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Cryogenic measurements
Classified abstracts 847-857
III. Vacuum applications 30. Evaporation and sputtering 30 : 41 : 56 847. Capacitors with thin oxide film dielectrics. (Great Britain) The preparation of thin oxide dielectric films by vacuum deposition o f refractory metal oxides for the production of capacitors is described, and it is shown that the resulting products possess many desirable properties. B Walton, Electronic Engng, 37, June 1965, 384-387. 30 : 20 : 21 Vacuum evaporation practice. See abstract number 836. 30 : 21 Applications of ion pumping, titanium-getter pumping and cryogenic pumping in the construction of evaporation plant for the study of thin films, electron guns for the evaporation of the source. See abstract number 838. 30 : 56 Apparatus for the preparation of passive micro-circuits. See abstract number 873. 30 : 41 848. Vacuum-deposited thin-film circuits. (USA) Some practical details of a nichrome, silicon-oxide, aluminium thin-film process are discussed, including mask making, deposition, and testing. J C Karp, Electro-Technology, 75 (2), Feb 1965, 79-83. 30 : 41 849. Thin film thermoelectrics. (USA) Vacuum evaporation techniques were used to form thin films of thermoelectric alloys, including both n and p-type films having properties similar to those of the bulk alloys. The behaviour of vacuum deposited film thermocouples as low power dc generators was also investigated. Some advantages gained by application of the technique are considered. G Abowitz et al, Semiconductor Prod Solid State Technol, 8 (2),
Feb 1965, 18-22. 30 : 33 : 37 850. Vacuum ultraviolet reflectometer. (USA) Details are given of a reflectometer constructed for the study of BasTe. Special features include provisions for the preparation of thin-film samples, and subsequent measurement of their optical absorption and reflectivity without exposing the films to the atmosphere. C R Chubb and E B Hensley, Rev Scient Instrum, 36 (4), April 1965,
547-548. 30 : 33 : 37 851. Internal stress of evaporated thin gold films. (Japan) The character of a planar tensile stress observed in evaporated gold films has been investigated by means of bending method and X-ray diffraction. It has been found that stress increases with increasing film thickness in films thinner than 1000A and approaches to a certain value of the order of 109 dyne/cm 2 in thicker films. By annealing, the bending of the substrate increases, showing the increase of the stress in films, but the X-ray diffraction shows that the stress in crystal grains in films decreases. (Japan) A Kinbara and H Haraki, Jap J Appl Phys, 4 (4), April 1965,
243-249. 30 : 33 : 37 852. Determination of structure of thin films by electron microscope examination. (Belgium) In order to obtain information about the structure three different methods can be used. (1) Direct observation, the electron beam going through the deposed substance. (2) The replica method. (3) Biological method by making sections. The authors discuss essentially the technique used for making sections of thin metallic films of thickness between 200 and 500A-. (Belgium) W van Itterbeek and R Coppens, Revue de la Socidtd Royale des
lng~nieurs et des Industriels, (5), May 1965, 247, (in French). 30 : 33 : 37 853. Initial stages in formation of a thin, evaporated film. (Belgium) All properties of thin films are different from those corresponding to the bulk material, primarily due to difference in structure (itself closely dependent on mode of preparation) but also because of the high relative surface/volume ratio. Three methods of investigation of the early stages of film formation are used: electron diffraction in
UHV, measurement of electrical resistance, and condensation on a vacuum micro-balance. An answer is given to the question--can a simple criterion be found which gives the advance knowledge of the type of film structure in its initial stage of formation, knowing the materials of the substrate and of the film? (Germany) H Mayer, Revue de la Soci~td Royale Beige des lng~nieurs et des
lndustriels, (5), May 1965, 231, (in French). 30 : 34 854. Methods of monitoring and control of thin films during vacuum evaporation. (Belgium) Optical, electrical, nucleonic, space-research and metallurgical technologies are concerned with this problem. Various methods of photometric and gravimetric (piezo-electric microbalance) type are discussed and the applications of the two main groups are listed.
(France) B Saudreau, Revue de la Soci~t~ Royale Beige des Ing~nieurs et des
lndustriels, (5), May 1965, 239.
