- Email: [email protected]
Establishment of reliability data for power plant components by means of an information system
268
World Abstracts on Microelectronics and Reliability
cost allocation to interdependent mission components (e.g., geographical coverage, timing, bandwidth, amplification); or the need for game-theoretic evaluation of the economic risk in a competitive environment. These arguments may be valid if one were considering satellite utility as such; as long, however, as this task is restricted to local allocation of incremental reliability, the problem becomes manageable not only in principle, but with reasonable prospect of fruitful results.
states is large this method encounters problems of storage, computer time and rounding off errors. The problem areas while using this approach for large and complex repairable systems are identified and suitable methods for overcoming these difficulties are suggested. The techniques of state merging, state space truncation and sequential truncation are presented. A brief introduction to the frequency balancing approach is also given as it is necessary for understanding these techniques.
Sequential Hie tests. H. B. BEMMANN. Nachrichtentechnik. Elektronik 24, 9, 325 (1974). (In German). A sequential test method by a "three-way decision procedure" is described in detail, investigating more fully the dependences on the alternatives h = ~,~ ho for the test ~ = Ao and mentioning its advantages compared with a "two-way procedure".
Reliability design of a m a l n t a l n ~ system. K. B. MrSRA.
Simplification method oi fault detection making monoterm degeneration compatible with lunctional completeness• MATUROH NAKAMICHI and TAKASHI YAGI. Trans. Inst. Electronics Commun. Engrs Japan. 57, 9, 43 (1974). Some interesting methods to simplify the fault detection in digital networks have been studied. In this paper, the monoterm degenerated functions which are the general term for the most simple and diagnosable functions, are proposed, and the following problems are investigated (1) what properties they have (2) why they have been used for the trails to simplify the fault detection and (3) what new possibilities they have.
An alternative approach to a reliability problem. N. SINGH. Microelectroa. & Reliab. 13, 277 (1974). In this paper, the author makes use of the regenerative property of a failurerepair process to illustrate how the probabilities of various states of a redundant system with two components can be evaluated. The state probability expressions have been obtained for arbitrary failure and repair rates. However, the results have been verified by assuming exponential failure and repair rates.
Diagnosis of equipment failures by pattern recognition. U F. PAU. IEEE Trans. Reliab. R-23, 3, 202 (August 1974). The main problems in relation to automatic fault finding and diagnosis in equipments or production systems are discussed: (1) compression of the syndrome and observation spaces for better discrimination between failure modes; (2) simultaneous display of the failure patterns and the failure instants, for maintenance control and review of the reliability design; (3) automatic production of a final set of diagnosis assumptions classified according to their probabilities; (4) sequencing of the inspections in accordance with the failure rates and inspection costs.
Establishment of reliability data for power plant components by means of an intormation system. B. WOHACK and H. HORTNER. IEEE Trans. Reliab. R-23, 3, 154 (August 1974). The increasing importance of safety and availability of power plant units demands more detailed and ~proven reliability data for plant components than operational experience could provide till now. In the Federal Republic of Germany an extensive collection of field data from a conventional power plant has been compiled since 1972. The authors give a survey on the information system processing these field data, in order to establish empirically tested reliability data for plant components. •
J
Reliability analysts of large repairable systems. C. SrNGI~. Microelectron. & Reliab. 13, 487 (1974). The state space approach is a flexible technique for system reliability modeling and calculations. When, however, the number of
Microelectron. & Reliab. 13, 495 (1974). The necessity of a proper tradeoff, to achieve an optimum reliability design of a system, is stressed in the paper. Both reliability and availability can be considered as design criteria to arrive at an optimum configuration. Non-linear constraints are permitted. The optimization is carried out through an algorithm developed for the purpose, in earlier papers [ 1, 2]. Examples on system design are also provided.
