- Email: [email protected]
Materials samples get stressed on stage
TOOLS & TECHNIQUES
Software for stress analysis PANalytical’s X’Pert Stress Plus 2.0 software package enables the analysis of residual stresses in amorphous substrates, polycrystalline coatings, or single crystals. The new software is part of a package that includes PANalytical’s X’Pert PRO hardware platform and the stress measurement software, X’Pert Data Collector 2.2. Examples of applications include analysis of TiC on steel, TiAlN coatings on tool inserts, surface stresses in ceramics, and oxide coatings on glass. X’Pert Stress Plus 2.0 supports data for grazing incidence measurements and multiple peak analysis. Contact: www.panalytical.com
Viscometer targets dark samples The MiniVis 445 from Grabner Instruments combines a rolling ball viscometer, a density meter, and an automatic filling system for determining the dynamic and kinematic viscosity of samples over a wide temperature range. It is suited to heavy-duty environments, but can also be used on the lab bench. The use of reflection sensors makes it useful for dark samples like heavy oil. MiniVis 445 uses small sample volumes and has an automatic sample feeding system. The measurement cell is easily accessible, eliminating the cleaning problems associated with viscometers. Temperature control using the built-in Peltier elements allows for quick determination of viscosity indices. Contact: www.ametek.com
including those with spectroscopy options, to enable sample morphology to be viewed as a function of temperature change. Data can be obtained for polymers and adhesive films with thicknesses down to a few microns. The TST350 has two screws to maintain uniform vertical and horizontal sample alignment. Sample jaws move in opposite directions to keep the sample in the field of view in both reflection and transmission microscopes.
Scanning electron microscope magnifies further A new thermal field-emission scanning electron microscope (SEM) from JEOL, the JSM-7001F, can acquire micrographs at up to 1 000 000X magnification. The JSM-7001F features an in-lens field-emission gun that delivers more than 200 nA of beam current to the sample. A small probe diameter at low kilovolts and high current enables characterization of nanostructures with a resolution of 1.2 nm at 30 kV.
The temperature can be varied by up to 30°C/min, from -196°C to 350°C, with a resolution of 0.1°C. Contact: www.linkam.co.uk
The SEM can be used to study semiconductors, metals, minerals, materials, and ceramics, as well as nonconductive biological samples. The SEM can also be equipped with a dual column focused ion beam (FIB) system or an e-beam lithography tool. It comes with a choice of three stage sizes and exchange chambers, and a five-axis automated stage. The JSM-7001F can be configured for both high- and low-vacuum operation. Contact: www.jeolusa.com
Chemical imaging focuses on the near infrared Malvern Instruments has introduced the SyNIRgi near infrared chemical imaging (NIR-CI) system for the determination of content uniformity, blending efficiency, polymorph distribution, moisture content, contaminant location, and coating and layer thickness of solid samples.
New camera for microscopes The new 5 megapixel DP25 digital color camera for microscopes from Olympus allows easy image documentation, reporting, and analysis. It features fast frame rates and good color fidelity. The DP25 offers live images with full resolution (2560 x 1920 pixels) at eight frames per second (fps), suitable for obtaining high-resolution detail. Other options include a live-video mode (640 x 480 pixels) at 32 fps, and a progressive mode with a resolution of 1280 x 1920 pixels. Contact: www.olympusamerica.com
The tensile speed ranges between 1 µm/s and 1600 µm/s and a force range of either 0.01 N to 20 N, or 0.1N to 200 N is available.
This system has an increased data acquisition speed and sensitivity, and can accommodate a larger imaging area than previous models.
