Progress in Materials Analysis, Vol. 1 [Mikrochimica Acta, supplement 10]

International Journal of Mass Specfrometry

Elsevier

Science

Publishers

B.V., Amsterdam

59 (1984) 219-220 - Printed in The Netherlands

and Ion Processes,

219

Book Reviews Progress

in Materials Analysis,

Vol. I [Mikrochimica

A cfa, Supplement IO], edited by M. Grasserbauer and M.K. Zacherl, Springer-Verlag, Vienna, New York, 1983, 349 pp., price U.S. $49.70 (soft cover).

This volume is the Proceedings of the 11 th Colloquium on Metallurgical Analysis held at the Technical University of Vienna, 3-5 November, 1982. The colloquium was a joint venture of the Institute of Analytical Chemistry of the Technical University in Vienna, the Austrian Society for Analytical Chemistry and Microchemistry, the German Metals Society and the Society of German Iron and Steel Engineers. All the papers are published in English and report the use of a variety of techniques for studying materials. Of the twenty nine papers, seven report work in which secondary ions mass spectrometry (SIMS) or ion microprobe analysis were used. One of these, by A. Ladding and H. Odelius of the Chalmers University of Technology, reviews the practical aspects of SIMS and illustrates these in studies of different materials. The recently developed technique of secondary neutral mass spectroscopy (SNMS) is described by K.H. Miiller and H. Occhsuer of the Fachbereich Physik der Universitat Kaiserslautern. They discuss some applications which demonstrate its potential for chemical bulk analysis and depth profiling. The volume will not be of general interest to mass spectroscopists, but those using SIMS in their own work may find several of the papers interesting. F.M. HARRIS University College of Swansea Gt. Britain