Determination of K shell absorption jump factors and jump ratios of 3d transition metals by measuring K shell fluorescence parameters

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Determination of K shell absorption jump factors and jump ratios of 3d transition metals by measuring K shell fluorescence parameters M.R. Kacal, I. Han, F. Akman

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S0969-8043(14)00366-2 http://dx.doi.org/10.1016/j.apradiso.2014.10.012 ARI6799

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Applied Radiation and Isotopes

Received date: 24 June 2014 Revised date: 10 October 2014 Accepted date: 11 October 2014 Cite this article as: M.R. Kacal, I. Han, F. Akman, Determination of K shell absorption jump factors and jump ratios of 3d transition metals by measuring K shell fluorescence parameters, Applied Radiation and Isotopes, http://dx.doi.org/ 10.1016/j.apradiso.2014.10.012 This is a PDF file of an unedited manuscript that has been accepted for publication. As a service to our customers we are providing this early version of the manuscript. The manuscript will undergo copyediting, typesetting, and review of the resulting galley proof before it is published in its final citable form. Please note that during the production process errors may be discovered which could affect the content, and all legal disclaimers that apply to the journal pertain.

Determination of K shell absorption jump factors and jump ratios of 3d transition metals by measuring K shell fluorescence parameters

M.R. Kacal1*, I. Han2, F. Akman3 1

2

Faculty of Sciences and Arts, Department of Physics, Giresun University, 28100 Giresun, Turkey Faculty of Sciences and Arts, Department of Physics, Ar brahim Çeçen University, 04100 Ar, Turkey 3 Bingöl University, Vocational School of Technical Sciences, Department of Electronic Communication Technology, 12000 Bingöl, Turkey.

*

Corresponding author.Tel./fax: +90 4543102805. E-mail address: [email protected].

Abstract Energy dispersive X-ray fluorescence technique (EDXRF) has been employed for measuring K-shell absorption jump factors and jump ratios for Ti, Cr, Fe, Co, Ni and Cu elements. The jump factors and jump ratios for these elements were determined by measuring K shell fluorescence parameters such as the KD X-ray production cross-sections, K shell fluorescence yields, KE-to-KD X-rays intensity ratios, total atomic absorption cross sections and mass attenuation coefficients. The measurements were performed using a Cd-109 radioactive point source and an Si(Li) detector in direct excitation and transmission experimental geometry. The measured values for jump factors and jump ratios were compared with theoretically calculated and the ones available in the literature.  Keywords: XRF, EDXRF jump factor, jump ratio, K shell fluorescence parameters

1.

Introduction X-ray fluorescence (XRF) spectrometry is used world-wide. The most established

technique is energy dispersive X-ray fluorescence (EDXRF) for quantitative analysis because EDXRF is relatively inexpensive and requires less technical effort to run the system (Han and Demir, 2010). EDXRF is very useful for determination of XRF parameters such as production cross sections, fluorescence yields, intensity ratios, mass attenuation coefficients, total atomic absorption cross sections and jump ratio and jump factor etc. Accurate values of these parameters are required in several fields such as atomic, molecular and radiation physics, material

science,

environmental

science,

agriculture,

forensic

science,

dosimetric

computations for health physics, cancer therapy, elemental analysis, basic studies of nuclear physics, etc. A vacancy in the inner shell of an atom is produced by various methods; photoionization (photoelectric process) is one of them. The photoelectric process is an important process of 1

