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New range of spectroscopy instruments and accessories
TOOLS & TECHNIQUES
Perpendicular indentation with AFM precision Asylum Research has introduced a new NanoIndenter module for use on its MFP-3D atomic force microscope (AFM) systems THAT is capable of driving a nanoindenting tip perpendicular to the sample. This avoids nonorthogonality issues associated with nanoindentation on surfaces. Tip displacement is measured by combining data from the optical detector with NPS™ Nanopositioning sensors incorporated into the system. The new NanoIndenter offers precise positioning and greater control over tip manipulation for lithographic purposes, as well as the ability to image the indenter tip. Quantitative force measurements and surface characterization can be obtained with accurate imaging offsets. Elastic and inelastic behavior, dislocation phenomena, fractures, and residual stresses can be measured for a range of hard and soft materials and thin films. The NanoIndenter is available as a standard or a low force model. Asylum Research has also introduced a new imaging mode for its MFP-3D atomic force microscope. In the Dual AC mode, the cantilever is driven at or near two or more of its resonance frequencies when characterizing materials in air and liquids. This can give more information than normal phase imaging, showing increased contrast over a wider range of imaging parameters or revealing frequency-dependent mechanical properties of a surface. Contact: www.AsylumResearch.com
New range of spectroscopy instruments and accessories HORIBA Jobin Yvon has released NanoLED-265, a pulsed laser source that emits deep ultraviolet pulses at a nominal wavelength of 265 nm with a pulse width of 1.2 ns and a spectral full width at half maximum (FWHM) of 15 nm. The source is fully compatible with NanoLED controllers and other time-correlated single photon counting (TCSPC) systems, and is particularly suited to fluorophores like phenylalanine and aromatic hydrocarbons. Adjustable optics and a driver module control both repetition rate and synchronization delay. A Mini Flow volume accessory for the Partica LA-950 Laser Diffraction Particle Size Analyser has also been released. The small volume circulation system minimizes sample requirements to 35-55 mls volumes, has a good resistance to organic solvents, and incorporates a built-in ultrasonic probe for material dispersion. It is specifically designed for accurate measurements and contains an auto-fill pump and an auto-drain for fast sample processing.
46
NOVEMBER 2006 | VOLUME 1 | NUMBER 4
Sygnature™ is a compact linear charge-coupled device detection system that can be interfaced with HORIBA Jobin Yvon spectrographs and monochromators, offering high sensitivity and acquisition speed. The charge-coupled device features a 3648 element array and 8 µm x 200 µm pixels over a 29 nm focal plane at wavelengths between 250 nm and 1100 nm, and is particularly suited to optical absorption, colorimetric, emission and fluorescence processes. Contact: www.jobinyvon.co.uk
Detectors offer fast microanalysis Two new detectors from Oxford Instruments are designed for microanalysis applications. INCAPentaFET-x3 is a Si(Li) detector with a 30 mm2 detecting crystal that has the same resolution as a conventional 10 mm2 crystal. It gives faster results, or better quality data for the same analysis time, without compromising resolution or performance. INCAx-act is the first available analytical drift detector. It combines the speed of a Si drift detector with the precision and accuracy of an external fieldeffect transistor and digital pulse processing. Where high count rates are generated, INCAx-act can provide energy dispersive X-ray data in seconds. Contact: www.oxford-instruments.com
Combined expertise in a nanotechnology workstation The NVision 40 is the latest addition to the range of CrossBeam® workstations that combine scanning electron microscopy (SEM) with focused ion beam (FIB) capabilities. Suitable for nanoscale imaging, structuring, and analysis, NVision 40 has been developed jointly by Carl Zeiss SMT and SII NanoTechnology. The system is based on Carl Zeiss’ ULTRA platform with a GEMINI® e-beam column. Two in-lens detectors can record secondary and backscattered electrons simultaneously, even at low acceleration voltages and short working distances. The workstation is also equipped with SII’s zeta FIB column and a single-injector, multichannel gas injection system for subsurface defect analysis and nanostructuring applications. It offers a resolution of 4 nm and high current densities. The design of the e-beam column allows SEM imaging during FIB milling for better control of the process. NVision 40 also supports the automated preparation of samples for transmission electron microscopy. Contact: www.smt.zeiss.com or www.siint.com/en