31. Evacuation and sealing 31 : 56 855. Historical development and present status of vacuum switches.
(Germany) The development of vacuum switches is reviewed, and the permissible field strength in relation to the electrode separation is considered, together with the physical phenomena associated with a vacuum arc. K Thiel, Vakuum-Tech, 14 (1), Feb 1965, 21-24, (in German).
32. Nucleonics 32 : 20 : 22 Diffusion pump oil deposition measurements utilizing radioactive tracers. See abstract number 837.
33. General physics and electronics 33 : 11
Ultra-high vacuum techniques. See abstract number 826. 33 : 18 Ion distribution in the drift region of tubular electron beams. See abstract number 829. 33 : 20 Vacuum design problems of high current electron storage rings. See abstract number 835. 33 : 22 : 25 Cryogenic measurements. See abstract number 844. 33 : 30 : 37 Vacuum ultraviolet reflectometer. See abstract number 850. 33 : 30 : 37 Internal stress of evaporated thin gold films. See abstract number 851. 33 : 30 : 37 Determination of structure of thin films by electron microscope examination. See abstract number 852. 33 : 30 : 37 Initial stages in formation of a thin, evaporated film. See abstract number 853. 33 : 20 856. Ultra-high vacuum for storage rings for 28-GeV protons. (USA) The basic concepts and design of a vacuum system for intersecting storage rings at about 10 -9 torr. G E Fischer, J Vacuum Sci Technol, 2 (3), May-June 1965, 142-
148. 33 : 37 857. Excitation of spin waves in thin ferromagnetic films. (Belgium) Describes use of a microwave spectrometer at a frequency of 9.000 mc/s to study spin waves in thin films of permalloy. The films were evaporated on heated substrates of either glass or quartz in a vacuum of 10 -9 mm Hg. The anomalies in the dispersion law and the influence of oxidation and reduction on the spin wave distribution are examined. The results seem to support the theory of volume inhomogeneity of the magnetization. (Belgium) J Witters et al, Revue de la Soci~td Royale Beige des Ingdnieurs et
des lndustriels, (5), May 1965, 228.
34. High altitude and space technology 34 : 30 Methods of monitoring and control of thin films during vacuum evaporation. See abstract number 854.
523
III. Vacuum applications 30. Evaporation and sputtering 30 : 41 : 56 847. Capacitors with thin oxide film dielectrics. (Great Britain) The preparation of thin oxide dielectric films by vacuum deposition o f refractory metal oxides for the production of capacitors is described, and it is shown that the resulting products possess many desirable properties. B Walton, Electronic Engng, 37, June 1965, 384-387. 30 : 20 : 21 Vacuum evaporation practice. See abstract number 836. 30 : 21 Applications of ion pumping, titanium-getter pumping and cryogenic pumping in the construction of evaporation plant for the study of thin films, electron guns for the evaporation of the source. See abstract number 838. 30 : 56 Apparatus for the preparation of passive micro-circuits. See abstract number 873. 30 : 41 848. Vacuum-deposited thin-film circuits. (USA) Some practical details of a nichrome, silicon-oxide, aluminium thin-film process are discussed, including mask making, deposition, and testing. J C Karp, Electro-Technology, 75 (2), Feb 1965, 79-83. 30 : 41 849. Thin film thermoelectrics. (USA) Vacuum evaporation techniques were used to form thin films of thermoelectric alloys, including both n and p-type films having properties similar to those of the bulk alloys. The behaviour of vacuum deposited film thermocouples as low power dc generators was also investigated. Some advantages gained by application of the technique are considered. G Abowitz et al, Semiconductor Prod Solid State Technol, 8 (2),
Feb 1965, 18-22. 30 : 33 : 37 850. Vacuum ultraviolet reflectometer. (USA) Details are given of a reflectometer constructed for the study of BasTe. Special features include provisions for the preparation of thin-film samples, and subsequent measurement of their optical absorption and reflectivity without exposing the films to the atmosphere. C R Chubb and E B Hensley, Rev Scient Instrum, 36 (4), April 1965,
547-548. 30 : 33 : 37 851. Internal stress of evaporated thin gold films. (Japan) The character of a planar tensile stress observed in evaporated gold films has been investigated by means of bending method and X-ray diffraction. It has been found that stress increases with increasing film thickness in films thinner than 1000A and approaches to a certain value of the order of 109 dyne/cm 2 in thicker films. By annealing, the bending of the substrate increases, showing the increase of the stress in films, but the X-ray diffraction shows that the stress in crystal grains in films decreases. (Japan) A Kinbara and H Haraki, Jap J Appl Phys, 4 (4), April 1965,
