Journal of Non-Crystalline Solids 97&98 (1987) 1351-1354 North-Holland, Amsterdam
E R A S A B L E L A S E R RECORDING OPTICAL DISK MEDIUM M. OKUDA,
F.S.
JIANG,
1351
CHARACTERISTICS
J.C.
IN A Ga-Se-Te
RHEE and T. MATSUSHITA*
Department of Electronics, College of Engineering, University of O s a k a Prefecture Mozu, Sakai, Osaka, 591 Japan *Department of Electronics, College of Engineering, O s a k a Industrial University Nakagaito, Daito, Osaka, 574 Japan Reversible optical change in a thin film system of parylene/GaSe-Te film/parylene structure has been studied by measuring the time required to crystallize from the amorphous state (the erasing time) and the numbers of reversible reflectance changes occurring between amorphous (written) and crystalline (erased) states. From the discussion of Ga-Se-Te phase diagram, it becomes clear that the optimum composition showing write-erase characteristics is obtained at an eutectic point, in which the segregation does not occur and many cycle o p e r a t i o n is possible. i. Introduction Optical
data storage
on a disk using ity.
Write-once
duced
and a greater
ible optical alloy
products
research
state phase
transition
havior
to an optical
reflectivity Regarding
with
cycles,
transitions, were most
optimum
of Te- or Se-based media
to the crystalline
When we apply
films,
phase good
this bein the
transition.
sensitivity
amorphous-to-crystalline
as high quality
stability
In this work,
we prepared
T e x ( G a y S e l _ y ) l _ x films
owing
In this case,
we make use of a difference
for recording
as well
to revers-
recording
characteristics.
are amorphous
high-speed
important.
of c h a l c o g e n i d e s
intro-
has been devoted
an amorphous-crystalline
capability
write-erase
have been commercially
and vice versa.
disk,
spots activ-
as optical
laser-writing
characteristics
area with
Thin films
studied
write-erase
of micro-sized on-going
effort
materials.
widely
to their excellent
on the making
is a research
storage
storage
are being
based
a laser
of
phase
and r e v e r s i b i l i t y
in order
some compositions to learn
the
composition.
2. Experimental In this experiment, a crystalline
photo-induced
to an amorphous
phase
out by the use of a s e m i c o n d u c t o r
phase
transitions,
and vice versa,
laser
0022-3093/87/$03.50 ©Elsevier Science Publishers B.V. (North-Holland Physics Publishing Division)
(wavelength
i.e.
were
from
carrled
830 nm).
1352
M. Okuda et aL
As
the initial
area,
"write"
a short long
interval
In o r d e r
used
and
were
of the
laser
1.0-15
irradiated
transitions
intensity
(P=O.I
crystalline
in the w h o l e
of a s t r o n g
by a r e l a t i v e l y
weak
light
light
for
for a
pulse
or cycle
power
was
m W / c m 2. through
were
of a laser
controlled
In this a glass
detected beam
of w r i t e - e r a s e
pulses
substrate.
with
Hz)
in the range
experiment,
of
the G a - S e - T e The b e h a v i o r
by m e a s u r e m e n t s
biased
tran-
(f=O.l-l.O
of the
a constant
reflec-
low p o w e r
mW).
From
the
width,
relation
it is c l e a r
is d e s i r a b l e
w i t h x=0.7, pulse
lization than
was
illumination
the c h a r a c t e r i s t i c s
light
the
films
imum
by the
"erase"
to e x a m i n e
intensity
(Ga)
and
one-shot
light
tion
of G a - S e - T e
was made
interval.
sitions, were
film
/ Erasable laser recording characteristics
width
(the
8 % was
of m o r e
erasing).
than
2000
been
that m e m o r y
largely
time
depend
The m i n -
the
crystalmore
ratio the
of
above
characteristics
and
upon
in c o m p a r i s o n
cycling,
From
pulse
and y = O . I 5
for
a contrast
of y=O.15.
found
laser
in Fig.l.
attained
and
crystallization
times
(Te)
memory
reversible
be o b t a i n e d
we have
the
of x = O . 7
as shown
i ~s has
in G a c o m p o s i t i o n
results
and
optical
y=O.l,
During
could
the m i n i m u m
power
a composition
and x=0.7,
cycles
experimental
the erase
the r e v e r s i b l e
of about
observed
requiring
that for
y=O.O5
2000
between
reversible
the
cycles
additional
Ga
concentration.