absorption of gamma photons in matter; in this process, the incident gamma photon is completely absorbed and a bound electron is ejected from continuum state of atom, creating a vacancy in the inner shell. The photoelectric process is significant at low energy ( 100 keV) and for high-Z target. The total photoelectric cross section can be determined by transmission experiment of photons in a target. A plot of photoelectric cross section versus energy of a photon for a given target element gives a saw tooth structure. When K-shell electrons are involved in the photoelectric process, the energy corresponding to the steep fall of the saw tooth structure gives the K-shell binding energy or K absorption edge. The lower energy branch gives the cross section corresponding to L and higher shells, and upper energy branch corresponding to that due to K shell and higher shells. The ratio of cross section at the upper energy branch and that at lower energy branch gives the K-shell jump ratio and the difference gives the K-shell photoelectric cross section at K edge. Absorption jump factor and jump ratios are some of the important parameters related to emission and absorption of fluorescent x-rays and accurate values of these parameters are needed because of their numerous applications in various fields (Lachanca and Claisse, 1995). Review of literature shows that four methods are adopted for measuring the K-shell jump ratio and jump factors: the gammaray attenuation method, the attenuation of Compton scattered photons, the energy dispersive x-ray fluorescence method and the bremsstrahlung transmission method. Several researchers have used the above methods for determining the K-shell jump ratio and jump factor. The K shell absorption jump factors and jump ratios for Tm, Yb, Lu, Hf, Ta, W, Re and Os (Mallikarjuna et al., 2002); and K jump ratios for La, Ce, Pr, Nd, Sm, Gd, Dy, Ho and Er (Kaya et al., 2007) have been measured using the gamma-ray attenuation method. In the gamma-ray attenuation method, the attenuation of gamma photons of different energies around the K absorption edge is measured and K-shell absorption jump factors and jump ratios were derived from mass attenuation coefficient measurements. The Compton scattering attenuation method is based on simultaneous measurement of fluorescence radiation and scattered radiation. The Compton scattering photons by an Al scatterer is used as a primer source and this primer gamma ray has been send to absorbers and total mass attenuation coefficients can be obtained. Ayala and Mainardi (1996) have measured the K X-ray absorption jump ratio of Er by attenuation of a Compton peak using HPGe detector and Am-241 radioactive source. The X-ray absorption jump factor and jump ratios for Gd, Dy, Ho and Er have been determined by measuring the attenuation of Compton scattered photons with a Si(Li) detector, Am-241 gamma rays and Al secondary exciter (Budak and Poalt, 2004). 2

In the energy dispersive x-ray fluorescence method, some K shell fluorescence parameters such as the K production cross sections, K shell X-ray fluorescence yields and KEto-KD X ray intensity ratios are measured by creating K-shell vacancies with a radioactive source or X ray tube and the jump factors and jump ratios are derived using these parameters. The jump ratios and jump factors for Zr, Mo, Pd, Ag, Sb, Ce and Nd with Si(Li) detector and Am-241 radioactive point source (Erturul et al., 2002), for Nb, Tc, Ru, Rh, Cd, In, Sn, Te, Pr, Pm, Sm, Eu, Gd, Tb, Dy, Ho and Er with Si(Li) detector and Am-241 radioactive point source (Budak et al., 2003), for Tm, Yb, Lu, Hf, Ta, W, Re and Os with Ultra-LEGe detector and Co-57 radioactive annular source (Kaya et al., 2008), for Mn, Fe, Co, Cu, Zn, As and Sr with X-PIPS Si(Li) detector andAm-241 radioactive point source (Sidhu et al., 2011) have been measured using energy dispersive x-ray fluorescence method. In bremsstrahlung transmission method, continuous bremsstrahlung radiation from a weak beta source is allowed to pass through a thin target. The transmitted bremsstrahlung spectrum shows a sudden drop in intensity at the K shell binding energy of the target atom. From this sudden drop, the K shell absorption jump factor has been measured. Recently, Nayak and Badiger, (2006) have determined K shell absorption jump factor for Hf, Ta, Au and Pb by using the bremsstrahlung radiation from a single weak source and later Bennal and Badiger, (2007) have adopted a 2S geometrical configuration measuring K shell absorption jump factors for Mo, Ag, Cd, In and Sn using a single weak gamma source and a single target of each element. The present experimental study is on measurements of K-shell absorption jump factors and jump ratios for elements Ti, Cr, Fe, Co, Ni and Cu using the EDXRF method. This paper presents the first measurement of these parameters for the studied elements using the experimental values of the K shell fluorescence parameters such as the KD X-ray production cross-sections, K shell fluorescence yields, KE-to-KD X-rays intensity ratios, total atomic absorption cross sections and mass attenuation coefficients, the present weak gamma source and detector in energy dispersive X-ray fluorescence technique. 2.

