World Abstracts on Microelectronics and Reliability (0.66)(predicted MTTR) < Z2 < (I0.00) (predicted MTTR) Where: Z~ = Quantitative Manufacturer's Effect Z2 = Quantitative Operational Effect From the study data, Z~ = 1.20 and Z2 = 3.78. Quantitatively, this means that the operational factors (Z2} comprise as much as 84 percent of the total disparity between predicted and field-reported maintenance times.
On circuit design for timing margin reliability. RUDY D. SCHALOW, THOMAS C. GOLART and MAC A. YOUNG. Proc. IEEE A. Reliab. Maintainab. Syrup., Los Angeles. 17-19 January 1978, p. 173. An analytic procedure for determining the cost-effectiveness of full worst-case design compliance versus a modified statistical approach to the circuit delay problem is presented. In addition, the degree of performance closeness of any design compared to worst-case is established, as well as is the in-service repair reliability. The expressions are useful not only for analysis, but are also suited for application to the establishment of design criteria. The development considers vendor yield factors, parts characterization data. circuit complexity, random failure rates, repair costs, and other pertinent variables. The results contained herein were applied to the Navy's Advanced Signal Processor Analyzer Unit to determine whether redesign during the transition from Advanced Development to Service Test Models (STM) would be invoked. It was found that substantial redesign effort would not be necessary. Key reliability assurance techniques--Power Tools. R. C. WEBER~ JR. Proc. IEEE A. Reliab. Maintainab. Syrup., Los Angeles, 17-.19 January 1978, p. 28. In the Power Tool business, as in any Consumer Product business today, attention to the assurance of Product Reliability is essential in attaining customer satisfaction, and maintaining competitive leadership. This paper is devoted to certain techniques which are a key part of a total Quality-Reliability system. These techniques, when combined and adhered to as part of an organized system, have proven successful in assuring the reliability in the production of Power Tools. The purpose of this paper is to provide insight to these techniques in hope that further applications in Consumer Products wilt become apparent. Reliability-centered maintenance. F. STANLEY NOWLAN and HOWARD F. HEAP. Proc. IEEE A. Reliab. Maintainab. Syrup.. Los Angeles. 17d9 January 1978. p. 38. This paper
407
describes a logical discipline that enables the development of efficient scheduled (i.e. preventive) maintenance programs for complex equipment, and the ongoing management of such programs. Such programs are called reliability-centered maintenance programs because they are centered on achieving the inherent safety and reliability capabilities of equipment at a minimum cost. There are only four types of tasks in a scheduled maintenance program. Mechanics can be asked to : 1. Inspect an item to detect a potential functional failure. 2. Rework an item before a maximum permissible age is exceeded. 3. Discard an item before a maximum permissible age is exceeded. 4. Inspect an item to find failures that have already occurred but were not evident to the operating crew. Two or more types of tasks are applicable to some equipment items. There are other items to which only one type of task is applicable. And there are many items to which no type of preventive maintenance task is applicable. Very often a task which is applicable is not effective and should not be included in the scheduled maintenance program. The problem, therefore, is to determine which types of maintenance tasks, if any, should be applied to an item.
Tacan RIW program. ANDREW J. HAUTER and CLAIR W. STREMPKE. Proc. IEEE A. Reliab. Maintainab. Symp., Los Angeles, 17-19 January 1978, p. 62. For the typical avionics reliability engineer who has a government customer, traditional goals have been the passing of qualification demonstrations and production sampling tests. Whether he should be concerned with field reliability is rhetorical. In fact until now there have been neither real incentives nor workable mechanisms for directing his attention to the field MTBF. Reliability Improvement Warranty (RIW) gives the avionics contractor the first i'eal opportunity to judge for himself what effect the total operating environment has on his product, and to test whether field MTBF growth can be made to occur. An inherent risk amounts to how much the environment was misunderstood when the warranty commitment was made. Risk control in the development of energy processes. DAVID A. MCBR1DE and LARRY R. ALBAUGH. Proc. IEEE A. Reliab. Maintainab. Syrnp., Los Angeles, 17-19 January 1978, p. 151. A system analysis technique applied to a coal gasification process demonstration unit is presented. The technique is illustrated by an example from the gasification process. Parallels of safety analyses and reliability analyses are considered. The efficiency and cost effectivity of conducting safety and reliability analyses simultaneously is discussed.
4. M I C R O E L E C T R O N I C S - - G E N E R A L ECL memories speeding to market. WILUAM F. ARNOLD. Electronics p. 77 (17 August 1978), Push of emittercoupled-logic RAMS into mainframe applications pits it against popular metal-oxide-semiconductor versions.
5. M I C R O E L E C T R O N I C S
Television chips are good bet for channel tuning. JOHN GOSCH. Electronics p. 3E (20 July 1978). Planned offering includes three-chip synthesizer plus units for remote control and on-screen display.
DESIGN
Automatic photoresist develop process end point detection software. E. G. SMITH. Pro~. IEEE 28th Electron. Componems Con~i. Anaheim. 24-26 April 1978. p. 362. As physical dimensions land propagation times) of large scale integrated (LSII circuits become smaller and smaller, the
AND
CONSTRUCTION
need for LSI fabricator automation becomes necessary. To help meet higher LSI performance and process yield goals. automatic photoresist develop process end point detection and control (PEPDC) systems are designed to signal when photoresist patterns are properly delineated in LSI products.