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Atomic spectroscopy
Spectrochimica Acta, Vol, 45B, Nos 1/2, pp. i-ii , 1990
0584-8547/90 $3.00 + 0,00 Pergamon Press pie
Printed in Great Britain
NEW PATENTS This Section contains abstracts and, where appropriate, illustrations of recently issued United States patents and published patent applications filed from over 30 countries under the Patent Cooperation Treaty. This information was obtained from recent additions to the Pergamon PATSEARCH~ online database in accordance with interest profiles developed by the Editors. Further information about Pergamon PATSEARCH® can be obtained from Pergamon Orbit InfoLine Inc., 8000 Westpark Drive, McLean, Virginia 22102 U.S.A. Copies of complete patents announced in this Section are available from Pergamon Orbit InfoLine Inc. for $8 per copy. Payment with order is required. Orders outside North America add $2 for air postage. Order by patent number for Pergamon Orbit InfoLine only.
4806489 MATRIX MODIFIER AND METHOD FOR MODIFYING A MATRIX TO IMPROVE ANALYSIS OF METAL CONSTITUENTS DURING GRAPHITE FURNACE ATOMIC ABSOR~ION SPECTROSCOPY Lucinda M Beach assigned to Varian Associates A matrix modifier of finely-divided metallic palladium dispersed to contact a metal constituent to improve analysis of the constituent during graphite furnace atomic absorption spectroscopy. The palladium interacts with a variety of metals in a sample to increase the vaporization temperatures of the metals. One way of contacting palladium with the metal analyte is to introduce it as a salt in solution with the sample into the graphite furnace along with a surfactant. A finely-divided metallic palladium having high surface area is produced in the furnace by introduction of hydrogen gas, which acts as a reducing agent, to reduce and maintain palladium in its metallic form at an early point in the temperature program, prior to evaporation of the surfactant.
4812040 HOLLOW
CATHODE PLUME
PLASMA
R Kenneth Marcus, W W Harrison assigned to The University of Virginia Alumni Patents Foundation Sample material is sputtered from an orifice in a disc mounted in a hollow cathode. A plasma
plume is ejected from the orifice and the material sputtered from the smaple is transported directly into the base of the plasma plume. Collisions with particles in the plasma plume excite the sputtered material. Light emission and absorption from the plume are measured and ions in the plume are measured.A chamber surrounding the plasma plume is maintained at about 1 torr. About 15 cc's per minute of argon are supplied to the hollow cathode at 2 torr. The power supply supplies about 200 volts at about 0.10 amps. Low energy argon ions strick the disc at the end of the cathode tube and sputter atoms off the aperture. Atoms collide with particles in the plasma causing excitation, photon emission and ionization of atoms which are measured by optical and mass spectrometers.
4824241 ATOMIC SPECTROSCOPY Davi Littlejohn, John Marshall, Glasgow, United Kingdom assigned to U S Philips Corporation A method of atomic spectroscopy is provided involving the steps of inserting a probe into a cuvette, depositing a sample to be atomized onto the probe by means of a sample dispenser, withdrawing the probe from the cuvette, heating the cuvette to a desired temperature sufficient to atomize the sample, and then reinserting the probe into the cuvette. The sample dispenser may be a manually-operated pipette, or the dosing tube of an autosampler. Liquid samples may be dried by heating the cuvette to a temperature lower than the atomization temperature before withdrawing the probe from the cuvette. Both solid and liquid samples may be atomized by this procedure. Such samples also may be ashed where appropriate by heating the cuvette
ii
New Patents
to a second temperature between the first temperature and the atomization temperature before withdrawing the probe from the cuvette. A spectrophotometer using the technique is also described.
4824249
SYSTEMS FOR THE DIRECT ANALYSIS OF SOLID SAMPLES BY A T O M I C E M I S S I O N SPECTROSCOPY Michael Lucas, Terry Hughes, Ivanhoe, Australia assigned to Chamber Ridge Pty Ltd An analysis system for directly analyzing solid samples by atomic emission spectroscopy
wherein the system includes an atomic spectral lamp (1) of the type which enables a solid sample to be analyzed to be demountably located as a cathode of the lamp (1), means (2) for producing a primary electric discharge by cathodic sputtering from the sample via connection (8) and a secondary boosted discharge for analytical emission via connection (9), spectral wave length analysis device (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and control means (3) for controlling the system, the current level of the sample cathode and the operation of the spectral wave length analysis device (4) being controlled on the basis of output from the photomultiplier tube (7) such that the intensity of the spectral lines is maximized and the relationship between spectral line intensity and concentration of the corresponding element in the sample is maintained in a region which is substantially linear.