243-249. 30 : 33 : 37 852. Determination of structure of thin films by electron microscope examination. (Belgium) In order to obtain information about the structure three different methods can be used. (1) Direct observation, the electron beam going through the deposed substance. (2) The replica method. (3) Biological method by making sections. The authors discuss essentially the technique used for making sections of thin metallic films of thickness between 200 and 500A-. (Belgium) W van Itterbeek and R Coppens, Revue de la Socidtd Royale des
lng~nieurs et des Industriels, (5), May 1965, 247, (in French). 30 : 33 : 37 853. Initial stages in formation of a thin, evaporated film. (Belgium) All properties of thin films are different from those corresponding to the bulk material, primarily due to difference in structure (itself closely dependent on mode of preparation) but also because of the high relative surface/volume ratio. Three methods of investigation of the early stages of film formation are used: electron diffraction in
UHV, measurement of electrical resistance, and condensation on a vacuum micro-balance. An answer is given to the question--can a simple criterion be found which gives the advance knowledge of the type of film structure in its initial stage of formation, knowing the materials of the substrate and of the film? (Germany) H Mayer, Revue de la Soci~td Royale Beige des lng~nieurs et des
lndustriels, (5), May 1965, 231, (in French). 30 : 34 854. Methods of monitoring and control of thin films during vacuum evaporation. (Belgium) Optical, electrical, nucleonic, space-research and metallurgical technologies are concerned with this problem. Various methods of photometric and gravimetric (piezo-electric microbalance) type are discussed and the applications of the two main groups are listed.
(France) B Saudreau, Revue de la Soci~t~ Royale Beige des Ing~nieurs et des
lndustriels, (5), May 1965, 239.
31. Evacuation and sealing 31 : 56 855. Historical development and present status of vacuum switches.
(Germany) The development of vacuum switches is reviewed, and the permissible field strength in relation to the electrode separation is considered, together with the physical phenomena associated with a vacuum arc. K Thiel, Vakuum-Tech, 14 (1), Feb 1965, 21-24, (in German).
32. Nucleonics 32 : 20 : 22 Diffusion pump oil deposition measurements utilizing radioactive tracers. See abstract number 837.
33. General physics and electronics 33 : 11
Ultra-high vacuum techniques. See abstract number 826. 33 : 18 Ion distribution in the drift region of tubular electron beams. See abstract number 829. 33 : 20 Vacuum design problems of high current electron storage rings. See abstract number 835. 33 : 22 : 25 Cryogenic measurements. See abstract number 844. 33 : 30 : 37 Vacuum ultraviolet reflectometer. See abstract number 850. 33 : 30 : 37 Internal stress of evaporated thin gold films. See abstract number 851. 33 : 30 : 37 Determination of structure of thin films by electron microscope examination. See abstract number 852. 33 : 30 : 37 Initial stages in formation of a thin, evaporated film. See abstract number 853. 33 : 20 856. Ultra-high vacuum for storage rings for 28-GeV protons. (USA) The basic concepts and design of a vacuum system for intersecting storage rings at about 10 -9 torr. G E Fischer, J Vacuum Sci Technol, 2 (3), May-June 1965, 142-
148. 33 : 37 857. Excitation of spin waves in thin ferromagnetic films. (Belgium) Describes use of a microwave spectrometer at a frequency of 9.000 mc/s to study spin waves in thin films of permalloy. The films were evaporated on heated substrates of either glass or quartz in a vacuum of 10 -9 mm Hg. The anomalies in the dispersion law and the influence of oxidation and reduction on the spin wave distribution are examined. The results seem to support the theory of volume inhomogeneity of the magnetization. (Belgium) J Witters et al, Revue de la Soci~td Royale Beige des Ingdnieurs et
des lndustriels, (5), May 1965, 228.
34. High altitude and space technology 34 : 30 Methods of monitoring and control of thin films during vacuum evaporation. See abstract number 854.
523