Reliability assessment of a semiconductor memory by design analysis. D. E. BARNES and J. E. THOMAS. Proc. IEEE Reliab. Phys. Syrup. 74 (1974). The proliferation of new processes, designs and materials now appearing within the confines of what used to be a discrete part package has made the design review an essential tool to the user of modern complex LSI circuits. The functional and circuit detail of a 1024 bit, field programmable, read-only memory is reviewed as an exampie of an LSI device with many unique features, as well as a device which has, in the past, experienced a unique failure mode (program recovery). All of the memory circuits are covered, however the three main elements essential to establishing and maintaining the program are emphasized. These elements are (1) the nichrome resistor programming element, (2) the circuit that develops and delivers the programming pulse and (3) the process and construction of the programming circuit,
Computer-aided sequential testing for equipment reliability. G. LAFO~D. Microelectron. & Reliab. 13, 477 (1974). This paper describes the various aspects of the sequential probability ratio technique as applied to reliability testing. The decision rules are derived and the corresponding boundaries are calculated by means of a computer program which also provides the user with the expected test time and the truncation time. The specification of the test parameters and the choice of the sample size are discussed. The MINIMAX criterion is used to determine the most cost-effective test.
Reliability evaluation of communication systems using flow graphs. K. K. AGGARWAL,J. S. GLrPTA and K. B. MISRA. Microelectron. & Reliab. 13, 535 (1974). Reliability of a network containing only link failures is well attempted in the reliability literature. In a communication network, node failure probability is sometimes as significant as link failure probability. The problem has been given little attention. The procedure evolved is tedious and the resulting reliability expression is quite lengthy. In this paper, the flow graph method of reliability evaluation has been extended to consider simultaneously the node as well as link failure. The method suggested is simple and leads to a simpler reliability expression. An example has been solved doing all the steps of the procedure clearly. On the soltware reliability. N. SUGIURA,M. YAMAMOTO and T. SmINo. Microelectron. & Reliab. 13, 529 (1974). There are two approaches to the software reliability. In one approach, software is evaluated in the same measure as hardware by expanding the concepts of hardware reliability. In the other approach, a new measure based on the
World Abstracts on Microelectronics and Reliability
cost allocation to interdependent mission components (e.g., geographical coverage, timing, bandwidth, amplification); or the need for game-theoretic evaluation of the economic risk in a competitive environment. These arguments may be valid if one were considering satellite utility as such; as long, however, as this task is restricted to local allocation of incremental reliability, the problem becomes manageable not only in principle, but with reasonable prospect of fruitful results.
states is large this method encounters problems of storage, computer time and rounding off errors. The problem areas while using this approach for large and complex repairable systems are identified and suitable methods for overcoming these difficulties are suggested. The techniques of state merging, state space truncation and sequential truncation are presented. A brief introduction to the frequency balancing approach is also given as it is necessary for understanding these techniques.
Sequential Hie tests. H. B. BEMMANN. Nachrichtentechnik. Elektronik 24, 9, 325 (1974). (In German). A sequential test method by a "three-way decision procedure" is described in detail, investigating more fully the dependences on the alternatives h = ~,~
Reliability design of a m a l n t a l n ~ system. K. B. MrSRA.
Simplification method oi fault detection making monoterm degeneration compatible with lunctional completeness• MATUROH NAKAMICHI and TAKASHI YAGI. Trans. Inst. Electronics Commun. Engrs Japan. 57, 9, 43 (1974). Some interesting methods to simplify the fault detection in digital networks have been studied. In this paper, the monoterm degenerated functions which are the general term for the most simple and diagnosable functions, are proposed, and the following problems are investigated (1) what properties they have (2) why they have been used for the trails to simplify the fault detection and (3) what new possibilities they have.
An alternative approach to a reliability problem. N. SINGH. Microelectroa. & Reliab. 13, 277 (1974). In this paper, the author makes use of the regenerative property of a failurerepair process to illustrate how the probabilities of various states of a redundant system with two components can be evaluated. The state probability expressions have been obtained for arbitrary failure and repair rates. However, the results have been verified by assuming exponential failure and repair rates.
