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Easy-to-use AFMs
TOOLS & TECHNIQUES
Nanoparticles count NanoSight has launched the NANOSIGHT LM20, a benchtop system for rapid sizing and counting of individual nanoparticles in suspension. The instrument includes precision mechanics and updated software that enables the rapid analysis of particles as small as 15 nm. A laser light source is used to illuminate individual particles. A software package enabling realtime visualization is used to measure the size of particles in suspension and a rapid quantitative estimation of size distribution can be obtained. Polydisperse and multimodal samples can also be studied. The measurements complement those obtained from lightscattering techniques. The NANOSIGHT LM20 system is aimed at researchers across chemical and biotechnology fields. Contact: www.nanosight.co.uk
Easy-to-use AFMs The Agilent 5400 atomic force microscopy (AFM)/scanning probe microscopy (STM) systems offer atomic resolution for research and industry. This instrument has quick-install nose cones to allow easy switching of imaging modes, a scanner that snaps into position, open access to the sample plates, and simple optics alignment. The software is designed for intuitive operation. The Agilent 5400 has applications in materials science, polymer studies, general surface characterization, and nanolithography. It is hoped that the low price and ease of use will also attract teaching institutions. Contact: www.agilent.com
Optical profiling over a wide range Veeco Instruments has launched two new optical profilers, the Wyko® NT9300™ and NT9800™, for imaging biomedical and semiconductor devices. The profilers can measure surface topographies between 0.1 nm and 10 mm in height, extending noncontact surface measurement capabilities in materials analysis and process development. A new harmonic drive scan mechanism and laser reference signal for z-position feedback increase scan accuracy and resolution. These instruments have a reduced number of moving parts to improve their longterm use. Contact: www.veeco.com
Scanners focus quickly PIFOC® piezo z-drive systems, which enable highspeed z-stack image acquisition, have been introduced by PI (Physik Instrumente). The high-speed microscopy objective scanners are available as separate components or as complete systems including the piezo objective scanner, a controller, and two distance cases. The scanners have a focusing speed of 10 ms and a resolution of 1 nm, providing high-quality images in less time than scanners driven by a stepper motor.
Latest developments in Raman software LabSpec 5 (LS5) software has been developed by HORIBA Jobin Yvon for use on all its Raman instruments. LS5 records Raman images at high spectral and spatial resolution. A wide range of dataprocessing tools are available and additional detectors can be incorporated. Contact: www.jobinyvon.com/raman
The systems come with either 100 µm or 400 µm travel ranges, can reach speeds of 7 ms per step, and are compatible with all major image acquisition packages. These systems have applications in biotechnology, semiconductor fabrication, and photonic packaging. Contact: www.pi-usa.us
X-ray diffraction becomes fully automated A fully automated X-ray diffraction system from Rigaku offers a comprehensive range of measurements. The SmartLab NANO-Extreme enables powder diffraction of bulk materials and glancing incidence diffraction of deposited nanostructures. Other applications include small-angle X-ray scattering for determination of morphology and particle size distributions in solids and liquids, and in-plane diffraction of ultrathin layers for surface orientation. The instrument combines a horizontal sample mount with Cross Beam Optic technology. Rigaku has also introduced the MiniFlex™ II benchtop X-ray diffraction system and the NANOHUNTER benchtop total reflection X-ray fluorescence spectrometer. The Miniflex II has a variable incident beam splitter and diffracted beam monochromator, which make it suitable for crystallinity measurements and structural characterization. The NANOHUNTER features fully automated control of all axes, making it suitable for surface, multiple layer, and substrate analyses. Contact: www.rigaku.com
Automated profiler speeds up image acquisition Hyphenated Systems has launched an automated optical profiler for three-dimensional imaging with <50 nm resolution. The HS200A NanoScale™ Optical Profiler, which incorporates Advanced Confocal Microscopy™ (ACM) technology, is capable of acquiring high-resolution images in seconds. The profiler takes a series of images, slicing through the sample at varying heights, and combines them into a single image. This instrument has applications in three-dimensional imaging and metrology of rough surfaces of microelectromechanical systems (MEMS) and other semiconductor devices, or in the imaging of subsurfaces through transparent materials. A variable optical microscope is included and automation enables fast, repetitive, routine operations. Contact: www.hyphenated-systems.com
