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Precision positioning catalogue
TOOLS AND TECHNIQUES
shaped to suit curved geometry. By using a soft backing layer, the flexibility of the crystal is retained. At around 3mm high, Flex transducers are low profile. Neil Hankinson, Project Manager with Phoenix Inspection Systems, said: “Flex transducers are low profile and extremely versatile, making them ideal for inspecting difficult to access areas and complex geometries, typically found on composite components such as radii areas. They have a broadband response providing exceptional signal quality, especially at low frequencies.”
Precision positioning catalogue Piezo positioning systems specialists PI (Physik Instrumente) has released a new catalog on precision motion control products for microscopy. The new catalogue covers a variety of novel positioning stages and scanning systems for specimen as well as microscope objectives and the technology behind the products. Ultrasonic-ceramic motor drives with self-clamping properties, for example, provide better stability in long-term imaging applications than conventional motor-driven stages.
“Flex transducers are an example of the way in which innovation can overcome day to day inspection challenges such as testing complex shapes. They have proved a major success with our aerospace clients, and we can also see widespread potential uses within the marine and wind energy sectors, where composites are also commonly used. There are also a wide range of applications for testing complex geometries in metals, for example in weld cap areas or on castings.” Visit: www.phoenixisl.co.uk
The precision positioning systems covered in the new catalog are often used in Super Resolution Microscopy (SRM) techniques such as STORM (Stochastic Optical Reconstruction Microscopy), PALM (Photoactivated Localization Microscopy), STED (Stimulated Emission Depletion) and SIM (Structured Illumination Microscope)
New solution for EDS on TEM Oxford Instruments NanoAnalysis has announced the launch of AZtecTEM, EDS software for the Transmission Electron Microscope (TEM), following on from the launch of the AZtec microanalysis system for the Scanning Electron Microscopes (SEM) in April 2011.
A new flexible ultrasonic transducer which can squeeze into corners and conform to curved surfaces is set to revolutionize the inspection of composites and components with complex geometries. The Flex transducer series, available from Phoenix Inspection Systems, has already proved a success during trials within the aerospace sector, where composite materials are commonplace. However Phoenix believes it will have much wider appeal, in other sectors that use composites and for the inspection of metals with complex geometry. The Flex transducer is made of a thin but durable piezoelectric material that is soft enough to bend and can be
222
MAY 2012 | VOLUME 15 | NUMBER 5
Brewer Science, Inc., introduces new wafer processing equipment designed for thin wafer separation and postdebonding cleaning, steps that are critical for ultrasensitive compound semiconductor (CS) device processing. These latest equipment designs enable thin wafer handling technologies that can broaden your process window and lower your total cost of ownership by reducing yield loss and increasing throughput. The new tools comprise: the Cee® 1300CSX thermal debonder for hightemperature slide-off debonding of thinned III-V and CS materials (GaAs, GaN, InP, and SiC) in a confidential laboratory setting; the enhanced ZoneBOND® separation tool which provides superior precision control for debonding materials that are highly sensitive to mechanical and thermal shock; and the Cee® 300MXD megasonic cleaning system, for the gentle removal of adhesive residues and contaminants without damaging fragile device structures. Visit: www.brewerscience.com
Compact and discrete nutrient analysis
Download the catalogue from: www.MicroscopeStage.net/ Microscope_Positioning_Systems.htm
Revolutionary composite inspection
Thin wafer handling
AZtecTEM packs innovative tools and technologies into a platform specifically designed for the TEM user. It unleashes the potential of the latest generation of large area SDDs, the X-MaxTEM, to enable high quality data acquisition even when counts are low. Unique Tru-Q analysis algorithms bring new levels of certainty and detail to sample analysis. For the first time, TEM users will be able to see true chemical variations in real-time using AZtec’s overlap corrected TruMap and TruLine scans. At the same time, AZtecTEM uses predictive and reactive routines to automatically correct microscope drift, vital when collecting data at the nanoscale. Dr. Ian Barkshire, Managing Director NanoAnalysis, commented, “Working at the frontiers of nanotechnology, we have developed an enviable reputation for innovation and quality of analysis. AZtecTEM is the result of our 30 years of TEM experience being applied to solve real world TEM challenges.” Visit: www.oxford-instruments.com
Laboratory instrumentation manufacturer SEAL Analytical has launched the ‘AQ1’ discrete analyzer which automatically tests multiple samples in discrete reaction vessels: ideal for laboratories requiring varied tests on different samples and for those that need fast individual results. The AQ1 is supplied with standard methods to USEPA, ASTM, ISO and other internationally recognised standards for the analysis of a wide variety of parameters including alkalinity, ammonia, chloride, cyanides, nitrate/nitrite, nitrite, phenolics, ortho phosphate, total phosphorus, silicate, sulfate and total Kjeldahl nitrogen. The AQ1 has all the advantages of discrete analysis – automatic standard preparation, automatic dilution, automatic method changeover, and low reagent consumption. The AQ1 was designed specifically for the automated analysis of nutrients in water, wastewater, soils, extracts and digests. However, SEAL’s Stuart Smith says “The instrument is extremely flexible and reflects our intention to deliver analytical technology that meets every customer’s individual needs.” Visit: www.seal-analytical.com
shaped to suit curved geometry. By using a soft backing layer, the flexibility of the crystal is retained. At around 3mm high, Flex transducers are low profile. Neil Hankinson, Project Manager with Phoenix Inspection Systems, said: “Flex transducers are low profile and extremely versatile, making them ideal for inspecting difficult to access areas and complex geometries, typically found on composite components such as radii areas. They have a broadband response providing exceptional signal quality, especially at low frequencies.”
