- Email: [email protected]
Laser beams get flat-tops
TOOLS & TECHNIQUES UPDATE
Laser beams get flat-tops Newport Corporation’s Refractive Beam Shaper converts a laser beam with a Gaussian profile into a collimated, flat-top beam that propagates over large distances without variation in power, intensity, or uniformity. The beam shaper relies on low-dispersion refractive optics and produces no hard edges, speckles, or diffraction effects. It functions over a large bandwidth, from far infrared to deep ultraviolet, and has a near 100% conversion efficiency. The 910A Spatial Filter Series from Newport is suitable for all of its Mand L-Series objective lenses and 910PH-Series mounted pinholes. The spatial filters combine five-axis alignment with high stability. Contact: www.newport.com
Searching materials data Granta Design Limited continues to develop its software system for managing materials data with the launch of the latest version of the Cambridge Engineering Selector. CES4.1 adds more content to databases designed for materials selection and engineering design. The company has also created a Material Data Network, www.matdata.net, which brings together a range of disparate materials information sources that can be searched using CES4.1. Granta Design’s teaching software for undergraduate and Masters students is also available in a new version, CES4.1 EDUPACK. This now includes content for environmentally conscious design. Contact: www.grantadesign.com
Data center A plastics materials database has been launched by Omnexus to give researchers and engineers access to information on over 8000 polymer grades. This represents ~80% of global plastics products from over 35 suppliers. The Material Data and Applications Center continually updates ISO CAMPUS®, ASTM, and applications data. Users can search across 210 properties in English and German, and switch between metric and imperial units. Contact: www.omnexus.com
out STEM investigations at low accelerating voltages. Excellent contrast with low-density materials and samples composed of low atomic number elements can be achieved. This is particularly useful in studies of polymers, for example. An in-lens geometry gives high resolution in the secondary electron imaging mode and the detector offers a resolution of 0.6 nm at 30 kV in the STEM mode. Contact: www.hht-eu.com
Three systems, two beams
LIBRA stars for LEO The LIBRA® 200 FE is a new energy filter transmission electron microscope (EFTEM) from LEO Electron Microscopy. As well as EFTEM studies, the microscope can be used for high-resolution transmission electron microscopy, scanning transmission electron microscopy, electron diffraction, and electron energy loss spectrometry. The EFTEM combines a field emission illumination system with an in-column energy filter that offers second order aberration correction. The OMEGA filter provides energy resolution at the sub-electron volt level with a large isochromatic sample viewing area and diffraction angle acceptance. The high-resolution imaging and spectroscopy capabilities of the LIBRA 200 FE make it suitable for applications such as atomic-scale imaging, interface and strain analysis, and characterization of buried interfaces and segregation effects. LEO Electron Microscopy is also introducing the ULTRA range of field emission scanning electron microscopes (FESEMs) for high-resolution topographic and compositional imaging. A new EsB (energy and angleselected backscattered) detector is placed directly above an in-lens secondary electron detector, offering simultaneous real-time imaging with both secondary and backscattered electrons. Contact: www.leo-em.com
STEM imaging in an SEM A new transmission detector from Hitachi HighTechnologies Corp. allows scanning transmission electron microscopy (STEM) to be performed in a scanning electron microscope (SEM). With this combination, the S-5200 field emission SEM can carry
FEI Company is releasing three new DualBeam™ systems for the laboratory that integrate focused ion beam (FIB) and scanning electron microscopy (SEM) in one instrument. The combination allows researchers to modify, fabricate, and analyze a wide variety of samples in three dimensions at the nanoscale. Quanta™ 3D is designed for subsurface materials characterization. Nova™ NanoLab is a single tool for nanoscale machining, characterization, and analysis. High-resolution scanning transmission electron microscopy is provided by the Strata™ DB-STEM for semiconductor and data storage applications. Contact: www.feicompany.com
Fast CL spectrometry Gatan is launching a cathodoluminescence (CL) system suitable for almost all scanning electron microscopes (SEMs), microprobes, and analytical transmission electron microscopes (TEMs). MonoCL SP offers parallel CL spectroscopy with panchromatic imaging for applications where fast and precise characterization is essential without beam damage. The spectrometer has a new design in which a fixed position grating disperses the CL over a wide CCD array. This allows fast acquisition of the spectrum. The 20 µm CCD pixel size also gives a high spectral resolution. Panchromatic CL imaging allows the region of interest on the specimen to be characterized before performing CL spectroscopy. Contact: www.gatan.com
