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How many should you check. Chances are, there's money to be saved in your sampling program
World Abstracts on Microelectronics and Reliability
The reliability parameter and its importance for life cycle management. R. L. BAGLOW. Proc. 1975 Canadian SRE Reliability Symposium. May 10th, 1975. Ottawa. p. 91. Increasing importance is being attached to the concept of Life Cycle Management, in military circles at least. The essential element in this concept is to take account of the total cost of ownership and operation of an equipment, or system--the initial capital cost, and the subsequent costs of operation and maintenance over the operational "life" of the equipment. The reliability parameter enters into both classes of cost, but not in any simple way. It interacts with a number of other factors--the complexity of the equipments, the planned availability, the response time for maintenance, the geographic distribution of the equipment, the length of the operational life, the end item cost, and the average cost of a repair action--to mention a few. In this paper we will discuss the nature of the interactions and give some parametric calculations to show the order of magnitude of the effects. A data base management (DBMP) program for integrated logistics support (ILS). A. CHRISTENSENand R. S. J. VOYTEK. Proc. 1975 Canadian SRE Reliability Symposium. May 10th, 1975. Ottawa. p. 73. The Integrated Logistics Support function and its interdependent disciplines such as life cycle costing, reliability and maintainability engineering, spares determination and sparing philosophies is discussed in this paper. This interrelationship is pursued from a Data Base Management Program (DBMP) ~,iewpoint. The (DBMP) can be applied directly to the optimum design and selection of a system of equipment for a sailing vessel, an aircraft, a computer complex or a large orbiting space station. Throwaway maintenance--fact or fiction. ROBERT L. DRAKE. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D . C . p . 139. This paper examines reasons for historic inability to implement discard-upon-failure maintenance policies despite analysis which indicates this to be the least costly alternative. Near term and long term solutions to the problem are offered and a conclusion drawn for improving Logistics Management of evolving electronic product designs. Cost effective burn-in and replacement times. RONALD V. CANFIELD. IEEE Trans. Reliab. R-24, 154 (1975). Burnin and replacement policies have been used to reduce the cost of maintaining a system function. Existing solutions to the burn-in and the combined burn-in, replacement problems are typically difficult to apply. A simpler solution to this problem is given. The only distributional property required is the reliability function. Thus either parametric or nonparametric estimates of reliability can be used in the solution. The nonparametric solution is appealing in the case of a combined burn-in and replacement policy because the U-shaped failure rate makes parametric estimation of reliability difficult. Maintainability analyses and prototype operations. John L. HESSE. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 194. Operations of a large phased array radar prototype are examined as a source of maintainability data. Requirements for data are defined in a system context, and a collection program designed to satisfy them. Analyses of the data obtained yield design feedback as well as an insight into system availability and maintainability. The question of data transferability from the prototype to the production system is addressed, and lessons learned discussed.
19
Application of the sequential t-test to maintainability demonstration. JOSEF SCHMEE. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 239. For a Lognormal maintainability model a joint sequential test for the two parameters /x and cr is proposed. The joint test is carried out by simultaneously using the sequential t-test for ~, and Wald's test for o- with /z unknown. Both tests are truncated. An example is given. Active redundancy in analogue electronic systems. KLAAS B. KLAASSEN. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. p. 573. In analogue electronic systems, active redundancy cannot be accomplished by a simple parallel connection of a number of redundant units. At the branching and the confluence of the signalflow, extra circuits are necessary for fault-isolating signal distribution and fault-tolerant signal combination. A number of principles and methods for the realization of these circuits is given. Further, the partitioning of an analogue system for the allotment of redundancy in view of these required extra circuits is discussed. Finally, the application of signal feedback and signal feedforward is shown to provide means to secure the system functions where no fault-tolerant signal combination is possible.
