Mechanical twinning in CuAu-I and CuAu-II ordered thin films prepared by vacuum deposition
Thin Solid Films, 89 (1982) 115 METALLURGICAL AND PROTECTIVE COATINGS
115
M E C H A N I C A L T W I N N I N G IN CuAu-I AND CuAu-II O R D E R E D T ...
Thin Solid Films, 89 (1982) 115 METALLURGICAL AND PROTECTIVE COATINGS
115
M E C H A N I C A L T W I N N I N G IN CuAu-I AND CuAu-II O R D E R E D T H I N F I L M S P R E P A R E D BY V A C U U M D E P O S I T I O N * SAIYU MARUYAMA
Department of Natural Science, Osaka Women's University, Daisen-cho, Sakai City, Osaka 590 (Japan)
Mechanical twinning was produced in both the CuAu-I and the CuAu-II phases of vacuum-deposited ordered thin films where the shorter axis c was controlled by a specially devised method to be overall normal to the film plane. In films stretched along the [110] direction in the (001) film plane, (111), ~[112] mechanical twinning was identified. In CuAu-I the twins are genuine mirror reflections of the matrix with respect to the types of atoms, whereas in CuAu-II the twins are not genuine with respect to the antiphase boundaries, i.e. the antiphase boundaries (100) and (010) are transformed into (1T1) and (111) respectively. Thus, a new type of antiphase structure was obtained by mechanical twinning. The spacing (22/~) of the new antiphase boundaries and the angle (74 °) between the two types of boundaries (llT) and (ilT) were confirmed by both electron micrography and diffraction.
*Abstract of a paper presented at the Fifth International Thin Films Congress, Herzlia-on-Sea,Israel, September21-25, 1981. 0040-6090/82/0000-0000/$02.75