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EPROM Testing—Part II: Application to 16K N-channel devices
1176
World Abstracts on Microelectronics and Reliability
system and the mean time to system failure under several repair disciplines are obtained. Finally some properties of the steady-state availability for each repair discipline are given.
Switch failure in a two-unit standby redundant system. S. M. GUP~A, N. K. JMSWAL and L. R. GOEL. Microelectron. Reliab. 23 (l), 129 (1983). In this paper we study the effect of imperfect switching on a two-unit standby redundant system, in which each unit works in three different modes (normal, partial failure and total Iailure) when the failure time distributions are exponential with different means and the repair times are arbitrarily distributed. Several reliability characteristics of interest to system designers as well as operations managers have been evaluated and particular cases are shown to corroborate earlier results. Failure modes induced in TTL-LS bipolar logics by negative inputs. C. CANALI, F. FANT1NI,G. SONCINI,P. VENTURI and E. ZANONI. AIta Freq. LI (6), 340 (November-December 1982). Logic faults induced by negative inputs in TTL-LS bipolar devices have been analysed. TTL-LS-00 quad twoinput N A N D of different suppliers manufactured by conventional planar junction isolated technology have been used in the experiments. Failures are primarily induced by parasitic lateral npn transistors, as evidentiated by scanning electron microscopy and by direct measurements on the chip with microprobes. New bipolar Schottky logic families manufactured by oxide isolated technology are less affected by negative input voltages. Failure diagnosis on the LTI280. P. L. BARRY. I B M Jl Res. Dev. 27 (1), 41 (1983). The high-density circuitry and I/O pin population of the thermal conduction module (TCM), the VLSI package used in the IBM 3081 processor models, dictates that there be a precise and cost-effective method of detecting and diagnosing T C M defects. This paper describes the challenge faced in testing the logic and random access memories of the T C M and the diagnostic approach used in the LTI28 test system for testing the T C M through its I/O pins. The generation and application of tests are discussed, and the automated multiple-defect diagnostic (AMDD) algorithm is presented in detail. A model for the prediction of assembly, rework and test yields. B. J. DOOLE~Y. IBM Jl Res. Der. 27 (1), 59 (1983). The increase in density and complexity of computer components used as field-replaceable units of the IBM 3081 processors has required more sophisticated and capital-intense m a n u facturing and test lines than heretofore seen. To help in the manufacturing planning effort, a simulation model based on the concepts described in this paper was implemented as a means for studying the behaviour of different assembly/test methodologies and to predict the throughput capabilities of various manufacturing configurations. By adopting a different simulation philosophy, the model was greatly simplified, and by taking advantage of the matrix processing features of APL, modelling changes required due to procedure or test-equipment changes could easily be implemented. This paper reviews the philosophy of the simulation of computer part assembly, takes a new look at modelling, and describes the architectural concepts embodied in the implementing program. It also details some of the more important concepts needed to complete the simulator. Multi-chip module test and diagnostic methodology. J. J. CURTIN and J. A. WAICUKAUSKI.I B M Jl Res. Dev. 27 (1), 27 (1983). The development of a manufacturing test and diagnostic methodology for multi-chip modules as used in the IBM 4300 processor models involves determining the most attractive compromise a m o n g a number of conflicting factors: (a) high test coverage, (b) high diagnostic resolution,
(c) test generation, (d) test equipment and (e) test application and diagnosis. This paper describes a set of solutions which were developed to create a high-volume, low-cost manufacturing test operation for the product in question. This paper examines the role of the testing methodology in productivity and product quality, details the diagnostic approach chosen, and provides an example of the overall manufacturing system performance achieved by analysing a large module production sample. A modified block replacement with two variables. TosHIO NAKAGAWA.IEEE Trans. Reliab. R-31 (4), 398 (1982). This paper considers a modified block replacement policy in which a unit is replaced at failure during (0, 7o) and at scheduled replacement time T. If a failure occurs in an interval (To, T), then the unit remains as it is until T. The mean cost rate is obtained, using the results of renewal theory. The model with two variables is transformed into one variable and the optimum policy is discussed. An example shows how to compute the optimum To* and T* when the failure time of the unit has a g a m m a distribution.