New maintainability demonstration tests. THOMAS 1. GOSS. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D . C . p . 231. This paper provides new sequential tests for the median, the variance and the mean in maintainability demonstration tests. The tests on the variance and the mean assume that the distribution of repair times follow a lognormal distribution. The nonparametric test for the median is applicable to any percentile of a distribution. Each test is truncated and calculated with exact results using Aroian's direct method in sequential analysis. Sequential estimation and its relationship to how incentives can be applied to a maintainability demonstration are briefly illustrated. Reliability life cyde of a complex electronic airborne equipment. S. P. MERCURIO and J. M. BLACK. IEEE Trans. Reliab. R-24, 2 (1975). A good reliability program through design and production results in excellent equipment performance in the field. A full life cycle under controlled failure reporting and analysis procedures is covered. An excess of 48,000 flight hours over 27,000 missions with 303 failures reported from five reporting maintenance shops constitutes the field reporting phase. In addition, details and supporting documentation of the overall reliability program during the Design Phase, Demonstration Phase, Production Phase and Field Use Phase are presented. Reliability models of NMR systems. FRANCIS P. MATHUR and PAULO T. DE SOUSA. IEEE Trans. Reliab. R-24, 108 (1975). Majority voted redundant systems are widely used. A reliability model is developed and analyzed for N-tuple Modular Redundancy--NMR: (n + 1)-out-of(2n + l)--where the units are subject to stuck-at-0, stuckat-1 or stuck-at-X failures and where failures can occur in a mutually compensatory manner. A reconfiguration of the NMR redundancy, the NMR/Simplex strategy, is proposed and evaluated and its model shown to be included in the general model for the compensated NMR.
How many should you check. Chances are, there's money to be saved in your sampling program. L W MILLER Quality Progress. p. 14 (March 1975). Many opportunities exist for significantly reducing quality costs simply through enlightened application of present sampling technology. Hopefully, the illustrations outlined here will
20
World Abstracts on Microelectronics and Reliability
encourage quality managers and engineers to re-examine the economics of their present program of lot sampling, process sampling and audits.
Reliability criteria for experimental programs. R. J. ALLEN. PrOC. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 98. This paper proposes reliability guidelines/criteria to be used on Experimental Programs. These guidelines and recommendations are based on the work of several, but in particular, two Reliability Programs: (1) The Minuteman Missile System, a large design, development and production Program; and, (2) The Integrated Propulsion Control System (IPCS), an Exploratory Research Program. Experimental Programs should have many of the same reliability criteria by which large programs are controlled. The requirements should be exacting, but specifically defined within the specialized needs of the program and encompass only those elements necessary to justify the dollar cost of reliability. The objectives of an Experimental Program may never be accomplished or at best be compromised if the Experimental System is not highly reliable. On IPCS, criteria were developed, in addition to those imposed by contract, to provide a theoretically, high reliability system.
Elimination of fault sources, an efficient aid to quality ~lbtrov~lltelllk W. ROMMERSKIRCH. Feinwerktechnik & Messtechnik 83, 212 (1975). (In German). The quality standards demanded nowadays cannot be secured any more with the conventional types of quality control. Instead, comprehensive measures vouching for high q~ a1~ty are needed at all phases of production. Nor c,~'.J the necessary degree of quality be achieved and maintained by a few single steps, for it calls for an entire range of interacting activities. A measure is described in this paper which has been adopted successfully in a Swiss company making high-precision machine tools.
A case study approach to the reliability of shipborne electronic systems. P. L. SHOVE and I. E. G. GILROY. Microelectron. and Reliab. 14, 57 (1975). This case study compares the variability between several reliability prediction techniques and failure rate lists. The results were compared against Fleet experience taking into account the anomalies of the reporting system. Maintainability is also predicted and the accuracy of the results compared with Fleet data. The study indicates that standard prediction techniques should be used for both reliability and maintainability and recommends, for reliability, the one which produces the minimum error related to the Fleet environment. The case study concludes by a comparison of the resultant availabilities.
4. M I C R O E L E C T R O N I C S - - G E N E R A L
Recent SOS technology, advances and applications. RAN. S. RONEN and FRANK B. MICHELETTI. Solid State Technology. August 1975. Current SOS technology is described and several significant developments in the past five years are highlighted. Recent interest in SOS has been high both for conventional commercial applications, such as high performance CMOS switching circuits and memories, and for many special requirements that cannot be filled by other technologies, particularly in military systems. The latter applications include radiation hardened MOS and MNOS computer electronics, and linear systems such as amplifiers and power supplies. They also include high-performance signal-processing systems utilizing high speed digital electronics or analog high-frequency Surface Acoustic Wave (SAW) Programmable Tapped Delay Lines (PTDL's) e.g. matched filters, in the commercial area, SOS circuits are mostly advocated for high speed, high performance applications. However, some projections indicate that SOS technology can be cost competitive with equivalent bulk silicon technology, due to increased packing density, easier processing, and significantly simpler topography in specific applications due to the inherent dielectric isolation. However, this has yet 5. M I C R O E L E C T R O N I C S The bipolar LSI breakthrough, Part 1: Rethinking the problem. HORST H. I BERGER and SIEGFRIED K. WIEDMANN. Electronics p~, 89 (Sept. 1975). Complex processing, extravagent use of space and excessive power dissipation impeded the bipolar transistor's move into LSI: basic redesign eliminates large resistors, simplifies gate structure, needs only four-mask process. The bipolar LSI breakthrough, Part 2: ExtendiLg the limits. HORST H. BERGER and SIEGFRIEDK. W1EDMANN. Electronics p. 99 (Oct. 1975). Now that they have the basic structure of merged-transistor logic well in hand, designers are looking for ways of boosting performance to the highest levels without complicating the process too much.
