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Basic principles, methods and objectives of reliability operations
Microelectronics and Reliability
PergamonPress 1970. Vol. 9, pp. 109-126.
Printed in Great Britain
WORLD ABSTRACTS ON MICROELECTRONICS AND RELIABILITY THE following abstracts are given in reasonable detail when necessary so that a fuller appreciation may be made of the coverage of the article. Subjects 1. Reliability--General. 2. Reliability of Components, Tubes, Transistors and ICs. 3. Circuit and Systems Reliability, Maintenance and Redundancy. 4. Microelectronics--General. 5. Microelectronics Design and Construction. 6. Microelectronics--Components and Equipments. 7. Semiconductor Integrated Circuits, Devices and Materials. 8. Thick- and Thin-Film Circuits and Materials. Abstracts marked t are acknowledged from R. and D. Abstracts, published by TIL Report Centre, Ministry of Technology, Orpington, Kent. 1. RELIABILITY--GENERAL ~-Basle principles, methods and objectives of reliability operations. H. GROSS, April (1968), 17 pp. NASA-TTF-11545. (In German.) Description of a number of theoretical and experimental research methods associated with engineering reliability. A general outline of the basic concepts of reliability operation is presented, followed by a discussion of the various problems that may be successfully attacked by these methods. tNaval research logistics quarterly 15, No. 3, September (1968), 475 pp. P-157570 NAVSO-P-1278. Contents: Cannibalization in multicomponent systems and the theory of reliability (W. M. HIRSCHand M. MEISNER); Probabilistic models of decreasing failure rate processes (J. M. COZZOLINO);Optimal policies for a multi-product inventory system with negotiable lead times (G. P. WRIGHT); A maximum utility solution to a vehicle constrained tanker scheduling problem (M. BELLMOREand G. BENmNOTON); The fixed charge problem (W. M. HIRSCH and G. B. DANTZIG); Adaptive competitive decision in repeated play for a matrix game with uncertain entries (C. W. SWEAT); Programming with linear fractional functionals (S. ZIONTS); On minimum walks in graphs (S. HEDETNIEMI); Derivation and application of unit cost expressions perturbed by design changes (P. M. JAMES);A note on sequential search (M. KLEIN). Sense and nonsense in electronic reliability engineering. J. H. SrtAaPE, Proc. Inst. Mech. Engrs 29, No. 10, October (1968), p. 358. Examines various procedures for the measurement and demonstration of reliability in quantitative terms which can lead to a considerable amount of nonsense. Suggests also that there is sense in current work and trends in high stress and failure mechanism testing. On the rate of failure and other quantitative characteristics of reliability. K. REINSCHKE, Nachrichtentechnik 19, No. 2, February (1969), p. 41. (In German.) The most important reliability characteristics are defined and their practical importance is demonstrated by examples. Universal relations existing between various reliability characteristics are disclosed. 109
PergamonPress 1970. Vol. 9, pp. 109-126.
Printed in Great Britain
WORLD ABSTRACTS ON MICROELECTRONICS AND RELIABILITY THE following abstracts are given in reasonable detail when necessary so that a fuller appreciation may be made of the coverage of the article. Subjects 1. Reliability--General. 2. Reliability of Components, Tubes, Transistors and ICs. 3. Circuit and Systems Reliability, Maintenance and Redundancy. 4. Microelectronics--General. 5. Microelectronics Design and Construction. 6. Microelectronics--Components and Equipments. 7. Semiconductor Integrated Circuits, Devices and Materials. 8. Thick- and Thin-Film Circuits and Materials. Abstracts marked t are acknowledged from R. and D. Abstracts, published by TIL Report Centre, Ministry of Technology, Orpington, Kent. 1. RELIABILITY--GENERAL ~-Basle principles, methods and objectives of reliability operations. H. GROSS, April (1968), 17 pp. NASA-TTF-11545. (In German.) Description of a number of theoretical and experimental research methods associated with engineering reliability. A general outline of the basic concepts of reliability operation is presented, followed by a discussion of the various problems that may be successfully attacked by these methods. tNaval research logistics quarterly 15, No. 3, September (1968), 475 pp. P-157570 NAVSO-P-1278. Contents: Cannibalization in multicomponent systems and the theory of reliability (W. M. HIRSCHand M. MEISNER); Probabilistic models of decreasing failure rate processes (J. M. COZZOLINO);Optimal policies for a multi-product inventory system with negotiable lead times (G. P. WRIGHT); A maximum utility solution to a vehicle constrained tanker scheduling problem (M. BELLMOREand G. BENmNOTON); The fixed charge problem (W. M. HIRSCH and G. B. DANTZIG); Adaptive competitive decision in repeated play for a matrix game with uncertain entries (C. W. SWEAT); Programming with linear fractional functionals (S. ZIONTS); On minimum walks in graphs (S. HEDETNIEMI); Derivation and application of unit cost expressions perturbed by design changes (P. M. JAMES);A note on sequential search (M. KLEIN). Sense and nonsense in electronic reliability engineering. J. H. SrtAaPE, Proc. Inst. Mech. Engrs 29, No. 10, October (1968), p. 358. Examines various procedures for the measurement and demonstration of reliability in quantitative terms which can lead to a considerable amount of nonsense. Suggests also that there is sense in current work and trends in high stress and failure mechanism testing. On the rate of failure and other quantitative characteristics of reliability. K. REINSCHKE, Nachrichtentechnik 19, No. 2, February (1969), p. 41. (In German.) The most important reliability characteristics are defined and their practical importance is demonstrated by examples. Universal relations existing between various reliability characteristics are disclosed. 109