A43 J.E. G R E E N E
Department of Materials Science, The Coordinated Science Laboratory, and The Materials Research Laboratory, 1101 W. Springfield Avenue, University of Illinois, Urbana, 1L 61801, USA Received 17 August 1988; accepted for publication 14 October 1988 The structure and surface morphology of In overlayers on Si(100) surfaces were investigated as a function of substrate temperature and surface coverage using low-energy and reflection high-energy electron diffraction as well as Auger electron spectroscopy. Desorption kinetics of adsorbed In was studied with modulated-beam desorption and temperature-programmed desorption spectroscopies. Indium was found to grow on Si(100) according to a Stranski-Krastanov mechanism with the initial formation of several two-dimensional phases preceding the nucleation and growth of three-dimensional In islands. Binding energies and frequency factors were extracted from the desorption measurements using a model based on first-order desorption from several interdependent surface phases. First-order and zeroth-order kinetics were observed for the total desorbing flux from coexisting surface phases.
Surface Science 209 (1989) 335-344 North-Holland, Amsterdam SURFACE
STRUCTURES
T. I D E , T. N I S H I M O R I
335 OF Si(100)-Al PHASES
a n d T. I C H I N O K A W A
Department of Applied Physics, Waseda University, 3-4-1, Ohkubo, Shinjuku-ku, Tokyo 160, Japan Received 1 August 1988; accepted for publication 27 October 1988 The surface structures of Si(100)-AI phases of coverages less than one monolayer were studied by low energy electron diffraction (LEED) and Auger electron spectroscopy (AES). 2 x 2, 2 × 3, 4 x 5, 1 x 7 and c(4 x 12) structures appeared depending on the coverage and substrate temperature during deposition. On the basis of the similarity of their LEED patterns in Si(100)-column-IIl systems (A1, Ga and In) and the fine structures of the surface states measured by AES in the present experiment, the structure models of Si(100)2 x 2-A1 and 2 x 3-AI are presented.
Surface Science 209 (1989) 345-363 North-Holland, Amsterdam GROWTH AND ATOMIC ON W(llO) AND W(100) P a u l J. B E R L O W I T Z
STRUCTURE
345 OF CHROMIUM
* a n d N e a l D. S H I N N
OVERLAYERS
**
Sandia National Laboratories, Division 1134, Albuquerque, N M 87185, USA Received 29 June 1988; accepted for publication 3 October 1988 The growth, structure and thermal stability of chromium overlayers vapor-deposited onto W(ll0) and W(100) substrates have been studied using Auger electron spectroscopy, temperature programmed desorption, work function measurements and low energy electron diffraction. Layer-by-layer growth is observed on both substrates in the 120-400 K temperature range, despite a 9% Cr : W bulk lattice mismatch. On W(ll0), a pseudomorphic (1 x 1) Cr monolayer (ML) forms