For information about PATSEARCH ®
Pergamon Orbit InfoLine Inc. 8000 Westpark Drive McLean, VA 22102 USA Telephone (703) 442-0900 Telex: 90-1811
Pergamon Orbit lnfoLine Ltd 12 Vandy Street London EC2A 2DE UK Telephone (01) 377-4650 Telex: 8814614
0584-8547/90 $3.00 + 0,00 Pergamon Press pie
Printed in Great Britain
NEW PATENTS This Section contains abstracts and, where appropriate, illustrations of recently issued United States patents and published patent applications filed from over 30 countries under the Patent Cooperation Treaty. This information was obtained from recent additions to the Pergamon PATSEARCH~ online database in accordance with interest profiles developed by the Editors. Further information about Pergamon PATSEARCH® can be obtained from Pergamon Orbit InfoLine Inc., 8000 Westpark Drive, McLean, Virginia 22102 U.S.A. Copies of complete patents announced in this Section are available from Pergamon Orbit InfoLine Inc. for $8 per copy. Payment with order is required. Orders outside North America add $2 for air postage. Order by patent number for Pergamon Orbit InfoLine only.
4806489 MATRIX MODIFIER AND METHOD FOR MODIFYING A MATRIX TO IMPROVE ANALYSIS OF METAL CONSTITUENTS DURING GRAPHITE FURNACE ATOMIC ABSOR~ION SPECTROSCOPY Lucinda M Beach assigned to Varian Associates A matrix modifier of finely-divided metallic palladium dispersed to contact a metal constituent to improve analysis of the constituent during graphite furnace atomic absorption spectroscopy. The palladium interacts with a variety of metals in a sample to increase the vaporization temperatures of the metals. One way of contacting palladium with the metal analyte is to introduce it as a salt in solution with the sample into the graphite furnace along with a surfactant. A finely-divided metallic palladium having high surface area is produced in the furnace by introduction of hydrogen gas, which acts as a reducing agent, to reduce and maintain palladium in its metallic form at an early point in the temperature program, prior to evaporation of the surfactant.
4812040 HOLLOW
CATHODE PLUME
PLASMA
R Kenneth Marcus, W W Harrison assigned to The University of Virginia Alumni Patents Foundation Sample material is sputtered from an orifice in a disc mounted in a hollow cathode. A plasma
plume is ejected from the orifice and the material sputtered from the smaple is transported directly into the base of the plasma plume. Collisions with particles in the plasma plume excite the sputtered material. Light emission and absorption from the plume are measured and ions in the plume are measured.A chamber surrounding the plasma plume is maintained at about 1 torr. About 15 cc's per minute of argon are supplied to the hollow cathode at 2 torr. The power supply supplies about 200 volts at about 0.10 amps. Low energy argon ions strick the disc at the end of the cathode tube and sputter atoms off the aperture. Atoms collide with particles in the plasma causing excitation, photon emission and ionization of atoms which are measured by optical and mass spectrometers.
4824241 ATOMIC SPECTROSCOPY Davi Littlejohn, John Marshall, Glasgow, United Kingdom assigned to U S Philips Corporation A method of atomic spectroscopy is provided involving the steps of inserting a probe into a cuvette, depositing a sample to be atomized onto the probe by means of a sample dispenser, withdrawing the probe from the cuvette, heating the cuvette to a desired temperature sufficient to atomize the sample, and then reinserting the probe into the cuvette. The sample dispenser may be a manually-operated pipette, or the dosing tube of an autosampler. Liquid samples may be dried by heating the cuvette to a temperature lower than the atomization temperature before withdrawing the probe from the cuvette. Both solid and liquid samples may be atomized by this procedure. Such samples also may be ashed where appropriate by heating the cuvette
ii
New Patents
to a second temperature between the first temperature and the atomization temperature before withdrawing the probe from the cuvette. A spectrophotometer using the technique is also described.
4824249
SYSTEMS FOR THE DIRECT ANALYSIS OF SOLID SAMPLES BY A T O M I C E M I S S I O N SPECTROSCOPY Michael Lucas, Terry Hughes, Ivanhoe, Australia assigned to Chamber Ridge Pty Ltd An analysis system for directly analyzing solid samples by atomic emission spectroscopy
wherein the system includes an atomic spectral lamp (1) of the type which enables a solid sample to be analyzed to be demountably located as a cathode of the lamp (1), means (2) for producing a primary electric discharge by cathodic sputtering from the sample via connection (8) and a secondary boosted discharge for analytical emission via connection (9), spectral wave length analysis device (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and control means (3) for controlling the system, the current level of the sample cathode and the operation of the spectral wave length analysis device (4) being controlled on the basis of output from the photomultiplier tube (7) such that the intensity of the spectral lines is maximized and the relationship between spectral line intensity and concentration of the corresponding element in the sample is maintained in a region which is substantially linear.
For information about PATSEARCH ®
Pergamon Orbit InfoLine Inc. 8000 Westpark Drive McLean, VA 22102 USA Telephone (703) 442-0900 Telex: 90-1811
Pergamon Orbit lnfoLine Ltd 12 Vandy Street London EC2A 2DE UK Telephone (01) 377-4650 Telex: 8814614