High sensitivity spectral measurements

High sensitivity spectral measurements

RadiationMea.wements.Vol. 23, Nos 213.p. 517, 1594 Copyright0 1994Elsevicr!kicnceLtd Printedin GreatBritain.All tights reserved 1350-4487/94 57.00+ .o...

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RadiationMea.wements.Vol. 23, Nos 213.p. 517, 1594 Copyright0 1994Elsevicr!kicnceLtd Printedin GreatBritain.All tights reserved 1350-4487/94 57.00+ .ocl

Abstract HIGH

SENSITIVITY P. D.

SPECTRAL TOWNSEND

MEASUREMENTS

and 8. J. LUFF

MAPS, University of Sussex, Brighton BNI 9QH, U.K. A new thermoluminescence (TL) spectrometer system has been constructed (Luff and Townsend, 1993) [&fear. Sci. Technol. 465-71) in which the spectra are wavelength multiplexed from 200 to 800 nm using a pair of spectrometers and position sensitive photomultiplier detectors. The use of two spectrometers optimizes the overall detection e&iency. Temperature ranges are either 20-300 K or 20400°C. Overall sensitivity is sutlicient to record TL emission spectra from weak TL sources such as natural quartz or feldspar. For a sensitive radiation dosimeter, CaSO, : Dy, spectra are obtainable down to dose levels near 10gGy. Papers within this conference using the equipment exemplify the advantages of spectral information. Examples include the etching of different types of natural quartz and feldspar, a “variable ED” sediment, and effects of heat treatment and dose on calcite and fluorite-containing impurities. REFERENCES Luff B. J. and Townsend P. D. (1993) High sensitivity thermoluminescence spectrometer. hfeac. Sci. Technof. 4, 65-71.

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