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319. Scattering of electrons near a laser focus
Classified abstracts 311-325 33 311. Automatic measurement and evaluation of spectra of a source of multiply charged ions. (USSR) A method for automatization of the processes of measurement and evaluation of basic parameters (distribution of mass and charge of ions and their relative intensities) of a source of multiply charged ions is presented for on-line work with a small computer. I Lang et al, Prib Tekh Eksper, 3, 1973, 92-96 (in Russian). 33 312. Three-electrode electron gun with earthed anode and ultra-high frequency modulation of beam by a grid. (USSR) Construction of a three-electrode electron gun is described. The gun generates 2 A current clusters with phase duration of 180° at frequency of 2.85 to 2.87 GHz. A n oxide cathode is used at a pressure of 10 -7 to 10 -e tort in the system. A S Bogomolov and E M Zakutov, Prib Tekh Eksper, 3, 1973, 23-24
(in Russian). 33 313. Analyzer of energy and phase distributions of electrons in a beam. (USSR) Construction and operation of an analyzer of phase and energy distributions of electrons in beams are described. The deflecting system consists of two cylindrical resonators with the Eolo working mode of oscillations. A n example of analysis of a pulsed 50 keV electron beam is presented. A S Bogomolov et al, Prib Tekh Eksper, 3, 1973, 27-30 (in Russian). 33 314. Utilization of nonlinear phosphors for alignment of the beam of an electron accelerator. (USSR) Screens with ZnS.CdS--Ag, Ni phosphors are described, in which the brightness of luminescence is proportional to the third power of the ionization density. The screens enable one to obtain a contrast image of an electron beam. N V Mitrofanova et ai, Prib Tekh Eksper, 3, 1973, 34-36 (in Russian). 33 315. Electrostatic prism beta-spectrometer with axially symmetric lenses. (USSR) A n electrostatic prism beta-spectrometer with axially symmetric lenses and a resolution of 0.08 ~o is described, which is used for the investigation of radiation electron emission of radioactive substances. Working pressure in the spectrometer chamber is 10 - s torr. B V Bobykin et al, Prib Tekh Eksper, 3, 1973, 38-41 (in Russian). 33 316. The role of depleted zones in neutron irradiated metals. (Germany) Neutron irradiation damage studies in platinum have been carried out using a field ion microscope. It is found that depleted zones created at reactor temperatures are of numerous sizes and that the larger zones grow at the expense of the smaller zones when the samples are annealed at increasing temperatures. O T lnal and L E Murr, Phys Stat Sol (a), 17 (2), 1973, K93-K96
(in German). 33 317. Investigation of distribution of intensity of molecular beam emitted from a conical ring source. (USSR) The distribution of intensity of molecular beam emitted from effusion source is calculated in dependence on the radius of detector and geometrical parameters of the system source-detector. T S Tsulaya, Zh Tekh Fiz, 43 (6), 1973, 1290-1296 (in Russian). 33 318. Identification of some peaks in spectrum of characteristic losses of electron energy in tungsten. (USSR) Using a spectrometer with a high resolution of 0.2~o, the spectrum of characteristic losses of electron energy in tungsten is measured in a vacuum of 2 × 10 - 6 torr. The peaks due to interband transitions, plasma losses of surface and bulk types and plasma oscillations in oxide are identified. E F Chaykovskiy et ai, Fiz Tverd Tela, 15 (6), 1973, 1947-1948 (in
Russian). 33 319. Scattering of electrons near a laser focus. (USSR) Scattering of 7 to 15 eV electrons passing near a focus of a ruby laser is investigated in a vacuum chamber. The experimental data are corn-
pared with the results of calculations performed by the averaging method. V M Chernenko, Zh Eskper Teor Fiz, 64 (6), 1973, 1975-1985 (in
Russian). 33 320. Electron-microscopical investigation of the process of formation of holes in thin resistive films under the action of coherent radiation. (USSR) Using an electron microscope, structural changes due to power coherent ultraviolet radiation in resistive films of Cr.SiO and Cr.Si.Fe.W, prepared by thermal evaporation in a vacuum, are investigated. I G Stoyanova et al, Izv A N SSSR Ser Fiz, 36 (9), 1972, 1937-1944
(in Russian). 33 321. Techniques for treatment of porous materials for investigation in scanning electron microscope. (USSR) Some techniques of drying, deposition of conducting coating and investigation of deep pores in porous materials for scanning electron microscope examinations are described. Gold film deposited in a vacuum is used as a conducting coating on surface of dielectrics. Extraction magnetic field is recommended for observation of deep pores. R A Bochko et al, Izv A N SSSR Ser Fiz, 36 (9), 1972, 2000--2004 (in
