- Email: [email protected]
New at Newport
TOOLS & TECHNIQUES UPDATE
A philosophy for life Damage Tolerance and Durability of Material Systems by Kenneth L. Reifsnider and Scott W. Case falls into two sections. The first outlines what is described as ‘a new philosophy’ of damage and the long-term behavior of materials. This uses the concepts of remaining strength and remaining life to predict how long material systems will last under given environmental conditions. The second element to the book consists of the presentation and interpretation of experimental evidence on durability, damage tolerance, and fatigue in composite material systems. Publisher: John Wiley & Sons Ltd. ISBN: 0-471-15299-4 Publication: May 2002 Hardback, pp. 435 Price: $99.95 / £74.50 / 117.60
Contact: www.wiley.com Guide for polymer electronics The Handbook of Polymers in Electronics edited by Bansi Dhar Malhotra covers both the electronic properties of polymers and their potential applications in the electronics industry. The book includes sections explaining topics such as charge transport in polymers as well as the preparation and characterization of suitable polymeric materials. The applications of polymer systems in light emitting diodes, batteries, microactuators, biosensors, and molecular electronics form a large part of the handbook. Publisher: Rapra Technology ISBN: 1-85957-286-3 Publication: June 2002 Hardback, pp. 474 Price: $232 / £155 / 264
Contact: www.polymerbooks.com
In a XFlash Röntec has improved its QUANTAX X-ray spectrometer (EDS) system for the analysis of materials including ceramics, minerals, and metals in the scanning electron microscope (SEM). The new line of XFlash® X-ray detectors allows the detection of light elements and has a resolution of up to 127 eV. The cooling of the detector works thermoelectrically and does not require
Newport RGV100
liquid nitrogen, water, or other consumables. It has a high count rate capability that enables its use in many
New at Newport
high-speed applications. The new software offers high
Newport announces a number of new precision
precision analysis routines for all specimen surfaces so
instruments and tools for laser and optical technologies
that analysis is not limited to polished samples but also
and micropositioning applications.
particles, fibers, and rough surfaces.
• The precision vertical translation stage VP-5ZA has
Contact: www.roentec.com
applications in semiconductor wafer inspection, photonics testing and packaging, micro-assembly, and precision metrology. It has a low profile and is
Stress monitoring The ASET® sensor from Sensor Products, Inc. measures interfacial stresses in real time. It is a magnetic resistive
capable of 4.8 mm vertical motion with 0.02 µm resolution. • The RGV100 high speed precision rotation stage has
ink sensor element with a thin profile that reveals the
enhanced speed, reliability, and position sensitivity. It
contact surface area and displacement. It has the
has a maximum speed of 120 rpm and a resolution of
advantages that it does not require complicated
0.0001°.
calibration and is durable. It has a number of potential
• Models 2930F, 1930-C, 1930IS, and 2930-C are a
applications including integration into smart structures,
series of new optical power meters for telecom laser
measuring relative position and applied force in ball
power measurements with direct fiber optic
joints, monitoring where and when objects impact on surfaces, and checking object grip or contact surface area in robotics systems. Contact: www.sensorprod.com
connections. • Newport’s newly designed optical tables allow mounting holes 12.5 mm from the table edge, offering a greater usable work surface. Contact: www.newport.com
XRF data analysis software Pro-Trace data analysis software from Philips Analytical
UV laser for deposition
enables users of their MagiX family of X-ray
ThinFilmStar is a new UV light laser from Tuilaser for
fluorescence (XRF) spectrometers to calculate trace-
pulsed laser deposition (PLD). The excimer laser rapidly
element composition down to sub-ppm levels. These
ablates and deposits metal oxides and other materials
spectrometers are able to measure elemental
in highly uniform and reproducible thin films for
concentrations down to 0.1 ppm, but at these
applications including ferroelectrics, piezoelectrics, and
concentrations background noise is a problem. Pro-
smart materials.
Trace solves this problem and calculates net intensities
The low divergence, small beam profile, and fast rise-
using algorithms for accurate background
time to peak power of the ThinFilmStar laser result in
determination. The analysis uses specially prepared
high intensities and a homogeneous ablation plume.
blank specimens and calibration standards that are
The reliable and compact laser reduces operating costs
claimed to have the calibrating power of more than 200
since less energy is required in comparison to
international standard reference materials.
conventional lasers.
