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Foreword for the special issue on the ninth international workshop on low energy electron microscopy and photoemission electron microscopy
Ultramicroscopy 159 (2015) v–vi
Contents lists available at ScienceDirect
Ultramicroscopy journal homepage: www.elsevier.com/locate/ultramic
Preface
Foreword for the special issue on the ninth international workshop on low energy electron microscopy and photoemission electron microscopy
The Ninth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM9) was hosted in Berlin, Germany on 14–18 September 2014. Since the first LEEM/PEEM workshop held in Tempe, Arizona, in 1998, the series continued with biennial meetings, with the venue moving between America, Europe and Asia. The main aim of the meeting is to discuss scientific advances in the fields of surface and solid state physics achieved with the help of cathode lens microscopy, to disseminate knowledge, and to promote applications of cathode lens microscopy to a broad audience of interested scientists. The technical approaches include LEEM, PEEM, spin-polarized LEEM, spectroscopic PEEM with synchrotron and laboratory light sources, time-resolved microscopies and specialized techniques. The field of cathode lens microscopy is very lively. With only two years time between LEEM/PEEM-8 in Hongkong and LEEM/ PEEM-9, there were a number of exciting new developments in the direction of spectromicroscopy with soft and hard x-rays, time-resolved experiments down to the femtosecond regime, k-space microscopy, and spin-resolved PEEM with a two-dimensional spin detector. A special event during LEEM/PEEM-9 was the publication of a monograph on cathode lens microscopy by Ernst Bauer [1]. Ernst Bauer is the inventor of LEEM [2] and with his many contributions over the years has laid the foundation for a flourishing field, which continuously progresses in instrumentation and methods that advance the spatial, depth, temporal, energy and spin resolution of LEEM and PEEM. The scope of the Workshop broadly covered these developments and applications of LEEM/ PEEM: (1) to study various phenomena at crystalline surfaces, thin films and surfacesupported nanostructures, including growth and self-organization, magnetism, chemistry, and plasmonics, and (2) to characterize a broad range of specific materials systems, including graphene, multiferroics, oxides, organic layers, compound semiconductors, and (3) to discuss new instrumental developments. LEEM/PEEM-9 was attended by over 150 participants from 21 countries. It was highlighted by talks from six invited Distinguished Guest Lecturers representing close-by experimental approaches to enrich the Workshop and to stimulate new directions in cathode lens microscopy development and applications: http://dx.doi.org/10.1016/S0304-3991(15)00213-2 0304-3991/
Dr. Andrew Bass on “Interactions of Slow Electrons with Organic Matter”, Harald Brune on “Honeycomb Networks as Templates for Magnetic Nanostructures”, Hermann Dürr on “Imaging ultrafast spin dynamics with x-ray free electron lasers”, Jürgen Kirschner on “Experiments on the exchange-correlation hole in solids”, John M. Rodenburg on “Ptychography: a revolution in atomic-scale microscopic imaging”, Tonica Valla on “Natural and Artificial HeteroStructures Involving Topological Insulators”, and Johan Verbeeck on “The production and use of electron vortex beams”. Preceeding the general Workshop program, a half-day tutorial session was also held that provided an opportunity for over thirtyfive students, scientists new to LEEM/PEEM and established members of the community alike, to learn from three leading experts, Ruud Tromp, Michael S. Altman and Frank Meyer zu Heringdorf. The local organizers of the Berlin meeting thank the LEEM/ PEEM Workshop International Advisory Committee for valuable recommendations and encouragement. The organizers gratefully acknowledge support from corporate sponsors, SPECS, ELMITEC, Omicron, Focus, Springer, and A· P· E. Generous financial support was provided by the Deutsche Forschungsgemeinschaft (Grant no. Schn-353/20-1) and CENIDE at the University of Duisburg-Essen. The Guest Editors are also very appreciative of the selfless contributions of peer-reviewers, who delivered insightful evaluations of the manuscripts published in this Special LEEM/PEEM-9 Proceedings Issue of Ultramicroscopy. References [1] E. Bauer, Surface Microscopy with Low Energy Electrons, Springer, New York, 2014. [2] Bauer E. Fifth International Congress for Electron Microscopy, in: Breese S.S. Jr. (Ed.) vol. 1, 1962, Academic Press, New York, p. 11.
