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Contemporary logic design
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• •
high-density interconnections and deposited dielectrics; wire and wirebonds;
• •
tape automated bonds; device and substrate attachment;
• • • •
cases; leads; lead seals; lid seals;
•
material and product evaluation methods;
• rework methods. A useful bibliography completes the text. Each of the principal chapters has the subdivisions (i) Materials, (ii) Manufacturing and process quality, (iii) Failure mechanisms, and (iv) Qualification, thus m a k i n g each c h a p t e r c o m p r e h e n s i v e and self-contained. The chapter on 'Material and product evaluation methods', however, is very general, and refers extensively to appropriate American Society for Testing and Materials (ASTM) specifications. European standards are not mentioned. In total, this is a text which contains a great deal of information in a specialist area. It does not contain any new research concepts or information, but is useful for bringing existing information and further references together in one publication.
M. S. Harris
System Test and Diagnosis
directed to systems in general, not specifically to microelectronic systems, and represents the work of the authors over twelve years of research at the A R I N C Research Corporation, Annapolis, USA. The book is divided into three main parts: Part 1, Motivation (3 chapters), Part 2, Analysis and Application (7 chapters), and Part 3, Advanced Topics (5 chapters). The first part is an overview of maintainability, measures of maintainability, and the problems of field diagnosis and repair including system self-test. Part 2 then continues with the main content of the book, covering the tools necessary for analysing system testability and diagnostic strategies. The modelling of systems from both a bottom-up and a top-down approach is first considered, from which the author's main theory of an information flow model emerges. This model is then applied and extended to evaluating system diagnostics and testability for different system structures. Part 3 discusses advanced topics of diagnosis, and includes aspects of fuzzy logic, neural networks and statistical inference. Modelling temporal information is comprehensively considered, with a final chapter on pitfalls in modelling and a comparison of tools that use diagnostic algorithms. T h i s is n o t a t e x t w h i c h the p r a c t i s i n g microelectronic system designer will happily or usefully use. Its approach is strongly fundamental and mathematical, and it will therefore appeal much more to those doing basic research and development on system reliability. As such, it represents an authoritative and very valuable depository of guidance and information.
W.R. Simpson and J.W. Sheppard, Kluwer Academic Publishers, Norwell, MA, 1994, 382pp., D.fl. 190.00, US$93.00, £67.95 This book addresses the subject of test and diagnosis at the system level, where a system is defined by the authors as an aggregation of elements for which it is impracticable to treat all of the elements at a lower level of detail. The philosophy of diagnosis and diagnostic tools is treated in the context o f a model-based approach, which is applicable to different levels of a hierarchical system. The work is
)iX
S.L. Hurst
Contemporary Logic Design R.H. Katz, Benjamin Publishing Co., CA, 1994, 698 pp., £24.95 A number of new texts on basic digital logic design are currently available in bookshops, each of which reflects a modern emphasis on programmable logic devices, introduction to CAD, and basic processors
Microelectronics Journal, VoL 26, No. 5
as well as fundamental,;. Most contain 500 or more pages, and use colour to advantage in figures, tables and state diagrams. Thi:s text is no exception, its title Contemporary Logic Design supposedly emphasizing a modern approach. The first chapter of this book is possibly the most distinctive in comparison with other texts. It introduces in general terms the concepts of the process of design from system level downwards, design specification, design constraints and the advantages of digital systems, followed by Boolean algebra, behaviour descriptions, and methods of implementation. This is a useful chapter to read rather than to acquire detailed knowledge. The following chapters become more conventional. The rules and theorems of Boolean algebra are first covered, leading on to two-level and multilevel combinational logic design. Chapter 4, titled 'Programmable and steerable logic',is a good chapter on all forms of PLDs. The final chapters deal with sequential network,;, and collectively c o v e r synchronous and asynchronous network design, ASM charts, finite state machine partitioning, and finite state machines for simple CPUs and m i c r o p r o g r a m m e d controllers. Each chapter concludes with a set of simple exercises, but no solutions are given in the normal edition of the book. The standard and clari~ryof the book are excellent. The only point to raise a frown is the Appendix, tided 'Basic electronic components'; one wonders whether it was really necessary to include DTL logic, and more detail of MOS and CMOS circuits might have been more useful. However, overall, potential users o f the book should compare it carefully and favourably with the several other similar texts now available.
