International Winter Conference 1980 on Developments in Atomic Plasma Spectrochemical Analyses, Inductively Coupled, Microwave, and D.C. Plasma Discharges 7–11 January 1980, San Juan, Puerto Rico, U.S.A.

Spenrochimica Acta, Vol. 348. pp. 457 to 466. Pagamon Press Ltd., 1979. Printed in Great Britain.

ANNOUNCEMENTS

International Winter Conference 1980 011

Developments in Atomic Plasma Spectrochemical Analyses, Inductively Coupled, Microwave, and D.C. Plasma Discharges 7-11 January 1980, San Juan, Puerto Rico, U.S.A. Further to the Announcement in SpectrochimicuActu 34B, 237 (1979) we present here the Preliminary Program of the International Winter Conference 1980 on Developments in Atomic Plasma Spectrochemical Analyses.

Preliminary

Program

PLPSMA CHARAClERISTICS Mondaytimlng,Januxry 7

'NOTE:

DElEcIION LIMITSAND OTHER FIGURESOF l@ZRIT IN I.C.P.E.S. Albr1pj-k

&

S.

Greenfield,

Wilson,P.O. Box 80, TrinitySt., Oldbury,Warley,West Mid-

lands,B69 4LN, U.K.

INVESl?IGATIONOF33¶3NONEQUILIBFUUMPF0Z%ES IN?HE CHEMICAL ICP Tt3RCH.Hans U. Eckert, 3901Via Pavion,PslosVerdesEstates,Pslos Verdes,Cdlif. 90274. ‘THEORE!lXAL

INIxTCTtONPLASMA~DELLING-STA'IEOFTHEAFU'. MaherBoulos and-n M. Bames, CheticalEnglneerlngDept.,Universityof Sherbrwke, she+ brooke,P.Q. JlK 2Rl, Canada. PRELIMINARYRFSULTSWITHA LOW CONSUMPTION ARGON ICP. G. R. Komblum, Jsffalasn9, 2628 BX Delft,The Netherlands. SPECTPALINlE'3Z3ENCES WITH AN ICP IN AmlIC EMTSSIONSPEZ~SCOPY. J. M. I'&mx?t and C. Trassy,InstitutNationalde8 SciencesAppliquees, Laboratoirede Physicochimie Industrielle, Bt 401, 20 AvenueA. Einstein, 69621Villeurbanne~edex,~rsnce. ICP SPECTRALCHARAClERISTICSATLOWUVWAVEZ3JG?XS. G. F. Wallaceand R. D. Ediger,Perkin-Elrrer Corp.,Norwalk, Corm. 06856. STUDY OFTHECONTJNUUM SNANARGONINDUfZIVELY COUPLEDPLASMA. A.Batal, J. Jarosz,and J. M. Mem&, hstitut Nationaldes SciencesAppliquees, Lsboratoired.ePhysicochimie Industrielle, Bt 401, 20 AvenueA. Einstein, 69621Villewhnne CEl33X, France.

HIGHL,Y-STRUCTUF!EDICPBACKGRO~EMISSION. R. D.EdigerandD.L.Hoult, Perkin-Ehr Corp.,~~~alk, corm. 06856. THE OPTIMIZATON OF AN INDUCTIVELY COUPLED PLASM4 FOR METALLURGICAL SheffieldCity Polytechnic ANALYSIS. Dr. L. Ehlon, Dept. of Chexrdstry, Pond Street,Sheffield,Sl lWB, wand.

I%ndsyAftemoon,Jsnusry 7 GJZOLOGICAL AND WA'IERANALYSIS KEYNO!lZ:

LJ3'EWITHSPECTROcHEMICALPLASM&SOURCES IN AIPOCKANALYSISLABOF?&IORY: 457

458

Announcements

MIFfl?Y'IOFmlY-~T EXCITEVZ3NT. K. Ckwindaraju,CentreNational de la Rechemhe Scientifique, C. 0. No. 1, 54 500 Vandoeuvre-les Nancy, France. KEYNOTE:

CURRENTSTATUSOF PLASMAEMISSIONSPECTROSCOPY IN WATER ANALYSIS. H. E. Taylor,U. S. GeologicalSurvey,P. 0. Box 25046,Denver,Colorado, 80225.