EPROM Testing--Part 11: Application to 16K N-channel devices. S. ALLINEY, D. BERTOTTI, F. FANTINI and C. MORANDI. Microelectron. Reliab. 22 (5), 987 (1982). This paper shows how the fault models introduced in the parent paper may be applied to a commercial device. After discussion of typical E P R O M architecture and circuitry, it is shown that most of the faults are detected by the proposed test sequence; additional tests are suggested to detect those faults in the peripheral circuitry which are not described by the "symmetric decoder fault" model. Although developed with reference to a specific architecture, most of the results of this work have general validity, since the analysed architecture is c o m m o n to the great majority of available devices. Dependability modeling of safety systems. J. C. LAPR1E and K. MEDHAFrER-KANOUN. Microelectron. Reliab. 22 (5), 997 (1982). A safety system is aimed at monitoring the behaviour of a process and at preventing severe damage to the process itself and its environment upon occurrence of an incident, due to the propagation of its effects. The paper is divided into three parts. In the first part the functions of a safety system are stated and the dependability measures for such a system are defined. The second part is firstly devoted to a detailed study of the dependability of a simplex non fault-tolerant safety system, the problems of unrevealed faults and maintenance policy which are of a particular importance are emphasized. The results are then used to study the dependability of faulttolerant safety systems. The third part is devoted to the evaluation of an actual distributed safety system with degraded mode of operation: the control system of the extra high voltage substations of French Electricity network. The software integrity of a computer system installed in a Royal Naval frigate. G. HART. Microelectron. Reliab. 22 (6), 1061 (1982). This paper describes the work carried out as part of a Design to Life Cost Study. The aim of this phase was to examine the loss of system availability due to software in a computer system installed in a Royal Naval frigate. The paper shows that the simple classification of possible causes of error for such a system into hardware and software is inadequate. This is demonstrated by examination of two approaches to understanding the nature of software integrity; counting the programming errors and the consideration of the behaviour of a program in operation. The latter approach was applied to field data collected from a Royal Naval frigate. Analysis showed that the reported loss of system availability differed from that truly due to software. This
World Abstracts on Microelectronics and Reliability
system and the mean time to system failure under several repair disciplines are obtained. Finally some properties of the steady-state availability for each repair discipline are given.
Switch failure in a two-unit standby redundant system. S. M. GUP~A, N. K. JMSWAL and L. R. GOEL. Microelectron. Reliab. 23 (l), 129 (1983). In this paper we study the effect of imperfect switching on a two-unit standby redundant system, in which each unit works in three different modes (normal, partial failure and total Iailure) when the failure time distributions are exponential with different means and the repair times are arbitrarily distributed. Several reliability characteristics of interest to system designers as well as operations managers have been evaluated and particular cases are shown to corroborate earlier results. Failure modes induced in TTL-LS bipolar logics by negative inputs. C. CANALI, F. FANT1NI,G. SONCINI,P. VENTURI and E. ZANONI. AIta Freq. LI (6), 340 (November-December 1982). Logic faults induced by negative inputs in TTL-LS bipolar devices have been analysed. TTL-LS-00 quad twoinput N A N D of different suppliers manufactured by conventional planar junction isolated technology have been used in the experiments. Failures are primarily induced by parasitic lateral npn transistors, as evidentiated by scanning electron microscopy and by direct measurements on the chip with microprobes. New bipolar Schottky logic families manufactured by oxide isolated technology are less affected by negative input voltages. Failure diagnosis on the LTI280. P. L. BARRY. I B M Jl Res. Dev. 27 (1), 41 (1983). The high-density circuitry and I/O pin population of the thermal conduction module (TCM), the VLSI package used in the IBM 3081 processor models, dictates that there be a precise and cost-effective method of detecting and diagnosing T C M defects. This paper describes the challenge faced in testing the logic and random access memories of the T C M and the diagnostic approach used in the LTI28 test system for testing the T C M through its I/O pins. The generation and application of tests are discussed, and the automated multiple-defect diagnostic (AMDD) algorithm is presented in detail. A model for the prediction of assembly, rework and test yields. B. J. DOOLE~Y. IBM Jl Res. Der. 27 (1), 59 (1983). The increase in density and complexity of computer components used as field-replaceable units