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Author index to volume 16
Ultramicroscopy 16 (1985) 453-455 North-Holland, Amsterdam
453
AUTHOR INDEX TO VOLUME 16
Ade, G., see Hanszen Aebi, U., see Buhle, Jr. Bachmann, L., R. Becker, G. Leupold, M. Barth, R. Guckenberger and W. Baumeister, Decoration and shadowing of freezeetched catalase crystals Barth, M., see Bachmann Baumeister, W., Guest editorial Baumeister, W., see Bachmann Baumeister, W., see Engelhardt Baumeister, W., see Wildhaber Baxter, C.S. and W.M. Stobbs, TEM methods for the characterisation of fine metal muitilayers Becket, R., see Bachmann Benassayag, G., P. Sudraud and B. Jouffrey, In situ high voltage TEM observation of an electrohydrodynamic (EHD) ion source Bradley, C.R., M.L. Wroge and P.C. Gibbons, How to remove multiple scattering from core-excitation spectra. I. Forward scattering Buhle, Jr., E.L., U. Aebi and P.R. Smith, Correlation of surface topography of metal-shadowed specimens with their negatively stained reconstructions Bursill, L.A., see Smith
16 (1985) 47 16 (1985)436
16 (1985) 305 16 (1985)3O5 16(1985) 285 16 (1985) 305 16 (1985) 395 16(1985) 411
16 (1985) 213 16(1985) 305
16(1985)
Egerton, R.F., see Cheng Endoh, H., see Tomita Engel, A., see Reichelt Engel, A., see Wildhaber Engeihardt, H., R. Guckenberger, R. Hegerl and W. Baumeister, High resolution shadowing of frceze-dried bacterial photosynthetic membranes: multivariate statistical analysis and surface relief reconstruction Firmani, C., L. Salas, R. Henriquez, E. Ruiz, A. G6mez, D. Romeu, R. P6rez, V. Castaho, P.S. Schabes and M.J. Yacamim, Use of two-dimensional single electron detector for electron diffraction studies in TEM Fromm, J.E., see Pacansky
16(1985) 279 16 (1985) 9 16 (1985) 69 16 (1985) 411
16(1985) 395
16(1985) 89 1 6 (1985) 81
1
16 (1985) 95
16 (1985)436 16 (1985) 19
Carlemalm, E., see Reichelt Castaho, V., see Firmani Chalcroft, J.P., Considerations for the quantitative analysis of coated reliefs Cheng, S.C. and R.F. Egerton, Signal/background ratio of ionization edges in EELS Cowley, J.M. and L. Peng, The image contrast of surface steps in reflection electron microscopy Crewe, A.V. and D.A. Crewe, Inexact reconstruction: some improvements Crewe, D.A., see Crewe Cusack, S. and J.-C. J6sior, Three-dimensional molecular shape determination from a limited number of projections
16 (1985) 203
Donnelly, S.E., see Rossouw
16 (1985) 41
Fades, J.A., see Shannon Echenique, P.M. and A. Howie, Image force effects in electron microscopy
16 (1985) 175
16 (1985) 69 16 (1985) 89 16(1985) 371 16(1985)279
16 (1985) 59 16 (1985) 33 16 (1985) 33
16(1985) 269
Gibbons, P.C., see Bradley Glaeser, R.M., see Henderson G6mez, A., see Firmani Goodman, P., A. Olsen and H.J. Whitfield, Mirror-symmetric and non-mirror-symmetric glide planes in CuAsSe 1_xSx. I. A convergent beam electron diffraction study Gronsky, R., see Kilaas Gross, H., T. Mtiiler, I. Wildhaber and H. Winkler, High resolution metal replication, quantified by image processing of periodic test specimens Gross, H., see Wiidhaber Gross, H., see Winkler Gross, H., see Miiller Gross, H., see Kunath Gross, H., see Wildhaber Guckenberger, R., see Bachmann Guckenberger, R., Surface reliefs derived from heavy-metal-shadowed specimens - Fourier space techniques applied to periodic objects Guckenberger, R., see Engelhardt
16 (1985) 95 16 (1985) 139 16(1985) 89
Haase, G., see Zrrgiebel Hanszen, K.-J., R. Lauer and G. Ade, The effect of non-isoplanatism in micrographs taken with an electron microscope equipped with a field emission gun Hashimoto, H., see Tomita Hawkes, P.W., Meeting report: Sir Charles
16 (1985) 115
16 (1985) 227 16(1985) 193