Contact: www.analytical.philips.com
Contact www.tuilaser.com
September 2002
45
A philosophy for life Damage Tolerance and Durability of Material Systems by Kenneth L. Reifsnider and Scott W. Case falls into two sections. The first outlines what is described as ‘a new philosophy’ of damage and the long-term behavior of materials. This uses the concepts of remaining strength and remaining life to predict how long material systems will last under given environmental conditions. The second element to the book consists of the presentation and interpretation of experimental evidence on durability, damage tolerance, and fatigue in composite material systems. Publisher: John Wiley & Sons Ltd. ISBN: 0-471-15299-4 Publication: May 2002 Hardback, pp. 435 Price: $99.95 / £74.50 / 117.60
Contact: www.wiley.com Guide for polymer electronics The Handbook of Polymers in Electronics edited by Bansi Dhar Malhotra covers both the electronic properties of polymers and their potential applications in the electronics industry. The book includes sections explaining topics such as charge transport in polymers as well as the preparation and characterization of suitable polymeric materials. The applications of polymer systems in light emitting diodes, batteries, microactuators, biosensors, and molecular electronics form a large part of the handbook. Publisher: Rapra Technology ISBN: 1-85957-286-3 Publication: June 2002 Hardback, pp. 474 Price: $232 / £155 / 264
Contact: www.polymerbooks.com
In a XFlash Röntec has improved its QUANTAX X-ray spectrometer (EDS) system for the analysis of materials including ceramics, minerals, and metals in the scanning electron microscope (SEM). The new line of XFlash® X-ray detectors allows the detection of light elements and has a resolution of up to 127 eV. The cooling of the detector works thermoelectrically and does not require
Newport RGV100
liquid nitrogen, water, or other consumables. It has a high count rate capability that enables its use in many
New at Newport
high-speed applications. The new software offers high
Newport announces a number of new precision
precision analysis routines for all specimen surfaces so
instruments and tools for laser and optical technologies
that analysis is not limited to polished samples but also
and micropositioning applications.
particles, fibers, and rough surfaces.
• The precision vertical translation stage VP-5ZA has
Contact: www.roentec.com
applications in semiconductor wafer inspection, photonics testing and packaging, micro-assembly, and precision metrology. It has a low profile and is
Stress monitoring The ASET® sensor from Sensor Products, Inc. measures interfacial stresses in real time. It is a magnetic resistive
capable of 4.8 mm vertical motion with 0.02 µm resolution. • The RGV100 high speed precision rotation stage has
ink sensor element with a thin profile that reveals the
enhanced speed, reliability, and position sensitivity. It
contact surface area and displacement. It has the
has a maximum speed of 120 rpm and a resolution of
advantages that it does not require complicated
0.0001°.
calibration and is durable. It has a number of potential
• Models 2930F, 1930-C, 1930IS, and 2930-C are a
applications including integration into smart structures,
series of new optical power meters for telecom laser
measuring relative position and applied force in ball
power measurements with direct fiber optic
joints, monitoring where and when objects impact on surfaces, and checking object grip or contact surface area in robotics systems. Contact: www.sensorprod.com
connections. • Newport’s newly designed optical tables allow mounting holes 12.5 mm from the table edge, offering a greater usable work surface. Contact: www.newport.com
XRF data analysis software Pro-Trace data analysis software from Philips Analytical
UV laser for deposition
enables users of their MagiX family of X-ray
ThinFilmStar is a new UV light laser from Tuilaser for
fluorescence (XRF) spectrometers to calculate trace-
pulsed laser deposition (PLD). The excimer laser rapidly
element composition down to sub-ppm levels. These
ablates and deposits metal oxides and other materials
spectrometers are able to measure elemental
in highly uniform and reproducible thin films for
concentrations down to 0.1 ppm, but at these
applications including ferroelectrics, piezoelectrics, and
concentrations background noise is a problem. Pro-
smart materials.
Trace solves this problem and calculates net intensities
The low divergence, small beam profile, and fast rise-
using algorithms for accurate background
time to peak power of the ThinFilmStar laser result in
determination. The analysis uses specially prepared
high intensities and a homogeneous ablation plume.
blank specimens and calibration standards that are
The reliable and compact laser reduces operating costs
claimed to have the calibrating power of more than 200
since less energy is required in comparison to
international standard reference materials.
conventional lasers.
Contact: www.analytical.philips.com
Contact www.tuilaser.com
September 2002
45