S.L. Hurst
Electrotechnical Materials: Microphysics Structure Properties Gerhard Fasching, Springer- Verlag, Wien and New York, 1994 (in German)
The rapid advance being made in electrical and electronic engineering and technology is due largely to new material developments and the vast range of applications, and could not be achieved without a clear understanding of the fundamental processes occurring in materials. This excellent, newly revised and considerably expanded book presents a comprehensive survey of three principal areas in materials science: (i) f u n d a m e n t a l physical processes and related phenomena; (ii) materials structure; and (iii) materials properties. The scope of the book is broadened to take into account specific topics concerning the new materials and their properties, which are given ten appendices. All materials o f importance in electrical and electronic engineering are covered in this book: metals, ceramics, polymers, semiconductors, dielectrics, magnetics and superconductive materials. The book will undoubtedly be of considerable interest to students in electronics, electrical engineering, material science and solid state physics, and also to all those who are active in the production of new devices based on traditional or new materials. T h e b o o k begins ( C h a p t e r s 1-3) w i t h an introduction to quantum mechanics, providing the necessary background in atomic structure and interatomic bonding. Chapter 4 is devoted to gases and liquid systems. The common solid structures, along with crystal defects, are described in detail in Chapter 5. The following three chapters (6-8) provide a detailed description of metals, ceramics, organic and high polymer structures. Chapters 9 and 10 give an insight into the importance of mechanical and thermal properties of materials. Conduction processes and band structure in semiconductors are described in Chapter 11, and electrical properties of materials in Chapter 12. Chapter 13 surveys dielectric properties of insulators and follows with an explanation of piezoelectric, pyroelectric and ferroelectric phenomena. Finally, Chapter 14 addresses the magnetic properties of materials, and great attention is focused on magnetic ordering and ferromagnetism.
xxi
• •
high-density interconnections and deposited dielectrics; wire and wirebonds;
• •
tape automated bonds; device and substrate attachment;
• • • •
cases; leads; lead seals; lid seals;
•
material and product evaluation methods;
• rework methods. A useful bibliography completes the text. Each of the principal chapters has the subdivisions (i) Materials, (ii) Manufacturing and process quality, (iii) Failure mechanisms, and (iv) Qualification, thus m a k i n g each c h a p t e r c o m p r e h e n s i v e and self-contained. The chapter on 'Material and product evaluation methods', however, is very general, and refers extensively to appropriate American Society for Testing and Materials (ASTM) specifications. European standards are not mentioned. In total, this is a text which contains a great deal of information in a specialist area. It does not contain any new research concepts or information, but is useful for bringing existing information and further references together in one publication.
M. S. Harris
System Test and Diagnosis
directed to systems in general, not specifically to microelectronic systems, and represents the work of the authors over twelve years of research at the A R I N C Research Corporation, Annapolis, USA. The book is divided into three main parts: Part 1, Motivation (3 chapters), Part 2, Analysis and Application (7 chapters), and Part 3, Advanced Topics (5 chapters). The first part is an overview of maintainability, measures of maintainability, and the problems of field diagnosis and repair including system self-test. Part 2 then continues with the main content of the book, covering the tools necessary for analysing system testability and diagnostic strategies. The modelling of systems from both a bottom-up and a top-down approach is first considered, from which the author's main theory of an information flow model emerges. This model is then applied and extended to evaluating system diagnostics and testability for different system structures. Part 3 discusses advanced topics of diagnosis, and includes aspects of fuzzy logic, neural networks and statistical inference. Modelling temporal information is comprehensively considered, with a final chapter on pitfalls in modelling and a comparison of tools that use diagnostic algorithms. T h i s is n o t a t e x t w h i c h the p r a c t i s i n g microelectronic system designer will happily or usefully use. Its approach is strongly fundamental and mathematical, and it will therefore appeal much more to those doing basic research and development on system reliability. As such, it represents an authoritative and very valuable depository of guidance and information.