POSTER

TRACEELEMENTDE!IERMINA'ITONS INGEOLGGICALREFERENCEMA?ERIALS. S.E. SESSION: Church,AppliedResearchLaboratories, 9545 WentworthStreet,SLnland, Calif.91040. MEAS~TSOFMTNERPLLSTOICHIO~:THIANDCOHE~~TRA~OS~ ~CALSTUDIESBYARGONINWClTVELYCO~DPLASElASPECTIIOMETRY. D. W. Golightly,U.S. GeologLcslSurvey,957 NationalCenter,Reston, Va. 22092. APPLICATIONS OF INDUCTIVELYCXXJPLED PLASMASPECTROSCOPY 'RIGEXHEMICAL RECCNNAISSANCE FOR URANIUMEXPLORATION.G. W. Cagle and T. R. Butz, UFE Project,K-1570-C,m-246, Union Carbide,NuclearMtision, Oak Ridge,Tent-~. 37830. 'DIEAPPLICATIONOF ICP !I0EXPLORATIONGEOCHEMISTRY.Paul J. Lechler and R. LeFninger,IndianaGeo Survey,611 N. Walnut Grove,Bloorrdngton, Ind. 47405. IRONOREANALYSISBY DC PLASMA. Larry ford, ct.

Shore,

Amricsn

Cyansmid,Stam

APPLICATIONOF THE INDUCTIVELYCOUPLEDPLASMA'ICTHE ANALYSISOF MAIUNE SAMPLES. S. S. Berman,J. W. McLaren,and D. S. Russell,Analytical Chernlstry Section,NationalResearchCouncilof Canada (N.R.C.),Ottawa, KlaOR9, Canada. ANALYSISOF SEAWATER. Walter G. Cox, Naval UnderwaterSystemsCenter, Materialsand ChemistryBranch,Newport,R. I. 02840. CORRECTIONFDRENHAN~EFFECIS INIHED.C. PLASMA. Mart&Schulz HendrickandDelyleEastwood,U. S. Coast GuardR & D Center,Avery Point, Gmton, Ct. 06340 ?SALT"EF?iEc!TS IN A STABILIZEDDC PLASMAARC. Thorrras R. Gilbert,Harold EdgertonRes. Lab., New EnglandAquarium,Boston,MA 02110 and Danton D. Nygasrd,Dept. of Chemistry,Bates College,Lewiston,ME 04240. ATOMICEMISSIONSPEC'IXXSo3PY: III. DIRECT.CURRENTPLASMA/MUL~ ANALYSISOF GEC'IHEIIMAL WATERS. EverettA. Jenne and J~s W. Ball, U.S. GeologicalSurvey,345 MiddlefieldRoad, Menlo Psrk, Calif.94025 D.C. PLASMAEMISSIONSPEcTIlllScOPY COMPARIS3NOFAlPIOMATICMIJLTI~ ANDATOMTCABSORPTIONSPECTR3SCOPYFDREPADIS~~ANALYSES. Hank Griffinand Amold Savolainen,Texas Instruments, Inc., M'S 10-16, 34 ForestSt., Attlebom, MA 02703. USE OFICPESINSTUDIES 733IZEFINE ?HEHYDI%3~GICIME'ACTOFUiNDFILT., DISPOSALOFSOLIDWAS~FROMFLUUlIZEDBEDCOMB~~ON. RobertM. Mann and D. L. Heinrich,Radian Corporation, 8500 Shoal CreekBlvd.,Austin, Texas, 78766. SIMULTANECUS MULTIELEMENT ANALYSISOF NATURALWATERSBY INDUCTIVELY CoupLEDPLASMA-OP!lTCAL EMISSIONSPEmMlXTRY. G. F. Larson,R. T. Go&pasture, R. W. Morrow,Oak Ridge Y-12 Plant,P. 0. Box Y, Oak Rid@, Term. 37830. HFAVYMETALcON?ENTOF DRINKINGWATER BY ICAP SPECTROMETRY.ArthurW. Vames and WilllamH. Strain,Case WesternReserveMedicalSchool,3395 ScrantonRd., Cleveland,Ohio 44109. DE'IEmAnON OF 'IWTAL ORGANICCARBONIN WATER BY ICP4ES. tennisA. Yates,J. StephenJones and EdwardJ. Hinderbewr, Envirorxn?ntal Trace Substancesyes. Center,Vniversityof Missouri,Coltiia, w 65201.