to be demonstrated. Progress in the SOS area depends heavily on improvement in the material, rather than invention of novel circuit concepts or new process technologies. Specific circuits that illustrate current applica tions at Rockwell are discussed, together with the major process technologies involved. Extensive reference material is cited.
Monoliffiics mature, passives improve. LUCINDA MAqq'ERA. Electronics. p. 116. (October, 1975). As in many areas, the major developments in components of late are due largely to improvements in integrated-circuit technology. There is, for example--to cite probably the most notable achievement of the past year---the first complete monolithic analog-to-digital converter. Without ion implantation and other refinements in IC technology, this component would not be available. To a great extent the same is true of other data converters, as well as opera~ tional amplifiers, resistor networks, and virtually the whole gamut of active and passive components. Whatever the driving technology may be. today's state of the art in components is impressive DESIGN
AND
CONSTRUCTION
Logic network synthesis using digital-summation threshold-logic gates. S. L. HURST. MicroeIectronics 6. 42 1975). The recently-developed digital-summanon threshold-logic (DSTL) gate will be introduced, and lib advantages and disadvantages briefly discussed in comparison with previous analogne-type threshold-logic gates. Some typical applications will be shown indicating package and pin savings in random-logxc networks. Consideration of optimum universal package specifications for random-logic work will be mentioned. RAM, ROM, PROM dreuits for simple imao,e processing. M. J. D. WILSON and I. ALEKSANDER.Microelectronics 6, 30 (1975). Image processing is a field which has always suffered from being technologically ahead of its time.
The reliability parameter and its importance for life cycle management. R. L. BAGLOW. Proc. 1975 Canadian SRE Reliability Symposium. May 10th, 1975. Ottawa. p. 91. Increasing importance is being attached to the concept of Life Cycle Management, in military circles at least. The essential element in this concept is to take account of the total cost of ownership and operation of an equipment, or system--the initial capital cost, and the subsequent costs of operation and maintenance over the operational "life" of the equipment. The reliability parameter enters into both classes of cost, but not in any simple way. It interacts with a number of other factors--the complexity of the equipments, the planned availability, the response time for maintenance, the geographic distribution of the equipment, the length of the operational life, the end item cost, and the average cost of a repair action--to mention a few. In this paper we will discuss the nature of the interactions and give some parametric calculations to show the order of magnitude of the effects. A data base management (DBMP) program for integrated logistics support (ILS). A. CHRISTENSENand R. S. J. VOYTEK. Proc. 1975 Canadian SRE Reliability Symposium. May 10th, 1975. Ottawa. p. 73. The Integrated Logistics Support function and its interdependent disciplines such as life cycle costing, reliability and maintainability engineering, spares determination and sparing philosophies is discussed in this paper. This interrelationship is pursued from a Data Base Management Program (DBMP) ~,iewpoint. The (DBMP) can be applied directly to the optimum design and selection of a system of equipment for a sailing vessel, an aircraft, a computer complex or a large orbiting space station. Throwaway maintenance--fact or fiction. ROBERT L. DRAKE. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D . C . p . 139. This paper examines reasons for historic inability to implement discard-upon-failure maintenance policies despite analysis which indicates this to be the least costly alternative. Near term and long term solutions to the problem are offered and a conclusion drawn for improving Logistics Management of evolving electronic product designs. Cost effective burn-in and replacement times. RONALD V. CANFIELD. IEEE Trans. Reliab. R-24, 154 (1975). Burnin and replacement policies have been used to reduce the cost of maintaining a system function. Existing solutions to the burn-in and the combined burn-in, replacement problems are typically difficult to apply. A simpler solution to this problem is given. The only distributional property required is the reliability function. Thus either parametric or nonparametric estimates of reliability can be used in the solution. The nonparametric solution is appealing in the case of a combined burn-in and replacement policy because the U-shaped failure rate makes parametric estimation of reliability difficult. Maintainability analyses and prototype operations. John L. HESSE. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 194. Operations of a large phased array radar prototype are examined as a source of maintainability data. Requirements for data are defined in a system context, and a collection program designed to satisfy them. Analyses of the data obtained yield design feedback as well as an insight into system availability and maintainability. The question of data transferability from the prototype to the production system is addressed, and lessons learned discussed.
