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A method of determining the thickness of silver deposited on glass
VACUUM Classified Abstracts - .-~---.
III -- Vacuum Processing Techniques -
--__
30 -
EVAPORATION
-
Abstract No. and References
III
30
Plating by Vacuum Evaporation
89/W
United Kingdom. A survey is made of all aspects of metal deposition by the vacuum evaporation process. The basic principles of the technique are described, some technical data is given, e.g. the evaporation rates of various metals, and processing requirements of interest to the industrialist are discussed. Finally, practical applications are reviewed :-the production of astronomical mirrors, television tubes, sealed-beam headlights, quartz crystals for high-frequency apparatus, capacitors and Christmas decorations. Sommaare : On examine toutes les applications dans le vide.
industrielles des couches metalliques prep&es
par Bvaporaticm
.
A Hardness Tester for Thin Films
Germany. An instrument is described which is designed for testing the hardness of thin films in particular, reflection-reducing films deposited on lenses. The coated side of the lens is exposed to the rubbing action of a plunger moving repeatedly across the lens face. The pressure exercised by the plunger can be varied. If the coating shows no defects after 20 rubbing actions of the plunger at a pressure of 2 kg/ems, the lens is passed as satisfactory. As the plunger is driven by an electrical motor, the operation of the instrument is fully automatic and facilitates the testing of the films in accordance with reproducible standards. Sommaire : Description depots sur lentilles.
d’un instrument
mecanique. pour l’essai de durete de couches
minces, par example
N’“? Fob K&w: Tech. I950
Sl/III
United States. The method described here has originally been proposed by Gardner and Case. A small crystal of iodine placed on or near the silver layer to be measured will give off iodine vapour which reacts with the silver and forms silver-iodide. Eventually a transparent spot will appear on the silver layer, around which the silver is only partially converted into silver-iodide. If light is directed to this area it will be reflected in the form of coloured rings surrounding the transparent spot. The actual number of rings showing is a function of the thickness of the film. A table is added to this note giving the actual values of film thickness for various numbers of rings.
: Description d’une methode pour la determination de l’epaisseur de couches d’argent sur du verre.
An Interferometric
90/111
4r Ma%
A Method of Determining the Thickness of Silver Deposited on Glass
Sommaire
yti$b& Mich. Llo a 22, 14.10.1B50 87-92
Method for Accurate Thickness Measurements of Thin Evaporated Films
Note by L. 5. Nelson J. Chews. E&w. 28, Feb. 1951 103
92/m
United States. The method described is based on the use of the Fabry-Perrot interferometer. This instrument possesses a calibrated screw facilitating direct readings and an adjustment mechanism which ensures proper positioning of the sample. A sodium lamp is employed as the light source with its characteristic D-lines serving as the standard of length. The separation of the two sets of fringes produced by the sodium light is approximately 500 wavelengths. When the separation is decreased by the amount Mx or increased by the amount My, the thickness T of the deposit can be ascertained from :
T=
W+My) 4K
where h = (hi + X2)/2 and K = (A,h,)/2(A,-A,).
Full details of the method and its limitations
are given.
Sommaire : Proposition d’une methode de mesure de l’epaisseur de couches minces basee sur l’utilisation interferometre Fabry-Perrot.
A Graphical Method of Determining See Abstract
the Optical Constants and Thickness of Thin Metal Layers
of Thin Films No.
94AII
: 71/I
Low-Reflectance
Coatings and The Sensitivity Curve of the Eye
See Abstract
: 72/I
July,
93/III
No. : 69/I
Achromatizing See Abstract
Simultaneously
d’un
Article by L. G. Schulz J. Opt. Sot. Amu. 4%6$&po
No.
1951 Vol.
Vacuum I No. 3
95/III
231
III -- Vacuum Processing Techniques -
--__
30 -
EVAPORATION
-
Abstract No. and References
III
30
Plating by Vacuum Evaporation
89/W
United Kingdom. A survey is made of all aspects of metal deposition by the vacuum evaporation process. The basic principles of the technique are described, some technical data is given, e.g. the evaporation rates of various metals, and processing requirements of interest to the industrialist are discussed. Finally, practical applications are reviewed :-the production of astronomical mirrors, television tubes, sealed-beam headlights, quartz crystals for high-frequency apparatus, capacitors and Christmas decorations. Sommaare : On examine toutes les applications dans le vide.
industrielles des couches metalliques prep&es
par Bvaporaticm
.
A Hardness Tester for Thin Films
Germany. An instrument is described which is designed for testing the hardness of thin films in particular, reflection-reducing films deposited on lenses. The coated side of the lens is exposed to the rubbing action of a plunger moving repeatedly across the lens face. The pressure exercised by the plunger can be varied. If the coating shows no defects after 20 rubbing actions of the plunger at a pressure of 2 kg/ems, the lens is passed as satisfactory. As the plunger is driven by an electrical motor, the operation of the instrument is fully automatic and facilitates the testing of the films in accordance with reproducible standards. Sommaire : Description depots sur lentilles.
d’un instrument
mecanique. pour l’essai de durete de couches
minces, par example
N’“? Fob K&w: Tech. I950
Sl/III
United States. The method described here has originally been proposed by Gardner and Case. A small crystal of iodine placed on or near the silver layer to be measured will give off iodine vapour which reacts with the silver and forms silver-iodide. Eventually a transparent spot will appear on the silver layer, around which the silver is only partially converted into silver-iodide. If light is directed to this area it will be reflected in the form of coloured rings surrounding the transparent spot. The actual number of rings showing is a function of the thickness of the film. A table is added to this note giving the actual values of film thickness for various numbers of rings.
: Description d’une methode pour la determination de l’epaisseur de couches d’argent sur du verre.
An Interferometric
90/111
4r Ma%
A Method of Determining the Thickness of Silver Deposited on Glass
Sommaire
yti$b& Mich. Llo a 22, 14.10.1B50 87-92
Method for Accurate Thickness Measurements of Thin Evaporated Films
Note by L. 5. Nelson J. Chews. E&w. 28, Feb. 1951 103
92/m
United States. The method described is based on the use of the Fabry-Perrot interferometer. This instrument possesses a calibrated screw facilitating direct readings and an adjustment mechanism which ensures proper positioning of the sample. A sodium lamp is employed as the light source with its characteristic D-lines serving as the standard of length. The separation of the two sets of fringes produced by the sodium light is approximately 500 wavelengths. When the separation is decreased by the amount Mx or increased by the amount My, the thickness T of the deposit can be ascertained from :
T=
W+My) 4K
where h = (hi + X2)/2 and K = (A,h,)/2(A,-A,).
Full details of the method and its limitations
are given.
Sommaire : Proposition d’une methode de mesure de l’epaisseur de couches minces basee sur l’utilisation interferometre Fabry-Perrot.
A Graphical Method of Determining See Abstract
the Optical Constants and Thickness of Thin Metal Layers
of Thin Films No.
94AII
: 71/I
Low-Reflectance
Coatings and The Sensitivity Curve of the Eye
See Abstract
: 72/I
July,
93/III
No. : 69/I
Achromatizing See Abstract
Simultaneously
d’un
Article by L. G. Schulz J. Opt. Sot. Amu. 4%6$&po
No.
1951 Vol.
Vacuum I No. 3
95/III
231