Annoonccmcnts

459

SIMUL~US

MULT ANALYSISOF NATURALWATERSBY INDUC!IIVFLY CoupLEDPLASMA-OPTICALEMISSIONSPEC~. GeorgeMarson

ANALYSISOFOILFIELDBRINESFDRHEAVYMETALCONCENTRATIONSBYlX ARGON PLASMAsPEcxPuXXx PY. Walter G. Cox, Naval UnderwaterSystemsCenter, Materialsand ChetistryBranch,Newport,R. I. 02840. DE~A~ONOFLEADAM)~-ONEO'MER~~INGLASSFIBERFIL'IERS BY lNDXX'IVJ&YcOupLED~NPLAsMA-A'1DMIC~IONSpEcTRD~. CharlesT. Elly, U.S. EPA, CentralRegionalLab, 536 So. Clark St., chic=, 111. 60605. RAPIDANALYSISOFELEC'lP0LYMCCOPPERREFINERYSLIMESFDRPRECIOUSAND O'IHERmTAISBYM: ARGONPLASMADISCHARGE. DonaldE.Jordan,Phelps Dodge Corp.,Mxenci Branch,Mxenci, Ariz. 85540. SAMPLEINTRDDUCPION TuesdayMooming,January8 KEYNOTE:

ICP: A FOLYHEDRCNWITH MANY INTERFACES. Dr. Paul Bousnns,PhilipsReseamhLabomtory,Eindhoven,IheNetherlands. DESIGNOFANEWULTRASONTCNEBULIZERFORROVrSNE~~YSIS ININDUCTIVELY CXJPLEDPLASMA-ATOMTC EMISSIONSPECTFOSCOPY.J. M. Msmet and C. Trassy, InstitutNationaldes SciencesAppliquees,Laboratoim de Physicochinde Industrielle, Bt. 401, 20 AvenueA. Einstein,69621Villeurbanne, France., and P. R&xxi-x and J. P. Ellerbach,InstrumentsS.A. DivisionJobin-Yvon, 16 rue duCanal,gll60 L.o~~au,Frence. NEwApP~A~STosAMpLE~~cmON~THEINDUC'IIvELYcOupLEDPLAsMA. Ronald Suddendorf', KennethW. Boyer,AnalyticalChemistry& PhysicsBranch, Div. of Chemistry& Physics,Bureau of Foods,~~~-146, Dept. of HEW, Food sndDrugAdm., Wash?u-@on,D.C. 20204. RECENTSTUD~~SAMPLE~DUCTLON~'IHERFICP. RichsxdF. Browner,MarilynS. Black and AndrewW. Boom, Geor@;La Instituteof %xhnology, Schoolof Chemistry,Atlanta,Ga. 30332. PRECISIONCF ROVTINEICP ANALYSISWITH A HIGH PRESSURECROSS-FLOW NEBULIZER. H. An&rson,H.KsiserandB.Mxidin@;s,SherrlttGordon mes, Ltd., Fort Saskatchewan, Alberta,T8L 2P2, Canada. CONCENTRICNEBULIZERS:ANUPDATE. Jms Rd., Santa Ana, Calif.92705.

E. Meinhsrd,12472 Rsnchwood

NEWNEBULIZERDESIGNSFORTHE INDUCTIVELYCOUPLEDPLASMA. CharlesC. Wohlersand Csrml J. Hofti, Jarrell-AshDiv., Fisher ScientificCo., 590 LincolnSt., Waltham,MA. 02154. STUDIES OF CROSS FLOWNEBULIZERS. StephenMvers,D.H. TracyandR.D. Ediger,PerkinElrrerCorp.,Main Ave., Norwalk,Ct. 06856.