Russian). 33 322. Ultrahigh vacuum pumping systems of emission electron microscopes. (USSR) Vacuum requirements of emission electron microscopy are considered. Oil-frec vacuum system of a metallic electrostatic electron emission microscope is described. Metallic gaskets are used and all materials can be heated to high temperatures. The pressure of 10 - s to 10 -7 torr can be easily reached.: To further improve the limiting pressure in the microscope chamber, a liquid-nitrogen cooled titanium sublimation pump was used. At sample changing the chamber is filled with dry nitrogen. After one-hour pumping the pressure 1 × 10 -7 tort is reached. After 4 h baking at 250°C and subsequent 6 h pumping the pressure 8.5 × I0 -9 torr was reached. Switching-on the sublimation pump resulted in lowering the pressure to 1 × 10 -9 torr. Residual gas composition was analyzed with the aid of an omegatron. Hydrogen formed the main component. The ambient allows the maintenance of the examined oxide cathode in a state of high activity for a long time of observation in the microscope. A A Isaev, Izv A N S S S R Se# Fiz, 36 (9), 1972, 1957-1960 (in Russian). 33 323. Utilization of the method of vacuum coating for investigation of defect structure and processes of growth of thin crystals. (USSR) A method of vacuum coating is used for investigation of defect structure and processes of growth of thin crystals. Both coating partides and investigated thin crystal are observed simultaneously in an electron microscope. Gold condensation in a vacuum was used for coating. V M Kosevich and A A Sokol, lay A N SSSR Ser Fiz, 36 (9), 1972, 1978-1982 (in Russian). 33 324. Ion gun and ultraviolet Source for emission microscope. (USSR) A high-frequency gas-discharge ion gun for electron emission microscope operating in the secondary ion-electron emission mode has been developed. A mercury lamp is used as an intense ultraviolet source for the photoemission mode of the emission electron microscope. Examples of imaging 0f surfaces of Cu, Ni and oxide cathode by secondary electrons and l~hotoelectrons are presented. N B Kagan et al, Izv A N SSSR Ser Fiz, 36 (9) 1972, 1932-1936 (in
Russian). 33 325. Utilization of emission electron microscope for investigation of dynamic processes in thyrlstors. (USSR) Using an emission electron microscope in the secondary ion-electron emission mode, dynamic processes in thyristors are investigated. The experimental arrangement is: described. Quantitative measurements of the potential relief of p-~n-p-n structure during the switching process have been made. V A Zlobin et al, lzv A N S S S R Ser Fiz, 36 (9), 1972, 1924-1928 (in
Russian). 145
(in Russian). 33 313. Analyzer of energy and phase distributions of electrons in a beam. (USSR) Construction and operation of an analyzer of phase and energy distributions of electrons in beams are described. The deflecting system consists of two cylindrical resonators with the Eolo working mode of oscillations. A n example of analysis of a pulsed 50 keV electron beam is presented. A S Bogomolov et al, Prib Tekh Eksper, 3, 1973, 27-30 (in Russian). 33 314. Utilization of nonlinear phosphors for alignment of the beam of an electron accelerator. (USSR) Screens with ZnS.CdS--Ag, Ni phosphors are described, in which the brightness of luminescence is proportional to the third power of the ionization density. The screens enable one to obtain a contrast image of an electron beam. N V Mitrofanova et ai, Prib Tekh Eksper, 3, 1973, 34-36 (in Russian). 33 315. Electrostatic prism beta-spectrometer with axially symmetric lenses. (USSR) A n electrostatic prism beta-spectrometer with axially symmetric lenses and a resolution of 0.08 ~o is described, which is used for the investigation of radiation electron emission of radioactive substances. Working pressure in the spectrometer chamber is 10 - s torr. B V Bobykin et al, Prib Tekh Eksper, 3, 1973, 38-41 (in Russian). 33 316. The role of depleted zones in neutron irradiated metals. (Germany) Neutron irradiation damage studies in platinum have been carried out using a field ion microscope. It is found that depleted zones created at reactor temperatures are of numerous sizes and that the larger zones grow at the expense of the smaller zones when the samples are annealed at increasing temperatures. O T lnal and L E Murr, Phys Stat Sol (a), 17 (2), 1973, K93-K96