Theory When a beam of photons of intensity I0 passed through a target of mass thickness t, the

transmitted intensity I is given by the Beer–Lambert formula I

I o e  ( P / U )t

(1)

3

where / is the mass attenuation coefficient,  is the density of mass. The total atomic cross section t is related to / by (Han and Demir, 2009);

Vt

(P / U )

N NA

(2)

where N is the atomic mass of target materials and NA is the Avogadro’s number. Because of variation of t versus photon energy, it gives a saw-tooth curve around the K shell of the binding energy of the target atom. This curve has three regions: a lower energy branch, a sudden increase in the K shell binding energy and an upper energy branch. The lower energy branch corresponds to the total atomic photoelectric cross section due to L, M and higher shells. The upper energy branch corresponds to the total atomic photoelectric cross section due to K, L, M and higher shells. The sudden increase is essentially due to the onset of the K shell photoelectric cross section. The difference between the cross section corresponding to the upper energy branch and the lower energy branch gives the K shell photoelectric cross section and the ratio gives the K shell absorption jump ratio rK and is given by;

rK

W K  (W L  W L  W L )  ...  W L  W L )  (W M  W M  W M  ...)  ... I

(W L I

II

II

III

III

I

II

(3)

III

where i is the photoelectric cross section for the shell i. The K shell absorption jump factor is the probability that a K shell electron will be ejected from the target element rather than any other shells and is defined as the fraction of the total absorption that is associated with a given shell rather than for any other shell.

JK

W K  (W L  W L  W L I

II

III

WK )  (W M  W M  W M  ...)  ... I

II

(4)

III

The K shell absorption jump factor JK is related to the K shell absorption jump ratio rK through the relation, JK

1  rK 1

(5)

4

3. Measurement and Computation Method 3.1. Measurement of absorption edge jump factor (JK) and jump ratio (rK)

K-shell jump factor, JK, of an element has been derived using the following relation (Erturul et al., 2002); JK

V KD (V t  V ts )Z K FKD

(6)

where V KD V t and V ts are KD X-ray production cross-section, total atomic interaction crosssection and total scattering cross-section at incident photons of energy, respectively, Z K is the K-shell fluorescence yield and FKD the fraction of KD X-ray emission rates. The values of jump ratios, rK can be evaluated presently measured values of JK using the Eq. 5. In this study K-shell jump factors for elements Ti, Cr, Fe, Co, Ni and Cu have been measured by making use of the measured values of the parameters V KD , V t , FKD and Z K and by using the theoretically calculated values of V ts (Gerward et al., 2001, 2004). It is to be noted here that in order to measure FKD , the KE X-rays production cross-sections, V K E have also been measured along with V KD . Subsequent paragraphs describe the measurement of these parameters. 3.2. Measurement of Ki X-ray production cross-section (i=D, E)

For the measurements of VKi (i=D, E), target elements of Ti, Cr, Fe, Co, Ni and Cu in the form of circular discs of 13 mm diameter have been irradiated with 22.6 keV -rays emitted from 10 mCi Cd-109 source in a geometrical setup shown in Figure 1. The K-shell fluorescence Xrays emitted from targets measured by a high resolution liquid nitrogen cooled Si(Li) detector (FWHM = 160 eV at 5.9 keV, active area 12mm2, sensitive crystal depth 3mm and Be window thickness 0.025mm) coupled with a multichannel analyzer system supplied by CANBERRA, USA and spectroscopy amplifier. The Si(Li) detector has 0.025 mm Be (beryllium) window to protect it from the moisture since the detector material is hygroscopic. The detector was also placed in a step-down shield made from Pb (4.2 mm), Fe (1.1 mm) and Al (1 mm) to minimize the detection of any radiation coming directly from the source and scattered from the surroundings. The present samples have high purities (99.5%- 99.9%) and mass thicknesses (or areal densities) ranging from 0.16 to 0.32 g/cm2. The areal density (mass per unit area) of samples were determined by weighing it using a precision balance with an 5

accuracy of 0.0001 mg and measuring its dimensions using a micrometer with an accuracy of 0.01 cm. The peak areas have been calculated from the spectrum obtained for each measurement. The each spectrum was recorded for sufficient time to accumulate an adequate number of counts under the photo peak to limit the uncertainty of <1%. The spectrums were analyzed by using Microcal Origin 7.5 Demo Version software program with least-squares fit method. To determine the net peak areas, the areas under the peak Gaussian function were subtracted to correct for background in the peak region. A typical K-shell X-ray spectrum of Fe is shown in Figure 2. The experimental Ki X-ray fluorescence cross sections were evaluated using the relation:

