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Spectroelectrochemistry: Theory and practice
333
J. Electroanal.
Chem., 214 (1989) 333-337
Elsevier SequoiaS.A., Lausanne - Printed in The Netherlands
Book reviews Spectroelectrochemistry:
Theory and Practice. R.J. Gale (Editor). Plenum Press, New York, 1988, xv + 450 pp., US$85.00.
This valuable book contains seven chapters reviewing aspects of the title subject: X-ray Techniques by J. Robinson; Photoemission Phenomena at Metallic and Semiconducting Electrodes by R.B. Severeyn and R.J. Gale; UV Visible Reflectance Spectroscopy by D.M. Kolb; Infrared Reflectance Spectroscopy by B. Beden and C. Lamy; Surface-Enhanced Raman Scattering by R.L. Birke and J.R. Lombardi; ESR Spectroscopy of Electrode Processes by R.G. Compton and A.M. Waller; Mossbauer Spectroscopy by D.A. Scherson. In each case, the authors provide a clear summary of the theory of the method, an account of the experimental technique, usually with helpful practical details, and several examples of the application. They will be particularly useful for an electrochemist who would like to know the capabilities of the technique and how to set it UPIt is interesting to compare the coverage with that of recent technique-oriented books. In the Bockris et al. Treatise, the only overlap in Vols. 8 and 9 is with Raman and ESR spectroscopy, though this covers Ellipsometry, which is scarcely mentioned in the present volume. This is a measure of the rapid advance of spectroelectrochemistry since the Treatise was planned. The more recent volume in the Comprehensive Chemical Kinetics series correspondingly overlaps with IR, Raman, ESR photocurrent spectroscopy and electroreflectance (but only at semiconductors) and it also has a chapter on ellipsometry. In no case is the overlap serious except for the ESR chapters in the Kinetics series and in the present volume, which are by the same authors and inevitably, cover much the same material. Most of the present book can be very strongly recommended for the clarity of the exposition and the helpfulness of the information provided. My few minor criticisms do not detract from this: three chapters mention the use of UHV ex-situ techniques, but none quotes the work of Arthur Hubbard, who was the real pioneer in this work. Although Kolb specifically excluded elhpsometry, he could have usefully mentioned the work of Gottesfeld and MacIntyre on iridium oxide. The discussion ,of the various potentials and the calculation of the conduction band energies for liquids on pp. 58-59 is not at all clear, nor is the reason why eqn. 16 on p. 48 is an improvement over eqn. 10 on p. 46. The book is well produced and copiously referenced, though the index is rather brief. In comparison with the general run of book prices, it is excellent value. R. PARSONS
Southampton
J. Electroanal.
Chem., 214 (1989) 333-337
Elsevier SequoiaS.A., Lausanne - Printed in The Netherlands
Book reviews Spectroelectrochemistry:
Theory and Practice. R.J. Gale (Editor). Plenum Press, New York, 1988, xv + 450 pp., US$85.00.
This valuable book contains seven chapters reviewing aspects of the title subject: X-ray Techniques by J. Robinson; Photoemission Phenomena at Metallic and Semiconducting Electrodes by R.B. Severeyn and R.J. Gale; UV Visible Reflectance Spectroscopy by D.M. Kolb; Infrared Reflectance Spectroscopy by B. Beden and C. Lamy; Surface-Enhanced Raman Scattering by R.L. Birke and J.R. Lombardi; ESR Spectroscopy of Electrode Processes by R.G. Compton and A.M. Waller; Mossbauer Spectroscopy by D.A. Scherson. In each case, the authors provide a clear summary of the theory of the method, an account of the experimental technique, usually with helpful practical details, and several examples of the application. They will be particularly useful for an electrochemist who would like to know the capabilities of the technique and how to set it UPIt is interesting to compare the coverage with that of recent technique-oriented books. In the Bockris et al. Treatise, the only overlap in Vols. 8 and 9 is with Raman and ESR spectroscopy, though this covers Ellipsometry, which is scarcely mentioned in the present volume. This is a measure of the rapid advance of spectroelectrochemistry since the Treatise was planned. The more recent volume in the Comprehensive Chemical Kinetics series correspondingly overlaps with IR, Raman, ESR photocurrent spectroscopy and electroreflectance (but only at semiconductors) and it also has a chapter on ellipsometry. In no case is the overlap serious except for the ESR chapters in the Kinetics series and in the present volume, which are by the same authors and inevitably, cover much the same material. Most of the present book can be very strongly recommended for the clarity of the exposition and the helpfulness of the information provided. My few minor criticisms do not detract from this: three chapters mention the use of UHV ex-situ techniques, but none quotes the work of Arthur Hubbard, who was the real pioneer in this work. Although Kolb specifically excluded elhpsometry, he could have usefully mentioned the work of Gottesfeld and MacIntyre on iridium oxide. The discussion ,of the various potentials and the calculation of the conduction band energies for liquids on pp. 58-59 is not at all clear, nor is the reason why eqn. 16 on p. 48 is an improvement over eqn. 10 on p. 46. The book is well produced and copiously referenced, though the index is rather brief. In comparison with the general run of book prices, it is excellent value. R. PARSONS
Southampton