Distributed redundancy in two-layer threshold logic networks

Distributed redundancy in two-layer threshold logic networks

WORLD ABSTRACTS ON M I C R O E L E C T R O N I C S AND R E L I A B I L I T Y 17 Fault isolation in conventional linear systems: a progress report. J...

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WORLD ABSTRACTS ON M I C R O E L E C T R O N I C S AND R E L I A B I L I T Y

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Fault isolation in conventional linear systems: a progress report. J. H. MAENPAA,C. J. STEHMAN and W. J. STAHL,IEEE Trans. Reliab. R-18, No. 1, February (1969), p. 12. A computer program is described which implements a previously suggested procedure for isolating faults in conventional linear systems. The technique is based on the analysis of network function responses at critically chosen test frequencies applied to the normal input-output terminals of the circuit under test. The feasibility of the diagnosis technique is discussed in terms of the experience with the computer program and some empirical studies which have been conducted. Example circuits are included which have been processed by the computer program. Problem areas related to both the basic theory of the technique and the computational limitations of implementation are defined. Solutions are proposed for some of these problems; others are merely defined for study by the circuit theorists. Reliability of a special class of redundant systems. D. E. ANDERSON,IEEE Tram. Reliab. R-18, No. 1, February (1969), p. 21. This paper develops equations for predicting the reliability of a special class of redundant systems. Applicable systems include those which operate in a standby mode for a long period of time in anticipation of participation in a single mission. Manual repair is allowed in the standby mode but not in the mission mode. The analysis is also applicable to the single-mission case alone (no standby), where the reliability in this case is evaluated as a function of the reliability state at the start of the mission. The development employs the traditional approach using the concept of failure states and the attendant birth-and-death equations. Distributed redundancy in two-layer threshold logic networks. J. I. YOUNGBLOODand A. M. BREIPOHL, IEEE Trans. Reliab. 11-18, No. 1, February (1969), p. 15. This paper contains a description of a method which can be used to select redundant threshold logic units on the basis of system considerations rather than the duplication of existing units. This mathematical technique consists of iteratively selecting redundant threshold logic units for the first layer of a two-layer threshold logic network. Use of the technique is illustrated in the solution of simple problems, and it is shown that fewer units are required for single error correction than would be needed if existing units were duplicated. The designer/maintainer interface in the Royal Navy. T. J. BIRD and J. C. EDWARDS,Electron. Pwr, February (1969), p. 40. For a very large system, such as a complete guided weapons complex, a more comprehensive procedure than the basic one is required for the development and introduction of electronic and electromechanical equipment into operation in the Royal Navy. There is a great need for maintainability, and for a management tool which can aid design for good maintainability as well as provide the functionally identified information required for the maintenance handbook. 4. IVHCROELECTRONICS--GENERAL

HF and VHF inductorless filters for microelectronic systems. R. C. SMYTHE,Proc. 1969 Electron. Compon. Conf., Washington D.C., 30 April-2 May (1969), p. 115. Integrated crystal filters utilize acoustical coupling to obtain a monolithic structure electrically equivalent to a conventional crystal filter section composed of discrete resonators and balanced, tuned transformer. Tandem monolithic sections are used to obtain highest stopband performance. Performance of monolithic and tandem monolithic integrated crystal filters at center frequencies up to 350 MHz is illustrated by examples. Applications include spectrum clean-up, carrier channel and other single-side-band filters, IF channel filters and simulated front-end filtering using parametric up-conversion. Engineer and manufacturer against problems brought by technology of electronic circuits. J. FAGOT,Onde Elect. 49, No. 5, May (1969), p. 509. (In French.) At first the author reviews shortly microelectronic technics which now renew circuitry technology: monolithic integrated circuit, thin-film circuit, thick-film circuit--the last two being, generally, of "hybrid" type. Problems encountered for engineer and manufacturer in application of these new technologies are examined. Interconnections for microcircuits I . A . S . CALDERand J. R. PICREM, Electron. Compon., June (1969), p. 719. This state-of-the-art review gives some of the factors influencing the engineering form of a system using integrated microcircuits, and the way in which their relative importance affects the