Laser finds new range

Laser finds new range

TOOLS & TECHNIQUES UPDATE flexibility in launching light into the spectrometer. The photodiode-array-based design covers the 190-380 nm (IS-190) and ...

327KB Sizes 0 Downloads 229 Views


flexibility in launching light into the spectrometer. The photodiode-array-based design covers the 190-380 nm (IS-190) and 380-1100 nm (IS-380) spectral ranges and offers a broader spectral response and superior sensitivity in the ultraviolet compared to charge-coupled device-based instruments. RS-232 and USB interfaces are standard, with WiFi optional. Contact:

Inverted metallograph

3D atom probe now with laser To cope with both low-conductivity and conducting samples, Oxford nanoScience’s laser three-dimensional atom probe (L-3DAP) uses a femtosecond laser to evaporate atoms, allowing the determination of both their elemental identity and position. It can be used for semiconductors, thin-film structures grown on Si, metals, and alloys, enabling semiconductor makers to visualize the atomic structure of Si devices. Key benefits include improved mass resolution, excellent detection limits, rapid sample analysis, and outstanding measurement accuracy.

The IM-7000 series of inverted metallurgical microscopes from Meiji Techno has an integrated front-mounted camera port, with adapters available for 35 mm, charge-coupled device, complementary metal oxide semiconductor, and other cameras for fast and easy evaluation of metallurgical specimens. The lenses are new E. Planachromat Infinity Corrected objectives for brightfield observation. Also, a powerful Koehler method vertical illuminator with a 6 V, 30 W halogen bulb in an adjustable centering socket provides enhanced image quality and adjustable brightness control. Contact:


Superconductor-based probe station Lake Shore Cryotronics has added both horizontal field (1 T) and vertical field (1 T or 3 T) superconducting magnet-based probe stations to its Desert line of cryogenic four-probe, six-probe, and full wafer probe stations. The new stations can operate at 4.2-400 K, have up to four ultrastable micromanipulated probe arms, and accommodate wafers up to 1” in diameter. Magnetotransport, electrical, electro-optic, parametric, high-Z, dc, rf, and microwave properties can be measured in materials including nanoscale electronics, quantum wires and dots, organic and dilute magnetic semiconductors, superconductors, and spintronics devices. A wide choice of probes, cables, sample chucks, and options is available. Contact:

Broad-spectrum minispectrometers Newport's Oriel IS Series Minispectrometers are available in fiber-coupled and free-space models, with up to ~0.6 nm resolution for laboratory applications or integration into other instruments. Free-space versions offer direct access to the slit, making it easy and inexpensive to change the resolution and throughput. It also offers greater


September 2005

Laser finds new range Spectra-Physics has launched an enhanced HP version of its Mai Tai® Ti:sapphire laser range that delivers >2.5 W of average power and has an enhanced 700-1020 nm tuning range. This eliminates the need for a second infrared laser to cover unavailable wavelengths. The laser is also fully computer controlled and produces 100 fs pulses. Mai Tai HP features fast and smooth automated wavelength tuning for real-time excitation profiling, and pointing stability that eliminates the need to realign the setup. Contact:

Mass spec with chromatography Thermo Electron has extended its PolarisQ ion trap mass spectrometer (MS) range by incorporating the FOCUS™ gas chromatograph (GC). The FOCUS-PolarisQ ion trap GC/MS provides quadrupole ion trap GC/MS and GC/MSn analyses. GC/MS/MS offers substantial selectivity and performance advantages over standard GC/MS selected ion monitoring (SIM) applications. External ionization allows maximum productivity and reliability while yielding classical, library searchable spectra, regardless of matrix and concentration. It also integrates full-scan MS and MS/MS modes by simultaneously capturing both spectra for each peak in the chromatogram. Contact:

Spectroscopic ellipsometry The MM-16 spectroscopic ellipsometer from HORIBA Jobin Yvon extends the capabilities of classical ellipsometry for characterizing thin-film thickness and optical properties with exceptionally high accuracy. The MM-16 collects full spectral ellipsometric data (2048 points) at high resolution and calculates the complete 16-element Müller matrix in <2 s. This allows simple characterization of complex birefringent materials, and also simplifies investigation of samples exhibiting depolarization effects. The DeltaPsi2 integrated software package provides turnkey operation. Contact:

Ultra-precise surface analysis LEXT from Olympus is a confocal laser scanning microscope for surface analysis with resolution of 0.12 µm (xy) and 0.01 µm (z). No preparation is required, samples are placed directly on the stage, and both observation and high-precision measurements are possible in three dimensions in real-time. Its twochannel display shows conventional and confocal views in parallel for fast focusing and alignment. LEXT can also produce roughness analyses. An optional motorized scanning stage enables automated image acquisition and simultaneous measurement at several points. The navigator allows programming of predefined grids or individual points for statistical process control. Contact: