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Next generation HBLED tools
TOOLS & TECHNIQUES
when the possibility of separate phases arises, or when doubt surrounds the sample composition. Contact: www.bruker.com
Bruker Corporation, a leading provider of instruments for molecular and materials science for research and industry, recently acquired the Metrology & Instrumentation Group of Veeco Instruments Inc. This group includes the Scanning Probe Microscopy (SPM), Optical Industrial Metrology (OIM) and Stylus Profiler product lines of Veeco.
Customised Silicon Agar Scientific, a major supplier of consumables and equipment for microscopy, has announced that their partners TEMwindows will offer a wafer fabrication service. TEMwindows has experience in ultrathin films and MEMs processes, and so will be able to support customers who require unique solutions to their microscopy problems. They will offer design, etching and inspection of novel supports and films constructed from silicon, silicon dioxide and silicon nitride. Features as small as two microns can be etched into membranes, and metal deposition with a thickness of fifty to two hundred nanometres can be performed. Custom packaging will also be arranged to ensure that the tailor-made products arrive in the desired condition. Contact: www.agarscientific.com
Next generation HBLED tools Oxford Instruments is, among other titles, the world leading supplier of high volume bath plasma tools for the production market. Now the company is launching the PlasmaPro™ NGP®1000 HBLED range of plasma etch and deposition tools, which the company hopes will prove to be invaluable for high-brightness LED (HBLED) manufacturers. The new tools offer a much higher throughput than previously available, as well as aiming to be reliable and easy-to-service products. The range includes the PlasmaPro™ NGP1000 PECVD system, designed to deposit SiO2 and SiNx layers over large areas, and the PlasmaPro™ NGP1000 etch system, designed for GaN, AlGaInP and Sapphire etching. By using the new 60MHz Viper™ plasma source it is possible to obtain uniformity over a wider area than conventional sources, while still performing at an industry leading rate. Contact: www.oxford-instruments.com
Novel desktop x-ray instrument A new system for angle-dispersive x-ray diffraction (ADXRD), energy-dispersive x-ray diffraction (EDXRD) and x-ray fluorescence (XRF) measurements is now being offered by Bruker AXS. The D2 PHASER uses the XFlash detector, which provides an energy resolution of less than 180 eV at 100 000 counts per second. The detector is a silicon drift type device, and thanks to its high energy resolution, it is able to provide superior peak-to-background intensity ratios. The energy of the D2 PHASER can be moved throughout the copper emission spectrum, allowing the Kα doublet or the Kβ line to be selected. Such an approach overcomes the overlap problem associated with using Kα radiation. The XRF data can be collected during other measurements, allowing elements and concentrations to be identified. Such a measurement is incredibly valuable
50
Bruker acquires Metrology & Instrumentation Group
Small but able mass spectrometer
Acquired at a cost of $229 million, the new purchase is expected to contribute over $130 million to Bruker in 2011. The Metrology & Instrumentation Group is now part of Bruker’s new Nano Surfaces Business, and is compromised of all of the group’s former assets, such as its facilities in California and Arizona, and the worldwide service support departments. Contact: www.bruker-nano.com
Extreme high-aspect ratio AFM Carbon Design Innovations, manufacturers of carbon nanotube devices, has recently announced an atomic force microscope (AFM) probe with an extreme high-aspect ratio, designed for life science imaging. Using CDI’s patented techniques, the company is able to produce incredibly straight probes, which can be precisely aligned. The Carbon Core BioProbes (CCB) have a total length of up to 5 μm, with an exposed nanotube length of <500 nm. The CCB AFM probes are able to provide a high-aspect ratio, stability and superb resolution.
A new compact mass spectrometer, the QGA, is now being offered by Hiden Analytical. The benchtop spectrometer can provide real-time multi-species analysis of gases and vapors between 2 bar and 100 mbar. The sample insert can be heated up to 200 °C, and the device will adjust the consumption rates to meet the processing requirements. By using available adaptors and extensions it is possible to study pressures up to 30 bar and extract gases from environments at 1000 °C. The device uses the QGA operating system, and can analyze 16 gases or vapors. Several advanced modes are available, which allow the analysis of complex organic molecules using soft ionization, and the selective ionization of many gas species.
The probe also offers a lifetime which is ten-fold longer than silicon probes, by exploiting the strength of carbon nanotubes. The probes consist of multiwall carbon nanotubes, which are securely attached, meaning that the tip can withstand forces that silicon or amorphous carbon probes cannot. The CCB probe is designed to be suitable for most non-contact mode operations; however custom coatings and processes are available, if the standard CCB is not ideal. The probe is also available on the user’s choice of cantilever.