19
Application of the sequential t-test to maintainability demonstration. JOSEF SCHMEE. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 239. For a Lognormal maintainability model a joint sequential test for the two parameters /x and cr is proposed. The joint test is carried out by simultaneously using the sequential t-test for ~, and Wald's test for o- with /z unknown. Both tests are truncated. An example is given. Active redundancy in analogue electronic systems. KLAAS B. KLAASSEN. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. p. 573. In analogue electronic systems, active redundancy cannot be accomplished by a simple parallel connection of a number of redundant units. At the branching and the confluence of the signalflow, extra circuits are necessary for fault-isolating signal distribution and fault-tolerant signal combination. A number of principles and methods for the realization of these circuits is given. Further, the partitioning of an analogue system for the allotment of redundancy in view of these required extra circuits is discussed. Finally, the application of signal feedback and signal feedforward is shown to provide means to secure the system functions where no fault-tolerant signal combination is possible.
New maintainability demonstration tests. THOMAS 1. GOSS. Proc. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D . C . p . 231. This paper provides new sequential tests for the median, the variance and the mean in maintainability demonstration tests. The tests on the variance and the mean assume that the distribution of repair times follow a lognormal distribution. The nonparametric test for the median is applicable to any percentile of a distribution. Each test is truncated and calculated with exact results using Aroian's direct method in sequential analysis. Sequential estimation and its relationship to how incentives can be applied to a maintainability demonstration are briefly illustrated. Reliability life cyde of a complex electronic airborne equipment. S. P. MERCURIO and J. M. BLACK. IEEE Trans. Reliab. R-24, 2 (1975). A good reliability program through design and production results in excellent equipment performance in the field. A full life cycle under controlled failure reporting and analysis procedures is covered. An excess of 48,000 flight hours over 27,000 missions with 303 failures reported from five reporting maintenance shops constitutes the field reporting phase. In addition, details and supporting documentation of the overall reliability program during the Design Phase, Demonstration Phase, Production Phase and Field Use Phase are presented. Reliability models of NMR systems. FRANCIS P. MATHUR and PAULO T. DE SOUSA. IEEE Trans. Reliab. R-24, 108 (1975). Majority voted redundant systems are widely used. A reliability model is developed and analyzed for N-tuple Modular Redundancy--NMR: (n + 1)-out-of(2n + l)--where the units are subject to stuck-at-0, stuckat-1 or stuck-at-X failures and where failures can occur in a mutually compensatory manner. A reconfiguration of the NMR redundancy, the NMR/Simplex strategy, is proposed and evaluated and its model shown to be included in the general model for the compensated NMR.
How many should you check. Chances are, there's money to be saved in your sampling program. L W MILLER Quality Progress. p. 14 (March 1975). Many opportunities exist for significantly reducing quality costs simply through enlightened application of present sampling technology. Hopefully, the illustrations outlined here will
20
World Abstracts on Microelectronics and Reliability
encourage quality managers and engineers to re-examine the economics of their present program of lot sampling, process sampling and audits.
Reliability criteria for experimental programs. R. J. ALLEN. PrOC. Reliability and Maintainability Symposium. 28-30 January, 1975. Washington D.C.p. 98. This paper proposes reliability guidelines/criteria to be used on Experimental Programs. These guidelines and recommendations are based on the work of several, but in particular, two Reliability Programs: (1) The Minuteman Missile System, a large design, development and production Program; and, (2) The Integrated Propulsion Control System (IPCS), an Exploratory Research Program. Experimental Programs should have many of the same reliability criteria by which large programs are controlled. The requirements should be exacting, but specifically defined within the specialized needs of the program and encompass only those elements necessary to justify the dollar cost of reliability. The objectives of an Experimental Program may never be accomplished or at best be compromised if the Experimental System is not highly reliable. On IPCS, criteria were developed, in addition to those imposed by contract, to provide a theoretically, high reliability system.
