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Electrochemistry module
TOOLS & TECHNIQUES UPDATE
Analysis software Soft Imaging System is extending its analytical imaging software system, analySIS, with the release of software packages specifically for materials scientists. analySIS Research Materials Lab offers automatic analysis of grain sizes, determination of graphite content in cast iron, evaluation of microhardness indents, measurement of layer thickness, and analysis of surface roughness. Other products include analySIS LabFlow, an image acquisition, archiving, and reporting product, and ltm, an add-in tool for determining layer thickness in porous or compact coatings. Contact: www.soft-imaging.net
Electrochemistry module Princeton Applied Research has a new software module for performing analytical electrochemical measurements with its potentiostats/galvanostats. PowerPULSE offers a selection of 12 techniques, including squarewave, differential pulse, normal pulse, and reverse normal pulse voltammetry. Multistep pulse and cycling methods are also included.
Controlled reaction Polymer Laboratories is launching a series of systems for online process monitoring and control of polymerization reactions, developed under a license agreement with Symyx Technologies, Inc. The PL-PMC systems allow the automated acquisition and analysis of real time data to monitor polymer molecular weights. The systems use Symyx’s patented gel permeation chromatography (GPC) or flow injection analysis (FIA) techniques to make rapid molecular weight measurements. An extraction device at the front end of the PL-PMC system allows automatic and continuous sampling of the reactor contents. Measurements of molecular weight, degree of monomer conversion, and copolymer composition can be performed by FIA or GPC, and GPC can also give molecular weight distributions. The software can be used to monitor the process or provide feedback for control of the reactor parameters. Contact: www.polymerlabs.com
Contact: www.princetonappliedresearch.com
A clear picture Microscopists can get a clear picture from a number of hazy images using SharpStack Version 5.0, a plug-in module for Image-Pro Plus software from Media Cybernetics Inc. Image deconvolution options include nearest neighbor, no neighbor, inverse filter, and spherical aberration correction algorithms. Contact: www.mediacy.com
Number crunching Wolfram Research has released Mathematica 5, the latest version of the technical computing software. New features include exceptional speed for numerical linear algebra, support for fast sparse matrix operations, optimized numerical solvers for ordinary and partial differential equations, and extensive support for vector and array functions in numeric solvers. Contact: www.wolfram.com
Bringing atoms into focus JEOL’s JEM-2100F field emission electron microscope offers atomic scale resolution. It is designed for a broad range of techniques including transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), electron diffraction, electron energy-loss and energy-dispersive spectroscopy, and tomography. Multiple techniques for structural analysis are available simultaneously using different CCD cameras and detectors. The microscope features a high-brightness, Schottky field emission electron gun. A point-to-point resolution of 0.19 nm can be achieved in TEM and a resolution of 0.136 nm is possible using high angle annular dark field STEM imaging. Contact: www.jeol.com
Metrology in profile A new stylus profiler for characterizing semiconductors, data storage devices, microelectromechanical systems, and other surfaces is being launched by Veeco Instruments. The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force tip technology, and threedimensional data analysis. Dektak 8 has a vertical range of 1 mm and a 7.5 Å, 1 σ step height repeatability. An overhead gantry design allows roughness and planarity measurements on samples of up to 200 mm2. An N-Lite low-force option is ideal for scratch-free measurement of soft resists, polymers, metals, and films. Veeco is also releasing the torsional resonance mode (TRmode™) for Digital Instruments’ MultiMode® and Dimension™ scanning probe microscopes. It measures tip-sample interactions through the torsional resonance of the cantilever, providing lateral characterization of the sample surface. The new mode has applications in nanotribology, as well as in studies of polymers and magnetic materials. Contact: www.veeco.com
Size it up, grind it up Several new particle-sizing and milling instruments are being launched by FRITSCH. analysette 22 NanoTec is a laser particle-sizer that allows the determination of particle size distributions and shapes in a single process. It can measure a range of sizes from 10 nm to 1000 µm using scattered light at angles of 0-180°. Shape elongation ratios of 0.2-4.5 can be detected. Alternatively, analysette 22 COMPACT is a bench-top instrument for routine particle size analysis. FRITSCH is also introducing the pulverisette 9 vibrating cup mill. The mill allows vibration frequency to be varied to suit the material and grinding elements. Contact: www.fritsch.de
September 2003
45
Analysis software Soft Imaging System is extending its analytical imaging software system, analySIS, with the release of software packages specifically for materials scientists. analySIS Research Materials Lab offers automatic analysis of grain sizes, determination of graphite content in cast iron, evaluation of microhardness indents, measurement of layer thickness, and analysis of surface roughness. Other products include analySIS LabFlow, an image acquisition, archiving, and reporting product, and ltm, an add-in tool for determining layer thickness in porous or compact coatings. Contact: www.soft-imaging.net
Electrochemistry module Princeton Applied Research has a new software module for performing analytical electrochemical measurements with its potentiostats/galvanostats. PowerPULSE offers a selection of 12 techniques, including squarewave, differential pulse, normal pulse, and reverse normal pulse voltammetry. Multistep pulse and cycling methods are also included.
