- Email: [email protected]
Future Contributions
FUTURE CONTRIBUTIONS H.-W. Ackermann Electron micrograph quality S. Ando Gradient operators and edge and corner detection J. Angulo Mathematical morphology for complex and quaternion-valued images D. Batchelor Soft x-ray microscopy E. Bayro Corrochano Quaternion wavelet transforms C. Beeli Structure and microscopy of quasicrystals M. Berz and K. Makino, Eds (Vol. 191) Femtosecond electron imaging and spectroscopy C. Bobisch and R. M€ oller Ballistic electron microscopy F. Bociort Saddle-point methods in lens design K. Bredies Diffusion tensor imaging A. Broers A retrospective R.E. Burge (Vol. 191) A scientific autobiography N. Chandra and R. Ghosh Quantum entanglement in electron optics A. Cornejo Rodriguez and F. Granados Agustin Ronchigram quantification N. de Jonge, Ed. (Vol. 190) CISCEM 2014 L.D. Duffy and A. Dragt Eigen-emittance J. Elorza Fuzzy operators
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Future Contributions
A.R. Faruqi, G. McMullan and R. Henderson (Vol. 190) Direct detectors M. Ferroni Transmission microscopy in the scanning electron microscope R.G. Forbes Liquid metal ion sources P.L. Gai and E.D. Boyes Aberration-corrected environmental microscopy V.S. Gurov, A.O. Saulebekov and A.A. Trubitsyn Analytical, approximate analytical and numerical methods for the design of energy analyzers M. Haschke Micro-XRF excitation in the scanning electron microscope P.W. Hawkes (Vol. 190) Electron optics and electron microscopy conference proceedings and abstracts, a supplement R. Herring and B. McMorran Electron vortex beams M.S. Isaacson Early STEM development K. Ishizuka Contrast transfer and crystal images K. Jensen, D. Shiffler and J. Luginsland Physics of field emission cold cathodes M. Jourlin Logarithmic image processing, the LIP model. Theory and applications U. Kaiser The sub-Ångstr€ om low-voltage electron microcope project (SALVE) C.T. Koch In-line electron holography O.L. Krivanek Aberration-corrected STEM M. Kroupa The Timepix detector and its applications B. Lencova Modern developments in electron optical calculations H. Lichte Developments in electron holography M. Matsuya Calculation of aberration coefficients using Lie algebra
Future Contributions
J.A. Monsoriu Fractal zone plates L. Muray Miniature electron optics and applications M.A. O’Keefe Electron image simulation V. Ortalan Ultrafast electron microscopy D. Paganin, T. Gureyev and K. Pavlov Intensity-linear methods in inverse imaging N. Papamarkos and A. Kesidis The inverse Hough transform Q. Ramasse and R. Brydson The SuperSTEM laboratory B. Rieger and A.J. Koster Image formation in cryo-electron microscopy P. Rocca and M. Donelli Imaging of dielectric objects J. Rodenburg Lensless imaging J. Rouse, H.-n. Liu and E. Munro The role of differential algebra in electron optics J. Sanchez Fisher vector encoding for the classification of natural images P. Santi Light sheet fluorescence microscopy R. Shimizu, T. Ikuta and Y. Takai Defocus image modulation processing in real time T. Soma Focus-deflection systems and their applications I.F. Spivak-Lavrov Analytical methods of calculation and simulation of new schemes of static and time-of-flight mass spectrometers J. Valdés Recent developments concerning the Systeme International (SI) G. Wielgoszewski (Vol. 190) Scanning thermal microscopy and related techniques
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xxvii
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Future Contributions
A.R. Faruqi, G. McMullan and R. Henderson (Vol. 190) Direct detectors M. Ferroni Transmission microscopy in the scanning electron microscope R.G. Forbes Liquid metal ion sources P.L. Gai and E.D. Boyes Aberration-corrected environmental microscopy V.S. Gurov, A.O. Saulebekov and A.A. Trubitsyn Analytical, approximate analytical and numerical methods for the design of energy analyzers M. Haschke Micro-XRF excitation in the scanning electron microscope P.W. Hawkes (Vol. 190) Electron optics and electron microscopy conference proceedings and abstracts, a supplement R. Herring and B. McMorran Electron vortex beams M.S. Isaacson Early STEM development K. Ishizuka Contrast transfer and crystal images K. Jensen, D. Shiffler and J. Luginsland Physics of field emission cold cathodes M. Jourlin Logarithmic image processing, the LIP model. Theory and applications U. Kaiser The sub-Ångstr€ om low-voltage electron microcope project (SALVE) C.T. Koch In-line electron holography O.L. Krivanek Aberration-corrected STEM M. Kroupa The Timepix detector and its applications B. Lencova Modern developments in electron optical calculations H. Lichte Developments in electron holography M. Matsuya Calculation of aberration coefficients using Lie algebra
Future Contributions
J.A. Monsoriu Fractal zone plates L. Muray Miniature electron optics and applications M.A. O’Keefe Electron image simulation V. Ortalan Ultrafast electron microscopy D. Paganin, T. Gureyev and K. Pavlov Intensity-linear methods in inverse imaging N. Papamarkos and A. Kesidis The inverse Hough transform Q. Ramasse and R. Brydson The SuperSTEM laboratory B. Rieger and A.J. Koster Image formation in cryo-electron microscopy P. Rocca and M. Donelli Imaging of dielectric objects J. Rodenburg Lensless imaging J. Rouse, H.-n. Liu and E. Munro The role of differential algebra in electron optics J. Sanchez Fisher vector encoding for the classification of natural images P. Santi Light sheet fluorescence microscopy R. Shimizu, T. Ikuta and Y. Takai Defocus image modulation processing in real time T. Soma Focus-deflection systems and their applications I.F. Spivak-Lavrov Analytical methods of calculation and simulation of new schemes of static and time-of-flight mass spectrometers J. Valdés Recent developments concerning the Systeme International (SI) G. Wielgoszewski (Vol. 190) Scanning thermal microscopy and related techniques
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