Elimination of fault sources, an efficient aid to quality ~lbtrov~lltelllk W. ROMMERSKIRCH. Feinwerktechnik & Messtechnik 83, 212 (1975). (In German). The quality standards demanded nowadays cannot be secured any more with the conventional types of quality control. Instead, comprehensive measures vouching for high q~ a1~ty are needed at all phases of production. Nor c,~'.J the necessary degree of quality be achieved and maintained by a few single steps, for it calls for an entire range of interacting activities. A measure is described in this paper which has been adopted successfully in a Swiss company making high-precision machine tools.
A case study approach to the reliability of shipborne electronic systems. P. L. SHOVE and I. E. G. GILROY. Microelectron. and Reliab. 14, 57 (1975). This case study compares the variability between several reliability prediction techniques and failure rate lists. The results were compared against Fleet experience taking into account the anomalies of the reporting system. Maintainability is also predicted and the accuracy of the results compared with Fleet data. The study indicates that standard prediction techniques should be used for both reliability and maintainability and recommends, for reliability, the one which produces the minimum error related to the Fleet environment. The case study concludes by a comparison of the resultant availabilities.
4. M I C R O E L E C T R O N I C S - - G E N E R A L
Recent SOS technology, advances and applications. RAN. S. RONEN and FRANK B. MICHELETTI. Solid State Technology. August 1975. Current SOS technology is described and several significant developments in the past five years are highlighted. Recent interest in SOS has been high both for conventional commercial applications, such as high performance CMOS switching circuits and memories, and for many special requirements that cannot be filled by other technologies, particularly in military systems. The latter applications include radiation hardened MOS and MNOS computer electronics, and linear systems such as amplifiers and power supplies. They also include high-performance signal-processing systems utilizing high speed digital electronics or analog high-frequency Surface Acoustic Wave (SAW) Programmable Tapped Delay Lines (PTDL's) e.g. matched filters, in the commercial area, SOS circuits are mostly advocated for high speed, high performance applications. However, some projections indicate that SOS technology can be cost competitive with equivalent bulk silicon technology, due to increased packing density, easier processing, and significantly simpler topography in specific applications due to the inherent dielectric isolation. However, this has yet 5. M I C R O E L E C T R O N I C S The bipolar LSI breakthrough, Part 1: Rethinking the problem. HORST H. I BERGER and SIEGFRIED K. WIEDMANN. Electronics p~, 89 (Sept. 1975). Complex processing, extravagent use of space and excessive power dissipation impeded the bipolar transistor's move into LSI: basic redesign eliminates large resistors, simplifies gate structure, needs only four-mask process. The bipolar LSI breakthrough, Part 2: ExtendiLg the limits. HORST H. BERGER and SIEGFRIEDK. W1EDMANN. Electronics p. 99 (Oct. 1975). Now that they have the basic structure of merged-transistor logic well in hand, designers are looking for ways of boosting performance to the highest levels without complicating the process too much.
to be demonstrated. Progress in the SOS area depends heavily on improvement in the material, rather than invention of novel circuit concepts or new process technologies. Specific circuits that illustrate current applica tions at Rockwell are discussed, together with the major process technologies involved. Extensive reference material is cited.
Monoliffiics mature, passives improve. LUCINDA MAqq'ERA. Electronics. p. 116. (October, 1975). As in many areas, the major developments in components of late are due largely to improvements in integrated-circuit technology. There is, for example--to cite probably the most notable achievement of the past year---the first complete monolithic analog-to-digital converter. Without ion implantation and other refinements in IC technology, this component would not be available. To a great extent the same is true of other data converters, as well as opera~ tional amplifiers, resistor networks, and virtually the whole gamut of active and passive components. Whatever the driving technology may be. today's state of the art in components is impressive DESIGN
AND
CONSTRUCTION
Logic network synthesis using digital-summation threshold-logic gates. S. L. HURST. MicroeIectronics 6. 42 1975). The recently-developed digital-summanon threshold-logic (DSTL) gate will be introduced, and lib advantages and disadvantages briefly discussed in comparison with previous analogne-type threshold-logic gates. Some typical applications will be shown indicating package and pin savings in random-logxc networks. Consideration of optimum universal package specifications for random-logic work will be mentioned. RAM, ROM, PROM dreuits for simple imao,e processing. M. J. D. WILSON and I. ALEKSANDER.Microelectronics 6, 30 (1975). Image processing is a field which has always suffered from being technologically ahead of its time.