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Deferred state sampling procedures
Microelectronics and Reliability
Pergamon Press 1971. Vol. 10, pp. 301-313.
Printed in Great Britain
WORLD ABSTRACTS ON MICROELECTRONICS A N D RELIABILITY THE abstracts below are given in reasonable detail where necessary so that an appreciation can be made of the coverage of the article. They are probably the most comprehensive detailed abstracts published in these two fields and in general are all of articles published within the last 12 months. They are classified into the following sections.
Subjects: 1. 2. 3. 4. 5. 6. 7. 8. 9.
Reliability--General. Reliability of Components, Tubes, Transistors and ICs. Circuit and Systems Reliability, Maintenance and Redundancy. Microelectronics--General. Microelectronics--Design and Construction. Microelectronics--Components, Systems and Equipments. Semiconductor Integrated Circuits, Devices and Materials. Thick- and T h i n - F i l m Circuits and Materials. Electron, Ion and Laser Beams.
Abstracts marked * are acknowledged from R and D Abstracts, published by Mintech Reports Centre (TRC), Orpington, Kent. 1. R E L I A B I L I T Y - - G E N E R A L
Deferred state sampling procedures. A. W. WORTHAM and R. C. BAKER, Proc. Ann. Syrup. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R 12-14 January (1971), p. 64. This paper is concerned with attribute sampling inspection procedures in which the decision criteria for each lot dictates one of three dispositions: (1) accept the lot, (2) reject the lot, or (3) defer the decision until disposition of future lots are known. Deferred state sampling procedures will be classified as one of several types of dependent state sampling procedures developed within recent years. T h e first of these, called chain sampling, was developed by H. F. Dodge and K. S. Stephens. More recently, in 1969, A. W. Wortham and J. M. Mogg developed a dependent stage sampling procedure and exponentially smoothed sampling procedure. T h e primary objective of most dependent state sampling procedures was to give consideration of the quality of previously inspected lots in the judgement criteria of a current lot, with respect to acceptance or rejection of this lot. Deferred state sampling procedures, on the other hand, give consideration to the quality of future inspection lots.
Engineering application of failure data. S. J. I~ENE, JR., Proc. Ann. Syrup. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12-14 Januat~y (1971), p. 104 Reliability analysis often degenerates into a numbers 301
game completely isolated from design. Once failure rate data is derived, it must be used in an engineering manner to evaluate design. T h i s paper discusses failure rate data - - i t s significance, the uncertainty inherent in it and its usefulness. A specific application of failure rate data is then shown to have a strong impact on measuring and increasing design reliability and maintainability.
A Bayesian time-to-failure distribution. J. H. ENGLEMAN, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12-14 January (1971), p. 350. T h e paper derives a Bayesian time-to-failure distribution and applies it to burn-in and reliability prediction. T h e distribution is shown to yield a decreasing failure rate and a mean-time-to-failure which may not be finite. Other properties are discussed and compared with those of the Weibull distribution. A graphical estimation technique is introduced and used in an example.
Economic formulation of reliability objectives. H. HECHT, Proc. Ann. Syrup. Reliab., Washington DC, U.S.A. I E E E Cat. No. 71C 2-R. 12-14 January (1971), p. 280. Whether he works on consumer products, in the public service area, or in the increasingly budgetconscious aerospace industry, the reliability engineer finds it necessary today to explain the objectives of his
Pergamon Press 1971. Vol. 10, pp. 301-313.
Printed in Great Britain
WORLD ABSTRACTS ON MICROELECTRONICS A N D RELIABILITY THE abstracts below are given in reasonable detail where necessary so that an appreciation can be made of the coverage of the article. They are probably the most comprehensive detailed abstracts published in these two fields and in general are all of articles published within the last 12 months. They are classified into the following sections.
Subjects: 1. 2. 3. 4. 5. 6. 7. 8. 9.
Reliability--General. Reliability of Components, Tubes, Transistors and ICs. Circuit and Systems Reliability, Maintenance and Redundancy. Microelectronics--General. Microelectronics--Design and Construction. Microelectronics--Components, Systems and Equipments. Semiconductor Integrated Circuits, Devices and Materials. Thick- and T h i n - F i l m Circuits and Materials. Electron, Ion and Laser Beams.
Abstracts marked * are acknowledged from R and D Abstracts, published by Mintech Reports Centre (TRC), Orpington, Kent. 1. R E L I A B I L I T Y - - G E N E R A L
Deferred state sampling procedures. A. W. WORTHAM and R. C. BAKER, Proc. Ann. Syrup. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R 12-14 January (1971), p. 64. This paper is concerned with attribute sampling inspection procedures in which the decision criteria for each lot dictates one of three dispositions: (1) accept the lot, (2) reject the lot, or (3) defer the decision until disposition of future lots are known. Deferred state sampling procedures will be classified as one of several types of dependent state sampling procedures developed within recent years. T h e first of these, called chain sampling, was developed by H. F. Dodge and K. S. Stephens. More recently, in 1969, A. W. Wortham and J. M. Mogg developed a dependent stage sampling procedure and exponentially smoothed sampling procedure. T h e primary objective of most dependent state sampling procedures was to give consideration of the quality of previously inspected lots in the judgement criteria of a current lot, with respect to acceptance or rejection of this lot. Deferred state sampling procedures, on the other hand, give consideration to the quality of future inspection lots.
Engineering application of failure data. S. J. I~ENE, JR., Proc. Ann. Syrup. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12-14 Januat~y (1971), p. 104 Reliability analysis often degenerates into a numbers 301
game completely isolated from design. Once failure rate data is derived, it must be used in an engineering manner to evaluate design. T h i s paper discusses failure rate data - - i t s significance, the uncertainty inherent in it and its usefulness. A specific application of failure rate data is then shown to have a strong impact on measuring and increasing design reliability and maintainability.
A Bayesian time-to-failure distribution. J. H. ENGLEMAN, Proc. Ann. Symp. Reliab., Washington DC, U.S.A. IEEE Cat. No. 71C 2-R. 12-14 January (1971), p. 350. T h e paper derives a Bayesian time-to-failure distribution and applies it to burn-in and reliability prediction. T h e distribution is shown to yield a decreasing failure rate and a mean-time-to-failure which may not be finite. Other properties are discussed and compared with those of the Weibull distribution. A graphical estimation technique is introduced and used in an example.
Economic formulation of reliability objectives. H. HECHT, Proc. Ann. Syrup. Reliab., Washington DC, U.S.A. I E E E Cat. No. 71C 2-R. 12-14 January (1971), p. 280. Whether he works on consumer products, in the public service area, or in the increasingly budgetconscious aerospace industry, the reliability engineer finds it necessary today to explain the objectives of his