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Reliability physics—An assessment
450
WORLD
ABSTRACTS
ON MICROELECTRONICS
AND RELIABILITY
how they lead to the undesired event. If the design is adequate, the fault tree can be used to show that all conceivable causes have been considered. (3) For reliability analysis the fault tree provides a convenient and efficient format for the problem description, particularly when Monte Caro simulation is used. The primary objective of this paper is to present aspects germane to the utility of fault trees in reliability analysis. Additional discussion of the comparitive advantages of fault trees and areas of usefulness can be found in Ref. (5). Techniques for fault tree construction are discussed in Ref. ~6). An example of a fault tree representing unsafe failure of a "fail safe" system is shown in Fig 1. The symbology is defined in the appendix.
Computerized reliability analysis using R E A C T . F. TATAR, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R. 3-5 February (1970), p. 284. Philco-Ford SRS Reliability has developed a system of interrelated computer programs and a comprehensive parts data bank called R E A C T to support analysis activity in nearly every aspect of reliability assurance. This system has been organized to meet engineering needs at two levels: Total program level--where the entire complex of programs is used to support reliability assurance analyses at every stage of product development and use; and at the Independent analysis level--where programs are used individually or in groups to support problem or task-oriented activities. The purpose of R E A C T is to provide the most effective use of every reliability dollar spent. This is accomplished by: Standardized analysis methods; Computerized data processing; Extensive parts data bank; Output/input program coupling. In this paper, we will show how R E A C T has been organized to accomplish this purpose. Examples are presented to demonstrate implementation experience, costs, and typical output. It is felt that this experience will benefit those that are contemplating setting up similar computerized reliability support systems. In addition, details are provided concerning the availability of many REACT programs to interested parties. Appendix A contains a catalog description of all programs and their capabilities.
Reliability testing uniformity, efficiency and e c o n o m y needed. L. SESSEN,Proc. 1970 Ann. Syrup. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3-5 February (1970), p. 212. Notwithstanding the very large amount of money spent on reliability programs and reliability testing, an incredible lack of correlation of failure rate data exists. Recent articles indicate reliability prediction calculations are generally misapplied. Correlations of environment are given only with large tolerances. M T B F ' s are stated or specified at a hodge-podge of environments or one is left to guess what environment is meant. (A successful bidder usually guesses a benign environment.) The government after paying 5-50 per cent of the basic cost of units for reliability demonstration is at a loss to compare the reliability of different types of equipment or of different manufacture. All of the above is the result of pouting money into reliability testing without following standard guidelines.
Reliability physics--An assessment. J. VACCARO,Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3-5 February (1970), p. 348. Progress and future directions in studies of the physical and chemical mechanisms of degradation in semiconductor devices are discussed. Emphasis is placed on methods used in kinetic studies of the degradation process.
People subsystem m e a s u r e m e n t for total reliability. B. P. DAVIS and C. N. CORDONI, Proc. 1970 Ann. Sffmp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3-5 February (1970), p. 394. As society and systems become more complex and human performance has greater impact on the total reliability of operational systems, the need for quantifying and developing valid techniques for the prediction and analysis of the human component becomes more and more critical. This paper describes an empirical approach to the problem of "people system" reliability. It is the method used by IBM at the Cape Kennedy Facility to control its "people system" supporting the Apollo/Saturn Program. The method for the collection, analysis, and feedback of failure data and failure rates is described. Bsg000 and integrated circuits. A. LINDELL, Microelectronics, March (1970), p. 14. The BS9000 system, the subject of much consideration for many years, is a system of specifications and approval procedures for the procurement of electronic components by military and industrial users. This article briefly describes the system, and shows how it affects manufacturers and users of integrated circuits.
The philosophy of reliability. R. BRSWER, Electron. Equip. News, April (1970), p. 12. Reliability is not only a subject but a quantitative measure of performance. This is explained very clearly and all the factors which make up reliability in the general sense specified.
