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Photoluminescence of solutions with applications to photochemistry and analytical chemistry
MTCROCHEMICAL
JOURNAL
14,350-352(1969)
Book Reviews Photoluminescence of Solutions with Applications to Photochemistry and Analytical Chemistry. By C. A. PARKER, Am. Elsevier, New York, 1968. xvi + 544 pp. $30.00. This book is divided into five chapters which cover basic principles and definitions, kinetics of photoluminescence, apparatus and experimental methods, special topics and applications, and applications to analytical chemistry. In general the coverage of the subject matter is adequate but at times the author becomes engrossed in triva and in these places the reader will probably become bored rapidly. This is particularly true in the section on apparatus and experimental methods. As in most books of this length there are typographical errors as well as errors of fact. For the most part these errors will be of little consequence to the novice and will be easily recognized by the experienced investigator. The book is well indexed and the bibliography appears to be representative of the literature on photoluminescence. The list of mathematical symbols in the back of the book is very helpful but unfortunately the author did not conform to the nomenclature recommended by IUPAC. For example, he uses optical density in place of absorbance and molecular extinction coefficient rather than molecular absorptivity. In spite of these and some other minor shortcomings this book provides a useful and fairly comprehensive coverage of photoluminescence in solutions and will be very useful to anyone desiring a combination text and reference book. RICHARD
Institute for Atomic Research and Department of Chemistry, Iowa State University, Ames, Iowa 50010
N. KNISELEY,
Electron Microscopy and Microanalysis of Metals. Edited by J. A. BELK AND A. L. DAVIES. Am, Elsevier, New York, 1968. ix + 254 pp. $17.50. This book is a result of a series of lectures given at the Department of Metallurgy, of the University of Aston in Birmingham, England. Nine contributors cover the field, outlined by the title in logical sequence. The title might be misleading to one accustomed to the use of terms in the United States. What is called an “electron probe” in this country is called a “microanalyzer” in this book. Thus the expression “microanalysis of metals” in the title connotes the use of the electron probe in the analysis of metals. The basic principles of electron optics of the electron microscope is treated first. Details of construction are then discussed. The fundamental principles of electron diffraction is then taken up to the extent that the reader may understand the interpretation of simple diffraction patterns. A chapter on specimen preparation follows, with line drawings so that the reader would have no difficulty in following the techniques. Both the use of replicas and thin foil techniques are included. The practical applications of electron microscopy and diffraction to metallurgical problems are then covered in four chapters. These include applications to deformation and defects in metal crystals, stacking faults and partial dislocations. 350
JOURNAL
14,350-352(1969)
Book Reviews Photoluminescence of Solutions with Applications to Photochemistry and Analytical Chemistry. By C. A. PARKER, Am. Elsevier, New York, 1968. xvi + 544 pp. $30.00. This book is divided into five chapters which cover basic principles and definitions, kinetics of photoluminescence, apparatus and experimental methods, special topics and applications, and applications to analytical chemistry. In general the coverage of the subject matter is adequate but at times the author becomes engrossed in triva and in these places the reader will probably become bored rapidly. This is particularly true in the section on apparatus and experimental methods. As in most books of this length there are typographical errors as well as errors of fact. For the most part these errors will be of little consequence to the novice and will be easily recognized by the experienced investigator. The book is well indexed and the bibliography appears to be representative of the literature on photoluminescence. The list of mathematical symbols in the back of the book is very helpful but unfortunately the author did not conform to the nomenclature recommended by IUPAC. For example, he uses optical density in place of absorbance and molecular extinction coefficient rather than molecular absorptivity. In spite of these and some other minor shortcomings this book provides a useful and fairly comprehensive coverage of photoluminescence in solutions and will be very useful to anyone desiring a combination text and reference book. RICHARD
Institute for Atomic Research and Department of Chemistry, Iowa State University, Ames, Iowa 50010
N. KNISELEY,
Electron Microscopy and Microanalysis of Metals. Edited by J. A. BELK AND A. L. DAVIES. Am, Elsevier, New York, 1968. ix + 254 pp. $17.50. This book is a result of a series of lectures given at the Department of Metallurgy, of the University of Aston in Birmingham, England. Nine contributors cover the field, outlined by the title in logical sequence. The title might be misleading to one accustomed to the use of terms in the United States. What is called an “electron probe” in this country is called a “microanalyzer” in this book. Thus the expression “microanalysis of metals” in the title connotes the use of the electron probe in the analysis of metals. The basic principles of electron optics of the electron microscope is treated first. Details of construction are then discussed. The fundamental principles of electron diffraction is then taken up to the extent that the reader may understand the interpretation of simple diffraction patterns. A chapter on specimen preparation follows, with line drawings so that the reader would have no difficulty in following the techniques. Both the use of replicas and thin foil techniques are included. The practical applications of electron microscopy and diffraction to metallurgical problems are then covered in four chapters. These include applications to deformation and defects in metal crystals, stacking faults and partial dislocations. 350