PhysicaC 162-164(1989) 1297-1298 No~h-Hogand
A CONVERSION ELECTRON MOSSBAUER SPECTROSCOPY-STUDY OF C-AXIS ORIENTED 57Fe DOPED THIN FILMS OF YBa2Cu307 J.DENGLER I, G.RITTER I, G.SADtANN-ISCHENK01 I.S.SZUCS 3
B.ROAS 1,2, L.SCHULTZ 2, B.MOLNAR 3, D.L.NAGY 3,
1 Physikalisches Institut der Universit~t Erlangen-NUrnberg, D-8520 Erlangen, FI~ 2 Siemens AG, Research Laboratories, D-8520 Erlangen, FR~ 3 Central Research Institute for Physics, H-1525 Budapest, P.O.Box 49, Hungary First 57Fe MOssbauer spectra of fully c-axis oriented epitaxial thin films of YBa2(Cu0.9757Fe0.03)307 , recorded by CEMS (Conversion Electron mSssbauer Spectroscopy), are reported. Spectra taken at different angles between the normal of the film (i.e. the c-axis) and the g~mm~ ray direction show that for two of the three observed quadrupole doublets the main component of the EFG (electric field gradient) lies in the a-b-plane, for the third doublet it is parallel to the c-axis. Up to now, powders I
strongly
of
57Fe:YBa2Cu307
perconductors oriented
uniaxial
have
samples
been for
troscopy.
Here,
fully uniaxial
film
a
(c-axis
face,
a-
high-T c used
we present
and
b-axes
as
spec-
first
spec-
oriented
thin
to the
sur-
perpendicular
terer counter.
su-
only
M~ssbauer
tra
of
aligned
parallel
to
[
"
" °
"
I
the
surface and randomly distributed). The
thin
prepared
film
from
a
on
<100>
SrTiO 3 was
stoichiometric
pellet
of YBa2(CUl_x57Fex)307_y by excimer laser evaporation 2 . X-ray diffraction and inductive
Tc
measurements
proved
the
film to be fully
c-oriented
conducting with width: 3.5 K).
Tc=78 K
(transition
MSssbauer
spectroscopy
As is
absorption not
utilizable
(substrate CEMS.
for
thickness
CEMS
conversion
using
and
electrons
is
very
for such films, depth sensitivity
as is
ness
(-300 nm).
of
urements
the were
film done
in a He/CH4-flow
that
7.3 keV
film
K-shell suitable
in YBa2Cu307 the about the thick-
at room
The
meas-
temperature
proportional
.
.
.
,
-2.0
.0
VELOCITY
FIOURE i
210 (~/s)
FIGURE 2
super-
-1 nun), we applied
the
.
-2.0 .0 2.0 VELOCITY (,~/s)
backscat-
0921-4534/89/$03.50 © Elsevier Science Publishers B.V. (North-Holland)
FIG.l, Spectra of YBa2(Cu 0 9957Fe0.01)307 powder: a) CEMS b) absorption. FIG.2: Spectra of YBa2(Cu n 9757Fen 0q)307 a) CEMS of the thin f i ~ at ~ . ~ "; b) powder absorption spectrum of the pellet used for film preparation. A comparison tion
spectra
between CEMS and absorpof
57Fe:YBa2Cu307
powder
did not show any clear differences Fig.l), al. 3
as
also
reported
by
Nasu
(see et
Figure 2 shows a CEMS spectrum of the film at 54.7 e between gamzaa ray direc-
J. Dengler et al. / A conversion electron M6ssbauer spectroscopy-study
1298 and
:ion
c-axis
sity ratios 1)
and
of
("magic left
a
powder
(intensity
ratios
lines
are
usual 4
1).
of
m~/s),
8
(Eq=0.55
mm/s),
but
to show
of
C
is
the
doublets
A
ram/s)
C
and
differ
AzB:C=14.1%:43.9%:42.0%;
intensity
right
intensities
A:BzC=-22.9%z64.9%:12.2%).
are
spectrum
spectra
(Eq=l.01
inten-
lines
left
quadrupole
(Eq=l.87 (CEMS:
to right absorption
Both
three
angle",
powder:
Note that
higher
in
the
the film
and that for both spectra AsB~I:3. Figure
3
dependence ratio 0 o
of
shows t h e of
quality
of ~
angular
-
There
between
Results
and
the
for
Vzz
v,z>O
for
that
is no d e t e c t a b l e
-
The film is homogenous
To c o n f i r m
A rough data analysis
ments top
close to the surface
layer
on the
and
the ganm~
the
random
b-axes,
S
and
axes
(about
1%
relative
ray d i r e c t i o n the
also
of
rethe
0 of
shows
that a
surface
of about
of
sample
the
3 nm
thick-
I
I
I
I
I
I
to
random
allows
depth
resonance
absorption
the
scattering.
By
to
choosing
60
90
(°)
the
c-axis.
FIGURE 3 Angular dependence of the left/right intensity ratio I_/I+ of doublet A. Solid curve-" Vz~.Ic-axis a n d ~ 0, d a s h e d curve: Vz~Ic-a~s and ~ =i. The curves are c a l c u I a t e d for a random d i s t r i b u tion of a- and b-axes in the plane.
orientaselective
emitted lose
the more)
matter
30 ANGLE
were of the
30 o b e t w e e n
and the
The electrons
(the longer the way, by
of m e a s u r e -
i
C
measurements
direction
through
the
I
of
orientation
azimuth angles
at an angle
measurements.
way
within
H
tion is confirmed.
ter
to
+ 2
to the crystal axes.
differences,
CEMS
difference
H
As the spectra did not show any significant
thin
is polycrystalline.
the
Vzz
principal
made at d i f f e r e n t ray
some
the
limit.
I
film plane
good,
C
doublets
the
EFG are parallel
ga-.,a
for
gas
asymmetry
v,.la-axis or V=.Ib-axis o R o.15 o.15
results
a-
very
statements
Although used
of the EFG for A, B and C: B
the
not
the
the bulk and the layer close
detection
the high
film.
is
of
for
the subs:rate.
and thus confirms
Vzz
ratio
be
layers
film can be made#
ness)
v,,Ic-axis
The
counter
depth
obtained
A
quire
flow
can
resolution
qualitative
-
intensity
3:1
selected.
energy
at
the
The
spectroscopy the
complete
be
component
parameter
A.
certain
at
only
orientation,
measured
left/right
doublet
can
main
the
the e n e r g y spectrum,
the
af-
energy on their surface
windows
in
1 . P . B o o l c h a n d et al., Phys. Rev. B 38 (1988) 11313; R.A.Brand et al., Physica C 156 (1988) 539; P . C h a u d o u e t et al., Physica C 153-155 (1988) 1539. 2.B.Roas et al., Appl. Phys. Let:. 53 (1988) 1557. 3.S.Nasu et al., preprint. 4 . L . B o t t y & n et al., Phys. Rev. B 38 (1988) 11373.