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An empirical Bayes approach for the Poisson life distribution
Microelectronics and Reliability. Vol. 12, pp. 405-418. Pergamon Press 1973. Printed in Great Britain
WORLD ABSTRACTS ON MICROELECTRONICS AND RELIABILITY THE abstracts given below are given in reasonable detail where necessary so that an appreciation can be made of the coverage of the article. They are probably the most comprehensive detailed abstracts published in these two fields and, in general, are all of articles published within the last 12 months. They are classified into the following sections.
Subjects: 1. 2. 3. 4. 5. 6. 7. 8.
Reliability--General. Reliability of Components, Tubes, Transistors and 1Cs. Circuit and Systems Reliability, Maintenance and Redundancy. Microelectronics--General. Microelectronics Design and Construction. Microelectronics--Components, Systems and Equipments. Semiconductor Integrated Circuits, Devices and Materials. Thick- and Thin-Film Components, Circuits and Materials.
Abstracts marked * are acknowledged from R and D Abstracts, published by TIL Report Centre, Ministry of Technology, Orpington, Kent BR5 3RF.
1. RELIABILITY--GENERAL Minimizing the cost of reliability assurance. R. T. LOVELOCK. Electron. Comp., June (1973), p. 555. This article discusses some of the methods of cutting the costs of reliability assurance in relation to the introduction of the BS 9000 System. Methodology for value engineering. 1. DLUGATCH. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 20. This paper attempts to provide a methodology for selecting the product to which to apply Value Engineering (VE). It briefly summarizes existing VE methodology and points up the deficiencies. The technique is a sensitivity analysis of diagrams of networks which indicate the cost interdependencies of the product. By determining the areas with the highest cost reduction potential, VE efforts can be concentrated on these, Thus, VE can be made more cost-effective. Enterprise liability--let the vendor prepare. I. BIRNBAUM. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 40. This paper shows how Product Liability common law has developed over the decades. The kinds of defects with which one must deal are classified into manufacturing, design, marketing and puffing. They are analyzed with respect to their product liability implications. No-fault enterprise liability is described and analyzed. Product liability--is no-fault the answer. J. KELNER. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 45, Fault product-liability is the cornerstone of a responsible industry. It provides the moral and economic justification for safe products. No-fault product liability rewards the just and unjust alike, and provides no direct incentive for a manufacturer to make the safest product he can.
Product liability and consumer risk taking--economic tradeOtiS. J. PEARCE. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 49. The following 4 propositions are discussed. (1) Since every action by a producer relevant to whether the use of his product is attended by injuries has some cost and benefit consequences, a producer has numerous safetyrelated options available to him. (2) The degree of safety in the use of a product is an element of product quality. (3) If one focuses on the causes for some inevitable product safety costs, one may be able to anticipate and reduce the total public costs as well as private costs. (4) Liability for products is a kind of insurance device. An empirical Bayes approach for the Poisson life distribution. G. C. CANAVOS. IEEE Trans. Reliab. R-22, No. 2, June (1973), p. 91. A smooth empirical Bayes estimator is derived for the intensity parameter (hazard rate) in the Poisson distribution as used in life testing. The reliability function is also estimated either by using the empirical Bayes estimate of the parameter, or by obtaining the expectation of the reliability function. The behavior of the empirical Bayes procedure is studied through Monte Carlo simulation in which estimates of mean-squared errors of the empirical Bayes estimators are compared with those of conventional estimators such as minimum variance unbiased or maximum likelihood. Results indicate a significant reduction in meansquared error of the empirical Bayes estimators over the conventional variety. A consistent shape parameter estimator for the Weibull distribution. G. ARTHUR MIHRAM. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January, p. 1. In this paper is presented a new estimator for the shape parameter of the Weibull distribution. The estimator,
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WORLD ABSTRACTS ON MICROELECTRONICS AND RELIABILITY THE abstracts given below are given in reasonable detail where necessary so that an appreciation can be made of the coverage of the article. They are probably the most comprehensive detailed abstracts published in these two fields and, in general, are all of articles published within the last 12 months. They are classified into the following sections.
Subjects: 1. 2. 3. 4. 5. 6. 7. 8.
Reliability--General. Reliability of Components, Tubes, Transistors and 1Cs. Circuit and Systems Reliability, Maintenance and Redundancy. Microelectronics--General. Microelectronics Design and Construction. Microelectronics--Components, Systems and Equipments. Semiconductor Integrated Circuits, Devices and Materials. Thick- and Thin-Film Components, Circuits and Materials.
Abstracts marked * are acknowledged from R and D Abstracts, published by TIL Report Centre, Ministry of Technology, Orpington, Kent BR5 3RF.
1. RELIABILITY--GENERAL Minimizing the cost of reliability assurance. R. T. LOVELOCK. Electron. Comp., June (1973), p. 555. This article discusses some of the methods of cutting the costs of reliability assurance in relation to the introduction of the BS 9000 System. Methodology for value engineering. 1. DLUGATCH. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 20. This paper attempts to provide a methodology for selecting the product to which to apply Value Engineering (VE). It briefly summarizes existing VE methodology and points up the deficiencies. The technique is a sensitivity analysis of diagrams of networks which indicate the cost interdependencies of the product. By determining the areas with the highest cost reduction potential, VE efforts can be concentrated on these, Thus, VE can be made more cost-effective. Enterprise liability--let the vendor prepare. I. BIRNBAUM. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 40. This paper shows how Product Liability common law has developed over the decades. The kinds of defects with which one must deal are classified into manufacturing, design, marketing and puffing. They are analyzed with respect to their product liability implications. No-fault enterprise liability is described and analyzed. Product liability--is no-fault the answer. J. KELNER. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 45, Fault product-liability is the cornerstone of a responsible industry. It provides the moral and economic justification for safe products. No-fault product liability rewards the just and unjust alike, and provides no direct incentive for a manufacturer to make the safest product he can.
Product liability and consumer risk taking--economic tradeOtiS. J. PEARCE. IEEE Trans. Reliab. R-22, No. 1, April (1973), p. 49. The following 4 propositions are discussed. (1) Since every action by a producer relevant to whether the use of his product is attended by injuries has some cost and benefit consequences, a producer has numerous safetyrelated options available to him. (2) The degree of safety in the use of a product is an element of product quality. (3) If one focuses on the causes for some inevitable product safety costs, one may be able to anticipate and reduce the total public costs as well as private costs. (4) Liability for products is a kind of insurance device. An empirical Bayes approach for the Poisson life distribution. G. C. CANAVOS. IEEE Trans. Reliab. R-22, No. 2, June (1973), p. 91. A smooth empirical Bayes estimator is derived for the intensity parameter (hazard rate) in the Poisson distribution as used in life testing. The reliability function is also estimated either by using the empirical Bayes estimate of the parameter, or by obtaining the expectation of the reliability function. The behavior of the empirical Bayes procedure is studied through Monte Carlo simulation in which estimates of mean-squared errors of the empirical Bayes estimators are compared with those of conventional estimators such as minimum variance unbiased or maximum likelihood. Results indicate a significant reduction in meansquared error of the empirical Bayes estimators over the conventional variety. A consistent shape parameter estimator for the Weibull distribution. G. ARTHUR MIHRAM. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January, p. 1. In this paper is presented a new estimator for the shape parameter of the Weibull distribution. The estimator,
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