Spectrographs improve resolution

Spectrographs improve resolution

TOOLS & TECHNIQUES Creating signals at radio frequency Keithley Instruments has incorporated a series of enhanced features in its new Model 2910 radi...

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TOOLS & TECHNIQUES

Creating signals at radio frequency Keithley Instruments has incorporated a series of enhanced features in its new Model 2910 radio frequency (RF) vector signal generator. The Model 2910 V2.0 features a flexible digital modulation option that allows users to create a range of signals used in RF communication products. It also features a power calibration table that improves measurement accuracy by compensating for RF power losses in test fixture cables, correcting for cable losses to an accuracy of ±0.3 dB. A new arbitrary waveform generator (ARB) sequencing feature speeds up waveform switching times to support instant transition times. Contact: www.keithley.com

Spectrographs improve resolution The Shamrock SR-500 and SR-750 spectrographs from Andor Technology offer increased resolution across a range of applications, including Raman and fluorescence spectroscopy. They allow the user to control wavelength and calibration, grating selection, shutter control, and filter selection. The Shamrock SR-500 has an aperture of f/6.5, reciprocal dispersion of 1.7 nm/mm, and a wavelength resolution of 0.05 nm. The SR-750 has an aperture of f/9.8, reciprocal dispersion of 1.1 nm/mm and a wavelength resolution of 0.03 nm. Both offer a mechanical scan range of 0–1200 nm, wavelength accuracy of ±0.2 nm and a focal plane size of

Improved imaging in delicate situations The Magnetic AC Mode III Controller from Agilent Technologies is designed for the imaging of delicate samples in liquid or air in an atomic force microscope. The MAC Mode III provides improved accuracy, and a wide operating frequency range. A high harmonic provides an improvement on the contrast normally obtained with amplitude and phase signals. Topography and surface potential measurements can be collected using a cantilever approach system that is unaffected by scanner drift. The MAC Mode III can be operated with environmental, temperature, and electrochemical control. Contact: www.agilent.com

Improved etch and deposit Alcatel Micro Machining Systems has released the AMS 3200 and the AMS 4200, new deep-reactive ion etching (DRIE) and plasma-enhanced chemical vapor deposition (PECVD) multichamber tools for applications in microelectromechanical systems (MEMS) and semiconductors. The systems can etch Si and other glass-like materials as well as deposit isolation layers of SiO2 and Si3N4. They can be configured for wafer sizes ranging from 100 mm to 200 mm. The modules are equipped with a high density, low pressure, inductively coupled plasma (ICP) source, high vacuum pumping systems, a gas box, and energy rack. Contact: www.adixen.com

28 mm x 14 mm. Contact: www.andor.com

Image acquisition gets an upgrade The CapturePro 2.5 image acquisition software for the JENOPTIK ProgRes® microscope cameras features continuous exposure tracking to monitor and readjust exposure time. Automatic overexposure or underexposure can also be set. An extended fluorescence mode is available for acquisition of multifluorescence micrographs. Images from contrast techniques such as bright-field or differential interference contrast (DIC) micrographs can be superimposed with the fluorescence images. Contact: www.progres-camera.de

Driving actuators over long ranges Affordable microscopes FEI has released the Phenom™ microscope, a system capable of up to 20 000x magnification, 20 times higher than advanced optical microscopes. At one-third the price of a typical scanning electron microscope, the Phenom will be affordable for use in undergraduate research, while providing access to a system that bridges the gap between optical and electron microscopy. Contact: www.fei.com

The E-755 NEXLINE® ultra-high-resolution motion controller from PI (Physik Instrumente) is designed to drive linear motor actuators over long ranges, with picometer resolution. The controller combines high-end 32-bit digital filters and output drivers with low-noise, 24-bit digital to analog converters. It offers closed-loop operation, achieving high linearity within 0.001% over the full travel range. The controller has applications in static and dynamic high-precision positioning of samples. Contact: www.physikinstrumente.com

AUGUST 2007 | VOLUME 2 | NUMBER 4

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