W.R. Simpson and J.W. Sheppard, Kluwer Academic Publishers, Norwell, MA, 1994, 382pp., D.fl. 190.00, US$93.00, £67.95 This book addresses the subject of test and diagnosis at the system level, where a system is defined by the authors as an aggregation of elements for which it is impracticable to treat all of the elements at a lower level of detail. The philosophy of diagnosis and diagnostic tools is treated in the context o f a model-based approach, which is applicable to different levels of a hierarchical system. The work is
)iX
S.L. Hurst
Contemporary Logic Design R.H. Katz, Benjamin Publishing Co., CA, 1994, 698 pp., £24.95 A number of new texts on basic digital logic design are currently available in bookshops, each of which reflects a modern emphasis on programmable logic devices, introduction to CAD, and basic processors
Microelectronics Journal, VoL 26, No. 5
as well as fundamental,;. Most contain 500 or more pages, and use colour to advantage in figures, tables and state diagrams. Thi:s text is no exception, its title Contemporary Logic Design supposedly emphasizing a modern approach. The first chapter of this book is possibly the most distinctive in comparison with other texts. It introduces in general terms the concepts of the process of design from system level downwards, design specification, design constraints and the advantages of digital systems, followed by Boolean algebra, behaviour descriptions, and methods of implementation. This is a useful chapter to read rather than to acquire detailed knowledge. The following chapters become more conventional. The rules and theorems of Boolean algebra are first covered, leading on to two-level and multilevel combinational logic design. Chapter 4, titled 'Programmable and steerable logic',is a good chapter on all forms of PLDs. The final chapters deal with sequential network,;, and collectively c o v e r synchronous and asynchronous network design, ASM charts, finite state machine partitioning, and finite state machines for simple CPUs and m i c r o p r o g r a m m e d controllers. Each chapter concludes with a set of simple exercises, but no solutions are given in the normal edition of the book. The standard and clari~ryof the book are excellent. The only point to raise a frown is the Appendix, tided 'Basic electronic components'; one wonders whether it was really necessary to include DTL logic, and more detail of MOS and CMOS circuits might have been more useful. However, overall, potential users o f the book should compare it carefully and favourably with the several other similar texts now available.
S.L. Hurst
Electrotechnical Materials: Microphysics Structure Properties Gerhard Fasching, Springer- Verlag, Wien and New York, 1994 (in German)
The rapid advance being made in electrical and electronic engineering and technology is due largely to new material developments and the vast range of applications, and could not be achieved without a clear understanding of the fundamental processes occurring in materials. This excellent, newly revised and considerably expanded book presents a comprehensive survey of three principal areas in materials science: (i) f u n d a m e n t a l physical processes and related phenomena; (ii) materials structure; and (iii) materials properties. The scope of the book is broadened to take into account specific topics concerning the new materials and their properties, which are given ten appendices. All materials o f importance in electrical and electronic engineering are covered in this book: metals, ceramics, polymers, semiconductors, dielectrics, magnetics and superconductive materials. The book will undoubtedly be of considerable interest to students in electronics, electrical engineering, material science and solid state physics, and also to all those who are active in the production of new devices based on traditional or new materials. T h e b o o k begins ( C h a p t e r s 1-3) w i t h an introduction to quantum mechanics, providing the necessary background in atomic structure and interatomic bonding. Chapter 4 is devoted to gases and liquid systems. The common solid structures, along with crystal defects, are described in detail in Chapter 5. The following three chapters (6-8) provide a detailed description of metals, ceramics, organic and high polymer structures. Chapters 9 and 10 give an insight into the importance of mechanical and thermal properties of materials. Conduction processes and band structure in semiconductors are described in Chapter 11, and electrical properties of materials in Chapter 12. Chapter 13 surveys dielectric properties of insulators and follows with an explanation of piezoelectric, pyroelectric and ferroelectric phenomena. Finally, Chapter 14 addresses the magnetic properties of materials, and great attention is focused on magnetic ordering and ferromagnetism.
xxi