ACiUTICALEVALUATlONOFDIFF&RENT ICP SYSTEMSFOR 'IHEANALYSISOF SQLUTIONS. Dr. J. A. C. Bmekztert,Instltutfur Spektmchetie,Bunsen-Kirchhoff-Strasse11, 4600 Dxtmund 1, Gerseny. PETROLEUMANDINIXJSTFXALANALYSES TuesdsyAftemoon,January 8 KEYNOTE:

ME~~~YCOUPLEDPLASMA_ANIMPOKTANTANDVERSA??LE'IWILFr3R THE PETRCLEUMINDusTRY.Ruth Merryfield,PhilipsPetroleumConpary, Research& Developmnt, Bartlesville, OK. 74004.

KEYNOTE:

ICP/AESANALYSISAND THE COMPOSITIONOF AIFBORNEAND SOIL MATERIALSIN ME: VICINITYOF A LEAD/ZINCSMELTER. Dr. N. R. McQusker,A. J. Lynch andD.F.Bmwn, 3650 Wesbmok Crgs.,Vancouver,B.C.VGS 2L2,Csnada

FOLDER SESSION

MUL??-ELEMENT D.C. PLASMAEMISSIONSPECTBDSCOPIC ANALYSISOF STEELS. Hank Griffin,Amold Savolainen, Texas Instmts Inc., M/S 10-16,

34 ForrestSt., Attlebom, MA 02703,and Jms College,Providence,R. I. 02918.

Beliveau,Providence

Amolulcemmts

460

APPLICXPIONS OF I.C.P.IN SOLVINGCHEMICALANALYSISPw IN !IHE E?hanwrsadM. Joshi,Ford Mator Oonpsny,P.O. A~BILEINDUSTRIES. Box 2053, Dearborn,Mkh. 48121. WalterZamchek,Union MEICPINANGN-RX?XNELABORAlXXfY~. N.Y. 1059l. carbideCorp.,Old Saw MLll River Rd., Tarrytowr~, DCP SPEC~~~CANALY~ISOFSELE~J.ED~ INGLASS. S. J. Simon andR. A. Burdo,AnalyticslLaboratory,ContmlTechnologY, ComingGlass Works,M&I Plant 52-3, Coming, N. Y. 14830. AppLICA~oNOFIcPsOEINS~~~LABoRATDR1Es. OXXD~A~WXKSUPAndIe Wittmrm,Dr. PORIEDBYIHE CX'lMISSIONOFEUX)PEAN~~. Hughes,Dr. Hancart and Dr. Ohls, Laboratoim d'Analyse,IRSID,F 57210, Maizieresles M&z, France. ADIFECTCOMPAFUSONOFTHE INDUSIRIALANALYTICALUl'lLITYOFDCANDIC PLASMAS. CharlieFairlessandJimEdmnds,?he DoWChemical Company, AnalyticalLaboratories, Midland,Mich. 48640. 'IHED.C. AElGoNPLASMAIN P.M. ANALYSIS. H. R. Hayward,EhgelhardInGL14 2PB, U.K. dustries,Ltd., ValleyRoad, Cinderford,Gloucestershlre, EFFEC'ISOFINS~P~ UPON ICP LINE AND BACKGBXJNDEMISSION FRCM XXLENESOLUITONS. A. W. Vsmes, Ihe StandardOil Co., 4440 Wsrrensville CenterRd., Cleveland,Ohio 44128. TRACEMl?l!ALDISTRIBUl?IONINSOLVENT moALS (SRCS)FROMLCPEAK WIMH PRACTIONSBY ICP-OES. DouglasHauslerand Larry T. Taylor,Virgihia Polytech.& State University,Cherrdstry Dept.,Blacksburg,VA 24061. lXTERMINA~ONOFTRACEMETAJ_SINPETF0LEUMANDPE!B%XEUMPRODUCTSUSING THEIX PLASMA-ECHELLESPEClRGMER%.R.J.Brown,ChevmnResearchCo., P. 0. BOX 1627, Richmond,Callf.94802. FUSIONmCE. COALASHELEMENT ANALYSISBY ICPES USING AN AUlIIMATlC R. I. Botto,Exxon Research& Engkxerlng Co., SyntheticFuels Research, P. 0. Box 4255, Baytown,Texas 77520. ANALYSISOFENERGY-RELATEDEFFLUENTS USINGICPES. MaxyM.McKown, DonaldL. Sgontz,JudithE. Gebhartand Ann L. Alford,Battelle,Columbus Laboratories, 505 King Ave., Coltius, Ohio 43201.