V Ki

N Ki I 0GH Ki E t

i D, E

(7)

where NKi is the net number of counts under the corresponding photopeak, the product I0G is the intensity of the exciting radiation falling on the area of the target samples visible to the detector, H Ki , is the detector efficiency for Ki X-rays, t is the areal mass of the sample in g/cm2 and  is the self-absorption correction factor for the incident photons and emitted K Xray photons.  was calculated using the relation:

E

1  exp ª¬   Pi / cos T1  Pe / cos T 2 t º¼ ( Pi / cos T1  Pe / cos T 2 )t

where Pi and P e

(8)

are the mass attenuation coefficients (cm2/g) of incident photons and

emitted characteristic X-rays, respectively. T1 andT are the angles of incident photons and emitted X-rays with respect to the normal at the surface of the sample in the present setup and t is the mass thickness of the sample in g/cm2. To estimate the self-absorption correction in the sample and the absorption correction in the air path, We used the mass attenuation coefficients obtained by means of a computer program named WINXCOM (Gerward et al., 2001, 2004) which is based on the DOS-based compilation of XCOM developed by Berger and Hubbell, (1987, 1999) for calculating mass attenuation coefficients or photon interaction cross-section for any element, compound, or mixture at energies 1 keV to 100 GeV. This program uses mixture rule to calculate the partial and total mass attenuation coefficients for all elements, compounds, and mixtures at standard as well as selected energies.

6

3.3. Measurement of geometrical efficiency factor (I0GHKi)

In this study, value of the effective incident photon flux factor (I0GHKi) in Eq. 7, which contains the terms related to flux of photons emitted from the Cd-109 radioactive point source, geometrical factor and absolute efficiency of detector, has been determined by measuring t; E and the K X-ray intensities from thin samples of Ca, V, Mn, Zn, Ge, As and Br having the same size as the investigated targets and using theoretical VKi values; I 0GH Ki

N Ki

(9)

V Ki E Ki t

where the various terms have the same meaning as those explained in Eq. 7, except that i is the Ki X-ray production cross section of target. The measured I0GHKi values for the present geometry were plotted as a function of the mean K X-ray energy in Fig. 3. The theoretical K X-ray fluorescence cross-sections VKi were calculated using the fundamental parameter equation:

V Ki

V K ( E )Z K FKi

(10)

where V K ( E ) is the K-shell photoionization cross-section for the given elements at the excitation energy E (Scofield, 1973) and Z K is the fluorescence yield of the K-shell line (Hubbel, 1994) and FKi is the fractional ratio of the Ki X-rays (Scofield, 1974). 3.4. Measurement of fraction of KD X-ray emission rates ( FKD )

The fraction of Ki (i= D, E) X-ray radiative rates, FKi , for investigated elements has been defined using the following relations: FKD

(1 

IKE I KD

) 1

and FK E

(1 

I KD 1 ) IKE

(11)

where IKD and IKEare the measured intensities of KD and KE X-rays of elements, respectively. I

The KE-to-KD X-ray intensity ratio I KKDE , were evaluated using the equation IKE I KD

N K E E KD H KD N KD E K E H K E

(12)

where H KD and H K E are the detector-efficiency values for the KD and KE X-rays, respectively, others terms have the same meaning as explained earlier in Eq. 7 but for KE X-rays. 7

3.5. Measurement of the K-shell fluorescence yield ( Z K )

The fluorescence yield of an atomic shell or subshell is defined as the probability that a vacancy in that shell or subshell is filled through a radiative transition. Thus, for a sample containing many atoms, the fluorescence yield of a shell is equal to the number of photons emitted when vacancies in the shell are filled divided by the number of primary vacancies in the shell. The average K-shell fluorescence yields for elements under study were derived from the measured Ki X-ray fluorescence cross sections using the relationship:

