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Multichip integrated circuit memory with photoformed plated conductors
World Abstracts on Microelectronics and Reliability signal or the parametric amplifier output signal must not cause a substantial decay in the overall noise factor. This particular requirement was prominent throughout the design study, another object being to define a technology that could qualify for space applications. The microcircuit pacemaker. Space age spin-oil to achieve reliability and long life. T. P. ADAMSAND M. D. FASANO JR. Proc. Reliability and Maintainability Syrup., Washington D. C., p. 360, 28-30 January, 1975. "The Heart" - - it pumps five quarts of blood in a minute, 75 gallons in an hour, 70 barrels in a day and 18 million barrels in 70 years. It does this by means of the most intricately woven muscle in the body. In a nation in which heart disease is now the leading killer, thousands of men and women are alive today or live more comfortably due to one of the wonders of modern medicine: the artificial cardial pacemaker which utilizes electricity to aid heart operation. The role of electricity in heart activity is by no means a 20th-century concept. As early as the 18th century, scientists recognized that electricity would augment the contractions that pump blood through the body. The development and application of hybrid microelectronic circuitry in artificial cardiac pacemakers is however a recent concept. General Electric has drawn on the proven parts and processes, construction techniques and packaging approaches used in its aerospace satellite projects in the development and production of the cardiac pacemaker. The stringent spacecraft requirements for size, weight, and reliability are directly applicable and in fact highly desirable for successful pacemaker operation. The paper will specifically address the importance of miniaturization and high reliability to the success of pacemaker operation, the general theory of operation, comparisons of discrete devices and hybrid microcircuits, design concepts, description of configurations and circuitry, procurement policies and principles, processes utilized, assembly and inspection procedures and testing philosophies. Power supplies for C-MOS. circuitry. D. BLANDFORDand A. BISHOP. Electronics and Power 6th March, 1975, p. 247. Two of the major advantages of complementary m.o.s, integrated-circuit logic systems are their low power dissipation and their ability to operate over a wide range of supply voltages. These features permit their use with simple, small, low-cost power supplies. Multichip integrated circuit memory with photoformed plated conductors. E A GUDITZ and R. L BURKE. IEEE Trans. Pans, Hybrids & Packaging. PEIP-11, (2) 89 (1975). A 20-chip integrated circuit memory has been constructed utilizing techniques of plastic embedment, photoformation of plastics, and selective electroless metal deposition previously reported [1]. This paper is a continuation and update of that earlier work. It has been demonstrated that groups of passivated integrated circuit chips can be accurately placed in array positions, embedded in plastic, and interconnected with electroless nickel conductors deposited in photoformed multilayered conductor paths separated by selectively photoformed plastic dielectric layers. Thermal paths of nickel, plated directly to the backs of the chips and to an adhered photoetched metal substrate, effectively remove heat from the chips. The memory is assembled with relatively simple and inexpensive equipment. It is essentially nonrepairable and, because of limitations of photosensitive dielectrics available at the time of construction, is limited to operation in a computer-room environment. The three laboratory prototypes, constructed to demonstrate this packaging technique, were operated under dynamic cyclic-mode test
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conditions. No operational test data are available on the devices constructed nor can recommendations regarding use of the assembly method be made at this time. Two instrument ICs sum six inputs. A. P. BROKAW. Electronics. August 7, 1975, p. 97. Connecting two IC instrumentation amplifiers (in-amps) produces an amplifier that will sum six input signals. The six inputs may be independent s~gnals that can be added or subtracted to produce a single output. Alternatively, some of the inputs may be paired in the usual fashion to yield two floating differential inputs, leaving the remaining two inputs available for independent use. This latter arrangement sums two input signals that lack a common reference or ground, and the two remaining inputs allow the addition of singleended signals that are referred to the output signal ground. IC runs complex radio. R. SCHNEIDERMAN.Electronics. August 7, 1975, p. 124. LSI chip minimizes knobs, switches and wiring; lets OEM give user various sleeping, waking options. Consider 1024-bit C-MOS RAMs tor small staticmemory systems. S. HUME. Electronics. July 24, 1975, p. 102. The latest complementary-MOS random-access memory, besides dissipating almost no power when quiescent, achieves