Wednesday~~,January KEYhlO!m:

9

SPEC~ScOPICIXCEC?DFS INCHF0MAlOGRAPHY-AREVIEW. P.C. Uden,Dept. of Chemistry,GRC Tower I, lfiiversity of Massachusetts, Amherst,MA 01003. USEOFANI~/~NP~SOURCEASLIE?ECXIRF13RGAS~~GRAPHY. Dr. Knut Ohls, HoeschHuttenwerke, HorderBurstr.15017,4600 Dxtmmd 30, Genraru. ~~~'IITONOFANAIM3SPHERICPIlESSUREHELIUMMIC~AVEPLASMAASAGAS CHROMA%XRAPHYIXXECIORF0RPESPICItES.JosephHubert,T.Han&,S. Coulor&e,M. Moisan and J. H&m-t, Chertdstry Dept.,Universityof Mintreal,I%ntrml, P.Q.H3C 3Vl, Canada. INDUSTRIALAPPLICA'ITTONS OF MICROWAVEAND DC PLASMAS. CharlieFairless, Wayne BlaserandJimEdmnds, The DoWChemical Co.,AnslyticalLaboratO* ies, Mklland,Mlch. 48640. NITBXENFORGAS CHROMA'IDCHEMILUMINESCENCELIcIEc'113RBASEDONAC'EIVE GRAPHYOF HYDRQCARBONS.D. G. Suttonand J. E. l&km, The AerVSpaCe P.O. Box 92957,Los Angeles,Calif. 90009. COW.9 A NEW MICraOWAVE lXIEC!l-OR FOR GAS CHBXATGGRAPHY:THE MPD 860. J. S. Hobbs, Technical Director,AppliedChmmatographyLtd., ConcordeHouse,COnCOrdle LU2 OJE, U.K. St., Bedfordshim, ~?ERMINA~ONOFSULFURININOROANICANDO~C~~~~G GAS GENERA'ITON ~JSINGVACUUMULTRAVIOLETPLASMAA!tDMIC SPECTBXCGPY.

Steve.R. Ellebracht,Paul D. Swain and Duane S. 'keybig,Ihe Cow Cheticalco., CentralLaboratory,TexasDivisicn,I+eeport,Texas77541. 'DiF, COUPLINGOFAMI~WAVE~UCED~~TO?HE~~~ONOF~~C VOLATU.,E CoMpoUXxS. Prof. Dr. K. Bkkunxn, Fachbereich8, 61 Damstadt, Bochschulstrasse 4, Gemany.

PLASMACHARAc!TJzRISTiCS T!ursdayMoming,Jsnuary10 KEYNOTE:

NOVEL POSSIULITIESOFMIP AND'iCPSOLRCES. Leo de Gslan,Lab. Analytical Chemist~,lkxhnischeHogeschoolDelft,Jaffalaan 9,Lklft 8,!the Netherlands. OPERATIONALCIWIAC?ERIS~mCSOFAHIBIPOWERMI~WAVEINWCED~ PLASM4. AndrewT. Zander,Spectrtitrics, Inc. 204 AndoverSt., Andover, Mass. 01810,and Gary M. Hieftje,Dept. of Chendstry,IndianaUniversity, Bloomington,Ind. 47401. PULSE !%XTED MUXOWAVE DISCHARGFSINN2 ANDA,tN2 ANDEARLY AF'IERGLOW. Nagah Elkattan,~tsry Te&niceJ_College,Kobry elkobba,Cairo, Egypt. GASEOUSINlERFERFNQ%S IXMUXWAVEPLUMAS. PeterBarrzttandT.R. Copeland,Dept. of Chemistry,Northeastern University,Boston,Mass. 02ll5 MEX'ASTABLE 'IRANSFER EMISSIONSPEmmTRY: TRACE ANALYSISOF LIQUID SAMPLES. J. E. &lzer and D. G. Sutton,The AerospaceCorporation, P.O. Box 92957,Los Angeles,Cslif.90009. ACCURAIFANALYSISUSING A DIRFCT CURRENTARGON PLASMAOPTICALEMISSION 'IECHNIQUE.Greg W. Johnson,204 AndoverSt., Andover,Mass. 01810. I'UUl'IaT ANALYSISOF COMPLEXM4A'IERIALs BY D.C. ARGON PLASMAEMISSION SPECTRXCOPY. Glenn E. Bentley,Los Alms ScientificLaboratory, CNC-11,MS-514,Los Alas, New M%dco, 87545. WCE CALIBRA'IIONANDCORRE~ONPIX)CEWREFORICPESDIRECT~ INGSPEcTfaoMETERS. R. I.Botto,Exxon~search &EngineerlngC~.,SyntheticFuels Research,P. 0. Box 4255, Bsytown,TX 77520. RECENTIIGvELoPMzNTS IN IX PLASMAEXCITATION. G. N. Colemsn,A. M. Allen, R. R. Williams,Universityof GeorgLa,ChemistryDept.,Athens,GA 30602. NEW INS~ATION