FEBRUARY 2007 | VOLUME 2 | NUMBER 1
55
Nanoparticles count NanoSight has launched the NANOSIGHT LM20, a benchtop system for rapid sizing and counting of individual nanoparticles in suspension. The instrument includes precision mechanics and updated software that enables the rapid analysis of particles as small as 15 nm. A laser light source is used to illuminate individual particles. A software package enabling realtime visualization is used to measure the size of particles in suspension and a rapid quantitative estimation of size distribution can be obtained. Polydisperse and multimodal samples can also be studied. The measurements complement those obtained from lightscattering techniques. The NANOSIGHT LM20 system is aimed at researchers across chemical and biotechnology fields. Contact: www.nanosight.co.uk
Easy-to-use AFMs The Agilent 5400 atomic force microscopy (AFM)/scanning probe microscopy (STM) systems offer atomic resolution for research and industry. This instrument has quick-install nose cones to allow easy switching of imaging modes, a scanner that snaps into position, open access to the sample plates, and simple optics alignment. The software is designed for intuitive operation. The Agilent 5400 has applications in materials science, polymer studies, general surface characterization, and nanolithography. It is hoped that the low price and ease of use will also attract teaching institutions. Contact: www.agilent.com
Optical profiling over a wide range Veeco Instruments has launched two new optical profilers, the Wyko® NT9300™ and NT9800™, for imaging biomedical and semiconductor devices. The profilers can measure surface topographies between 0.1 nm and 10 mm in height, extending noncontact surface measurement capabilities in materials analysis and process development. A new harmonic drive scan mechanism and laser reference signal for z-position feedback increase scan accuracy and resolution. These instruments have a reduced number of moving parts to improve their longterm use. Contact: www.veeco.com
Scanners focus quickly PIFOC® piezo z-drive systems, which enable highspeed z-stack image acquisition, have been introduced by PI (Physik Instrumente). The high-speed microscopy objective scanners are available as separate components or as complete systems including the piezo objective scanner, a controller, and two distance cases. The scanners have a focusing speed of 10 ms and a resolution of 1 nm, providing high-quality images in less time than scanners driven by a stepper motor.
Latest developments in Raman software LabSpec 5 (LS5) software has been developed by HORIBA Jobin Yvon for use on all its Raman instruments. LS5 records Raman images at high spectral and spatial resolution. A wide range of dataprocessing tools are available and additional detectors can be incorporated. Contact: www.jobinyvon.com/raman
The systems come with either 100 µm or 400 µm travel ranges, can reach speeds of 7 ms per step, and are compatible with all major image acquisition packages. These systems have applications in biotechnology, semiconductor fabrication, and photonic packaging. Contact: www.pi-usa.us
X-ray diffraction becomes fully automated A fully automated X-ray diffraction system from Rigaku offers a comprehensive range of measurements. The SmartLab NANO-Extreme enables powder diffraction of bulk materials and glancing incidence diffraction of deposited nanostructures. Other applications include small-angle X-ray scattering for determination of morphology and particle size distributions in solids and liquids, and in-plane diffraction of ultrathin layers for surface orientation. The instrument combines a horizontal sample mount with Cross Beam Optic technology. Rigaku has also introduced the MiniFlex™ II benchtop X-ray diffraction system and the NANOHUNTER benchtop total reflection X-ray fluorescence spectrometer. The Miniflex II has a variable incident beam splitter and diffracted beam monochromator, which make it suitable for crystallinity measurements and structural characterization. The NANOHUNTER features fully automated control of all axes, making it suitable for surface, multiple layer, and substrate analyses. Contact: www.rigaku.com
Automated profiler speeds up image acquisition Hyphenated Systems has launched an automated optical profiler for three-dimensional imaging with <50 nm resolution. The HS200A NanoScale™ Optical Profiler, which incorporates Advanced Confocal Microscopy™ (ACM) technology, is capable of acquiring high-resolution images in seconds. The profiler takes a series of images, slicing through the sample at varying heights, and combines them into a single image. This instrument has applications in three-dimensional imaging and metrology of rough surfaces of microelectromechanical systems (MEMS) and other semiconductor devices, or in the imaging of subsurfaces through transparent materials. A variable optical microscope is included and automation enables fast, repetitive, routine operations. Contact: www.hyphenated-systems.com
FEBRUARY 2007 | VOLUME 2 | NUMBER 1
55