Contact: www.HidenAnalytical.com
Contact: www.carbondesigninnovations.com
DECEMBER 2010 | VOLUME 13 | NUMBER 12
when the possibility of separate phases arises, or when doubt surrounds the sample composition. Contact: www.bruker.com
Bruker Corporation, a leading provider of instruments for molecular and materials science for research and industry, recently acquired the Metrology & Instrumentation Group of Veeco Instruments Inc. This group includes the Scanning Probe Microscopy (SPM), Optical Industrial Metrology (OIM) and Stylus Profiler product lines of Veeco.
Customised Silicon Agar Scientific, a major supplier of consumables and equipment for microscopy, has announced that their partners TEMwindows will offer a wafer fabrication service. TEMwindows has experience in ultrathin films and MEMs processes, and so will be able to support customers who require unique solutions to their microscopy problems. They will offer design, etching and inspection of novel supports and films constructed from silicon, silicon dioxide and silicon nitride. Features as small as two microns can be etched into membranes, and metal deposition with a thickness of fifty to two hundred nanometres can be performed. Custom packaging will also be arranged to ensure that the tailor-made products arrive in the desired condition. Contact: www.agarscientific.com
Next generation HBLED tools Oxford Instruments is, among other titles, the world leading supplier of high volume bath plasma tools for the production market. Now the company is launching the PlasmaPro™ NGP®1000 HBLED range of plasma etch and deposition tools, which the company hopes will prove to be invaluable for high-brightness LED (HBLED) manufacturers. The new tools offer a much higher throughput than previously available, as well as aiming to be reliable and easy-to-service products. The range includes the PlasmaPro™ NGP1000 PECVD system, designed to deposit SiO2 and SiNx layers over large areas, and the PlasmaPro™ NGP1000 etch system, designed for GaN, AlGaInP and Sapphire etching. By using the new 60MHz Viper™ plasma source it is possible to obtain uniformity over a wider area than conventional sources, while still performing at an industry leading rate. Contact: www.oxford-instruments.com
Novel desktop x-ray instrument A new system for angle-dispersive x-ray diffraction (ADXRD), energy-dispersive x-ray diffraction (EDXRD) and x-ray fluorescence (XRF) measurements is now being offered by Bruker AXS. The D2 PHASER uses the XFlash detector, which provides an energy resolution of less than 180 eV at 100 000 counts per second. The detector is a silicon drift type device, and thanks to its high energy resolution, it is able to provide superior peak-to-background intensity ratios. The energy of the D2 PHASER can be moved throughout the copper emission spectrum, allowing the Kα doublet or the Kβ line to be selected. Such an approach overcomes the overlap problem associated with using Kα radiation. The XRF data can be collected during other measurements, allowing elements and concentrations to be identified. Such a measurement is incredibly valuable
50
Bruker acquires Metrology & Instrumentation Group
Small but able mass spectrometer
Acquired at a cost of $229 million, the new purchase is expected to contribute over $130 million to Bruker in 2011. The Metrology & Instrumentation Group is now part of Bruker’s new Nano Surfaces Business, and is compromised of all of the group’s former assets, such as its facilities in California and Arizona, and the worldwide service support departments. Contact: www.bruker-nano.com
Extreme high-aspect ratio AFM Carbon Design Innovations, manufacturers of carbon nanotube devices, has recently announced an atomic force microscope (AFM) probe with an extreme high-aspect ratio, designed for life science imaging. Using CDI’s patented techniques, the company is able to produce incredibly straight probes, which can be precisely aligned. The Carbon Core BioProbes (CCB) have a total length of up to 5 μm, with an exposed nanotube length of <500 nm. The CCB AFM probes are able to provide a high-aspect ratio, stability and superb resolution.
A new compact mass spectrometer, the QGA, is now being offered by Hiden Analytical. The benchtop spectrometer can provide real-time multi-species analysis of gases and vapors between 2 bar and 100 mbar. The sample insert can be heated up to 200 °C, and the device will adjust the consumption rates to meet the processing requirements. By using available adaptors and extensions it is possible to study pressures up to 30 bar and extract gases from environments at 1000 °C. The device uses the QGA operating system, and can analyze 16 gases or vapors. Several advanced modes are available, which allow the analysis of complex organic molecules using soft ionization, and the selective ionization of many gas species.
The probe also offers a lifetime which is ten-fold longer than silicon probes, by exploiting the strength of carbon nanotubes. The probes consist of multiwall carbon nanotubes, which are securely attached, meaning that the tip can withstand forces that silicon or amorphous carbon probes cannot. The CCB probe is designed to be suitable for most non-contact mode operations; however custom coatings and processes are available, if the standard CCB is not ideal. The probe is also available on the user’s choice of cantilever.
Contact: www.HidenAnalytical.com
Contact: www.carbondesigninnovations.com
DECEMBER 2010 | VOLUME 13 | NUMBER 12