Diagnosis of equipment failures by pattern recognition. U F. PAU. IEEE Trans. Reliab. R-23, 3, 202 (August 1974). The main problems in relation to automatic fault finding and diagnosis in equipments or production systems are discussed: (1) compression of the syndrome and observation spaces for better discrimination between failure modes; (2) simultaneous display of the failure patterns and the failure instants, for maintenance control and review of the reliability design; (3) automatic production of a final set of diagnosis assumptions classified according to their probabilities; (4) sequencing of the inspections in accordance with the failure rates and inspection costs.
Establishment of reliability data for power plant components by means of an intormation system. B. WOHACK and H. HORTNER. IEEE Trans. Reliab. R-23, 3, 154 (August 1974). The increasing importance of safety and availability of power plant units demands more detailed and ~proven reliability data for plant components than operational experience could provide till now. In the Federal Republic of Germany an extensive collection of field data from a conventional power plant has been compiled since 1972. The authors give a survey on the information system processing these field data, in order to establish empirically tested reliability data for plant components. •
J
Reliability analysts of large repairable systems. C. SrNGI~. Microelectron. & Reliab. 13, 487 (1974). The state space approach is a flexible technique for system reliability modeling and calculations. When, however, the number of
Microelectron. & Reliab. 13, 495 (1974). The necessity of a proper tradeoff, to achieve an optimum reliability design of a system, is stressed in the paper. Both reliability and availability can be considered as design criteria to arrive at an optimum configuration. Non-linear constraints are permitted. The optimization is carried out through an algorithm developed for the purpose, in earlier papers [ 1, 2]. Examples on system design are also provided.
Reliability assessment of a semiconductor memory by design analysis. D. E. BARNES and J. E. THOMAS. Proc. IEEE Reliab. Phys. Syrup. 74 (1974). The proliferation of new processes, designs and materials now appearing within the confines of what used to be a discrete part package has made the design review an essential tool to the user of modern complex LSI circuits. The functional and circuit detail of a 1024 bit, field programmable, read-only memory is reviewed as an exampie of an LSI device with many unique features, as well as a device which has, in the past, experienced a unique failure mode (program recovery). All of the memory circuits are covered, however the three main elements essential to establishing and maintaining the program are emphasized. These elements are (1) the nichrome resistor programming element, (2) the circuit that develops and delivers the programming pulse and (3) the process and construction of the programming circuit,
Computer-aided sequential testing for equipment reliability. G. LAFO~D. Microelectron. & Reliab. 13, 477 (1974). This paper describes the various aspects of the sequential probability ratio technique as applied to reliability testing. The decision rules are derived and the corresponding boundaries are calculated by means of a computer program which also provides the user with the expected test time and the truncation time. The specification of the test parameters and the choice of the sample size are discussed. The MINIMAX criterion is used to determine the most cost-effective test.
Reliability evaluation of communication systems using flow graphs. K. K. AGGARWAL,J. S. GLrPTA and K. B. MISRA. Microelectron. & Reliab. 13, 535 (1974). Reliability of a network containing only link failures is well attempted in the reliability literature. In a communication network, node failure probability is sometimes as significant as link failure probability. The problem has been given little attention. The procedure evolved is tedious and the resulting reliability expression is quite lengthy. In this paper, the flow graph method of reliability evaluation has been extended to consider simultaneously the node as well as link failure. The method suggested is simple and leads to a simpler reliability expression. An example has been solved doing all the steps of the procedure clearly. On the soltware reliability. N. SUGIURA,M. YAMAMOTO and T. SmINo. Microelectron. & Reliab. 13, 529 (1974). There are two approaches to the software reliability. In one approach, software is evaluated in the same measure as hardware by expanding the concepts of hardware reliability. In the other approach, a new measure based on the