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Elementary detection
TOOLS & TECHNIQUES UPDATE
chewing simulator has a biaxial testing configuration to assess the effectiveness of sealants or enamel replacements. Contact: www.enduratec.com
Synchrotron quality in the lab Mapping lifetimes Jobin Yvon is releasing a number of new spectroscopy products. The SPEX fluorescence system (shown) maps the fluorescence characteristics of a sample at the micron scale. Fluorescence intensity and pico- or nanosecond lifetime data are automatically accumulated after programming the movable sample stage. The data can be analyzed by fitting single or multiple lifetimes, or lifetime distributions. Elemental determination with high precision is offered by the ULTIMA 2C, an inductively coupled plasma optical emission spectrometer. It combines the flexibility of a sequential spectrometer with the speed of a simultaneous instrument. Low detection limits are provided by a single-view radial plasma and high optical resolution. The simultaneous optical system, which is viewed directly, results in no loss of light compared with systems using fiber optics or dual view. The Symphony line of CCD array detection systems is designed for extremely low-level signal detection and high-speed data acquisition in time domain spectroscopy.
The X’Pert PRO Alpha-1 system from PANalytical is a powder X-ray diffractometer that includes a symmetrical incident beam Johansson monochromator and an X’Celerator detector. The integration of these two devices into one system gives improved peak-tobackground ratio and resolution. Using this laboratory instrument, data of a quality comparable to synchrotron diffractometers can be obtained in scans recorded overnight. The instrument can be rapidly reconfigured to another X-ray optical setup using PreFIX (pre-aligned, fastinterchangeable X-ray optics). For example, the configuration can be changed from a parafocusing setup to a Debye-Scherrer geometry, in which the powder sample is in a glass capillary. Contact: www.panalytical.com
Tissue engineering ITEMS
44
September 2003
Contact: www.oaresearch.com
Material microscopy gains Carl Zeiss is introducing several products with materials microscopists in mind. A new version of its LSM 5 PASCAL confocal laser scanning microscope includes functions for quantitative surface analysis and characterization of materials. Four new series of objective lenses have also been developed. The EC Epiplan-Neofluar objectives allow brightfield, darkfield, polarization, and differential interference contrast observations. They offer improved contrast, edge resolution, and field illumination homogeneity. Contact: www.zeiss.com
Contact: www.jobinyvon.co.uk
EnduraTEC is launching a computer-controlled bioreactor for tissue engineering research. Used for the seeding and growth of cells within a scaffold, the ITEMS™ (intelligent tissue engineering via mechanical stimulation) BioReactor™ is a scalable, biodynamic system. It provides a complete, closed-loop flow of nutrients and is capable of introducing mechanical stresses and strains during the growth phase of the construct. Pressure and flow waveforms of varying shapes and frequencies can be applied to stimulate cell deposition and proliferation. The ITEMS bioreactor is available in a single- or six-chamber design for development of tissue-engineered blood vessels, grafts, or valves. Variations are available for other tissues, including bone, cartilage, and ligaments. A new instrument to evaluate dental biomaterials by simulating chewing, or the masticatory cycle, is also available from EnduraTEC. The ELectroForce (ELF) 3300
Nanocluster deposition Oxford Applied Research’s quadrupole mass spectrometer, the QMF200, can now be supplied with a QUVI PC interface and software package to automate data collection and analysis. When this setup is used in conjunction with the NC200U nanocluster deposition source, the mass spectrometer can analyze the nanoclusters or be used as a mass filter to give narrow nanocluster mass distributions. Clusters up to 4 million amu can be filtered and sorted.
Elementary detection Elemental analysis with a high sensitivity is possible using the SPECTRO X-LAB 2000. The new energydispersive X-ray fluorescence spectrometer from SPECTRO Analytical Instruments uses crystals to produce polarized X-rays. This reduces the background in the spectrum and enables the instrument to scan from Na to U in 100 s. Detection limits at the ppm range for elements such as Na, Mg, Al, S, and Cl are achievable. The instrument’s X-ray intensity also permits quantitative analysis of elements in the ng-range. A high resolution Si(Li) semiconductor detector is used because it is simultaneously sensitive to low and high energies. With this, it is possible to analyze precisely both trace and major elements at the same time. Contact: www.spectro.com
Full field of view A new digital camera for microscopy from JENOPTIK Laser, Optik, Systeme GmbH features a 4 megapixel CCD with a 21.4 mm sensor diagonal. The MacroFire camera provides a full field of view and an excellent signal-tonoise ratio because of its large pixel size. A fast FireWire interface connects the camera to a computer. Contact: www.progres-camera.com
Upgrade your AFM An ultraprecision, closed-loop scanner kit is available from nPoint, Inc. for upgrading existing atomic force microscopes (AFMs). The iC® system provides subnanometer resolution and excellent scan linearity. It does not require special installation or modifications to be made to the AFM. Contact: www.piezomax.com
chewing simulator has a biaxial testing configuration to assess the effectiveness of sealants or enamel replacements. Contact: www.enduratec.com
Synchrotron quality in the lab Mapping lifetimes Jobin Yvon is releasing a number of new spectroscopy products. The SPEX fluorescence system (shown) maps the fluorescence characteristics of a sample at the micron scale. Fluorescence intensity and pico- or nanosecond lifetime data are automatically accumulated after programming the movable sample stage. The data can be analyzed by fitting single or multiple lifetimes, or lifetime distributions. Elemental determination with high precision is offered by the ULTIMA 2C, an inductively coupled plasma optical emission spectrometer. It combines the flexibility of a sequential spectrometer with the speed of a simultaneous instrument. Low detection limits are provided by a single-view radial plasma and high optical resolution. The simultaneous optical system, which is viewed directly, results in no loss of light compared with systems using fiber optics or dual view. The Symphony line of CCD array detection systems is designed for extremely low-level signal detection and high-speed data acquisition in time domain spectroscopy.