16 (1985) 287 16 (1985) 321 16 (1985) 331 16 (1985) 340 16 (1985) 349 16 (1985) 411 16 (1985) 305
16 (1985) 357 16 (1985) 395
16 (1985) 47 16 (1985) 9
454
Author index
Oatley and the scanning electron microscope Hawkes, P.W., Special issues; news serials and many proceedings (E) Hegerl, R., see Engelhardt Heide, H.-G. and E. Zeitler, The physical behavior of solid water at low temperatures and the embedding of electron microscopical specimens Henderson, R. and R.M. Glaeser, Quantitative analysis of image contrast in electron micrographs of beam-sensitive crystals Henrtquez, R., see Firmani Howie, A., see Echenique
16 (1985) 139 16(1985) 89 16(1985) 269
Ikuta, T., see Tomita Isaacson, M., see Scheinfein
16 (1985) 9 16 (1985)233
J6sior, J.-C., see Cusack Jouffrey, B., see Benassayag
16 (1985)203 16 (1985) 1
16(1985)121 16 (1985)395
16 (1985)227
Pacansky, J., M. Maler and J.E. Fromm, A comparison of an electron-beam-induced chemical reaction at T = 10 K and T = 300 K Peng, L., see Cowley P~rez, R., see Firmani
16 (1985) 81 16 (1985) 59 16(1985) 89
16 (1985)151
Kilaas, R. and R. Gronsky, The effect of amorphous surface layers on images of crystals in high resolution transmission electron microscopy Kohl, H., A simple procedure for evaluating effective scattering cross-sections in STEM Kunath, W., F. Zemlin and K. Weiss, Apodization in phase-contrast electron microscopy realized with hollow-cone illuminat/on Kunath, W. and H. Gross, New high resolution imaging methods as tools for the observation of small clusters Kuo, K.H., see Ye
16 (1985)349 16 (1985)273
Lauer, R., see Hanszen Leupold, G.,-see Bachmann Lynch, D.F., see Rossouw
16(1985) 47 16 (1985)305 16(1985) 41
Maier, M., see Pacansky Marks, L.D., see Smith Marks, L.D., Direct observation of diffractive probe spreading Meichle, M.E., see Shannon Moor, H., see Wildhaber Moor, H., see Mi'qler M~ller, T., see Gross Mt~ller, T., H. Gross, H. Winkler and H. Moor, High resolution shadowing with pure carbon Muray, A., see Scheinfein
16 (1985) 81 16(1985)101
Niemietz, A. and L. Reimer, Digital image processing of multiple detector signals in scanning electron microscopy
Olsen, A., see Goodman 16(1985)119
16 (1985) 193
Reichelt, R., E. Carlemalm, W. Villiger and A. Engel, Concentration determination of embedded biological matter by scanning transmission electron microscopy Reimer, L., see Niemietz Rez, P., The use of array processors attached to minicomputers for multislice image calculations Romeu, D., see Firmani Rose, H., Information transfer in transmission electron microscopy (E) Rossouw, C.J., S.E. Donnelly and D.F. Lynch, Atomic step contrast from. forbidden reflections Rossouw, C.J., Coherence in inelastic electron scattering Rutz, E., see Firmani
16 (1985) 69 16 (1985) 161
16 (1985)255 16(1985) 89 16(1985) 121
16 (1985) 41 16 (1985) 241 16 (1985) 89
16 (1985)265
16(1985) 123
16 (1985) 261 16(1985)175 16(1985) 321 16 (1985)340 16(1985) 287
16 (1985) 340 16 (1985)233
16(1985) 161
Salas, L., see Firmani Saxton, W.O., Computer generation of shaded images of solids and surfaces Saxton, W.O., Discussion at the EUREM 1984 Symposium on High Resolution Shadowing and Decoration: Image Analysis Schabes, P.S., see Firmani Scheinfein, M., A. Muray and M. Isaacson, Electron energy loss spectroscopy across a metal-insulator interface at sub-nanometer spatial resolution Smith, D.J., L.A. Bursili and G.J. Wood, Non-anomalous high-resolution imaging of crystalline materials Schmiady, H., see Tesche Shannon, M.D., J.A. Fades, M.E. Meichle and P.S. Turner, Zone-axis patterns in reflection high-energy electron diffraction: a family of new techniques for surface characterization Smith, DJ. and L.D. Marks, Direct atomic imaging of solid surfaces. IlL Small particles and extended Au surfaces Smith, P.R., see Buhle, Jr. Stobbs, W.M., see Baxter Sudraud, P., see Benassayag Tesche, B. and H. Schmiady, Comparative electron microscopic studies of single bio-