four times the density and a third the access time of earlier C-MOS chips; prices should fall, too. Testing of the layout o| integrated solid-state circuits, in particular of bipolar ones. D. GARTE. Nachrichtentechnik. Elektronik 25, p. 203. (1975). (In German). Today a difference must be made between the primary and secondary development, the synthesis prevailing in the first and the analysis in the second. As in the present state of knowledge the synthesis is made in the form of an iterative analysis, this means that the analysis is the main point. Although many secondary conditions distract from essential points of a circuit, an attempt is made to discharge the design engineer from technical routine work by a strict division and clearly arranged informations. It is, however, not possible to substitute a faultless automatic project for a faulty manual one. This is the reason why, on the other hand, the manual project must be controlled, with which, however, an automatic machine can be charged. Detailed statements are made on the secondary conditions and control. Automated circuit testers lead the way out of continuity maze. J. LYMAN. Electronics. 7 August, 1975, p. 87. Manufacturers are overcoming the bugaboo of astronomical numbers of circuits that can be shorted or open; they are now checking backplanes, printed-circuit boards, cables, harnesses, and even hybrid substrates. A universal MOS-LSI testing system. L. CozzL Electronic Production June 1975. p. 9. Large-scale integration of arithmetic and logic units in multi-pin MOS and COSMOS devices has resulted in two specific testing requirements: The need to test systems with large numbers of drivers and sensors; The possibility of carrying out very long random testing sequences at high speed. In order to satisfy both these requirements simultaneously the testing system designer must create extremely complex equipment in both the analogue and digital areas.
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conditions. No operational test data are available on the devices constructed nor can recommendations regarding use of the assembly method be made at this time. Two instrument ICs sum six inputs. A. P. BROKAW. Electronics. August 7, 1975, p. 97. Connecting two IC instrumentation amplifiers (in-amps) produces an amplifier that will sum six input signals. The six inputs may be independent s~gnals that can be added or subtracted to produce a single output. Alternatively, some of the inputs may be paired in the usual fashion to yield two floating differential inputs, leaving the remaining two inputs available for independent use. This latter arrangement sums two input signals that lack a common reference or ground, and the two remaining inputs allow the addition of singleended signals that are referred to the output signal ground. IC runs complex radio. R. SCHNEIDERMAN.Electronics. August 7, 1975, p. 124. LSI chip minimizes knobs, switches and wiring; lets OEM give user various sleeping, waking options. Consider 1024-bit C-MOS RAMs tor small staticmemory systems. S. HUME. Electronics. July 24, 1975, p. 102. The latest complementary-MOS random-access memory, besides dissipating almost no power when quiescent, achieves four times the density and a third the access time of earlier C-MOS chips; prices should fall, too. Testing of the layout o| integrated solid-state circuits, in particular of bipolar ones. D. GARTE. Nachrichtentechnik. Elektronik 25, p. 203. (1975). (In German). Today a difference must be made between the primary and secondary development, the synthesis prevailing in the first and the analysis in the second. As in the present state of knowledge the synthesis is made in the form of an iterative analysis, this means that the analysis is the main point. Although many secondary conditions distract from essential points of a circuit, an attempt is made to discharge the design engineer from technical routine work by a strict division and clearly arranged informations. It is, however, not possible to substitute a faultless automatic project for a faulty manual one. This is the reason why, on the other hand, the manual project must be controlled, with which, however, an automatic machine can be charged. Detailed statements are made on the secondary conditions and control. Automated circuit testers lead the way out of continuity maze. J. LYMAN. Electronics. 7 August, 1975, p. 87. Manufacturers are overcoming the bugaboo of astronomical numbers of circuits that can be shorted or open; they are now checking backplanes, printed-circuit boards, cables, harnesses, and even hybrid substrates. A universal MOS-LSI testing system. L. CozzL Electronic Production June 1975. p. 9. Large-scale integration of arithmetic and logic units in multi-pin MOS and COSMOS devices has resulted in two specific testing requirements: The need to test systems with large numbers of drivers and sensors; The possibility of carrying out very long random testing sequences at high speed. In order to satisfy both these requirements simultaneously the testing system designer must create extremely complex equipment in both the analogue and digital areas.