ZK

V Ki

(13)

V K (E)

3.6. Measurement of total atomic interaction cross-sections (Vt)

The mass attenuation coefficients for the different materials are determined by performing transmission experiments by employing the geometry shown in Figure 4. This process is described by the following equation from Eq. 1. (P / U )

ln( I / I o ) t

(14)

where I o and I are the un-attenuated and attenuated photon intensities,   (cm2/g) is the mass attenuation coefficient and t (g/cm2) is sample mass thickness (the mass per unit area). For each sample and energy, Io and I intensities which are without and after attenuation were measured by a Si(Li) detector. The samples were placed individually between the source and the detector. The distance between the radioactive point source with sample and the sample and Beryllium window of Si(Li) detector were 14 and 1 cm, respectively. The measurements for all types of samples were carried out five times.

Photon spectra were recorded in the

following order: firstly, source spectrum recorded with source but without sample and the incident spectrum (without attenuation) was obtained. The transmitted spectrum recorded with source and sample and the transmitted spectrum I (after attenuation) was obtained. In both the spectra the photo-peak had Gaussian distribution. Finally, by integrating the incident spectrum and the transmitted spectrum over selected width of the photo-peak, incident intensity I0 and transmitted intensity I were obtained. The stability and possibility to be recreated of the experimental arrangement was tested before and after measurements. The total atomic cross-

8

sections ( V t ) for samples can be obtained using mass attenuation coefficient ( P / U ) values in Eq. 2. 4. Result and Discussion

The K shell jump factors ( J K ) and jump ratios, ( rK ) have been determined by measuring K shell fluorescence parameters such as the Ki X-ray production cross-sections ( V KD , V K E ), K I

shell fluorescence yields ( Z K ), KE-to-KD X-rays intensity ratios ( I KKDE ) and mass attenuation coefficients ( P / U ) , total atomic interaction cross sections ( V t ). These parameters were obtained by using the Ki X-ray intensity and the incident intensity I0, transmitted intensity I measurements were performed using a Cd-109 radioactive point source and a Si(Li) detector in transmission and direct excitation experimental geometry, respectively. In Table 1, the measured and theoretical values of KD X-ray production cross-sections ( V KD ), K shell I

fluorescence yields ( Z K ), KE-to-KD X-rays intensity ratios ( I KKDE ), total atomic interaction cross sections ( V t ), mass attenuation coefficients ( P / U ) and the total atomic scattering cross-section ( V ts ) were given. Also they are plotted as functions of the atomic number in Figure 5. For present elements, the measured values of K shell jump factors and jump ratios along with the calculated (Chantler et al., 2005) and the experimental data (Chantler et al., 2001; Sidhu et al., 2011) have been tabulated in Table 2 and were plotted versus the atomic number in Figure 6. From these Tables and Figure, it is found that the measured values are in good agreement with the theoretically calculated as well as the other experimental values within experimental uncertainties. The overall estimated error associated with the present measurement is of the order of ~6%, which includes uncertainty involved in the evaluation of different parameters such as area under photopeak, NKi (i.e. statistical error ~2%), non-uniform target thickness, t, and selfabsorption correction factor, E, ~2–3%, detector efficiency and geometrical factor (effective incident photon flux factor), I0GHKi, ~5%, etc. Uncertainties in the present measurements have been calculated by taking properly the propagation of errors in various measured quantities. The present experimental study has been undertaken to get some information on the K shell jump factors ( J K ) and jump ratios, ( rK ) and related X-ray fluorescence parameters ( V KD , Z K , IKE I KD

, V t , P / U etc.) for Ti, Cr, Fe, Co, Ni and Cu elements.