Claus M. Schneider Peter Grünberg Institut PGI-6, Forschungszentrum Jülich, 52425 Jülich, Germany Fakultät Physik, Universität Duisburg-Essen, 47057 Duisburg, Germany Frank Meyer-zu-Heringdorf Fakultät Physik, Universität Duisburg-Essen, 47057 Duisburg, Germany Wolfgang Kuch Institut für Experimentalphysik, Freie Universität Berln, 14195 Berlin, Germany
vi
Preface / Ultramicroscopy 159 (2015) v–vi
Contents lists available at ScienceDirect
Ultramicroscopy journal homepage: www.elsevier.com/locate/ultramic
Preface
Foreword for the special issue on the ninth international workshop on low energy electron microscopy and photoemission electron microscopy
The Ninth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM9) was hosted in Berlin, Germany on 14–18 September 2014. Since the first LEEM/PEEM workshop held in Tempe, Arizona, in 1998, the series continued with biennial meetings, with the venue moving between America, Europe and Asia. The main aim of the meeting is to discuss scientific advances in the fields of surface and solid state physics achieved with the help of cathode lens microscopy, to disseminate knowledge, and to promote applications of cathode lens microscopy to a broad audience of interested scientists. The technical approaches include LEEM, PEEM, spin-polarized LEEM, spectroscopic PEEM with synchrotron and laboratory light sources, time-resolved microscopies and specialized techniques. The field of cathode lens microscopy is very lively. With only two years time between LEEM/PEEM-8 in Hongkong and LEEM/ PEEM-9, there were a number of exciting new developments in the direction of spectromicroscopy with soft and hard x-rays, time-resolved experiments down to the femtosecond regime, k-space microscopy, and spin-resolved PEEM with a two-dimensional spin detector. A special event during LEEM/PEEM-9 was the publication of a monograph on cathode lens microscopy by Ernst Bauer [1]. Ernst Bauer is the inventor of LEEM [2] and with his many contributions over the years has laid the foundation for a flourishing field, which continuously progresses in instrumentation and methods that advance the spatial, depth, temporal, energy and spin resolution of LEEM and PEEM. The scope of the Workshop broadly covered these developments and applications of LEEM/ PEEM: (1) to study various phenomena at crystalline surfaces, thin films and surfacesupported nanostructures, including growth and self-organization, magnetism, chemistry, and plasmonics, and (2) to characterize a broad range of specific materials systems, including graphene, multiferroics, oxides, organic layers, compound semiconductors, and (3) to discuss new instrumental developments. LEEM/PEEM-9 was attended by over 150 participants from 21 countries. It was highlighted by talks from six invited Distinguished Guest Lecturers representing close-by experimental approaches to enrich the Workshop and to stimulate new directions in cathode lens microscopy development and applications: http://dx.doi.org/10.1016/S0304-3991(15)00213-2 0304-3991/
Dr. Andrew Bass on “Interactions of Slow Electrons with Organic Matter”, Harald Brune on “Honeycomb Networks as Templates for Magnetic Nanostructures”, Hermann Dürr on “Imaging ultrafast spin dynamics with x-ray free electron lasers”, Jürgen Kirschner on “Experiments on the exchange-correlation hole in solids”, John M. Rodenburg on “Ptychography: a revolution in atomic-scale microscopic imaging”, Tonica Valla on “Natural and Artificial HeteroStructures Involving Topological Insulators”, and Johan Verbeeck on “The production and use of electron vortex beams”. Preceeding the general Workshop program, a half-day tutorial session was also held that provided an opportunity for over thirtyfive students, scientists new to LEEM/PEEM and established members of the community alike, to learn from three leading experts, Ruud Tromp, Michael S. Altman and Frank Meyer zu Heringdorf. The local organizers of the Berlin meeting thank the LEEM/ PEEM Workshop International Advisory Committee for valuable recommendations and encouragement. The organizers gratefully acknowledge support from corporate sponsors, SPECS, ELMITEC, Omicron, Focus, Springer, and A· P· E. Generous financial support was provided by the Deutsche Forschungsgemeinschaft (Grant no. Schn-353/20-1) and CENIDE at the University of Duisburg-Essen. The Guest Editors are also very appreciative of the selfless contributions of peer-reviewers, who delivered insightful evaluations of the manuscripts published in this Special LEEM/PEEM-9 Proceedings Issue of Ultramicroscopy. References [1] E. Bauer, Surface Microscopy with Low Energy Electrons, Springer, New York, 2014. [2] Bauer E. Fifth International Congress for Electron Microscopy, in: Breese S.S. Jr. (Ed.) vol. 1, 1962, Academic Press, New York, p. 11.
Claus M. Schneider Peter Grünberg Institut PGI-6, Forschungszentrum Jülich, 52425 Jülich, Germany Fakultät Physik, Universität Duisburg-Essen, 47057 Duisburg, Germany Frank Meyer-zu-Heringdorf Fakultät Physik, Universität Duisburg-Essen, 47057 Duisburg, Germany Wolfgang Kuch Institut für Experimentalphysik, Freie Universität Berln, 14195 Berlin, Germany
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Preface / Ultramicroscopy 159 (2015) v–vi