The X’Pert PRO Alpha-1 system from PANalytical is a powder X-ray diffractometer that includes a symmetrical incident beam Johansson monochromator and an X’Celerator detector. The integration of these two devices into one system gives improved peak-tobackground ratio and resolution. Using this laboratory instrument, data of a quality comparable to synchrotron diffractometers can be obtained in scans recorded overnight. The instrument can be rapidly reconfigured to another X-ray optical setup using PreFIX (pre-aligned, fastinterchangeable X-ray optics). For example, the configuration can be changed from a parafocusing setup to a Debye-Scherrer geometry, in which the powder sample is in a glass capillary. Contact: www.panalytical.com
Tissue engineering ITEMS
44
September 2003
Contact: www.oaresearch.com
Material microscopy gains Carl Zeiss is introducing several products with materials microscopists in mind. A new version of its LSM 5 PASCAL confocal laser scanning microscope includes functions for quantitative surface analysis and characterization of materials. Four new series of objective lenses have also been developed. The EC Epiplan-Neofluar objectives allow brightfield, darkfield, polarization, and differential interference contrast observations. They offer improved contrast, edge resolution, and field illumination homogeneity. Contact: www.zeiss.com
Contact: www.jobinyvon.co.uk
EnduraTEC is launching a computer-controlled bioreactor for tissue engineering research. Used for the seeding and growth of cells within a scaffold, the ITEMS™ (intelligent tissue engineering via mechanical stimulation) BioReactor™ is a scalable, biodynamic system. It provides a complete, closed-loop flow of nutrients and is capable of introducing mechanical stresses and strains during the growth phase of the construct. Pressure and flow waveforms of varying shapes and frequencies can be applied to stimulate cell deposition and proliferation. The ITEMS bioreactor is available in a single- or six-chamber design for development of tissue-engineered blood vessels, grafts, or valves. Variations are available for other tissues, including bone, cartilage, and ligaments. A new instrument to evaluate dental biomaterials by simulating chewing, or the masticatory cycle, is also available from EnduraTEC. The ELectroForce (ELF) 3300
Nanocluster deposition Oxford Applied Research’s quadrupole mass spectrometer, the QMF200, can now be supplied with a QUVI PC interface and software package to automate data collection and analysis. When this setup is used in conjunction with the NC200U nanocluster deposition source, the mass spectrometer can analyze the nanoclusters or be used as a mass filter to give narrow nanocluster mass distributions. Clusters up to 4 million amu can be filtered and sorted.
Elementary detection Elemental analysis with a high sensitivity is possible using the SPECTRO X-LAB 2000. The new energydispersive X-ray fluorescence spectrometer from SPECTRO Analytical Instruments uses crystals to produce polarized X-rays. This reduces the background in the spectrum and enables the instrument to scan from Na to U in 100 s. Detection limits at the ppm range for elements such as Na, Mg, Al, S, and Cl are achievable. The instrument’s X-ray intensity also permits quantitative analysis of elements in the ng-range. A high resolution Si(Li) semiconductor detector is used because it is simultaneously sensitive to low and high energies. With this, it is possible to analyze precisely both trace and major elements at the same time. Contact: www.spectro.com
Full field of view A new digital camera for microscopy from JENOPTIK Laser, Optik, Systeme GmbH features a 4 megapixel CCD with a 21.4 mm sensor diagonal. The MacroFire camera provides a full field of view and an excellent signal-tonoise ratio because of its large pixel size. A fast FireWire interface connects the camera to a computer. Contact: www.progres-camera.com
Upgrade your AFM An ultraprecision, closed-loop scanner kit is available from nPoint, Inc. for upgrading existing atomic force microscopes (AFMs). The iC® system provides subnanometer resolution and excellent scan linearity. It does not require special installation or modifications to be made to the AFM. Contact: www.piezomax.com