Online help for sizing up proteins Malvern offers a new interactive function on its website that enables researchers to calculate the minimum sample concentration required for protein measurements using the Zetasizer Nano System. Researchers can input the molecular weight of their biomolecule into the Zetasizer Nano Minimum Concentration Calculator to determine the required sample concentration. The calculator also incorporates other features including size, zeta potential, and molecular weight determination. The Malvern Zetasizer Nano particle characterization system is a light-scattering instrument designed specifically for applications that include protein size determinations, screening for crystallization conditions, and melting point determinations. Size trends as a function of pH or additive concentration can also be measured by incorporating an MPT-2 autotitrator into the Zetasizer Nano. A Malvern Zetasizer Nano is now available at BegbrokeNano, Oxford, a UK center offering materials characterization facilities and services to companies and researchers involved in micro- and nanotechnologies. Contact: www.malvern.com
Peaks and troughs in surface analysis Alicona Imaging has updated its InfiniteFocus optical system for making three-dimensional surface measurements. Version 2 includes new software and hardware features that improve measurements of surface profiles and roughness. InfiniteFocus works by combining the small depth of focus of an optical system with vertical scanning to create a single three-dimensional picture of a sample with accurate topographical and color information. The resolution in the z-axis can be as low as 20 nm. Defining a profile path on a sample image allows roughness values to be calculated, virtual cross sections to be generated, and angles, circles, and height to be measured. Surface areas and texture can be defined, and peaks and troughs analyzed. Version 2 of InfiniteFocus is supplied as standard with new instruments and is available as an update for existing systems. Contact: www.alicona.com
Perpendicular indentation with AFM precision Asylum Research has introduced a new NanoIndenter module for use on its MFP-3D atomic force microscope (AFM) systems THAT is capable of driving a nanoindenting tip perpendicular to the sample. This avoids nonorthogonality issues associated with nanoindentation on surfaces. Tip displacement is measured by combining data from the optical detector with NPS™ Nanopositioning sensors incorporated into the system. The new NanoIndenter offers precise positioning and greater control over tip manipulation for lithographic purposes, as well as the ability to image the indenter tip. Quantitative force measurements and surface characterization can be obtained with accurate imaging offsets. Elastic and inelastic behavior, dislocation phenomena, fractures, and residual stresses can be measured for a range of hard and soft materials and thin films. The NanoIndenter is available as a standard or a low force model. Asylum Research has also introduced a new imaging mode for its MFP-3D atomic force microscope. In the Dual AC mode, the cantilever is driven at or near two or more of its resonance frequencies when characterizing materials in air and liquids. This can give more information than normal phase imaging, showing increased contrast over a wider range of imaging parameters or revealing frequency-dependent mechanical properties of a surface. Contact: www.AsylumResearch.com
New range of spectroscopy instruments and accessories HORIBA Jobin Yvon has released NanoLED-265, a pulsed laser source that emits deep ultraviolet pulses at a nominal wavelength of 265 nm with a pulse width of 1.2 ns and a spectral full width at half maximum (FWHM) of 15 nm. The source is fully compatible with NanoLED controllers and other time-correlated single photon counting (TCSPC) systems, and is particularly suited to fluorophores like phenylalanine and aromatic hydrocarbons. Adjustable optics and a driver module control both repetition rate and synchronization delay. A Mini Flow volume accessory for the Partica LA-950 Laser Diffraction Particle Size Analyser has also been released. The small volume circulation system minimizes sample requirements to 35-55 mls volumes, has a good resistance to organic solvents, and incorporates a built-in ultrasonic probe for material dispersion. It is specifically designed for accurate measurements and contains an auto-fill pump and an auto-drain for fast sample processing.