16 (1985) 89 16 (1985) 387
16 (1985) 451 16 (1985) 89
16 (1985) 233
16 (1985) 19 16 (1985) 423
16 (1985) 175
16 (1985) 101 16 (1985) 436 16 (1985) 213 16 (1985) 1
Author index
molecules negatively stained and freezedried metal-shadowed Tomita, M., H. Hashimoto, T. Ikuta, H. Endoh and Y. Yokota, Improvement and application of the Fourier-transformed pattern from a small area of high resolution electron microscope images Turner, P.S., see Shannon
16 (1985) 9 16 (1985) 175
Villiger, W., see Reichelt
16(1985) 69
Wang, D.N., see Ye Weiss, K., see Kunath Whitfield, H.J., see Goodman Wildhaber, I., see Gross Wildhaber, I., H. Gross and H. Moor, Comparative studies of very thin shadowing films produced by atom beam sputtering and electron beam evaporation Wildhaber, I., see Winkler Wildhaber, I., H. Gross, A. Engel and W. Baumeister, The effects of air-drying and
16(1985) 273 16 (1985)123 16 (1985) 227 16 (1985) 287
16 (1985) 423
16(1985) 321 16(1985)331
freeze-drying on the structure of a regular protein layer Winkler, H., see Gross Winkler, H., I. Wildhaber and H. Gross, Decoration effects on the surface of a regular protein layer Winkler, H., see Ml~ller Wood, G.J., see Smith Wroge, M.L., see Bradley Yacam/m, M.J., see Firmani Ye, H.Q., D.N. Wang and K.H. Kuo, Fivefold symmetry in real and reciprocal spaces Yokota, Y., see Tomita Zeindl, H.P., see Z6rgiebel Zeitler, E., see Heide Zemlin, F., see Kunath Z6rgiebel, F., H.P. Zeindl and G. Haase, New experiences with ultramicrotomy in elec. tron microscopic investigation of photochromic glasses
455
16(1985)411 16 (1985)287
16(1985) 331 16(1985)340 16(1985) 19 16 (1985) 95 16 (1985) 89
16 (1985)273 16(1985) 9 16 (1985)115 16 (1985) 151 16(1985) 123
16 (1985) 115
453
AUTHOR INDEX TO VOLUME 16
Ade, G., see Hanszen Aebi, U., see Buhle, Jr. Bachmann, L., R. Becker, G. Leupold, M. Barth, R. Guckenberger and W. Baumeister, Decoration and shadowing of freezeetched catalase crystals Barth, M., see Bachmann Baumeister, W., Guest editorial Baumeister, W., see Bachmann Baumeister, W., see Engelhardt Baumeister, W., see Wildhaber Baxter, C.S. and W.M. Stobbs, TEM methods for the characterisation of fine metal muitilayers Becket, R., see Bachmann Benassayag, G., P. Sudraud and B. Jouffrey, In situ high voltage TEM observation of an electrohydrodynamic (EHD) ion source Bradley, C.R., M.L. Wroge and P.C. Gibbons, How to remove multiple scattering from core-excitation spectra. I. Forward scattering Buhle, Jr., E.L., U. Aebi and P.R. Smith, Correlation of surface topography of metal-shadowed specimens with their negatively stained reconstructions Bursill, L.A., see Smith
16 (1985) 47 16 (1985)436
16 (1985) 305 16 (1985)3O5 16(1985) 285 16 (1985) 305 16 (1985) 395 16(1985) 411
16 (1985) 213 16(1985) 305
16(1985)
Egerton, R.F., see Cheng Endoh, H., see Tomita Engel, A., see Reichelt Engel, A., see Wildhaber Engeihardt, H., R. Guckenberger, R. Hegerl and W. Baumeister, High resolution shadowing of frceze-dried bacterial photosynthetic membranes: multivariate statistical analysis and surface relief reconstruction Firmani, C., L. Salas, R. Henriquez, E. Ruiz, A. G6mez, D. Romeu, R. P6rez, V. Castaho, P.S. Schabes and M.J. Yacamim, Use of two-dimensional single electron detector for electron diffraction studies in TEM Fromm, J.E., see Pacansky
16(1985) 279 16 (1985) 9 16 (1985) 69 16 (1985) 411
16(1985) 395
16(1985) 89 1 6 (1985) 81
1
16 (1985) 95
16 (1985)436 16 (1985) 19
