Reliability of maintainable structures

Reliability of maintainable structures

410 WORLD ABSTRACTS ON M I C R O E L E C T R O N I C S reliability assurance activity of solid state devices used mainly in a rolling mill plant. I...

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410

WORLD

ABSTRACTS ON M I C R O E L E C T R O N I C S

reliability assurance activity of solid state devices used mainly in a rolling mill plant. In addition, a reliability program based on field data and actual failure rates of transistor type solid state devices and component parts are covered.

Testing of spacecraft in long-term storage. R. J. MASTERSON and R. N. MILLER.Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January (1973), p. 149. This paper addresses the problem of developing a storage and test policy which may be applied to equipment placed in long-term storage prior to utilization. A closed-form analytic solution is developed to aid in evaluating the characteristics of a given policy in terms of test efficiency, on time delivery, and subsequent reliable operation of the equipment in its intended application. The analysis model is, to the authors knowledge, new and hence is described in detail; a computer program based on the model is outlined and a flow diagram of its logic included. Problems associated with estimating valid input data are treated. An example of the application of the analysis to spacecraft is presented to fully illustrate the approach. Finally, the paper closes with a discussion of some of the many situations in which such a tool could be employed in a variety of industrial, research, and sports contexts.

Maintenance strategies for ambiguous faults. FRANKA. EBLE. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January (1973), p. 238. When fault isolation capability is limited to identifying large groups of circuit cards, system restoration times and sparing requirements can be burdensome. The FARO computer program optimizes group replacement strategy, softening the impact of fault ambiguity on operational availability and system support. This paper describes FARO (Fault AmbiguityRepair Optimization) and shows how to use it effectively.

Microcomputers and QC. statistics: programs and tables. JOHN H. K. KAO. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January (1973), p. 410. In this paper, twenty five microcomputer programs are created to solve problems in Quality Control chart work, using Olivetti P-101, Hewlett-Packard 9100B and Wang 700A programmable calculators. As a result, tables for Control Chart constants which are superior to those originally published in ASTM Manual or recently published in ASQC Standard are presented. Numerical examples are given for each area of application.

Aegis An/Spy radar system--design for availability. WILLIAM J. O'LEARY. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January (1973), p. 50. The AEGIS Weapons System is a Navy defensive missile system designed to shield the fleet against airborne threats of the late 1970's and 1980"s. At the heart of this system is

AND RELIABILITY

the automatically controlled AN/SPYol radar, which provides target search and track and missile guidance functions. Considering its almost one million parts the AN/SPY-1 radar presents the greatest challenge to the achievement of AEGIS availability design objectives. Through specific examples, this paper shows how RCA approached a variety of reliability and maintainability design problems relating to the AN/SPY-1 radar and the overall success achieved. Availability design solutions are related to system support characteristics, such as manning and sparing. This relationship is shown in a requirements structure which relates system effectiveness elements. These elements are categorized into four major groupings with specific design objectives for each. It is shown that the AN/SPY-1 design solution achieves not only the high levels of availability desired but also has excellent support characteristics.

Aegis operational readiness test system--design for system effectiveness. HOWARD BOARDMANand WILLIAMO'LEARY. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January (1973), p. 68. The AEGIS Weapons System is a Navy defensive missile system designed to shield the fleet against airborne threats of the late 1970's and 1980's. The achievement of high operational readiness with complex weapon systems, such as AEGIS, is dependent on the development of precise methods for measuring and controlling system states. In AEGIS, status control is supported by the Operational Readiness Test System (ORTS). The fundamental mission of ORTS is to extract data relative to the degree of operability of the system, process failure data for operation and maintenance purposes, and conduct those functions in such a way that the system availability and effectiveness requirements are met as specified. This paper shows how the ORTS is functionally related to system effectiveness and how availability modelling techniques have been utilized to provide a quantitative relation between system effectiveness and ORTS design parameters. The results of a few key parametric tradeoff studies are described to indicate the method used in developing ORTS requirements. Also included is a discussion of how the ORTS design enables these requirements to be achieved, and includes its functional interfaces, its major equipment elements, and its computer control functions.

Reliability of maintainable structures. JHY-PYNG TANG. Proceedings 1973 IEEE Annual Reliability Maintainability Symposium. 23-25 January (1973), p. 17. A method is presented for computing the reliability of a structure with maintainable elements which may yield in response to strong excitations. Both general and specialized sequences of excitations are considered. The reliability of maintainable and non-maintainable structures is compared, and an expected cost criterion is also developed for use in comparison of the two types of structures.

4. MICROELECTRONICS--GENERAL BS 9000 and custom-built microelectronics. D. BOSWELL. Elec. Comp. April (1973), p. 330. The old borderlines

between component and equipment manufacture are disappearing quickly.