46
NOVEMBER 2006 | VOLUME 1 | NUMBER 4
Sygnature™ is a compact linear charge-coupled device detection system that can be interfaced with HORIBA Jobin Yvon spectrographs and monochromators, offering high sensitivity and acquisition speed. The charge-coupled device features a 3648 element array and 8 µm x 200 µm pixels over a 29 nm focal plane at wavelengths between 250 nm and 1100 nm, and is particularly suited to optical absorption, colorimetric, emission and fluorescence processes. Contact: www.jobinyvon.co.uk
Detectors offer fast microanalysis Two new detectors from Oxford Instruments are designed for microanalysis applications. INCAPentaFET-x3 is a Si(Li) detector with a 30 mm2 detecting crystal that has the same resolution as a conventional 10 mm2 crystal. It gives faster results, or better quality data for the same analysis time, without compromising resolution or performance. INCAx-act is the first available analytical drift detector. It combines the speed of a Si drift detector with the precision and accuracy of an external fieldeffect transistor and digital pulse processing. Where high count rates are generated, INCAx-act can provide energy dispersive X-ray data in seconds. Contact: www.oxford-instruments.com
Combined expertise in a nanotechnology workstation The NVision 40 is the latest addition to the range of CrossBeam® workstations that combine scanning electron microscopy (SEM) with focused ion beam (FIB) capabilities. Suitable for nanoscale imaging, structuring, and analysis, NVision 40 has been developed jointly by Carl Zeiss SMT and SII NanoTechnology. The system is based on Carl Zeiss’ ULTRA platform with a GEMINI® e-beam column. Two in-lens detectors can record secondary and backscattered electrons simultaneously, even at low acceleration voltages and short working distances. The workstation is also equipped with SII’s zeta FIB column and a single-injector, multichannel gas injection system for subsurface defect analysis and nanostructuring applications. It offers a resolution of 4 nm and high current densities. The design of the e-beam column allows SEM imaging during FIB milling for better control of the process. NVision 40 also supports the automated preparation of samples for transmission electron microscopy. Contact: www.smt.zeiss.com or www.siint.com/en
Online help for sizing up proteins Malvern offers a new interactive function on its website that enables researchers to calculate the minimum sample concentration required for protein measurements using the Zetasizer Nano System. Researchers can input the molecular weight of their biomolecule into the Zetasizer Nano Minimum Concentration Calculator to determine the required sample concentration. The calculator also incorporates other features including size, zeta potential, and molecular weight determination. The Malvern Zetasizer Nano particle characterization system is a light-scattering instrument designed specifically for applications that include protein size determinations, screening for crystallization conditions, and melting point determinations. Size trends as a function of pH or additive concentration can also be measured by incorporating an MPT-2 autotitrator into the Zetasizer Nano. A Malvern Zetasizer Nano is now available at BegbrokeNano, Oxford, a UK center offering materials characterization facilities and services to companies and researchers involved in micro- and nanotechnologies. Contact: www.malvern.com
Peaks and troughs in surface analysis Alicona Imaging has updated its InfiniteFocus optical system for making three-dimensional surface measurements. Version 2 includes new software and hardware features that improve measurements of surface profiles and roughness. InfiniteFocus works by combining the small depth of focus of an optical system with vertical scanning to create a single three-dimensional picture of a sample with accurate topographical and color information. The resolution in the z-axis can be as low as 20 nm. Defining a profile path on a sample image allows roughness values to be calculated, virtual cross sections to be generated, and angles, circles, and height to be measured. Surface areas and texture can be defined, and peaks and troughs analyzed. Version 2 of InfiniteFocus is supplied as standard with new instruments and is available as an update for existing systems. Contact: www.alicona.com