15
15
Teo.7(Go r 5%_y)0.3
o
Teoy (ra o ~ S e I_~ )0.3
v 0
y =o.o5
y=o.m
o rr
10
tO
.o 5
o
0.~
5
I.,LJ
0
~
I , 10 Pulse Widt h (las)
I
I 100
[
,
10
t
100
Pulse W i d t h ( ~ s )
Fig.l. C r y s t a l l i z e d r e g i o n s of some T e 0 . 7 ( G a y S e l _ y ) 0 . 3 films
Fig.2. C o n t r a s t ratio of some T e 0 . 7 ( G a y S e l _ y ) 0 . 3 films as a
as a f u n c t i o n of the erase p o w e r and the pulse width.
function
of the erase
pulse
width
1353
M. Okuda et aL / Erasable laser recording characteristics
In order
to determine
the crystalline be expressed
the change
and the amorphous
of reflection phase,
intensity
the contrast
at
ratio can
as ratio = (R c - Ra)/R c
Contrast
(1)
Here,
R is the reflection intensity at the crystalline phase c and R a is the reflection intensity at the amorphous phase. Figure 2 shows the contrast ratio at 6.5 mW erase power as a function of the erase pulse width. a contrast
width
of above
obtained we have trast
ratio
of under
50 ~s,
while
a contrast
for a Ga composition found
ratio
In the Ga composition
5 % could be obtained
ratio of 5-10 % could be
of y=O.l
and 0.15.
that as the Ga c o n c e n t r a t i o n
also gradually
of y=O.05,
at an erase pulse
From
increases,
the above, the con-
increases.
3. D i s c u s s i o n In order a Ga-Se-Te of Ga-Te,
to investigate phase Se-Te
diagram
and Ga-Se,
Te rich composition.
composition,
diagram
the melting
T A is the melting
position
diagram
points
for
temperature
can be approximately
as
T O = (TA/0A + TB/0B + T c / 0 C ) / ( I / O A Here,
phase
the melting
in Fig.3,
phase
we constructed
to the binary
and calculated
As shown
of point 0 in the ternary calculated
the optimum in relation
temperature
A, T B is the melting
B, and T C is the melting
+ I/OB + I/OC).
of the Se-Te
temperature
temperature
0A, OB and OC are the distances
system
of the Ga-Se
of the Ga-Te
at comsystem
system
from point 0 to points
C, respectively.
(2)
at
at C.
A, B and
I Te
5~
Tew(Ga?~'-Y~-x
u
~
02
501
OJ5
Se
B
Go 4s(
..................
oJ
Fig.3. A schematic picture used in the calculation of Ga-Se-Te ternary phase diagram. ~00
J
1.0
09
I
OB
J
O]
I
X
O~
Fig.4. Melting temperature of some Tex(GaySel_y)l_ x alloys function of the Te compositions.
as a
M. Okuda et al. / Erasable laser recording characteristics
1354
4 shows the melting
Figure
tions as a function eutectic
points
correspond
for Ga compositions
to the Te compositions
It was shown
that
disk materials,
segregation
While,
in order
segregation
point
the region
tions
These
of y=O.1,
O.15
Ga composi-
systems
have
and 0.2,
and
diagram
system
thus,
of reversible
unsuitable
the stable
is n e c e s s a r y
optical
such as the Se-Te for cyclic
operation, because
alloy operation.
the system hav-
at an eutectic
point,
has not occurred.
As can be seen
in Fig.4,
These
it is known
of Ga compositions
of x=O.7-0.8
erty.
and is,
to obtain
ing an eutectic
of various
of x=O.7-O.8.
in the phase
an isomorphous
causes
tem,
temperatures
of the Te compositions.
is suitable
results
agreed
that
in the Ga-Se-Te
of y=O.i-O.2
for obtaining
well with
sys-
and Te composi-
the eutectic
the experimental
prop-
results
in Fig.1. 4. Conclusion The experimental films
results
obtained
for erasable
of T e x ( G a y S e l _ y ) l _ x and the suitable
ing the reversible
chalcogenide
films
model
optical
are as follows;
i) In the Te composition
of T e x ( G a o . i S e o . 9 ) l _ x systems,
has good c h a r a c t e r i s t i c s
on the c r y s t a l l i z a t i o n
the contrast times)
ratio
(8-9 %) and the reversible
in comparison
with x=0.6
2) For the c r y s t a l l i z a t i o n leads
to a shorter
crystallization mum
time
time
and
time,
time
x=O.7
(8 ~s),
cycling
(2000
0.8.
the G a composition
than that of y = O . 0 5
of about
disk
for understand-
i us was
of y = O . 1 5
or y=O.1
obtained
and the
under
the opti-
condition.
3) From
the discussion
composition
on the G a - S e - T e
of the reversible
to the eutectic and many cycle
point.
Therefore,
operations
phase
chalcogenide
diagram,
materials
segregation
the optimum corresponds
has not occured
are possible.
References i) T.Matsushita, A.Suzuki, M.0kuda, J.C.Rhee and H.Naito: Jpn. J. Appl. Phys. 2__~4(1985) L504. 2) J.C.Rhee, M . 0 k u d a and T.Matsushita: Jpn. J. Appl. Phys. 2~6 (1987) 102. 3) M.Okuda, J.C.Rhee and T.Matsushita: Jpn. J. Appl. Phys.
26 ( 1 9 8 7 )
718.