l'humdayAftemoon,JanuarylO KEYNom:

SAMPLINGANDANALYSISSTRA'IEGIESI;ORPLPSMASPEC~MEMICALANALYSIS. RobertL. Watters,Jr., NationalBureauof Stsndards,Washington,D.C. 20234.

MP-DOWN VIEWINGOF THE ICP USING A CUAGGRATILNG, DIRECTREADING POS!l'ER SESSION: SPECTROGRAPHANDANALL-MIRROROPTICALSYSTEM. C.T.Ape1,D.V. Duchsne,B. A. P-r, T. M. Bieniewski,J. V. Pena, J. V. Kline, and D. W. Steinhaus,Los Alams ScientificLaboratory,P.O. Box 1663, Los Alanxx,New &xico 87545. MERITS AND LIMITATIONSOF PHOIODIODF, AHRAYSWITH SEPARATEOUTPUl!S FOR AVMMATIC BACKGROUNDCORRECTIONIN ICP-AES. P.W.J.M.Boumans,Philips ResearchLaboratories, Eindhoven,The Netherlands. IN'IERFACEOFANICP ?OASLEWSCANIXXJBIEMXOCHF0MA'IORRIRTHE~TAL ANALYSISOF WA'I!%AND FOOD. Joseph C. Carusoand J-s McCarthy, Universityof Cincinnati,Cincinnati, Ohio 45221. ALOW COST,VEXSATILE,VACUUMUL~VIOLETPLKSMAATOMTCEMISSIONSPECTEEOMETER.StevenR.Ellebracht,The Dow Chemical Co.,CentralLaboratory, Texas Div., B-2406Bldg.,Freeport,TX 77541,and CharlesM. Fsirless,The m ChemicalConpanyzAnalyticalLaboratories, MicXLsnd, Mich. 48640.

462

Announcements

INSTRUMENTATION FOR ICP ANALYSIS. J. M. Lemer, J. Katzenberger, InstrumentsSA, Inc., 173Essex Ave., Metuchen,N.J. 08840,and J. P. Ellenbach,Jobin-Yvon,16-18me du Canal,9116U Longjumeau,France. A COMPARISONOF SIMULTANEOUS AND SEQUEN'IITAL ICP INSTRUMENTATTON.Larry Ivbrganthaler, AppliedResearchLabs, P. 0. Box 129, Smland, Calif'. 91040. APPROACHESTo ASSURANCEOF ACCURACYIN ICP-AESANALYSISUL'ILIZING WAVELENGTH SCANS NEAR ANALYTESPECTRALLINES. R. L. Dahlquist,Applied ResearchLabs.,P.O. Box 129, Sunland,Calif. 91040. EXPERIENCESWITHA COMMERCIALCCMPvlER CONTROLLEDMINOCHHOM4?T)RCOUPLED 10 AN ICP SOURCE. E. Janssensand P. Schutyser,Institutefor Nucleaire Wetenschappen, Proeftuinstraat 86,B-9000 Gent, Belgiwn.