The results have been 9

demonstrated that the X-ray fluorescence parameters are a useful and sensitive physical quantities to determine the J K and rK values and energy dispersive X-ray fluorescence method can be employed reliability for measuring K-shell absorption jump factors and jump ratios. To the best of the authors’ knowledge, the present measurements for the present elements have been reported for the first time using the present radioactive source in energy dispersive x-ray fluorescence technique. However, more experimental and calculated data for the values of J K and rK for present elements are needed in order to have a further check for the accuracy and reliability of obtained values, the results of this work can stimulate both experimental and theoretical research on the K-shell absorption jump factors and jump ratios for various elements using the EDXRF method or different methods. References

Ayala, A.P., Mainardi, R.T., 1996. Measurement of the K X-ray absorption jump ratio of erbium by attenuation of a Compton peak. Radiat. Phys. Chem. 47, 177–181. Bennal, A.S., Badiger, N.M., 2007. Measurement of K shell absorption and fluorescent parameters for elements Mo, Ag, Cd, In and Sn using a weak gamma source. J. Phys. B: At. Mol. Opt. Phys. 40, 2189–2199. Berger, M.J., Hubbell, J.H., 1987. XCOM: photon cross sections on a personal computer. NBSIR 87–3597, (National Bureau of Standards Gaithersburg, MD. Berger, M.J., Hubbell, J.H., Seltzer, S.M., Coursey, J.S., Zucker, D.S., 1999. XCOM: photon cross section database (version 1.2), National Institute of Standards and Technology, Gaithersburg, MD, available at /http://physics.nist.gov/xcomS. Budak, G., Karabulut, A., Ertugrul, M., 2003. Determination of K-shell absorption jump factor for some elements using EDXRF Technique. Radiat. Meas. 37, 103–107. Budak, G., Polat, R., 2004. Measurement of the K X-ray absorption jump factors and jump ratios of Gd, Dy, Ho and Er by attenuation of a Compton peak. J. Quant. Spectrosc. Radiat. Transfer 88, 525–532. Chantler, C.T., Olsen, K,. Dragoset, R.A., Chang, J., Kishore, A.R., Kotochigova, S.A., Zucker, D.S., 2005. X-ray Form Factor, Attenuation and Scattering Tables (version 2.1), National Institute of Standards and Technology, Gaithersburg, MD. [Online] Available: http://physics.nist.gov/ffast [2010, August 22]. Chantler, C.T., Tran,C.Q., Barnea, Z., Paterson,D., Cookson, D.J., Balaic, D.X., 2001. Measurement of the X-ray mass attenuation coefficient of coppe rusing 8.85–20 keV synchrotron radiation. Phys.Rev.A 64 062506 - 1–15. Erturul, M., Karabulut, A., Budak, G., 2002. Measurement of the K shell absorption jump factor of some elements. Radiat. Phys. Chem. 64, 1–3. Gerward, L, Guilbert, N, Jensen, K B, Levring, H, 2001. X-ray absorption in matter Reengineering XCOM. Radiat. Phys. Chem. 60, 23–24. Gerward, L, Guilbert, N, Jensen, K B, Levring, H, 2004. WinXCom—a program for calculating X-ray attenuation coefficients. Radiat. Phys. Chem. 71, 653–654. Han, I., Demir, L., 2010. Alloying effect on K to L shell vacancy transfer probabilities in 3d transition metals. Radiat. Phys. Chem. 79, 1174–1179. 10