Controlled reaction Polymer Laboratories is launching a series of systems for online process monitoring and control of polymerization reactions, developed under a license agreement with Symyx Technologies, Inc. The PL-PMC systems allow the automated acquisition and analysis of real time data to monitor polymer molecular weights. The systems use Symyx’s patented gel permeation chromatography (GPC) or flow injection analysis (FIA) techniques to make rapid molecular weight measurements. An extraction device at the front end of the PL-PMC system allows automatic and continuous sampling of the reactor contents. Measurements of molecular weight, degree of monomer conversion, and copolymer composition can be performed by FIA or GPC, and GPC can also give molecular weight distributions. The software can be used to monitor the process or provide feedback for control of the reactor parameters. Contact: www.polymerlabs.com
Contact: www.princetonappliedresearch.com
A clear picture Microscopists can get a clear picture from a number of hazy images using SharpStack Version 5.0, a plug-in module for Image-Pro Plus software from Media Cybernetics Inc. Image deconvolution options include nearest neighbor, no neighbor, inverse filter, and spherical aberration correction algorithms. Contact: www.mediacy.com
Number crunching Wolfram Research has released Mathematica 5, the latest version of the technical computing software. New features include exceptional speed for numerical linear algebra, support for fast sparse matrix operations, optimized numerical solvers for ordinary and partial differential equations, and extensive support for vector and array functions in numeric solvers. Contact: www.wolfram.com
Bringing atoms into focus JEOL’s JEM-2100F field emission electron microscope offers atomic scale resolution. It is designed for a broad range of techniques including transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), electron diffraction, electron energy-loss and energy-dispersive spectroscopy, and tomography. Multiple techniques for structural analysis are available simultaneously using different CCD cameras and detectors. The microscope features a high-brightness, Schottky field emission electron gun. A point-to-point resolution of 0.19 nm can be achieved in TEM and a resolution of 0.136 nm is possible using high angle annular dark field STEM imaging. Contact: www.jeol.com
Metrology in profile A new stylus profiler for characterizing semiconductors, data storage devices, microelectromechanical systems, and other surfaces is being launched by Veeco Instruments. The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force tip technology, and threedimensional data analysis. Dektak 8 has a vertical range of 1 mm and a 7.5 Å, 1 σ step height repeatability. An overhead gantry design allows roughness and planarity measurements on samples of up to 200 mm2. An N-Lite low-force option is ideal for scratch-free measurement of soft resists, polymers, metals, and films. Veeco is also releasing the torsional resonance mode (TRmode™) for Digital Instruments’ MultiMode® and Dimension™ scanning probe microscopes. It measures tip-sample interactions through the torsional resonance of the cantilever, providing lateral characterization of the sample surface. The new mode has applications in nanotribology, as well as in studies of polymers and magnetic materials. Contact: www.veeco.com
Size it up, grind it up Several new particle-sizing and milling instruments are being launched by FRITSCH. analysette 22 NanoTec is a laser particle-sizer that allows the determination of particle size distributions and shapes in a single process. It can measure a range of sizes from 10 nm to 1000 µm using scattered light at angles of 0-180°. Shape elongation ratios of 0.2-4.5 can be detected. Alternatively, analysette 22 COMPACT is a bench-top instrument for routine particle size analysis. FRITSCH is also introducing the pulverisette 9 vibrating cup mill. The mill allows vibration frequency to be varied to suit the material and grinding elements. Contact: www.fritsch.de
September 2003
45