FridayMorning,, January11 kZYNO!fE:

THE i%lNNER IN WHICH DRY AEROSOLPRESENTAnONOF ANAL-YTE IN ME ICP MAY BE INFORMATIvEFOR UNDERSTANDINGOFEXCITATION~C%IANISMS. Dr. Gordon Kirkbright,Dept. of Chemistry,Irrperial Collegeof Scienceand Technology,South Kensington,London SW7 2AY, R-gland. ELEC!tF0PHERMALVAPO~ZATCONFROMGRAPHITE CORDASAMETHODOFSAMPLE INTRODUCTIONINANA?MosPHERICP~SSuREMcIRoWA~-~~~~I~P~~. P.W.J.M.Boms and P. J. Roars, PhilipsResearchLaboratories, Eindhoven,The Netherlands. ANALYSISOF LIQUID,SOLID AND GASEOUSSAMPLESUSING A HIGH POWER NITRC&EN/ARGONICP SYSTEM. Dr. K. Ohls, Btngerstr.7, ~4600 Dortmund30, Gemany. mHANISMSE73RTHE ICPANALYSISOFPOWIYZRS. J.Katzenbergerand J. M. Lemer, InstrumentsSA, Inc., 173 Essex Ave., Metucben,N. J. 08840,and J. P. Ellerbach,Jobin-Yvon,16-18 rue du Canal,91160 Longjumeau,France. INSTRUMZNTAL IMPROvEMENTANDOPl'IMIZATIONOFA LCW-POW 50 MHz ARGON ICP WITH SPECIALREFERENCE?r)SAMPLESWITHORGANIC CONSTITUENTB. P.W.J.M.Boumansand M. Ch. Lux-Steiner, PhilipsResearchLaboratories, Eindhoven,The Netherlands. CHARACIERISTICS OF A DC HE/AR PLASMA. John Wojciak,MathesonGas Pmducts,61 Grove St., P.O. Box 1147, Gloucester,Mass. 01930. LASERINDUCFDATOMICFLUORESCENCE SPECmSCOPYWITHAN INDUCTIVELY COUPLEDPLASMAAS ANA'lUMIZATLONSO~. F. Benhamu,R. Memiaszonek, J. L. Mouton,J. M. Menret,C. Trassy,InstitutNationaldes Sciences Appliquees,Laboratoirede Physicochimie Industrielle, Bt. 401, 20, AvenueA. Einstein,69621 Villeurbanne, CEDEX,France,and J. P. Laude, and J. C. Gatherin,InstrumentsS.A. Mvision Jobin-Yvon,16, rue du Canal,91160Longjumeau,France.

FridayAftemoon,January 11 AGRICULTURAL,BIOI.0GICALANDFCODANALYSES KEYNOTE:

TRACE ELEMENTANALYSISIN !B-IE LIFE SClENCES. WalterHertz,Nutrition Institute,U.S. Dept. of Agriculture, Beltsville,Md. 20705.

KEYNOTE:

ANALYTICALDEMANDSIN ECOLOGICALMINERALC'ICLWGINvESTIGA'ITON. Dr. Frank Galley,Instituteof Ecology,Universityof Georgia,Athens,Ga. 30602.

POSTER SESSION:

ICPES AND XRF: CLINICALAPPLICATIONS.RussellJaff'eand ClaireAlvarez, Spectm Laboratories, 2081 BeringDrive,Suite L, San Jose, Calif.9513l. PaulD.Kluckner ANALYSISOF TEETH BY PLASMAEMISSIONSPE-. andDavidF. Bmwn,~timnmz!ntal Laboratory,3650 ~sbmokMall,Vansower, B.C. ~6s 2L2, Canada.

