- Email: [email protected]
Guarantee of reliability in electronic components
i%
ABSTRACTS
ON ? ~ I r C R O E L E C T R O v I C S
AND RELfAB[I,I-F'Y
our laborato~" in accordance with C.CT.T. specifications. (2) Test and iavesti~:ati~m meth,,ds: measurcme,.'~ts w i t h i n t h e fraTpe-;--~rk of " G r o u p s A, B, C " : speciaiii'.cd measurements--ionization, capacitanc<, tan -g as a function ~f_ freqvlcncv. (up to li-~c~]. ~. ".;~sr. ,'~ maxim~=" t(~'cr:~D~e~' ' pow,'er factor, etc. "Fhe abo~ ~. permits a better component seiectio~ to be made for each particular applicafio-'._. A few example's illustrate how a given fault ia use can bc traced back to a pb-s{ca! defect and bow it trivea informatiolon the stresses and straips which a component may have tr~ tmderzo ap,d th~se which it is able t<~ withstand. (French) I n d u s t r i a l production and quality. J. CHOW, L'Onde Eh'c.'.rique, September (1963). pp. 842-,'5_46. Finding the best compromise between cost and reliability is today an important task " the work ,~f electronic manufacturers. Production on the industrial scale, notabiv in the field of electronic con> ponents, can contribute not only to lower costs but also to better a-nd more reliable products. Continuous and standardized manut~lcture bv the most modern methods of quality control is necessary to obtain, in a practical manner, the results aireadv reached experimentallv. It is also the only methoc:. by which to overcome, with the aid of specia!ized tcchnica! [aboratories, the numerous factors whicit cause upwanted variations ia the t]aished prodt'ct. T h e roles played bv different departments within an organization are linked to this problem. It is only in organizations- where the Gener-d Directi<~ plans hxdividual efforts correctl--, and where the main aim is correctly understood, that the work (~f electronic specialists in the field of reliability will bear fruit. (French)
RELIABILITY OF COMPONENTS, TUBES AND TRANSISTORS T e c h n o l o g y at the service of electronic tube reliability. R. CH.~_~IPEtx arld H. t-h'gIm, L'Onde
Electrique, September (1963), pp. 941-956. A correspondence between the difEculties at various stages of a tube's manufacture and its eventual reliability is established. T h e necessity to simplify basic structures and to tighten up controls at each stage of production is emphasized. T h e advantages, from a reliability point of view, of various established and non-conventional techniques are reviewed. T h e influence of the human factor in problems of reliability is also underlined. (French)
Guarantee of reliability in electronic components. P. D~:No~_', L'Onde E/ectriq'm, September (1963), pp. 906-912. Knowledge of the reliability of electronic components (of semiconductor devices in particular) is a necessity in modern industrial conccrns, it can be obtained ia two ways: (I) Reliability forecast--obtained bv the manufacturer as a result of more or less accurate experiment~" oa components. (2) Practical results--given by the users of the product_ The two methods overlap and are mutually beneficial to manufacturer aud user since they are based or~ :t clause collaboration between both partie~. (French) I m p r o v e m e n t s increase c e r a m i c capacitor reliability.* !,. NORDQt-tST, Electronic Industr. (U.S.A.) 22, 9 (1963), pp. 76-80. As a result of extended test programmes, common ceramic capacitor faiiure modes and the mechanisms involved are known and understood. A method developed to fluorinate the dielectric material and advanced encapsulation techniques now establish a high devree of reliability in the ceramic capacitor. Statistical aspects of electronic tube reliability. R. CHAMPEIX and H. I-[U,~ER, L'Ovde Electrique, September (1963), pp. 880-89 I. Essential d e m e n t s of reliability statistics are defined : curves of survival and deterioration, reject distribution function, rate of deterioration, average time between rejects, average life. T h e author recalls classical distribution functions: Poisson (exponential) distribution and uormal or Gaussian distribution. A new function called the Weibul! distribution is then advocated because it is better adapted to give an account of electronic tube reliability in terms of the relevant factors. T h e Weibull distribution is defined: R(t)=e--(~)iL, F r o m experimental results it appears that ~ is inversely proportional to the c o m p l e ~ t y of the tube. It is also apparent that the value of this exponent enables one to differentiate between the part played by defects of practical realization and that played by the basic conception of the tube. (French)