(in German). 33 317. Investigation of distribution of intensity of molecular beam emitted from a conical ring source. (USSR) The distribution of intensity of molecular beam emitted from effusion source is calculated in dependence on the radius of detector and geometrical parameters of the system source-detector. T S Tsulaya, Zh Tekh Fiz, 43 (6), 1973, 1290-1296 (in Russian). 33 318. Identification of some peaks in spectrum of characteristic losses of electron energy in tungsten. (USSR) Using a spectrometer with a high resolution of 0.2~o, the spectrum of characteristic losses of electron energy in tungsten is measured in a vacuum of 2 × 10 - 6 torr. The peaks due to interband transitions, plasma losses of surface and bulk types and plasma oscillations in oxide are identified. E F Chaykovskiy et ai, Fiz Tverd Tela, 15 (6), 1973, 1947-1948 (in
Russian). 33 319. Scattering of electrons near a laser focus. (USSR) Scattering of 7 to 15 eV electrons passing near a focus of a ruby laser is investigated in a vacuum chamber. The experimental data are corn-
pared with the results of calculations performed by the averaging method. V M Chernenko, Zh Eskper Teor Fiz, 64 (6), 1973, 1975-1985 (in
Russian). 33 320. Electron-microscopical investigation of the process of formation of holes in thin resistive films under the action of coherent radiation. (USSR) Using an electron microscope, structural changes due to power coherent ultraviolet radiation in resistive films of Cr.SiO and Cr.Si.Fe.W, prepared by thermal evaporation in a vacuum, are investigated. I G Stoyanova et al, Izv A N SSSR Ser Fiz, 36 (9), 1972, 1937-1944
(in Russian). 33 321. Techniques for treatment of porous materials for investigation in scanning electron microscope. (USSR) Some techniques of drying, deposition of conducting coating and investigation of deep pores in porous materials for scanning electron microscope examinations are described. Gold film deposited in a vacuum is used as a conducting coating on surface of dielectrics. Extraction magnetic field is recommended for observation of deep pores. R A Bochko et al, Izv A N SSSR Ser Fiz, 36 (9), 1972, 2000--2004 (in
Russian). 33 322. Ultrahigh vacuum pumping systems of emission electron microscopes. (USSR) Vacuum requirements of emission electron microscopy are considered. Oil-frec vacuum system of a metallic electrostatic electron emission microscope is described. Metallic gaskets are used and all materials can be heated to high temperatures. The pressure of 10 - s to 10 -7 torr can be easily reached.: To further improve the limiting pressure in the microscope chamber, a liquid-nitrogen cooled titanium sublimation pump was used. At sample changing the chamber is filled with dry nitrogen. After one-hour pumping the pressure 1 × 10 -7 tort is reached. After 4 h baking at 250°C and subsequent 6 h pumping the pressure 8.5 × I0 -9 torr was reached. Switching-on the sublimation pump resulted in lowering the pressure to 1 × 10 -9 torr. Residual gas composition was analyzed with the aid of an omegatron. Hydrogen formed the main component. The ambient allows the maintenance of the examined oxide cathode in a state of high activity for a long time of observation in the microscope. A A Isaev, Izv A N S S S R Se# Fiz, 36 (9), 1972, 1957-1960 (in Russian). 33 323. Utilization of the method of vacuum coating for investigation of defect structure and processes of growth of thin crystals. (USSR) A method of vacuum coating is used for investigation of defect structure and processes of growth of thin crystals. Both coating partides and investigated thin crystal are observed simultaneously in an electron microscope. Gold condensation in a vacuum was used for coating. V M Kosevich and A A Sokol, lay A N SSSR Ser Fiz, 36 (9), 1972, 1978-1982 (in Russian). 33 324. Ion gun and ultraviolet Source for emission microscope. (USSR) A high-frequency gas-discharge ion gun for electron emission microscope operating in the secondary ion-electron emission mode has been developed. A mercury lamp is used as an intense ultraviolet source for the photoemission mode of the emission electron microscope. Examples of imaging 0f surfaces of Cu, Ni and oxide cathode by secondary electrons and l~hotoelectrons are presented. N B Kagan et al, Izv A N SSSR Ser Fiz, 36 (9) 1972, 1932-1936 (in
Russian). 33 325. Utilization of emission electron microscope for investigation of dynamic processes in thyrlstors. (USSR) Using an emission electron microscope in the secondary ion-electron emission mode, dynamic processes in thyristors are investigated. The experimental arrangement is: described. Quantitative measurements of the potential relief of p-~n-p-n structure during the switching process have been made. V A Zlobin et al, lzv A N S S S R Ser Fiz, 36 (9), 1972, 1924-1928 (in
Russian). 145