nz.sbnd;dependence of superconducting properties in Bi2Sr2Can−1CunOy thin films prepared by in-situ MBE technique

nz.sbnd;dependence of superconducting properties in Bi2Sr2Can−1CunOy thin films prepared by in-situ MBE technique

PHYSiCA Physica C 185-189 (1991) 2011-2012 North-Holland n - D E P E N D E N C E OF S U P E R C O N D U C T I N G P R O P E R T I E S IN BijSr~.Ca~_...

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PHYSiCA

Physica C 185-189 (1991) 2011-2012 North-Holland

n - D E P E N D E N C E OF S U P E R C O N D U C T I N G P R O P E R T I E S IN BijSr~.Ca~_iCu~O~ T H I N FILMS P R E P A R E D B Y I N - $ I T U M B E T E C H N I Q U E I. T S U K A D A , H. W A T A N A B E , I. T E R A S A K I , A. M A E D A and K. U C H I N O K U R A Department of Applied Physics, The University of Tokyo, 7-3.1 Hongo, Bunkyo.kn, Tokyo I15, Japan. Thin films of BbSrjCa,~_lCu,~O~ (n = 1 .,~ 4) grown with a sequential deposition technique in properties, Hall coefficient and electron energy spectra were systematically changed from n = l

were prepared in sitn by molecular beam epitaxy. All films were an identical condition. To investigate the n dependence of physical loss spectroscopy were measured. Hall coefficient and energy loss to 3, but the results of the n=4 phase showed different behavior.

In BijSrjCan_lCu~Oy compounds, the number of

and 75 K for the n = l , 2, 3 and 4 phases, respectively.

CuO~ layers in a primitive cell (represented by n)

The normal state resistivities are low and comparable

mainly determines superconducting properties. Recent

to those of single crystals.

progress in thin film processing technique allows us to prepare in situ the metastable phases with n > 4.1

In BijSrjCa~_xCu,~Oy

compounds,

the mecha-

nism of doping holes is not so obvious as that of

To investigate the n dependence in Bi2 SrjCa,~_ 1Cu,~O~

(La, Sr)jCuO4 or YBajCusOr-s, but the excess oxy-

crystals, it is required that the samples are prepared in

gen plays an important role as a charge reservoir. ~,3

the same oxidizing conditions. Superconducting prop-

Hall coefficient provides us useful information about

erties of high-T~ cuprates are very sensitive to the oxy-

charge carriers.

Figure 2 shows the temperature de-

gen partial pressure during growth. Thin film process-

pendence of the Hall coefficient of the n = 1 ~ 4 phase

ing technique has an advantage of the precise control of

films. The measurement is carried out by an ordinary

the oxidizing conditions.

six-probe method under 1.8-T magnetic field parallel

In

this

paper

we

report

the

preparation

of

to the c axis.

RH values in the temperature range

BijSrjCan_lCunO~ superconductors with n up to 4. Hall coefficient (R//) and electron energy loss spec-

2.0

,

,

,

,

,

16.0

I

...." ...." L#,"

troscopy (EELS) were measured and the results are discussed. o 1.5-

The preparation technique of the n = 1 ~ 4 phases is the same as the previously reported one. 1 All films were prepared in situ by modified molecular beam epitaxy machine with pure ozone gas. The substrate tempera-

........

~

- ~ - - W - | .,.~...'"

~

.,

y.''"" --

~1.0 ~.~ ~.

.. ... ,-

..." ......

o,¢" .¢e,z

3 . 0 " " ~'b

,/ .... ...."

ture was kept around 780°C . The ozone pressure was kept around 2

x

i 0 °r'3

Pa during deposition, and ~'" LIiiS

O.

"~ "~"

1.:3

pressure was also kept until the substrate was cooled down to 235 ° C. Films were prepared in the same conditions except for the deposition sequence of each molecular beams.

!

0

Figure 1 shows the temperature dependence of the resistivity of the n=i ~ 4 phase films in an as-grown state. All films show superconductivity beloi~ 7, 65, 71

I

I

.

0

100 200 300 Temperature (K)

FIGUR]~ 1 The temperature dependence of the resistivity of the n = 1 ~ 4 phase films.

0921-4534/91/$03.50 © 1991 - Elsevier Science Publishers B.V. All rights reserve0.

L T~,kad, et al / n-Dependence of s~emonducting properaes in Bi2$r2Ca..zCu.Oy thin films

2012

4.0 I

I

I

I

!

I

EELS Ep-lO00 eV 600

g

3.0

....

~,600

,~400

~m

.2 2.0 .m,

.~

"'.::".:

,

~-oo

t,d

= a

1.0

n=4]'<'-,..-"'--i "'~'-q

m

~200 "1

0(n=4) (n=3)0

0.0 0

I

!

!

100

200

300

FIGURE

2

The temperature dependence of the Hall coefficient of the n = 1 ~ 4 phase films. of 100 ~ 5G0 K increase with increasing , up to 3,

O(n=2)

,oo

("=')°0

Temperature (K)

100 I

I

I

I

!

10 2'0 3'0 Energy (eV)

4O

FIGURE 3 Electron energy loss spectra of the n = 1 ~ 4 phase films.

which suggests that the carrier density in the unit cell decreases. In this experiment, oxidized state is thought

crystal structures. The spectrum of the n=4 phase is

to be the same in all samples because of the prepara-

quite similar to that of the n=3 phase. It is, however,

tion in the same oxidizing conditions. Thus the above

not clear whether the n=4 phase has the same elec-

results suggest that the definite numbers of holes are

tronic structure as that of the n=3 phase, because the

distributed to n sheets of Cue2 layers, and as a re-

energy of the primary electron is relatively weak and

sult the cattier density decreases.

the probing depth is not sufficiently long to detect the

Hall coefficient of

the n=4 phase, however, shows quite different behav-

difference between the n=3 and 4 phases.

ior. RH value of the n=4 phase is quite low, which can-

In summary we prepared the superconducting

not be explained in the extrapolation from the n <_ 3

Bi2Sr2Ca,_tCu, Ot ( n = l ~, 4) thin films in zitu by

phases.

Such a low value has not been observed in

molecular beam epitaxy. Hall coefficient and electron

Bi=Sr2C~_xCu,~O~ compounds before. The origin of the low value is not evident, and further experiments are requited.

energy loss spectroscopy were measured. The system-

To investigate the electronic structures, EELS were

films. The behavior of the n=4 phase film cannot be explained in the extrapolation from the n _< 3 phases.

also measured. The energy of the primary electron is 1000 eV. The observed spectra, shown in Fig. 3, are obtained in a reflection mode, where because of a short

atic change of Hall coefficient and the the electron energy loss spectra were observed in the n = 1 ~., 3 phase

REFERENCES

probing depth the spectra for thin films should be equivalent to those for single crystals . The spectra of the

n=l and 2 phases are the same as those of the bulk single-crystal samples. 4 In the spectra of the n=2 and 3 phases, the peak due to Ca is only observed as the intra-atomic transition (C), which supports the oxygen vacancy in the Ca layer. Thus the obtained spectra of the films are consistent with the electronic structures of the n = 1 ~ 3 phases expected from their

1. I. Tsukada and K. Uchinokura, Jpn. J. Appl. Phys. 30 (1991) Lll14. 2. G. Briceno and A. Zettl, Phys. Rev. B 40 (1989) 11354. 3. T. Ishida and T. Sakuma, Physica C 167 (1990) 258. 4. I. Terasaki e~ M., Supercond.

(1991) S397.

Sci.

Technol.

4