Physical problems in microelectronics

778

Book reviews

P H Y S I C A L P R O B L E M S IN M I C R O E L E C T R O N I C S

Proceedings

of t h e F o u r t h I n t e r n a t i o n a l

ISPPME

'85, V A R N A ,

MAY

School

BULGARIA

IZ-18, 1985.

Edited by :

J. K A S S A B O V .

Publishers :

W o r l d Scientific Publishing Co P i e L i m i t e d , P.O. BoxlZS, F a r r e r Road, SINGAPORE 91Z8.

Price :

£ 51.65.

(ISBN 9971-50-017-5)

T h e Fourth International School on Physical P r o b l e m s held in the H o u s e of the Bulgarian A c a d e m y M a y Ig to 18, 1985. Bulgarian A c a d e m y

ISPPME

of Sciences.

of Sciences near the city of V a r n a f r o m

T h e School is held every two years.

INTERFACES MOS

'85 w e r e :

AND

structures;

SURFACES Physics and Technology;

based structures and heterojunctions; Measurement

was

is sponsored by the Institute of Solid State Physics of the

T h e m a i n topics of I S P P M E -

i n Microelectronics

techniques;

Silicon and A 3 B 5

A d v a n c e d technologies;

Theoretical modeling of localized

state s. -

SEMICONDUCTOR Defects;

-

MATERIALS

Impurities;

Deep levels;

Growth and Annealing.

INSULATOR LAYERS Deposition;

Defect centers;

Breakdown

phenomena;

Carrier

mobilitie s. -

MODERN DEVICES Small size devices;

Physical

Radiation damage; This book is a record 17 l e c t u r e s

limitations;

Annealing;

of t h e P r o c e e d i n g s

were included and Z poster

sessions

Modeling;

Advanced technologies; New trends.

of t h e 1985 S c h o o l .

In t h e p r o g r a m m e ,

w i t h 36 o r i g i n a l c o m m u n i c a t i o n s

were

organised. The Proceedings,

consisting

of 639 p a g e s ,

e x c e l l e n t r e v i e w of w o r k in t h e E a s t e r n

is well produced

Block countries.

and forms

an

It w o u l d b e n e f i t b y t h e

a d d i t i o n of a n I n d e x b u t t h e r e i s n o d o u b t t h a t t h e r e i s a g r e a t d e a l of i n t e r e s t i n g valuable information

in the book.

G. W . A ° D .

and