of the IBM 3081 processors has required more sophisticated and capital-intense m a n u facturing and test lines than heretofore seen. To help in the manufacturing planning effort, a simulation model based on the concepts described in this paper was implemented as a means for studying the behaviour of different assembly/test methodologies and to predict the throughput capabilities of various manufacturing configurations. By adopting a different simulation philosophy, the model was greatly simplified, and by taking advantage of the matrix processing features of APL, modelling changes required due to procedure or test-equipment changes could easily be implemented. This paper reviews the philosophy of the simulation of computer part assembly, takes a new look at modelling, and describes the architectural concepts embodied in the implementing program. It also details some of the more important concepts needed to complete the simulator. Multi-chip module test and diagnostic methodology. J. J. CURTIN and J. A. WAICUKAUSKI.I B M Jl Res. Dev. 27 (1), 27 (1983). The development of a manufacturing test and diagnostic methodology for multi-chip modules as used in the IBM 4300 processor models involves determining the most attractive compromise a m o n g a number of conflicting factors: (a) high test coverage, (b) high diagnostic resolution,
(c) test generation, (d) test equipment and (e) test application and diagnosis. This paper describes a set of solutions which were developed to create a high-volume, low-cost manufacturing test operation for the product in question. This paper examines the role of the testing methodology in productivity and product quality, details the diagnostic approach chosen, and provides an example of the overall manufacturing system performance achieved by analysing a large module production sample. A modified block replacement with two variables. TosHIO NAKAGAWA.IEEE Trans. Reliab. R-31 (4), 398 (1982). This paper considers a modified block replacement policy in which a unit is replaced at failure during (0, 7o) and at scheduled replacement time T. If a failure occurs in an interval (To, T), then the unit remains as it is until T. The mean cost rate is obtained, using the results of renewal theory. The model with two variables is transformed into one variable and the optimum policy is discussed. An example shows how to compute the optimum To* and T* when the failure time of the unit has a g a m m a distribution.
EPROM Testing--Part 11: Application to 16K N-channel devices. S. ALLINEY, D. BERTOTTI, F. FANTINI and C. MORANDI. Microelectron. Reliab. 22 (5), 987 (1982). This paper shows how the fault models introduced in the parent paper may be applied to a commercial device. After discussion of typical E P R O M architecture and circuitry, it is shown that most of the faults are detected by the proposed test sequence; additional tests are suggested to detect those faults in the peripheral circuitry which are not described by the "symmetric decoder fault" model. Although developed with reference to a specific architecture, most of the results of this work have general validity, since the analysed architecture is c o m m o n to the great majority of available devices. Dependability modeling of safety systems. J. C. LAPR1E and K. MEDHAFrER-KANOUN. Microelectron. Reliab. 22 (5), 997 (1982). A safety system is aimed at monitoring the behaviour of a process and at preventing severe damage to the process itself and its environment upon occurrence of an incident, due to the propagation of its effects. The paper is divided into three parts. In the first part the functions of a safety system are stated and the dependability measures for such a system are defined. The second part is firstly devoted to a detailed study of the dependability of a simplex non fault-tolerant safety system, the problems of unrevealed faults and maintenance policy which are of a particular importance are emphasized. The results are then used to study the dependability of faulttolerant safety systems. The third part is devoted to the evaluation of an actual distributed safety system with degraded mode of operation: the control system of the extra high voltage substations of French Electricity network. The software integrity of a computer system installed in a Royal Naval frigate. G. HART. Microelectron. Reliab. 22 (6), 1061 (1982). This paper describes the work carried out as part of a Design to Life Cost Study. The aim of this phase was to examine the loss of system availability due to software in a computer system installed in a Royal Naval frigate. The paper shows that the simple classification of possible causes of error for such a system into hardware and software is inadequate. This is demonstrated by examination of two approaches to understanding the nature of software integrity; counting the programming errors and the consideration of the behaviour of a program in operation. The latter approach was applied to field data collected from a Royal Naval frigate. Analysis showed that the reported loss of system availability differed from that truly due to software. This