Announcements

ANALYSISOF NATURALWATERS AND BIOLCGICALMATERIALSBY 1CP-CF.S.Jar&la Buntanand Kurt Bostmm, Dept. of EconondcGeology,Universityof Lulea, S-951 87 Lulea,Sweden. ANALYSISOF BIOLOGICALMATERIALSININDucITVELYcoupLEDPLASMA-ATDMr.c InstitutNational EMISSIONSPECTROSCOPY.J. M. I%rmet and E. Pehlivanian, des SciencesAppliquees,Laboratoirede Physicochiade Industrielle, Bt 401, 20, AvenueA, Einstein,69621Villeurbanne, CEIEX,France. EVALUATIONOF MATRIXEFFECTSIN THE ANALYSISOF mZl!FUAL HYGIENE SAMPLES. J. c. Haartz end R. D. Hull,NIQSH, 4676 ColumbiaParkway, Cincinnati, Ohio 45226. ANALYSISOF INDUSTRIALHYGIENESAMPLESFRCMWElDINGA~PHERE. R. D. Hull, J. C. J~z, and T. P. Carsey,NIOSH, 4676 Coldia Parkway,Cincinnati, Ohio 45226. APPLIEDSPECTROSCOPY IEVEUIPMENTS IN THE ANALYSISOF SOIL EXTRACTS, PLANT TISSUEAND OTHER BIOLOGICALSUBSTANCES. Dr. J. BentonJones, Universityof Georgia,Athens,GA 30602. Jr., Dept. of Horticulture, PLANT TISSUEAND SOIL EXTRACTANALYSISBY ICP-ATOMICEMISSIONSPECTROSCOPY. Dr. RobertC. Mmter, ResearchAnalyticalLaboratory,135 Crops Research.Bldg., 1903 HendonAve., Universityof Minnesolta, St. Paul, Minnesota 55108. USE OF INDUCTIVELYCOUPLEDPLASMASPECTROMETRY FORTHE SIMULTANEOUS DET%MINATIONOFMACF0- ANDMICFQ-NUHUENTS IN NH4Hc03DPTA EXTRACTS OF SOILS. Dr. P. N. Soltanpour,S. M. Workmsn,and A. P. Schwab,Dept. of Agronov, ColoradoState University,Fort Collins,Col. 80523. ICP MULTIELEMENT ANALYSISOF FOOD CHEMICALS. Gayla A. Savage,Pfizer, Inc., EasternPoint Road, Gmton, Ct. 06340. ANALYSISOF MILK BY PLASMAEMISSIONSPECTROMETRY.Paul D. Kluckner, David F. Brown and RunjeetSylvestre,Environmental Laboratory,3650 Wesbmok Mall, Vancouver,B.C. V6S 2L2, Canada. APPLICATIONOF A SEQUENTIALICP-AESS'YSIEM To AGRICULTURAL ANALYSIS. C. David Carr and J. E. E?mst, AppliedResearchLaboratories, P.O. Box 149, Dearborn,MI. 48121. THE ANALYSISOF MACRO AND TRACE ELEMENTSINSCILEXI'RACI'SBYDCARGON PLASMASPECTROSCOPY.JosephA. Reednick,Spectrametrics, Inc., 204 AndoverSt., Andover,MA. 01810. UTILIZATIONOF A'ICMIC SPECTROSCOPY FOR ~NG~CHEMICALCO& POSITIONOF BIOLOGICALMATERIAL. RonaldF. Suddendorfand KennethW. Bayer,Bureau of Foods,Dept. of HEW, Food and Drug Administration, Washington,D.C. 20204. IN AGRICULTURALANDBIOLlxfICALSAMPLES DETERMINAlTONOFTOXIC~ ArthurF. Ward, Lou Marciello,J&u Carraraand BY ICAP SPECTROME'IRY. VincentLuciana,JarrellAsh Mvision, FisherScientificCompany, Waltham,MA. 01254. IN RAW AGRICULTURAL CROPS DETERMINA'IIION OF TOXIC AND NUTRITIONALv USING ICAP SPECTROSCOPY.KarenA. WolnikandFredL.Fricke,Fbodand Drug Administration, Cincinnati,Ohio 45202. MuL~~ANALYSISOFBoTANICALSAMpLEsuSINGANA~~INDucTIvELYCOUPLEDPLASMASPEcTRoMElER.R.T. Goodpasture,R.J.McElhaney,and R. W. Mormw, Gak Ridge Y-12 Plant,P.O. Box Y, Bldg. 9995, Oak Ridge, Term. 37380.

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Amouncemcnts

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Tuesday Evening, January 8 SPECIALDISCUSSION WlBZ.TONmTS-AFtEPORr

INTR3DUCl'ORY OX%NTS, S. GreenfYlelcl, Albri@-& andWilson,P. 0. Box 80, Oldbwy,Warley,WestMidlands 69 4LN,U.K. FZPANSION OF coNcEpTs, P. Ekmmns, PhilipsResearch Laboratory, EXndtmven, !he Netherlands. DISCUSSION