Han, I., Demir, L., Sahin, M., 2009. Determination of mass attenuation coefficients, effective atomic and electron numbers for some natural minerals. Radiat. Phys. Chem. 78, 760– 764. Hubbell, J.H., Trehan, P.N., Singh, N., Chand, B., Mehta, D., Garg, M.L., Garg, R.R., Singh, S., Puri, S., 1994. A review, bibliography, and tabulation of K, L, and higer atomic shell X-ray fluorescence yields. J. Phys. Chem. Ref. Data 23, 339–365. Kaya, N., Trasoglu, E., Apaydn, G., 2008. Determination of K shell absorption jump factors and jump ratios in the elements between Tm(Z = 69) and Os(Z = 76) by measuring K shell fluorescence parameters. Nucl. Instrum. Methods B 266, 1043–1048. Kaya, N., Trasoglu, E., Apaydn, G., Aylkc, V., Cengiz, E., 2007. K-shell absorption jump factors and jump ratios in element between Tm (Z=69) and Os (Z=76) derived from new mass attenuation coefficient measurements. Nucl. Instrum. Methods B 262, 16–23. Lachance, G.R., Claisse, F., 1995. Quantitative X-Ray Fluorescence Analysis. Theory and Application. Wiley, Chischester, England. Mallikarjuna, M.,.L., Appaji Gowda, S.B., Gowda, R., Umesh, T.K., 2002. Study on photon interaction around the K-edge of some rare earth elements. Radiat. Phys. Chem. 65, 217–223. Nayak, S.V., Badiger, N.M., 2006. A novel method for measuring K shell photoelectric parameters of high Z elements. J. Phys. B: At. Mol. Opt. Phys. 39, 2893–2900. Scofield, J.H., 1973. Theoretical photoionization cross-sections from 1 to 1500 keV. Report No. UCRL 51326. Lawrence Livermore Laboratory, Livermore, CA. Scofield, J.H., 1974. Exchange correction of K X-ray emission rates. Phys. Rev. A 9, 1041– 1049. Sidhu Baltej, Singh, Dhaliwal, A.S., Mann, K.S., Kahlon, K.S., 2011. Measurement of Kshell absorption edge jump factors and jump ratios of some medium Z elements using EDXRF technique. Radiat. Phys. Chem. 80, 28–32.

Figure Caption

Figure 1. Schematic diagram of direct excitation geometry. Figure 2. A typical K-shell X-ray spectrum of Fe. Figure 3. I0GH values versus mean K X-ray energy Figure 4. Schematic diagram of linear transmission geometry. Figure 5. The experimental and theoretical values of X-ray fluorescence parameters ( V KD , Z K , and V t ) versus atomic number. Figure 6. Plot of jump factor JK (a) and jump ratio rK (b) as a function of atomic number.

11

IKE I KD

,P / U

Table 1. The experimental and theoretical values of

V KD Element

ZK

I

V KD , Z K , I KKDE , V ts , P / U and V t ) . V ts

IKE I KD

Vt

(P / U )

Exp.

Theo.

Exp.

Theo.

Exp.

Theo.a

b

Exp.

Theo.

Exp.

Theo.

Ti

156

154

0.230

0.226

0.129

0.135

36.3

10.3

11.1

880

878

Cr

300

276

0.312

0.289

0.127

0.133

43.5

13.6

14.3

1251

1230

Fe

479

457

0.375

0.355

0.132

0.139

51.4

17.6

18.0

1664

1670

Co

565

576

0.388

0.388

0.134



55.8

19.0

19.7

1904

1930

Ni

723

716

0.427

0.421

0.133

0.140

60.5

24.2

22.7

2233

2210

Cu

807

878

0.422

0.454

0.137

0.137

65.8

23.7

23.9

2542

2520

a

Theoretical predictions using data from Scofield, (1974)

b

from WINXCOM (Gerward et al., 2001, 2004)

12

Table 2. The result of present and other experimental and theoretical for J K and rK .

JK Element

rK

Ti

Present Exp. 0.905

Theo. 0.901

Cr

0.899

0.899

Fe

0.898

0.892

Co

0.893

0.889

Ni

0.883

0.887

Cu

0.878

0.884

Other Exp.

Theo. 0,902c

Present Exp. 10.580

Theo. 10.148

0.905c

9.881

9.859

0.874a

0.897c

9.780

9.294

7.936a

9.695c

0.873a

0.893c

9.355

8.982

7.874a

9.371c

0.889c

8.517

8.874

0.885c

8.212

8.645

0.867a 0.869b

Other Exp.

Theo. 10.241c 10.530c

9.013c 7.519a 7.652b

8.688c

a

Sidhu et al., (2011) Chantler et al., (2001) c Chantler et al., (2005) b

Highlights >This work regard the K shell absorption jump ratios and jump factors of Ti, Cr, Fe, Co, Ni and Cu>This paper presents the first measurement of these parameters using the experimental K shell fluorescence parameters>A good agreement is found between experimental and theoretical values>The EDXRF technique is suitable, precise and reliable for the measurement of these atomic parameters>

13

Figure

Figure

Figure

Figure

Figure

Figure