. This ease of use is enhanced by the option of using free space or fibercoupled inputs, as well as the choice of high or low impedance termination. Contact: www.newport.com
February 2004
59