ABSTRACTS
ON ? ~ I r C R O E L E C T R O v I C S
AND RELfAB[I,I-F'Y
our laborato~" in accordance with C.CT.T. specifications. (2) Test and iavesti~:ati~m meth,,ds: measurcme,.'~ts w i t h i n t h e fraTpe-;--~rk of " G r o u p s A, B, C " : speciaiii'.cd measurements--ionization, capacitanc<, tan -g as a function ~f_ freqvlcncv. (up to li-~c~]. ~. ".;~sr. ,'~ maxim~=" t(~'cr:~D~e~' ' pow,'er factor, etc. "Fhe abo~ ~. permits a better component seiectio~ to be made for each particular applicafio-'._. A few example's illustrate how a given fault ia use can bc traced back to a pb-s{ca! defect and bow it trivea informatiolon the stresses and straips which a component may have tr~ tmderzo ap,d th~se which it is able t<~ withstand. (French) I n d u s t r i a l production and quality. J. CHOW, L'Onde Eh'c.'.rique, September (1963). pp. 842-,'5_46. Finding the best compromise between cost and reliability is today an important task " the work ,~f electronic manufacturers. Production on the industrial scale, notabiv in the field of electronic con> ponents, can contribute not only to lower costs but also to better a-nd more reliable products. Continuous and standardized manut~lcture bv the most modern methods of quality control is necessary to obtain, in a practical manner, the results aireadv reached experimentallv. It is also the only methoc:. by which to overcome, with the aid of specia!ized tcchnica! [aboratories, the numerous factors whicit cause upwanted variations ia the t]aished prodt'ct. T h e roles played bv different departments within an organization are linked to this problem. It is only in organizations- where the Gener-d Directi<~ plans hxdividual efforts correctl--, and where the main aim is correctly understood, that the work (~f electronic specialists in the field of reliability will bear fruit. (French)
RELIABILITY OF COMPONENTS, TUBES AND TRANSISTORS T e c h n o l o g y at the service of electronic tube reliability. R. CH.~_~IPEtx arld H. t-h'gIm, L'Onde
Electrique, September (1963), pp. 941-956. A correspondence between the difEculties at various stages of a tube's manufacture and its eventual reliability is established. T h e necessity to simplify basic structures and to tighten up controls at each stage of production is emphasized. T h e advantages, from a reliability point of view, of various established and non-conventional techniques are reviewed. T h e influence of the human factor in problems of reliability is also underlined. (French)
Guarantee of reliability in electronic components. P. D~:No~_', L'Onde E/ectriq'm, September (1963), pp. 906-912. Knowledge of the reliability of electronic components (of semiconductor devices in particular) is a necessity in modern industrial conccrns, it can be obtained ia two ways: (I) Reliability forecast--obtained bv the manufacturer as a result of more or less accurate experiment~" oa components. (2) Practical results--given by the users of the product_ The two methods overlap and are mutually beneficial to manufacturer aud user since they are based or~ :t clause collaboration between both partie~. (French) I m p r o v e m e n t s increase c e r a m i c capacitor reliability.* !,. NORDQt-tST, Electronic Industr. (U.S.A.) 22, 9 (1963), pp. 76-80. As a result of extended test programmes, common ceramic capacitor faiiure modes and the mechanisms involved are known and understood. A method developed to fluorinate the dielectric material and advanced encapsulation techniques now establish a high devree of reliability in the ceramic capacitor. Statistical aspects of electronic tube reliability. R. CHAMPEIX and H. I-[U,~ER, L'Ovde Electrique, September (1963), pp. 880-89 I. Essential d e m e n t s of reliability statistics are defined : curves of survival and deterioration, reject distribution function, rate of deterioration, average time between rejects, average life. T h e author recalls classical distribution functions: Poisson (exponential) distribution and uormal or Gaussian distribution. A new function called the Weibul! distribution is then advocated because it is better adapted to give an account of electronic tube reliability in terms of the relevant factors. T h e Weibull distribution is defined: R(t)=e--(~)iL, F r o m experimental results it appears that ~ is inversely proportional to the c o m p l e ~ t y of the tube. It is also apparent that the value of this exponent enables one to differentiate between the part played by defects of practical realization and that played by the basic conception of the tube. (French)