2. R E L I A B I L I T Y O F C O M P O N E N T S ,
T U B E S , T R A N S I S T O R S A N D ICs
Gain degradation in planar transistors following emltter-base reverse biassing. R. F. HAYTHOI~/THWAITE, IEE Conf. Reliab. Electron., Conf. Publ. No. 60, 10-12 December (1969), p. 123. Although the electrical characteristics of planar transistors are essentially stable, some operating conditions are more likely to cause changes in current
WORLD
ABSTRACTS
ON MICROELECTRONICS
AND RELIABILITY
how they lead to the undesired event. If the design is adequate, the fault tree can be used to show that all conceivable causes have been considered. (3) For reliability analysis the fault tree provides a convenient and efficient format for the problem description, particularly when Monte Caro simulation is used. The primary objective of this paper is to present aspects germane to the utility of fault trees in reliability analysis. Additional discussion of the comparitive advantages of fault trees and areas of usefulness can be found in Ref. (5). Techniques for fault tree construction are discussed in Ref. ~6). An example of a fault tree representing unsafe failure of a "fail safe" system is shown in Fig 1. The symbology is defined in the appendix.
Computerized reliability analysis using R E A C T . F. TATAR, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R. 3-5 February (1970), p. 284. Philco-Ford SRS Reliability has developed a system of interrelated computer programs and a comprehensive parts data bank called R E A C T to support analysis activity in nearly every aspect of reliability assurance. This system has been organized to meet engineering needs at two levels: Total program level--where the entire complex of programs is used to support reliability assurance analyses at every stage of product development and use; and at the Independent analysis level--where programs are used individually or in groups to support problem or task-oriented activities. The purpose of R E A C T is to provide the most effective use of every reliability dollar spent. This is accomplished by: Standardized analysis methods; Computerized data processing; Extensive parts data bank; Output/input program coupling. In this paper, we will show how R E A C T has been organized to accomplish this purpose. Examples are presented to demonstrate implementation experience, costs, and typical output. It is felt that this experience will benefit those that are contemplating setting up similar computerized reliability support systems. In addition, details are provided concerning the availability of many REACT programs to interested parties. Appendix A contains a catalog description of all programs and their capabilities.
Reliability testing uniformity, efficiency and e c o n o m y needed. L. SESSEN,Proc. 1970 Ann. Syrup. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3-5 February (1970), p. 212. Notwithstanding the very large amount of money spent on reliability programs and reliability testing, an incredible lack of correlation of failure rate data exists. Recent articles indicate reliability prediction calculations are generally misapplied. Correlations of environment are given only with large tolerances. M T B F ' s are stated or specified at a hodge-podge of environments or one is left to guess what environment is meant. (A successful bidder usually guesses a benign environment.) The government after paying 5-50 per cent of the basic cost of units for reliability demonstration is at a loss to compare the reliability of different types of equipment or of different manufacture. All of the above is the result of pouting money into reliability testing without following standard guidelines.
Reliability physics--An assessment. J. VACCARO,Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3-5 February (1970), p. 348. Progress and future directions in studies of the physical and chemical mechanisms of degradation in semiconductor devices are discussed. Emphasis is placed on methods used in kinetic studies of the degradation process.
People subsystem m e a s u r e m e n t for total reliability. B. P. DAVIS and C. N. CORDONI, Proc. 1970 Ann. Sffmp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3-5 February (1970), p. 394. As society and systems become more complex and human performance has greater impact on the total reliability of operational systems, the need for quantifying and developing valid techniques for the prediction and analysis of the human component becomes more and more critical. This paper describes an empirical approach to the problem of "people system" reliability. It is the method used by IBM at the Cape Kennedy Facility to control its "people system" supporting the Apollo/Saturn Program. The method for the collection, analysis, and feedback of failure data and failure rates is described. Bsg000 and integrated circuits. A. LINDELL, Microelectronics, March (1970), p. 14. The BS9000 system, the subject of much consideration for many years, is a system of specifications and approval procedures for the procurement of electronic components by military and industrial users. This article briefly describes the system, and shows how it affects manufacturers and users of integrated circuits.
The philosophy of reliability. R. BRSWER, Electron. Equip. News, April (1970), p. 12. Reliability is not only a subject but a quantitative measure of performance. This is explained very clearly and all the factors which make up reliability in the general sense specified.
2. R E L I A B I L I T Y O F C O M P O N E N T S ,
T U B E S , T R A N S I S T O R S A N D ICs
Gain degradation in planar transistors following emltter-base reverse biassing. R. F. HAYTHOI~/THWAITE, IEE Conf. Reliab. Electron., Conf. Publ. No. 60, 10-12 December (1969), p. 123. Although the electrical characteristics of planar transistors are essentially stable, some operating conditions are more likely to cause changes in current