Precision positioning catalogue Piezo positioning systems specialists PI (Physik Instrumente) has released a new catalog on precision motion control products for microscopy. The new catalogue covers a variety of novel positioning stages and scanning systems for specimen as well as microscope objectives and the technology behind the products. Ultrasonic-ceramic motor drives with self-clamping properties, for example, provide better stability in long-term imaging applications than conventional motor-driven stages.
“Flex transducers are an example of the way in which innovation can overcome day to day inspection challenges such as testing complex shapes. They have proved a major success with our aerospace clients, and we can also see widespread potential uses within the marine and wind energy sectors, where composites are also commonly used. There are also a wide range of applications for testing complex geometries in metals, for example in weld cap areas or on castings.” Visit: www.phoenixisl.co.uk
The precision positioning systems covered in the new catalog are often used in Super Resolution Microscopy (SRM) techniques such as STORM (Stochastic Optical Reconstruction Microscopy), PALM (Photoactivated Localization Microscopy), STED (Stimulated Emission Depletion) and SIM (Structured Illumination Microscope)
New solution for EDS on TEM Oxford Instruments NanoAnalysis has announced the launch of AZtecTEM, EDS software for the Transmission Electron Microscope (TEM), following on from the launch of the AZtec microanalysis system for the Scanning Electron Microscopes (SEM) in April 2011.
A new flexible ultrasonic transducer which can squeeze into corners and conform to curved surfaces is set to revolutionize the inspection of composites and components with complex geometries. The Flex transducer series, available from Phoenix Inspection Systems, has already proved a success during trials within the aerospace sector, where composite materials are commonplace. However Phoenix believes it will have much wider appeal, in other sectors that use composites and for the inspection of metals with complex geometry. The Flex transducer is made of a thin but durable piezoelectric material that is soft enough to bend and can be
222
MAY 2012 | VOLUME 15 | NUMBER 5
Brewer Science, Inc., introduces new wafer processing equipment designed for thin wafer separation and postdebonding cleaning, steps that are critical for ultrasensitive compound semiconductor (CS) device processing. These latest equipment designs enable thin wafer handling technologies that can broaden your process window and lower your total cost of ownership by reducing yield loss and increasing throughput. The new tools comprise: the Cee® 1300CSX thermal debonder for hightemperature slide-off debonding of thinned III-V and CS materials (GaAs, GaN, InP, and SiC) in a confidential laboratory setting; the enhanced ZoneBOND® separation tool which provides superior precision control for debonding materials that are highly sensitive to mechanical and thermal shock; and the Cee® 300MXD megasonic cleaning system, for the gentle removal of adhesive residues and contaminants without damaging fragile device structures. Visit: www.brewerscience.com
Compact and discrete nutrient analysis
Download the catalogue from: www.MicroscopeStage.net/ Microscope_Positioning_Systems.htm
Revolutionary composite inspection
Thin wafer handling
AZtecTEM packs innovative tools and technologies into a platform specifically designed for the TEM user. It unleashes the potential of the latest generation of large area SDDs, the X-MaxTEM, to enable high quality data acquisition even when counts are low. Unique Tru-Q analysis algorithms bring new levels of certainty and detail to sample analysis. For the first time, TEM users will be able to see true chemical variations in real-time using AZtec’s overlap corrected TruMap and TruLine scans. At the same time, AZtecTEM uses predictive and reactive routines to automatically correct microscope drift, vital when collecting data at the nanoscale. Dr. Ian Barkshire, Managing Director NanoAnalysis, commented, “Working at the frontiers of nanotechnology, we have developed an enviable reputation for innovation and quality of analysis. AZtecTEM is the result of our 30 years of TEM experience being applied to solve real world TEM challenges.” Visit: www.oxford-instruments.com
Laboratory instrumentation manufacturer SEAL Analytical has launched the ‘AQ1’ discrete analyzer which automatically tests multiple samples in discrete reaction vessels: ideal for laboratories requiring varied tests on different samples and for those that need fast individual results. The AQ1 is supplied with standard methods to USEPA, ASTM, ISO and other internationally recognised standards for the analysis of a wide variety of parameters including alkalinity, ammonia, chloride, cyanides, nitrate/nitrite, nitrite, phenolics, ortho phosphate, total phosphorus, silicate, sulfate and total Kjeldahl nitrogen. The AQ1 has all the advantages of discrete analysis – automatic standard preparation, automatic dilution, automatic method changeover, and low reagent consumption. The AQ1 was designed specifically for the automated analysis of nutrients in water, wastewater, soils, extracts and digests. However, SEAL’s Stuart Smith says “The instrument is extremely flexible and reflects our intention to deliver analytical technology that meets every customer’s individual needs.” Visit: www.seal-analytical.com