Materials samples get stressed on stage The TST350 is a tensile stress microscopy stage with temperature control from Linkam for the imaging and measurement of material properties. It replaces the standard sample stage on many light microscopes,
New sampling options mean that data collection for a variety of sample types can be optimized, and increased sensitivity enables more difficult problems to be solved. The standard version of SyNIRgi generates >80 000 NIR spectra from a 13 x 10 mm2 sample area in minutes. An option is available to collect NIR chemical images with more than 300 000 NIR spectra in a single measurement. Contact: www.malvern.com
MAY 2007 | VOLUME 10 | NUMBER 5
63
Software for stress analysis PANalytical’s X’Pert Stress Plus 2.0 software package enables the analysis of residual stresses in amorphous substrates, polycrystalline coatings, or single crystals. The new software is part of a package that includes PANalytical’s X’Pert PRO hardware platform and the stress measurement software, X’Pert Data Collector 2.2. Examples of applications include analysis of TiC on steel, TiAlN coatings on tool inserts, surface stresses in ceramics, and oxide coatings on glass. X’Pert Stress Plus 2.0 supports data for grazing incidence measurements and multiple peak analysis. Contact: www.panalytical.com
Viscometer targets dark samples The MiniVis 445 from Grabner Instruments combines a rolling ball viscometer, a density meter, and an automatic filling system for determining the dynamic and kinematic viscosity of samples over a wide temperature range. It is suited to heavy-duty environments, but can also be used on the lab bench. The use of reflection sensors makes it useful for dark samples like heavy oil. MiniVis 445 uses small sample volumes and has an automatic sample feeding system. The measurement cell is easily accessible, eliminating the cleaning problems associated with viscometers. Temperature control using the built-in Peltier elements allows for quick determination of viscosity indices. Contact: www.ametek.com
including those with spectroscopy options, to enable sample morphology to be viewed as a function of temperature change. Data can be obtained for polymers and adhesive films with thicknesses down to a few microns. The TST350 has two screws to maintain uniform vertical and horizontal sample alignment. Sample jaws move in opposite directions to keep the sample in the field of view in both reflection and transmission microscopes.
Scanning electron microscope magnifies further A new thermal field-emission scanning electron microscope (SEM) from JEOL, the JSM-7001F, can acquire micrographs at up to 1 000 000X magnification. The JSM-7001F features an in-lens field-emission gun that delivers more than 200 nA of beam current to the sample. A small probe diameter at low kilovolts and high current enables characterization of nanostructures with a resolution of 1.2 nm at 30 kV.
The temperature can be varied by up to 30°C/min, from -196°C to 350°C, with a resolution of 0.1°C. Contact: www.linkam.co.uk
The SEM can be used to study semiconductors, metals, minerals, materials, and ceramics, as well as nonconductive biological samples. The SEM can also be equipped with a dual column focused ion beam (FIB) system or an e-beam lithography tool. It comes with a choice of three stage sizes and exchange chambers, and a five-axis automated stage. The JSM-7001F can be configured for both high- and low-vacuum operation. Contact: www.jeolusa.com
Chemical imaging focuses on the near infrared Malvern Instruments has introduced the SyNIRgi near infrared chemical imaging (NIR-CI) system for the determination of content uniformity, blending efficiency, polymorph distribution, moisture content, contaminant location, and coating and layer thickness of solid samples.
New camera for microscopes The new 5 megapixel DP25 digital color camera for microscopes from Olympus allows easy image documentation, reporting, and analysis. It features fast frame rates and good color fidelity. The DP25 offers live images with full resolution (2560 x 1920 pixels) at eight frames per second (fps), suitable for obtaining high-resolution detail. Other options include a live-video mode (640 x 480 pixels) at 32 fps, and a progressive mode with a resolution of 1280 x 1920 pixels. Contact: www.olympusamerica.com
The tensile speed ranges between 1 µm/s and 1600 µm/s and a force range of either 0.01 N to 20 N, or 0.1N to 200 N is available.
This system has an increased data acquisition speed and sensitivity, and can accommodate a larger imaging area than previous models.
Materials samples get stressed on stage The TST350 is a tensile stress microscopy stage with temperature control from Linkam for the imaging and measurement of material properties. It replaces the standard sample stage on many light microscopes,
New sampling options mean that data collection for a variety of sample types can be optimized, and increased sensitivity enables more difficult problems to be solved. The standard version of SyNIRgi generates >80 000 NIR spectra from a 13 x 10 mm2 sample area in minutes. An option is available to collect NIR chemical images with more than 300 000 NIR spectra in a single measurement. Contact: www.malvern.com
MAY 2007 | VOLUME 10 | NUMBER 5
63