Carlemalm, E., see Reichelt Castaho, V., see Firmani Chalcroft, J.P., Considerations for the quantitative analysis of coated reliefs Cheng, S.C. and R.F. Egerton, Signal/background ratio of ionization edges in EELS Cowley, J.M. and L. Peng, The image contrast of surface steps in reflection electron microscopy Crewe, A.V. and D.A. Crewe, Inexact reconstruction: some improvements Crewe, D.A., see Crewe Cusack, S. and J.-C. J6sior, Three-dimensional molecular shape determination from a limited number of projections
16 (1985) 203
Donnelly, S.E., see Rossouw
16 (1985) 41
Fades, J.A., see Shannon Echenique, P.M. and A. Howie, Image force effects in electron microscopy
16 (1985) 175
16 (1985) 69 16 (1985) 89 16(1985) 371 16(1985)279
16 (1985) 59 16 (1985) 33 16 (1985) 33
16(1985) 269
Gibbons, P.C., see Bradley Glaeser, R.M., see Henderson G6mez, A., see Firmani Goodman, P., A. Olsen and H.J. Whitfield, Mirror-symmetric and non-mirror-symmetric glide planes in CuAsSe 1_xSx. I. A convergent beam electron diffraction study Gronsky, R., see Kilaas Gross, H., T. Mtiiler, I. Wildhaber and H. Winkler, High resolution metal replication, quantified by image processing of periodic test specimens Gross, H., see Wiidhaber Gross, H., see Winkler Gross, H., see Miiller Gross, H., see Kunath Gross, H., see Wildhaber Guckenberger, R., see Bachmann Guckenberger, R., Surface reliefs derived from heavy-metal-shadowed specimens - Fourier space techniques applied to periodic objects Guckenberger, R., see Engelhardt
16 (1985) 95 16 (1985) 139 16(1985) 89
Haase, G., see Zrrgiebel Hanszen, K.-J., R. Lauer and G. Ade, The effect of non-isoplanatism in micrographs taken with an electron microscope equipped with a field emission gun Hashimoto, H., see Tomita Hawkes, P.W., Meeting report: Sir Charles
16 (1985) 115
16 (1985) 227 16(1985) 193
16 (1985) 287 16 (1985) 321 16 (1985) 331 16 (1985) 340 16 (1985) 349 16 (1985) 411 16 (1985) 305
16 (1985) 357 16 (1985) 395
16 (1985) 47 16 (1985) 9
454
Author index
Oatley and the scanning electron microscope Hawkes, P.W., Special issues; news serials and many proceedings (E) Hegerl, R., see Engelhardt Heide, H.-G. and E. Zeitler, The physical behavior of solid water at low temperatures and the embedding of electron microscopical specimens Henderson, R. and R.M. Glaeser, Quantitative analysis of image contrast in electron micrographs of beam-sensitive crystals Henrtquez, R., see Firmani Howie, A., see Echenique
16 (1985) 139 16(1985) 89 16(1985) 269
Ikuta, T., see Tomita Isaacson, M., see Scheinfein
16 (1985) 9 16 (1985)233
J6sior, J.-C., see Cusack Jouffrey, B., see Benassayag
16 (1985)203 16 (1985) 1
16(1985)121 16 (1985)395
16 (1985)227
Pacansky, J., M. Maler and J.E. Fromm, A comparison of an electron-beam-induced chemical reaction at T = 10 K and T = 300 K Peng, L., see Cowley P~rez, R., see Firmani
16 (1985) 81 16 (1985) 59 16(1985) 89
16 (1985)151
Kilaas, R. and R. Gronsky, The effect of amorphous surface layers on images of crystals in high resolution transmission electron microscopy Kohl, H., A simple procedure for evaluating effective scattering cross-sections in STEM Kunath, W., F. Zemlin and K. Weiss, Apodization in phase-contrast electron microscopy realized with hollow-cone illuminat/on Kunath, W. and H. Gross, New high resolution imaging methods as tools for the observation of small clusters Kuo, K.H., see Ye
16 (1985)349 16 (1985)273
Lauer, R., see Hanszen Leupold, G.,-see Bachmann Lynch, D.F., see Rossouw
16(1985) 47 16 (1985)305 16(1985) 41
Maier, M., see Pacansky Marks, L.D., see Smith Marks, L.D., Direct observation of diffractive probe spreading Meichle, M.E., see Shannon Moor, H., see Wildhaber Moor, H., see Mi'qler M~ller, T., see Gross Mt~ller, T., H. Gross, H. Winkler and H. Moor, High resolution shadowing with pure carbon Muray, A., see Scheinfein
16 (1985) 81 16(1985)101
Niemietz, A. and L. Reimer, Digital image processing of multiple detector signals in scanning electron microscopy
Olsen, A., see Goodman 16(1985)119
16 (1985) 193
Reichelt, R., E. Carlemalm, W. Villiger and A. Engel, Concentration determination of embedded biological matter by scanning transmission electron microscopy Reimer, L., see Niemietz Rez, P., The use of array processors attached to minicomputers for multislice image calculations Romeu, D., see Firmani Rose, H., Information transfer in transmission electron microscopy (E) Rossouw, C.J., S.E. Donnelly and D.F. Lynch, Atomic step contrast from. forbidden reflections Rossouw, C.J., Coherence in inelastic electron scattering Rutz, E., see Firmani
16 (1985) 69 16 (1985) 161
16 (1985)255 16(1985) 89 16(1985) 121
16 (1985) 41 16 (1985) 241 16 (1985) 89
16 (1985)265
16(1985) 123
16 (1985) 261 16(1985)175 16(1985) 321 16 (1985)340 16(1985) 287
16 (1985) 340 16 (1985)233
16(1985) 161
Salas, L., see Firmani Saxton, W.O., Computer generation of shaded images of solids and surfaces Saxton, W.O., Discussion at the EUREM 1984 Symposium on High Resolution Shadowing and Decoration: Image Analysis Schabes, P.S., see Firmani Scheinfein, M., A. Muray and M. Isaacson, Electron energy loss spectroscopy across a metal-insulator interface at sub-nanometer spatial resolution Smith, D.J., L.A. Bursili and G.J. Wood, Non-anomalous high-resolution imaging of crystalline materials Schmiady, H., see Tesche Shannon, M.D., J.A. Fades, M.E. Meichle and P.S. Turner, Zone-axis patterns in reflection high-energy electron diffraction: a family of new techniques for surface characterization Smith, DJ. and L.D. Marks, Direct atomic imaging of solid surfaces. IlL Small particles and extended Au surfaces Smith, P.R., see Buhle, Jr. Stobbs, W.M., see Baxter Sudraud, P., see Benassayag Tesche, B. and H. Schmiady, Comparative electron microscopic studies of single bio-
16 (1985) 89 16 (1985) 387
16 (1985) 451 16 (1985) 89
16 (1985) 233
16 (1985) 19 16 (1985) 423
16 (1985) 175
16 (1985) 101 16 (1985) 436 16 (1985) 213 16 (1985) 1
Author index
molecules negatively stained and freezedried metal-shadowed Tomita, M., H. Hashimoto, T. Ikuta, H. Endoh and Y. Yokota, Improvement and application of the Fourier-transformed pattern from a small area of high resolution electron microscope images Turner, P.S., see Shannon
16 (1985) 9 16 (1985) 175
Villiger, W., see Reichelt
16(1985) 69
Wang, D.N., see Ye Weiss, K., see Kunath Whitfield, H.J., see Goodman Wildhaber, I., see Gross Wildhaber, I., H. Gross and H. Moor, Comparative studies of very thin shadowing films produced by atom beam sputtering and electron beam evaporation Wildhaber, I., see Winkler Wildhaber, I., H. Gross, A. Engel and W. Baumeister, The effects of air-drying and
16(1985) 273 16 (1985)123 16 (1985) 227 16 (1985) 287
16 (1985) 423
16(1985) 321 16(1985)331
freeze-drying on the structure of a regular protein layer Winkler, H., see Gross Winkler, H., I. Wildhaber and H. Gross, Decoration effects on the surface of a regular protein layer Winkler, H., see Ml~ller Wood, G.J., see Smith Wroge, M.L., see Bradley Yacam/m, M.J., see Firmani Ye, H.Q., D.N. Wang and K.H. Kuo, Fivefold symmetry in real and reciprocal spaces Yokota, Y., see Tomita Zeindl, H.P., see Z6rgiebel Zeitler, E., see Heide Zemlin, F., see Kunath Z6rgiebel, F., H.P. Zeindl and G. Haase, New experiences with ultramicrotomy in elec. tron microscopic investigation of photochromic glasses
455
16(1985)411 16 (1985)287
16(1985) 331 16(1985)340 16(1985) 19 16 (1985) 95 16 (1985) 89
16 (1985)273 16(1985) 9 16 (1985)115 16 (1985) 151 16(1985) 123
16 (1985) 115