October 2003
51
Laser beams get flat-tops Newport Corporation’s Refractive Beam Shaper converts a laser beam with a Gaussian profile into a collimated, flat-top beam that propagates over large distances without variation in power, intensity, or uniformity. The beam shaper relies on low-dispersion refractive optics and produces no hard edges, speckles, or diffraction effects. It functions over a large bandwidth, from far infrared to deep ultraviolet, and has a near 100% conversion efficiency. The 910A Spatial Filter Series from Newport is suitable for all of its Mand L-Series objective lenses and 910PH-Series mounted pinholes. The spatial filters combine five-axis alignment with high stability. Contact: www.newport.com
Searching materials data Granta Design Limited continues to develop its software system for managing materials data with the launch of the latest version of the Cambridge Engineering Selector. CES4.1 adds more content to databases designed for materials selection and engineering design. The company has also created a Material Data Network, www.matdata.net, which brings together a range of disparate materials information sources that can be searched using CES4.1. Granta Design’s teaching software for undergraduate and Masters students is also available in a new version, CES4.1 EDUPACK. This now includes content for environmentally conscious design. Contact: www.grantadesign.com
Data center A plastics materials database has been launched by Omnexus to give researchers and engineers access to information on over 8000 polymer grades. This represents ~80% of global plastics products from over 35 suppliers. The Material Data and Applications Center continually updates ISO CAMPUS®, ASTM, and applications data. Users can search across 210 properties in English and German, and switch between metric and imperial units. Contact: www.omnexus.com
out STEM investigations at low accelerating voltages. Excellent contrast with low-density materials and samples composed of low atomic number elements can be achieved. This is particularly useful in studies of polymers, for example. An in-lens geometry gives high resolution in the secondary electron imaging mode and the detector offers a resolution of 0.6 nm at 30 kV in the STEM mode. Contact: www.hht-eu.com
Three systems, two beams
LIBRA stars for LEO The LIBRA® 200 FE is a new energy filter transmission electron microscope (EFTEM) from LEO Electron Microscopy. As well as EFTEM studies, the microscope can be used for high-resolution transmission electron microscopy, scanning transmission electron microscopy, electron diffraction, and electron energy loss spectrometry. The EFTEM combines a field emission illumination system with an in-column energy filter that offers second order aberration correction. The OMEGA filter provides energy resolution at the sub-electron volt level with a large isochromatic sample viewing area and diffraction angle acceptance. The high-resolution imaging and spectroscopy capabilities of the LIBRA 200 FE make it suitable for applications such as atomic-scale imaging, interface and strain analysis, and characterization of buried interfaces and segregation effects. LEO Electron Microscopy is also introducing the ULTRA range of field emission scanning electron microscopes (FESEMs) for high-resolution topographic and compositional imaging. A new EsB (energy and angleselected backscattered) detector is placed directly above an in-lens secondary electron detector, offering simultaneous real-time imaging with both secondary and backscattered electrons. Contact: www.leo-em.com
STEM imaging in an SEM A new transmission detector from Hitachi HighTechnologies Corp. allows scanning transmission electron microscopy (STEM) to be performed in a scanning electron microscope (SEM). With this combination, the S-5200 field emission SEM can carry
FEI Company is releasing three new DualBeam™ systems for the laboratory that integrate focused ion beam (FIB) and scanning electron microscopy (SEM) in one instrument. The combination allows researchers to modify, fabricate, and analyze a wide variety of samples in three dimensions at the nanoscale. Quanta™ 3D is designed for subsurface materials characterization. Nova™ NanoLab is a single tool for nanoscale machining, characterization, and analysis. High-resolution scanning transmission electron microscopy is provided by the Strata™ DB-STEM for semiconductor and data storage applications. Contact: www.feicompany.com
Fast CL spectrometry Gatan is launching a cathodoluminescence (CL) system suitable for almost all scanning electron microscopes (SEMs), microprobes, and analytical transmission electron microscopes (TEMs). MonoCL SP offers parallel CL spectroscopy with panchromatic imaging for applications where fast and precise characterization is essential without beam damage. The spectrometer has a new design in which a fixed position grating disperses the CL over a wide CCD array. This allows fast acquisition of the spectrum. The 20 µm CCD pixel size also gives a high spectral resolution. Panchromatic CL imaging allows the region of interest on the specimen to be characterized before performing CL spectroscopy. Contact: www.gatan.com
October 2003
51